1. Field of the Invention
The present invention relates generally to a structure and method for fabrication of vapor cells adapted for use in making chip-scale atomic clocks (CSACs) via wafer-scale micro-machining processes.
2. Discussion of the Prior Art
The need for more and more precise and stable time-keeping for a wide variety of applications has been on the rise, particularly in applications such as digital communications, global positioning systems (GPS) and, more critically, for security and identification applications such as friend-or-foe (IFF) communications.
There are a wide variety of potential applications for enhanced time or frequency reference signal sources, which may be referred to as time bases or clocks. One example of the need for precise, stable time keeping is found in the development of enhanced, jam-resistant GPS receivers. The signals broadcast by GPS satellites are extremely low in power, making the GPS receivers highly susceptible to intentional jamming signals as well as to unintentional interference from sources transmitting in the same frequency band. For example, some GPS signals are transmitted over a wide bandwidth, making them considerably less susceptible to jamming than normal GPS signals. Typically, however, these broadband signals incorporate a code that repeats only every seven days, so that broadband receivers usually have to first lock onto the normal signal, and this eliminates the anti-jam advantage of the larger-bandwidth signal. If the broadband receiver's local clock were capable of determining the time to within 1 millisecond (ms) over several days, its search for the GPS signals would be narrowed so the receiver could, theoretically, lock onto the broadband signal directly, without first having to acquire the normal signal. Thus, if a more accurate clock were available, the receiver would be significantly more resistant to jamming.
Three important characteristics are necessary to realize a ‘good’ time base or clock: (1) long and short-term frequency stability (usually measured in Allan variance and phase noise of the frequency source); (2) physical size of the clock; and (3) the power consumed by the clock. Historically (and mainly to satisfy criterion 1), clocks based on electromagnetic oscillations of atoms have provided the most precise method of timing events lasting longer than a few minutes. So precise are these “atomic” clocks, that in 1967 the second was redefined to be the duration required for a cesium (Cs) atom in a particular quantum state to undergo exactly 9,192,631,770 oscillations. While the long-term precision of atomic clocks is unsurpassed, the size and power required to run them has prevented their use in a variety of areas, particularly in those applications requiring portability or battery operation. The NIST F-1 primary standard, for example, occupies an entire table and consumes several hundred watts when operating. The state of the art in compact commercial atomic frequency references is rubidium (Rb) vapor-cell devices with volumes near 100 cm3 operating on a few watts of power; such references cost about $1,000.00 USD.
Recently, miniature atomic clocks have been based on Microelectromechanical systems (MEMS) technology which offers advantages such as smaller size, an improvement in the device power usage due to reduced parasitic heat dissipation (as the heat lost to the environment via the device surface is smaller), and high-volume, wafer-based production methods, which may substantially reduce cost. In spite of these advantages, the power consumed by currently envisioned MEMS-based atomic clocks hasn't been reduced enough to permit their use in applications such as portable battery operated systems in long-term operations, including, for example, week-long missions for the military, months-long working of communication base units or even year/decade long operation for sensor node applications.
Prior art atomic clocks typically include a physics package, which is the heart of the clock and contains an atomic (usually Rb or Cs) vapor cell that acts as a frequency reference to determine the clock output frequency.
Solid state resonators (such as RF resonators based on quartz and silicon) are portable and energy efficient and so are often used in wrist watches and the like, but cannot provide an adequate reference signal because they have observable and random aging effects which cause their frequencies to shift in a non-predictable manner.
Stable frequency sources are extremely important for communication systems for civil and military applications, and for sensor stability for long-term operation of sensor nodes. Considerable work has been done in the last few years to realize miniaturized atomic clock systems or chip-scale atomic clocks (CSACs) demonstrating potential for portability and low power operation. Low operation power and size of the CSACs are required for portability, whereas good short and long-term stability and low cost of fabrication are essential to ensure applicability in a wide variety of markets.
The frequency stability of atomic clocks is based on transitions between the well-defined ground state hyperfine levels of alkali atoms such as rubidium (Rb) or cesium (Cs). The physics package of an atomic clock consists of alkali metal atoms enclosed in a vapor cell so that the atomic resonance is excited and interrogated by an RF local oscillator about a frequency that corresponds to the hyperfine energy difference in the ground state of atoms.
The vapor cells of CSACs use sealed micromachined cavities to enclose the highly reactive alkali metals (such as rubidium—Rb and cesium—Cs) in a buffer gas composition. In addition, since the size of the vapor cells are very small (of the order of mm3), the buffer gas pressure and composition have to be optimized to serve the two important purposes of creating an inert ambient environment for the alkali metals, and maximizing the coherence lifetimes of the atoms by decreasing their effective wall relaxation., in turn reducing the linewidth of the hyperfine absorption.
