Image sensors are used in electronic devices such as cellular telephones, cameras, and computers to capture images. In particular, an electronic device is provided with an array of image sensor pixels arranged in a grid pattern. Each image sensor pixel receives incident photons, such as light, and converts the photons into electrical signals. Column circuitry is coupled to each column for reading out sensor signals from each image sensor pixel.
High dynamic range (HDR) images can be created by combining pixel signals generated by image sensor pixels during two or more different exposures. A light filter may be used to attenuate incident light during one of the exposures. However, the dynamic range of the scene may change over time. Thus, the present disclosure provides image sensors, imaging systems, and methods that, among other things, adapt the attenuation of the light filter to cover the dynamic range of the scene with a high signal-to-noise ratio in the transition region of the combined response.
The present disclosure provides an image sensor including, in one implementation, a plurality of image sensor pixels, a light filter, and a controller. The light filter is configured to attenuate transmission of incident light to the plurality of image sensor pixels. The controller is configured to set the light filter to a high-transmission state for a first exposure. The controller is also configured to capture a first image generated by the plurality of image sensor pixels during the first exposure. The controller is further configured to set the light filter to a low-transmission state for a second exposure. The controller is also configured to capture a second image generated by the plurality of image sensor pixels during the second exposure. The controller is further configured to combine the first image and the second image to generate a high dynamic range image. The controller is also configured to adjust an attenuation of the light filter for a next iteration of the low-transmission state based on one or more pixel signals generated by the plurality of image sensor pixels during the second exposure.
The present disclosure also provides an imaging system including, in one implementation, an image sensor, a light filter and an imaging controller. The light filter is configured to attenuate transmission of incident light to the image sensor. The imaging controller is configured to capture a first image generated by the image sensor during the first exposure. The imaging controller is also configured to set the light filter to a low-transmission state for a second exposure. The imaging controller is further configured to capture a second image generated by the image sensor during the second exposure. The imaging controller is also configured to combine the first image and the second image to generate a high dynamic range image. The imaging controller is further configured to adjust an attenuation of the light filter for a next iteration of the low-transmission state based on one or more pixel signals generated by the image sensor during the second exposure.
The present disclosure further provides a method for high dynamic range imaging. The method includes setting a light filter to a high-transmission state for a first exposure, wherein the light filter is configured to attenuate transmission of incident light to an image sensor. The method also includes generating a first image with the image sensor during the first exposure. The method further includes setting the light filter to a low-transmission state for a second exposure. The method also includes generating a second image with the image sensor during the second exposure. The method further combining the first image and the second image to generate a high dynamic range image. The method also includes adjusting an attenuation of the light filter for a next iteration of the low-transmission state based on one or more pixel signals generated by the image sensor during the second exposure.
For a detailed description of example implementations, reference will now be made to the accompanying drawings in which:
Various terms are used to refer to particular system components. Different companies may refer to a component by different names—this document does not intend to distinguish between components that differ in name but not function. In the following discussion and in the claims, the terms “including” and “comprising” are used in an open-ended fashion, and thus should be interpreted to mean “including, but not limited to . . . ” Also, the term “couple” or “couples” is intended to mean either an indirect or direct connection. Thus, if a first device couples to a second device, that connection may be through a direct connection or through an indirect connection via other devices and connections.
Terms defining an elevation, such as “above,” “below,” “upper”, and “lower” shall be locational terms in reference to a direction of light incident upon a pixel array and/or an image pixel. Light entering shall be considered to interact with or pass objects and/or structures that are “above” and “upper” before interacting with or passing objects and/or structures that are “below” or “lower.” Thus, the locational terms may not have any relationship to the direction of the force of gravity.
In relation to electrical devices, whether stand alone or as part of an integrated circuit, the terms “input” and “output” refer to electrical connections to the electrical devices, and shall not be read as verbs requiring action. For example, a differential amplifier, such as an operational amplifier, may have a first differential input and a second differential input, and these “inputs” define electrical connections to the operational amplifier, and shall not be read to require inputting signals to the operational amplifier.
“Light” or “color” shall mean visible light ranging between about 380 and 700 nanometers (nm). “Light” or “color” shall also mean invisible light, such as infrared light ranging between about 800 nm and 1 millimeter. “Light” or “color” shall also mean invisible light, such as ultraviolet light ranging between about 100 to 400 nm.
