Claims
- 1. A method of comparing multiple signals from a source, comprising:
comparing a first input signal and a second input signal to a first reference voltage to produce a first output signal; and comparing the first input signal and the second input signal to a second reference voltage to produce a second output signal; wherein the first and the second output signal indicates whether the difference of the first and second input signals are within a reference window defined by the first and the second reference voltages.
- 2. The method of claim 1 further comprising computing the difference between the value of the first input and second input signal.
- 3. The method of claim 2, wherein the computing the difference between the value of the first and second input signal further comprises computing the difference between a maximum in-phase signal value with a minimum in-phase signal value and computing the difference between a maximum quadrature signal value with a minimum quadrature signal value resulting in a differential in-phase value of the input signals and a differential quadrature value of the input signals respectively.
- 4. The method of claim 3, wherein the computing the difference between the in-phase and quadrature signal further comprises sampling the differential in-phase and quadrature signals.
- 5. The method of claim 4, wherein the sampling the differential in-phase and quadrature signal further comprises computing an addition and a subtraction of the differential in-phase and quadrature signal voltages to determine a polarity of a resulting voltage.
- 6. The method of claim 5, wherein the subtraction of the differential in-phase and quadrature voltage further comprises reversing the polarity of the positive and negative components of the in-phase and quadrature signal.
- 7. The method of claim 5, wherein the computing the addition and the subtraction further comprises sampling the differential in-phase and quadrature voltage via a parasitic insensitive sampling circuit comprising a capacitor.
- 8. The method of claim 7, wherein the parasitic insensitive sampling circuit further comprises accomplishing the addition and the subtraction by a charge sharing of parallel capacitors.
- 9. The method of claim 4, wherein the sampling the differential in-phase and quadrature signal further comprises preamplifying a low level signal.
- 10. The method of claim 4, wherein the sampling the differential in-phase and quadrature signal further comprises latching a voltage level.
- 11. The method of claim 4, wherein the sampling the differential in-phase and quadrature signal further comprises generating a plurality of nominally identical voltages to reduce cross talk in a preamplified low level signal.
- 12. The method of claim 1 further comprising providing a reference voltage.
- 13. The method of claim 12, wherein the providing a reference voltage further comprises generating all needed reference voltages from a single source.
- 14. The method of claim 12, wherein the providing a reference voltage further comprises providing a control signal to regulate the reference voltage wherein the control signal varies a hysteresis window.
- 15. A detector circuit for comparing multiple signals from a source, comprising:
a first comparator circuit for comparing a first input signal and a second input signal to a first reference voltage to produce a first output signal; and a second comparator circuit for comparing the first input signal and the second input signal to a second reference voltage to produce a second output signal; wherein the first and the second output signal indicates whether the difference of the first and second input signals are within a reference window defined by the first and the second reference voltages.
- 16. The detector circuit of claim 15, wherein the first and second comparator circuit further comprises an arithmetic circuit for computing the difference between the value of the first input and second input signal and the sum of the first input and the second input signal.
- 17. The detector circuit of claim 16, wherein the arithmetic circuit computes the difference between a maximum in-phase signal value and a minimum in-phase signal value and computes the difference between a maximum quadrature signal value and a minimum quadrature signal value resulting in a differential in-phase value of the input signals and a differential quadrature value of the input signals respectively.
- 18. The detector circuit of claim 16, wherein the arithmetic circuit further comprises a sampling circuit for samples the differential in-phase and quadrature signals.
- 19. The detector circuit of claim 18, wherein the sampling the differential in-phase and quadrature further performs an addition and a subtraction of the differential in-phase and quadrature signals to determine a polarity of a resulting signal.
- 20. The detector circuit of claim 19, wherein the subtraction of the differential in-phase and quadrature signals further computes the difference between the in-phase and the quadrature signal by reversing a polarity of a positive and a negative input component of the in-phase and quadrature signal.
- 21. The detector circuit of claim 18, wherein the sampling circuit further comprises a parasitic insensitive sampling circuit for sampling the in-phase and quadrature signals via a parasitic insensitive sampling network.
- 22. The detector circuit of claim 21, wherein the parasitic insensitive sampling network further accomplishes the addition and the subtraction by a charge sharing of parallel capacitors.
- 23. The detector circuit of claim 18, wherein the sampling circuit further comprises an amplifier circuit for an output offset preamplifier, coupled to an input offset preamplifier, to amplify a low level signal.
- 24. The detector circuit of claim 23, wherein the amplifier circuit further comprises a capacitor for the reduction of an output offset voltage between the output offset preamplifier and the input offset preamplifier.
- 25. The detector circuit of claim 18, wherein the sampling circuit further comprises a regeneration latch for retaining a voltage level.
- 26. The detector circuit of claim 18, wherein the sampling circuit further comprises a set-reset latch for resetting to a predetermined voltage level.