The use of highly reactive and low melting alkali metals and filling the vapor cells with the optimum pressure and composition of buffer gases thus impose a MEMS packaging challenge. The fabrication of MEMS vapor cells so far has involved anodic bonding between micromachined silicon cavities and Pyrex glass. Since anodic bonding requires high-temperature (˜400° C.) processing, whereas the melting points of alkali metals are much lower (Rb ˜39.3° C., Cs ˜28.4 ° C. at 1 atm), the alkali-metal and buffer gases cannot be placed inside the cavities before the bonding process reliably. Knappe, et al, have tried to solve this problem by in-situ fabrication of the alkali metals from high temperature reaction of metal hydrides, metal chlorides and/or metal hydroxides during bonding. This can lead to residual impurities that cause long term drifts of the hyperfine resonance frequency. Lee, et al, have demonstrated a method of interconnecting the cavities using micromachined channels, and parallel filling after vapor cell formation. However isolation of the cells from each other and dicing requires the use of a wax-sealing, which leads to low yield, and requires bulk rubidium delivery, which is inefficient and results in uncontrolled delivery of rubidium in each vapor cell.
An alternative to using buffer gas to increase the coherence life time is to use a thin and uniform (or monolayers) of wall coating of materials such as Teflon (used in hydrogen maser frequency references), long chain alkanes (such as n-tetracontane—a component of paraffin wax), or some alkynated silanes (used in alkali metal frequency standards), as reported by Frueholtzs, et al and Sagiv, et al. However, the stringent requirements for the quality and apparatus needed for formation of wall coating is currently not compatible with MEMS processing. Furthermore, alkylated silanes have been shown to degrade over long-term operations directly affecting the long-term stability of the atomic clock system.
There is a need, therefore, for a structure and method for reliable fabrication of vapor cells adapted for economical use in making chip-scale atomic clocks (CSACs) via wafer-scale micro-machining processes that overcomes the problems with the prior art.
An object of the present invention is to provide a structure and method for fabrication of vapor cells adapted for use in making chip-scale atomic clocks (CSACs) via wafer-scale micro-machining processes adapted to overcome the problems with the prior art.
Briefly, in accordance with the present invention, the applicants noted that no such adverse effects have been reported in connection with the use of long chain alkanes in atomic clock vapor cells. In this embodiment, chemically inert alkanes, particularly long chain alkanes (called n-paraffins) are used to enclose highly reactive Rb inside wax to make Rubidium-Wax micropackets to form vapor cells for CSACs. In accordance with the present invention, a method for fabricating vapor cells for chip-scale atomic clocks (CSACs) uses wafer-scale micromachining processes.
Alkali metals are enclosed in a chemically inert wax to preform alkali metal-wax micropackets, keeping the alkali metals from reacting with the ambient surroundings during the vapor cell fabrication. This enables the deposition of precise amounts of pure alkali metal inside the vapor cells. Laser ablation of the alkali metal-wax micropackets provides a simple and effective way of releasing the enclosed metal. Apart from the high level of purity of the alkali metals in the resulting vapor cells, this method holds promise for inexpensive and flexible manufacturing of vapor cells, as well as easy handling of alkali metals used for a variety of applications other than for CSACs.
The process for Alkali-Metal Wax Micropacket Fabrication, includes a sequence of steps; first, a 1 micrometer (μm) thick layer of silicon dioxide (SiO2) is deposited on a 4-inch silicon wafer used as a handle substrate. Through-wafer holes are etched through the handle substrate using deep reactive ion etching (DRIE) on the back side to serve as etch holes for the release process.
A thin uniform layer of wax is deposited on top of the SiO2 layer in the following way. The handling wafer is placed on a hotplate with a level surface inside a nitrogen ambience glove box with low levels of oxygen and humidity within a few parts per million. A measured amount of solid wax is placed on the wafer, melted and spread using a microscope glass slide. The wafer is held above the melting point for a few minutes and rapidly cooled to ensure a uniform thickness (˜0.25 mm) of the resulting wax layer. An array of pins is poked down into in the wax layer to indent, impress or form wax dimples or divides by heating the wafer to the wax softening temperature. The pins or other indenting members define evenly spaced indentations or divides separated by sidewalls having a selected spacing and orientation.
Precise amounts of liquid Rb87 are micro-pipetted onto the wax indentations or divides using an X-Y-stage and a syringe pump to define a selected number of individual liquid Rb87 segments or balls.
