Claims
- 1. A system for performing CT scans, comprising:an X-ray source for providing X-rays during a plurality of views of a CT scan; a subsystem for correcting for X-ray fluctuations occurring during a CT scan, including: measurement means for measuring at least one value of the level of X-rays received from the X-ray source during each view; determination means for determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement; and replacement means for replacing measured values of levels of X-rays representing partially attenuated measurements with replacement values determined from values of remaining measurements.
- 2. A system according to claim 1, wherein the subsystem further includes:normalization means for using the replacement values and remaining values to normalize CT data acquired during the CT scan.
- 3. A system according to claim 1, further comprising:a detector array; and means rotating the X-ray source and detector array so as to generate CT data representing multiple views of an object positioned between the X-ray source and detector array during a CT scan.
- 4. A system according to claim 1, wherein the determination means includes statistical determination means for statistically determining the measured values of levels of X-rays representing partially attenuated measurements.
- 5. A system according to claim 1, wherein the determination means includes means for determining a histogram of all of the measured values of X-rays during a scan.
- 6. A system according to claim 5, wherein the determination means includes means for determining the upper and lower cutoff values of the histogram.
- 7. A system according to claim 6, wherein the determination means further includes means for low pass filtering all of the measured values of X-rays during a scan.
- 8. A system according to claim 7, wherein the replacement means for replacing measured values of levels of X-rays representing partially attenuated measurements with replacement values determined from values of remaining measurements includes means for determining an averaged filtered monitor value that are between the lower and upper monitor cutoff values of the histogram.
- 9. A system according to claim 8, wherein the determination means for determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement includes means for establishing which of the filtered monitor values is below the lower monitor cutoff value of the histogram.
- 10. A system according to claim 9, wherein the determination means for determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement further includes means for determining contiguous sets of views in which the filtered monitored value is below the monitor replacement value, and that are adjacent to the views in which the filtered monitor value is below the lower monitor cutoff value, and establishing such contiguous sets of views as attenuated measurements.
- 11. A method of normalizing CT data acquired exposing an object with X-rays from a X-ray source through multiple views using a detector monitor subassembly, comprising:measuring at least one value of the level of X-rays received from the X-ray source during each view; determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement; and replacing measured values of levels of X-rays representing partially attenuated measurements with replacement values determined from values of remaining measurements.
- 12. A method according to claim 11, further including:using the replacement values and remaining values to normalize CT data acquired during the CT scan.
- 13. A method according to claim 11, wherein determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement includes statistically determining the measured values of levels of X-rays representing partially attenuated measurements.
- 14. A method according to claim 13, wherein determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement includes determining a histogram of values of all of the measured values of X-rays during a scan.
- 15. A method according to claim 14, wherein determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement further includes determining the upper and lower cutoff values of the histogram.
- 16. A method according to claim 15, wherein determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement further includes low pass filtering all of the measured values of X-rays during a scan.
- 17. A method according to claim 16, wherein replacing measured values of levels of X-rays representing partially attenuated measurements with replacement values determined from values of remaining measurements includes means for determining an averaged filtered monitor value that is between the lower and upper monitor cutoff values of the histogram.
- 18. A method according to claim 17, wherein the determination means for determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement includes establishing which of the filtered monitor values is below the lower monitor cutoff value of the histogram.
- 19. A method according to claim 18, wherein determining which of the measured values of levels of X-rays represent at least partially attenuated measurements due to an unintended obstruction during the measurement further includes determining contiguous sets of views in which the filtered monitor value is below the monitor replacement value, and that are adjacent to the views in which the filtered monitor value is below the lower monitor cutoff value, and establishing such contiguous sets of views as attenuated measurements.
RELATED APPLICATION
This application is related to U.S. Provisional Patent Application Serial No. 60/243,651 filed on Oct. 26, 2000 in the name of Sergey Simanovsky, and assigned to the present assignee.
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Provisional Applications (1)
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