“Controller” shall mean, alone or in combination, individual circuit components, an application specific integrated circuit (ASIC), one or more microcontrollers with controlling software, a reduced-instruction-set computer (RISC) with controlling software, a digital signal processor (DSP), one or more processors with controlling software, a programmable logic device (PLD), a field programmable gate array (FPGA), or a programmable system-on-a-chip (PSOC), configured to read inputs and drive outputs responsive to the inputs.
The following discussion is directed to various implementations of the invention. Although one or more of these implementations may be preferred, the implementations disclosed should not be interpreted, or otherwise used, as limiting the scope of the present disclosure, including the claims. In addition, one skilled in the art will understand that the following description has broad application, and the discussion of any implementation is meant only to be exemplary of that implementation, and not intended to intimate that the scope of the present disclosure, including the claims, is limited to that implementation.
Various examples are directed to systems and methods that capture and combine images from consecutive exposures to generate high dynamic range (HDR) images. More particularly, various examples are directed to imaging systems that generate short exposures by using a light filter to attenuate incident light on an image sensor over a long integration time. More particularly still, various examples are directed to imaging systems and related controllers that adjust the attenuation of the light filter to cover the dynamic range of the scene. The specification now turns to an example system to orient the reader.
The imaging controller 108 may include one or more integrated circuits. The imaging circuits may include image processing circuits, microprocessors, and storage devices, such as random-access memory, and non-volatile memory. The imaging controller 108 may be implemented using components that are separate from the camera module 102 and/or that form part of the camera module 102, for example, circuits that form part of the image sensor 106. Digital image data captured by the camera module 102 may be processed and stored using the imaging controller 108. Processed image data may, if desired, be provided to external equipment, such as computer, external display, or other device, using wired and/or wireless communications paths coupled to the imaging controller 108.
The image sensor 106 illustrated in
The column controller 218 may be coupled to the pixel array 210 by way of one or more conductors, such as column lines 222. Column controllers may sometimes be referred to as column control circuits, readout circuit, or column decoders. The column lines 222 may be used for reading out pixel signals from image sensor pixels 212 and for supplying bias currents and/or bias voltages to image sensor pixels 212. If desired, during pixel readout operations, a pixel row in the pixel array 210 may be selected using the row controller 216 and pixel signals generated by image sensor pixels 212 in that pixel row can be read out along the column lines 222. The column controller 218 may include sample-and-hold circuitry for sampling and temporarily storing pixel signals read out from the pixel array 210, amplifier circuitry, analog-to-digital conversion (ADC) circuitry, bias circuitry, column memory, latch circuitry for selectively enabling or disabling the column circuitry, or other circuitry that is coupled to one or more columns of image sensor pixels 212 in the pixel array 210 for operating the image sensor pixels 212 and for reading out pixel signals from image sensor pixels 212. ADC circuitry in the column controller 218 may convert analog pixel values received from the pixel array 210 into corresponding digital image data. The column controller 218 may supply digital image data to the image sensor controller 214 and/or the imaging controller 108 (
Before an image is acquired, a reset control signal RST may be asserted. The reset control signal RST turns on a reset transistor 308 and resets a charge storage (CS) node 310 to a voltage equal or close to the supply voltage VAAPIX. The reset control signal RST may then be de-asserted to turn off the reset transistor 308. After the reset process is complete, a transfer gate control signal TX may be asserted to turn on a transfer transistor 312. When the transfer transistor 312 is turned on, charge generated by the photodetector 302 in response to incoming light is transferred to the charge storage node 310. The charge storage node 310 exhibits a capacitance that can be used to store the charge that has been transferred from the photodetector 302. The signal associated with the charge stored in the charge storage node 310 is buffered by a source-follower transistor 314. A row select transistor 316 connects the source-follower transistor 314 to one of the column lines 222.
