This application claims priority to and the benefit of Chinese Patent Application No. 201610179094.2, filed Mar. 24, 2016, which is incorporated herein by reference in its entirety.
The present invention relates to electronic circuits, more specifically, the present invention relates to power supply circuit and power supply method.
In USB car charger applications, the environment temperature is high and the PCB size is small. But the plastic housing of the USB car charger limits air flow. As a result, the temperature of the integrated circuit inside the car charger may get very high. For safety concerns, most car makers require the USB charging current to be reduced under high temperature conditions. But present USB 2.0 protocol doesn't support dynamic charge current adjustment. USB type-C specification supports output current adjustment. However, it is not compatible with the USB 2.0 protocol.
It is an object of the present invention to provide an improved power supply circuit which is compatible with both USB type-C specification and USB 2.0 protocol, which solves the above problems.
In accomplishing the above and other objects, there has been provided, in accordance with an embodiment of the present invention, a power supply circuit, comprising: a bus port, configured to provide a bus voltage; a power switch, wherein the bus port is coupled to a power stage to receive an output voltage by way of the power switch; a data plus port and a data minus port, coupled to a DCP automatic detector; a first configuration channel port, selectively coupled to a first pull up resistor or to a power supply via a first selective switch; a second configuration channel port, selectively coupled to a second pull up resistor or to the power supply via a second selective switch, wherein the first pull up resistor and the second pull up resistor are controlled by a type-C controller; and a ground port, coupled to a reference ground; wherein if a temperature of the power supply circuit is higher than a temperature threshold: 1) a system mode under USB 2.0 protocol is changed from DCP mode to SDP mode or the output voltage of the power stage is decreased; and 2) the first pull up resistor and the second pull up resistor are controlled to change their resistance values by the type-C controller.
In addition, there has been provided, in accordance with an embodiment of the present invention, a power supply system, including a power supply circuit acting as a downstream facing port and a load coupled to the power supply acting as an downstream facing port, the power supply system configured to decrease an output current capability of the power supply circuit if a temperature of the power supply circuit is higher than a temperature threshold, wherein the power supply circuit comprises: a bus port, configured to provide a bus voltage; a power switch, wherein the bus port is coupled to a power stage to receive an output voltage by way of the power switch; a data plus port and a data minus port, coupled to a DCP automatic detector; a first configuration channel port, selectively coupled to a first pull up resistor or to a power supply via a first selective switch; a second configuration channel port, selectively coupled to a second pull up resistor or to the power supply via a second selective switch, wherein the first pull up resistor and the second pull up resistor are controlled by a type-C controller; and a ground port, coupled to a reference ground; wherein if the temperature of the power supply circuit is higher than the temperature threshold: 1) a system mode under USB 2.0 protocol is changed from DCP mode to SDP mode or the output voltage of the power stage is decreased; and 2) the first pull up resistor and the second pull up resistor are controlled to change their resistance values by the type-C controller.
Furthermore, there has been provided, in accordance with an embodiment of the present invention, a power supply method supporting dual USB protocol, comprising: monitoring a die temperature during a charge process; detecting whether the die temperature is higher than a temperature threshold: if the die temperature is higher than the temperature threshold, 1) changing DCP mode to SDP mode under USB 2.0 protocol or decreasing a bus voltage, and 2) changing resistance values of a first pull up resistor coupled to a first configuration channel port and a second pull up resistor coupled to a second configuration channel port both from a first resistance value to a second resistance value or to a third resistance value under USB type-C specification; if the die temperature is not higher than the temperature, continuing to monitor the die temperature.
The use of the similar reference label in different drawings indicates the same of like components.
Embodiments of circuits and method for power supply circuit are described in detail herein. In the following description, some specific details, such as example circuits for these circuit components, are included to provide a thorough understanding of embodiments of the invention. One skilled in relevant art will recognize, however, that the invention can be practiced without one or more specific details, or with other methods, components, materials, etc.
The following embodiments and aspects are illustrated in conjunction with circuits and methods that are meant to be exemplary and illustrative. In various embodiments, the above problem has been reduced or eliminated, while other embodiments are directed to other improvements.
In one embodiment, the power supply circuit 100 further comprises: a temperature monitor 106, configured to monitor the temperature of the power supply circuit, and compare the monitored result with the temperature threshold, to generate the temperature signal Tind. In other embodiments, the temperature monitor 106 may be an external monitor, which is not integrated in a die (not inside the power supply circuit).