- 27. The detector circuit of claim 18, wherein the sampling circuit further comprises a biasing circuit for generating a plurality of nominally identical voltages for reducing cross talk between a plurality of preamplifiers.
- 28. The detector circuit of claim 27, wherein reducing cross talk further comprises a tail current source to provide a tail current for a plurality of preamplifier.
- 29. The detector circuit of claim 15 further comprising a reference voltage generator, coupled to the first and second comparator circuits, for supplying the reference voltage.
- 30. The detector circuit of claim 29, wherein reference voltage generator further comprises a current from a bandgap reference that is inversely proportional to a resistance of a polysilicon resistor by forcing this current across a resistor ladder.
- 31. The detector circuit of claim 29, wherein the reference voltage generator further comprises a control signal to regulate the reference voltage wherein the control signal varies a hysteresis window.
- 32. A system for comparing multiple signals from a source, comprising:
an antenna to retrieve a propagated signal; a detector, coupled to the antenna, for receiving the retrieved signal and generating an input signal; a window detector, coupled to the detector, for comparing the input signal with a reference voltage to generate a digital output in response thereto, wherein the window detector further comprises:
a first comparator circuit for comparing a first input signal and a second input signal to a first reference voltage to produce a first output signal; and a second comparator circuit for comparing the first input signal and the second input signal to a second reference voltage to produce a second output signal; wherein the first and the second output signal indicates whether the difference of the first and second input signals are within a reference window defined by the first and the second reference voltages.
- 33. The system of claim 32, wherein the first and second comparator circuit further comprises an arithmetic circuit for computing the difference between the value of the first input and second input signal and the sum of the first input and the second input signal.
- 34. The system of claim 33, wherein the arithmetic circuit computes the difference between a maximum in-phase signal value and a minimum in-phase signal value and computes the difference between a maximum quadrature signal value and a minimum quadrature signal value resulting in a differential in-phase value of the input signals and a differential quadrature value of the input signals respectively.
- 35. The system of claim 33, wherein the arithmetic circuit further comprises a sampling circuit for sampling the differential in-phase and quadrature signals.
- 36. The system of claim 35, wherein the sampling the differential in-phase and quadrature signals further performs an addition and a subtraction of the differential in-phase and quadrature signals to determine a polarity of a resulting signal.
- 37. The system of claim 36, wherein the subtraction of the differential in-phase and quadrature signals further computes the difference between the in-phase and the quadrature signal by reversing a polarity of a positive and a negative input component of the in-phase and quadrature signal.
- 38. The detector circuit of claim 35, wherein the sampling circuit further comprises a parasitic insensitive sampling circuit for sampling the in-phase and quadrature signals via a parasitic insensitive sampling network.
- 39. The system of claim 38, wherein the parasitic insensitive sampling network further accomplishes the addition and the subtraction by a charge sharing of parallel capacitors.
- 40. The system of claim 35, wherein the sampling circuit further comprises an amplifier circuit for an input offset preamplifier, coupled to an output offset preamplifier, for amplifying a low level signal.
- 41. The system of claim 40, wherein the amplifier circuit further comprises a capacitor for cancellation of an output voltage offset between the output offset preamplifier and the input offset preamplifier.
- 42. The system of claim 35, wherein the sampling circuit further comprises a regeneration latch for retaining a voltage level.
- 43. The system of claim 35, wherein the sampling circuit further comprises a set-reset latch for resetting to a predetermined voltage level.
- 44. The system of claim 35, wherein the sampling circuit further comprises a biasing circuit for generating a plurality of nominally identical voltages for reducing cross talk between a plurality of preamplifiers.
- 45. The system of claim 44, wherein reducing cross talk further comprises a tail current source to provide a tail current for the plurality of preamplifiers.
- 46. The system of claim 32 further comprising a reference voltage generator for supplying the reference voltage.
- 47. The system of claim 46, wherein the reference voltage generator further comprise a current from a bandgap reference that is inversely proportional to a resistance of a polysilicon resistor by forcing this current across a resistor ladder.
- 48. The system of claim 46, wherein the reference voltage generator further comprises a control signal to regulate the reference voltage, wherein the control signal varies a hysteresis window.
- 49. An article of manufacture for providing AGC window detection, the article of manufacture comprising a computer readable medium having instructions for comparing multiple signals from a source comprising:
comparing a first input signal and a second input signal to a first reference voltage to produce a first output signal; and comparing the first input signal and the second input signal to a second reference voltage to produce a second output signal; wherein the first and the second output signal indicates whether the difference of the first and second input signals are within a reference window defined by the first and the second reference voltages.
CROSS REFERENCE APPLICATIONS
[0001] This is a Continuation-in-Part of U.S. Ser. No. ______, filed on Mar. 3, 1999.