When it is desired to read out the value of the charge stored in the charge storage node 310, a control signal RS is asserted. The read-out value may be, for example, the value of the charge storage node 310 that is represented by the signal at the source terminal S of the source-follower transistor 314. When the control signal RS is asserted, the row select transistor 316 is turned on and an output signal Vout that is representative of the magnitude of the charge stored in the charge storage node 310 is produced on an output path 318. The output signal Vout is one example of a “pixel signal.” When the control signal RS is asserted, one of the column lines 222 can be used to route the output signal Vout from the image sensor pixel 212 to readout circuitry, such as the column controller 218 in
An image sensor pixel 212 may include fewer components, additional components, or different components in different configurations than the one illustrated in
The first terminal 414 is electrically coupled to the first electrode layer 406. The second terminal 416 is electrically coupled to the second electrode layer 410. The first terminal 414 and the second terminal 416 may be controlled to apply a desired electric field (or bias voltage) across the controllable polarization rotator 408. At a bias voltage with a first polarity, the controllable polarization rotator 408 may not rotate the polarization of incident light. At a bias voltage with an opposite polarity, the controllable polarization rotator 408 may rotate the polarization of incident light (for example, by ninety degrees). The light filter 402 is configured to attenuate transmission of incident light to the image sensor 106 proportional to the bias voltage. The magnitude of the bias voltage can be varied to control the attenuation of the light filter 402. For example, the peak-to-peak of the bias voltage can be varied to control the attenuation of the light filter. Controlled polarization rotation of the light that passes through the polarizer 404 allows the light filter 402 to have an adjustable transparency, thus selectively attenuating light provided to the image sensor 106. For example, the light filter 402 may provide more attenuation for a bias voltage of 5 Volts than for a bias voltage of 2 Volts. In some implementations, a current signal is used to control the attenuation of the light filter 402.
The light filter 402 is configured to operate in a high-transmission state and in a low-transmission state. In some implementations, while in the high-transmission state, the light filter 402 provides the maximum amount of light transmission that the light filter 402 can be controlled to provide. The light filter 402 provides less light transmission in the low-transmission state than in the high-transmission state.
When only one type of exposure is used by the imaging system 100, there will be a tradeoff between high light level performance and low light level performance. For example, if a short integration time is used for the exposure, the imaging system 100 may have improved high light level performance but poor low light level performance. If a long integration time is used, the imaging system 100 may have improved low light level performance but poor high light level performance. Pixel signals from multiple exposures may be used to increase the dynamic range of the imaging system 100. For example, an HDR image can be generated by combining a first image generated using a long integration time with a second image generated using a short integration time. However, in some applications, there may be restrictions on the integration times for the image sensor 106.
As one example, the integration time may need to have a minimum duration to avoid artifacts caused by flickering light in the scene. An example of flickering light includes light-emitting diodes (LEDs) that are commonly used in car headlights and in traffic signs (which can flicker tens of times per second). Flickering lights may change between on periods (in which light is emitted) and off periods (in which light is not emitted). Thus, when the integration time of the image sensor pixels 212 is not equal to or longer than a single pulse duration of the LEDs, one or more image sensor pixels 212 in the image sensor 106 may be integrating during an off period of the LEDs in some of the frames, which can cause the LEDs and the area that they illuminate to appear dark in these captured frame. This is especially true for bright scenery when integration times are short. Therefore, flickering light in the scene may cause various artifacts in images captured by the imaging system 100. The flickering light may cause flickering artifacts where an LED with a constant duty cycle appears to be on in one image and then off in a consecutive image. Flickering light may also cause color artifacts. Flickering artifacts may misguide machine vision systems. For example, in automotive applications, flickering artifacts may be interpreted as a turn signal or signals from an emergency vehicle.
To mitigate artifacts caused by flickering light in the scene, the integration time for the image sensor 106 may be selected to be sufficiently long to capture the on periods of the flickering light. For example, consider an LED in the scene that operates (i.e., has on periods) at a frequency of 90 Hertz. In this example, the time between each on period of the LED is 11.1 milliseconds. To ensure that the flickering light is captured by the image sensor 106, the integration time may therefore be selected to have a duration of at least 11.1 milliseconds. In bright scenes (or bright portions of a scene), however, this integration time may be too long and results in saturation of the image sensor 106. Usually, to capture a frame with low exposure that allows the details of very bright regions in the scene, the integration time is shortened. However, shortening the integration time below 11.1 milliseconds may result in artifacts from the flickering light.
The light filter 402 may be used to increase dynamic range without risking artifacts from flickering light in the scene. Returning to the aforementioned example of a bright scene that is limited to an integration time of at least 11.1 milliseconds, to capture a frame with low exposure, the light filter 402 may be placed in the low-transmission state where much of the incident light is attenuated and a small amount of light passes through to the image sensor 106. Attenuating the light in this manner prevents saturation of the image sensor 106 even at long integration times that meet the requirements to avoid flicker artifacts.