In one embodiment, if the temperature of the power supply circuit 100 is higher than the temperature threshold (e.g., 125° C.), the resistance values of the first pull up resistor Rp1 and the second pull up resistor Rp2 are both changed from a first resistance value (e.g. 10 kΩ) to a second resistance value (e.g. 22 kΩ) under the control of the type-C controller 105, to adjust an output current from a first current value (e.g. 3 A) to a second current value (e.g. 1.5 A). In another embodiment, when the temperature of the power supply circuit 100 is higher than the temperature threshold, the resistance values of the first pull up resistor Rp1 and the second pull up resistor Rp2 are both changed from the first resistance value (e.g. 10 kΩ) to a third resistance value (e.g. 56 kΩ) under the control of the type-C controller 105, to adjust the output current from the first current value (e.g. 3 A) to a third current value (e.g. 500 mA). In yet another embodiment, when the temperature of the power supply circuit 100 is higher than the temperature threshold, the resistance values of the first pull up resistor Rp1 and the second pull up resistor Rp2 are both changed from the second resistance value (e.g. 22 kΩ) to the third resistance value (e.g. 56 kΩ) under the control of the type-C controller 105, to adjust the output current from the current value (e.g. 1.5 A) to the third current value (e.g. 0.5 A).
In real world applications, the power supply circuit 100 acts as a downstream facing port (DFP), and the load coupled to the power supply circuit 100 acts as an upstream facing port (UFP). One of the configuration channel ports (CC1 & CC2) of the DFP is coupled to a configuration channel port of the UFP, whereas the other one is floating. If the first configuration channel port CC1 of DFP is coupled to the configuration channel port of the UFP, and the second configuration channel port CC2 is not coupled to UFP, a second terminal of the first selective switch M1 is selectively coupled to the first pull up resistor Rp1, and a second terminal of the second selective switch M2 is selectively coupled to the power supply Vconn. On the contrary, if the second configuration channel port CC2 of DFP is coupled to the configuration channel port of the UFP, and the first configuration channel port CC1 of DFP is not coupled to UFP, the second terminal of the first selective switch M1 is selectively coupled to the power supply Vconn, and the second terminal of the second selective switch M2 is selectively coupled to the first pull up resistor Rp2.
In one embodiment, the resistance values of the first pull up resistor Rp1 and the second pull up resistor Rp2 may be changed by removing and/or adding parallel coupled resistors (e.g., referring to
The power supply circuit 100 complies with both USB 2.0 protocol and USB type-C specification. When a load (e.g. a cell phone) coupled thereto supports USB 2.0 protocol, the power supply circuit 100 contacts with the load and/or charges the load on the basis of USB 2.0 protocol. When the load coupled thereto supports type-C specification, the power supply circuit 100 contacts with the load and/or charges the load on the basis of type-C specification. If the temperature of the power supply circuit exceeds the temperature threshold during the charge process, the system mode is changed to SDP mode by the DCP automatic detector 104, so that the output current is adjusted from 2.4 A to 0.5 A under USB 2.0 protocol; or the resistance values of the pull up resistors (Rp1 & Rp2) are both changed by the controller 105, so that the output current is adjusted from 3 A to 1.5 A or to 500 mA under USB type-C specification.
The operation of the power supply circuit 100 under over temperature condition will be illustrated in combination with
From t0 to t1 interval: no load is coupled to the power supply circuit 100, the die temperature is room temperature, the voltage VB at the bus port is the output voltage VO (the output voltage VO is 5 V in this example), the output current Io is zero, the output current capability of the power supply circuit 100 under type-C specification is controlled to be 3 A by the type-C controller 105, and the output current capability of the power supply circuit 100 under USB 2.0 protocol is controlled to be 2.4 A by the DCP automatic detector 104.
From t1 to t2 interval: an external load is coupled to and charged by the power supply circuit 100 at time point t1. Accordingly, the die temperature Tdie starts to rise from room temperature until the die temperature rises to the temperature threshold at time point t2. In the example of
From t2 to t3 interval: as discussed above, the die temperature rises to the temperature threshold at time point t2. Accordingly, the power switch 102 is turned off by the logical controller 103, which disconnects the connection between the power stage 101 and the bus port VBUS, so the bus voltage VB turns to zero. The power switch 102 is re-turned on at time point t3. During this internal, the die temperature Tdie declines due to the shutdown of the bus voltage, and the output current is zero.
From t3 to t4 interval: because the power switch 102 is re-turned on at time point t3, the bus voltage VB goes back to 5V. The die temperature Tdie continues to decline (e.g. it falls to 100° C. at time point t4). The system mode is controlled to be changed from DCP mode to SDP mode by the DCP automatic detector 104, so that the output current IO is adjusted to 500 mA under USB 2.0 protocol; and the resistance values of the first pull up resistor Rp1 and the second pull up resistor Rp2 are adjusted from the first resistance to the second resistance by the type-C controller 105, so that the output current IO is adjusted to 1.5 A under type-C specification.
From t4 to t5 interval: the charge process is over, and the output current IO falls to zero.
From t5 to-t6 interval: the power switch 102 is re-turned off, and the bus voltage VB enters restarting stage.
After time point t6: the resistance values of the first pull up resistor Rp1 and the second pull up resistor Rp2 are adjusted back to the first resistance value from the second resistance value by the type-C controller 105, so that the output current capability is renewed to 3 A under type-C specification; and the system mode is changed to DCP mode from SDP mode by the DCP automatic detector 104, so that the output current capability is renewed to 2.4 A under USB 2.0 protocol.