As described above, an HDR image can be generated by combining a first image generated using a long integration time with a second image generated using a short integration time.
In some implementations, the image sensor 106 operates with a rolling shutter scheme.
The dynamic range of the scene may change over time. Thus, the imaging system 100 is configured to adjust the amount of attenuation provided by the light filter 402 while in the low-transmission state based on the dynamic range of the scene.
At block 706, the light filter 402 is set to the low-transmission state for a second exposure. As described above, the light filter 402 provides less light transmission in the low-transmission state than in the high-transmission state. At block 708, a second image is generated with the image sensor 106 during the second exposure. In some implementations, the integration time of the second exposure is also sufficiently long to capture flickering lights. For example, the integration time of the second exposure may also be greater than 11.1 milliseconds for capturing a scene with a 90 Hertz LED.
At block 710, the first image and the second image are combined to generate an HDR image. In some implementations, the imaging controller 108 may combine the images by using a multi-exposure HDR combination algorithm, such as digital lateral overflow (DLO). Data from the first image is used for dimmer regions of the scene, and data from the second image is used for brighter regions of the scene. At intermediate signal levels, data from both images are combined to produce the HDR image. The resulting HDR image has high signal-to-noise (SNR) ratio over a wide range of light conditions and flicker artifacts are mitigated.
At block 712, the attenuation of the light filter 402 for the next iteration of the low-transmission state is adjusted based on one or more pixel signals generated by the image sensor 106 during the second exposure. In other words, the attenuation of the light filter 402 for the next second image is adjusted based on the pixel signals from the current second image. In some implementations, the attenuation of the light filter 402 for the next iteration of the low-transmission state is adjusted based on the number of saturated pixels during the second exposure. For example, the attenuation of the light filter 402 may be increased when the percentage of saturated pixels during the second exposure is greater than a threshold percentage.
In some implementation, the attenuation of the light filter 402 for the next iteration of the low-transmission state is adjusted based on the highest pixel signal generated by the image sensor 106 during the second exposure.
Returning to
In some implementations, the light filter 402 is a global filter that provides uniform light attenuation to each of the image sensor pixels 212 in the pixel array 210. In such implementations, each second image is a global dimmed image and the attenuation of the light filter 402 may be adjusted based on each global dimmed image as illustrated in
In imaging systems 100 with a patterned light filter, each second image is a patterned dimmed image and the attenuation of the light filter 402 may be adjusted based on each patterned dimmed image as illustrated in
In some implementations, the light filter 402 is configured to individually control the amount of attenuation provided to each pixel in the pixel array 210. In such implementations, the amount of attenuation provided to each pixel in the pixel array 210 may be adjusted based on the individual pixel signals. For example, the imaging controller 108 may adjust the amount of attenuation provided by the light filter 402 to a first pixel based on the pixel signal generated by the first pixel, and separately adjust the amount of attenuation provided by the light filter 402 to a second pixel based on the pixel signal generated by the second pixel. In imaging systems 100 with a per-pixel light filter, each image captured after the first image is a per-pixel dimmed image and the attenuation of the light filter 402 may be adjusted based on each per-pixel dimmed image as illustrated in
There is a trade-off between the dynamic range of the combined HDR response and the drop in SNR at the transition point. For example,
Many of the electrical connections in the drawings are shown as direct couplings having no intervening devices, but not expressly stated as such in the description above. Nevertheless, this paragraph shall serve as antecedent basis in the claims for referencing any electrical connection as “directly coupled” for electrical connections shown in the drawing with no intervening device(s).
The above discussion is meant to be illustrative of the principles and various implementations of the present invention. Numerous variations and modifications will become apparent to those skilled in the art once the above disclosure is fully appreciated. It is intended that the following claims be interpreted to embrace all such variations and modifications.
This application claims priority to and the benefit of U.S. Provisional Application Ser. No. 63/495,921 filed Apr. 14, 2023, titled “ADAPTIVE OPTICAL ATTENUATION FOR A DEVICE WITH AN IMAGE SENSOR AND A PARTIALLY TRANSMISSIVE ELECTRONIC SHUTTER,” the entire disclosure of which is hereby incorporated by reference for all purposes.
Number | Date | Country | |
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63495921 | Apr 2023 | US |