In one embodiment, the power supply circuit 200 further comprises: a temperature monitor 106, configured to monitor the temperature of the power supply circuit 200, and compare the monitored result with the temperature threshold, to generate the temperature signal Tind. In other embodiments, the temperature monitor 106 is an external monitor, which is not integrated in a die.
In one embodiment, when the output voltage VO of the power stage 101 decreases under the control of the DCP automatic detector 104, the output current capability under USB 2.0 decreases correspondingly.
The operation of the power supply circuit 200 under over temperature condition will be illustrated in combination with
From t0 to t1 interval: no load is coupled to the power supply circuit 200, the die temperature is room temperature, the voltage VB at the bus port is 5 V, the output current lo is zero, the output current capability of the power supply circuit 200 under type-C specification is controlled to be 3 A by the type-C controller 105, and the output current capability of the power supply circuit 200 under USB 2.0 protocol is controlled to be 2.4 A by the DCP automatic detector 104.
From t1 to t2 interval: an external load is coupled to and charged by the power supply circuit 200 at time point t1. Accordingly, the die temperature Tdie starts to rise from room temperature until the die temperature rises to the temperature threshold at time point t2. In the example of
From t2 to t3 interval: as discussed above, the die temperature rises to the temperature threshold at time point t2. Accordingly, the DCP automatic detector 104 provides an adjusted signal to the power stage 101, so that the output voltage VO of the power stage 101 decreases to 4.7 V, and the output current IO decreases to 1 A under USB 2.0 protocol; the resistance values of the first pull up resistor Rp1 and the second pull up resistor Rp1 are changed from the first resistance value to the second resistance value under the control of the type-C controller 105, so that the output current under USB type-C specification decreased to 1.5 A. As a result, the die temperature falls down.
From t3 to t5 interval: the charge process ends at time point t3. Then the output current IO falls to zero and the die temperature continues to decline (e.g., it falls to 100° C. at time point t4) until time point t5 at when the die temperature falls to room temperature.
After time point t5: as discussed above, the die temperature falls to room temperature at time point t5. Then the output voltage VO of the power stage 101 is renewed to 5 V under the control of the DCP automatic detector 104, the output current capability under USB 2.0 protocol is renewed to 2.4 A; and the resistance values of the first pull up resistor Rp1 and the second pull up resistor Rp2 are adjusted back to the first resistance value from the second resistance value by the type-C controller 105, so that the output current capability under type-C specification is renewed to 3 A.
Step 301, monitoring a die temperature during a charge process.
Step 302, detecting whether the die temperature is higher than a temperature threshold: if the die temperature is higher than the temperature threshold, go to step 303; and if the die temperature is not higher than the temperature, go back to step 301.
Step 303, 1) changing DCP (dedicated charge port) mode to SDP (standard downstream port) mode under USB 2.0 protocol or decreasing a bus voltage, so as to decrease an output current under USB 2.0 protocol, and 2) changing resistance values of a first pull up resistor coupled to a first configuration channel port and a second pull up resistor coupled to a second configuration channel port both from a first resistance value to a second resistance value or to a third resistance value under USB type-C specification, so as to decrease the output current under USB type-C specification.
In one embodiment, the method further comprises: when the charge process is over, and the die temperature falls to room temperature or the output current is lower than a lower current threshold, 1) changing SDP mode back to DCP mode under USB 2.0 protocol or renewing the bus voltage, and 2) changing the resistance values of the first pull up resistor and the second pull up resistor from the second resistance value or from the third resistance value back to the first resistance value under USB type-C specification.
In one embodiment, the output current deceases from 2.4 A to 500 mA when the mode is changed from DCP mode to SDP mode under USB 2.0 protocol; and the output current decreases from 2.4 A to 1 A when the bus voltage decreases under USB 2.0 protocol.
In one embodiment, if the resistance values of the first pull up resistor and the second pull up resistor are both changed from the first resistance value to the second resistance value under USB type-C specification, the output current decreases from 3 A to 1.5 A; and if the resistance values of the first pull up resistor and the second pull up resistor are both changed to the third resistance value under USB type-C specification, the output current decreases to 0.5 A.
Several embodiments of the foregoing power supply circuit and power supply method support both USB 2.0 protocol and USB type-C specification. If the temperature of the power supply circuit goes higher than a temperature threshold, the output current is adjusted, so as to lower the temperature of the power supply circuit, and insure the security of the charge.
It is to be understood in these letters patent that the meaning of “A” is coupled to “B” is that either A and B are connected to each other as described below, or that, although A and B may not be connected to each other as described above, there is nevertheless a load or circuit that is connected to both A and B. This load or circuit may include active or passive circuit elements, where the passive circuit elements may be distributed or lumped-parameter in nature. For example, A may be connected to a circuit element that in turn is connected to B.
This written description uses examples to disclose the invention, including the best mode, and also to enable a person skilled in the art to make and use the invention. The patentable scope of the invention may include other examples that occur to those skilled in the art.
Number | Date | Country | Kind |
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201610179094.2 | Mar 2016 | CN | national |