A wax enclosure is then formed by enclosing or sandwiching the Rb87 segments between upper and lower indented, wax-layered wafers. An upper indented, wax layered wafer assembly also comprises a substantially identical silicon dioxide (SiO2) layer deposited on a 4-inch silicon handle wafer that has a plurality of evenly spaced through-wafer holes (or vents or vias) etched through using deep reactive ion etching (DRIE) on the back side to serve as etch holes for the release process. Upper wafer assembly also has substantially identically spaced indentations or divides separated by sidewalls having the same selected spacing and orientation as for the lower wafer assembly described above.
The lower wafer assembly carries the Rb87 segments in the divides. In a sealing step, the wax layers of the upper and lower wafer assemblies are heat sealed to one another at the wax's pre-defined softening temperature to ensure that the Rb87 is completely enclosed by the wax layers of the upper and lower layered wafer assemblies.
The wafer-sandwich is then dipped in hydrofluoric acid (HF) to release the sealed, multi-segment wax enclosure from the silicon handlers. Chemical exposure to HF for extended intervals (e.g., overnight) shows no damage to the wax enclosure or the enclosed Rb87 segments. Finally, individual Rb-wax micropackets are formed by segmenting or dicing the wax enclosure to provide separate or individual Rb-wax micropackets, each containing a single Rb87 segment.
Alternative embodiments of the method are also possible to fabricate alkali metal-wax micropackets. Another simple method would be to evaporate a thin layer of wax directly on precise quantities of alkali metals or dip coating alkali metals by rapidly immersing in molten wax.
The use of alkali metal-wax micropackets to enclose alkali metals has the following advantages. First, it allows for the formation of pure alkali metal inside the final vapor cells. This is extremely important and currently the main limitation for the long term stability of CSACs. Second, it results in precise amounts of alkali metal needed for each type of vapor cell. This ensures reproducibility in the vapor cell performance and keeps the wastage of expensive alkali metals to a minimum. Third, the ease of fabrication and handling holds potential for inexpensive fabrication of CSAC vapor cells. The Rb-wax micropackets enable decoupling of MEMS fabrication for the rest of the vapor cell (such as cell fabrication, anodic bonding and buffer gas filling) from the stringent requirements of handling alkali metals. Additionally, for applications outside of CSAC, the use of Rb-wax micropackets provides an easy, inexpensive and safe way for packaging and transporting precise amounts of pure alkali metals.
A simple method of forming vapor cells using the Rb-wax micropackets begins with a substantially planar Pyrex wafer bonded to a low stress silicon (SixNy) substrate. The wafer includes a plurality of spaced cavities formed by bulk-micromachining of the silicon and anodic bonding of the thermally matched Pyrex wafer in an ambient environment that contains the required composition and pressure of buffer gases.
A Rb-wax micropacket array is thermally bonded to the silicon nitride (SixNy) membrane side of a wafer-scale cavity array and the enclosed Rb is released into the cavity by laser ablating the SixNymembrane through the glass wafer. The laser used for ablation is mounted on an X-Y stage to precisely ablate the wax in each micropacket to release the Rb in a controllable way into the cavity. Laser ablation thus offers a fast and effective way of delivering precise amount of Rb into the vapor cells.
Laser ablation may be done using a Coherent™ 355 nm laser system, and for large ablation times (>5 sec), the wax is ablated all the way through and results in the Rb reacting immediately with the atmosphere. For ablation times of ˜4 sec, the Rb is released and the wax forms a coating around the cavity. Although the effects of the wax wall coating remain unverified, one can conjecture that by carefully optimizing the ablation times and laser parameters, it is possible to form a thin uniform coating along the walls of the cavity that would result in increasing the coherence lifetimes of the alkali metals inside the vapor cells formed when using this process.
The foregoing and additional features and advantages of the present invention will become apparent upon consideration of the following detailed description of a specific embodiment thereof, taken in conjunction with the accompanying drawings, wherein like reference numerals in the various figures are utilized to designate like components, in which:
a is a schematic diagram illustrating a preliminary step in the process for making Rb-wax micropackets, an SiO2 layer is grown on a handler or wafer, a DRIE process is used to etch holes through the wafer, in accordance with the present invention;
b is a schematic diagram illustrating a second step in the process for making Rb-wax micropackets, a wax layer is deposited and divides or indentations are defined therein to receive Rb segments deposited with a micropipette, in accordance with the present invention;
c is a schematic diagram illustrating a third step in the process for making Rb-wax micropackets, a substantially identical upper wafer assembly is positioned over the lower wafer assembly carrying the Rb segments, and the two wafer assemblies are sealed together at wax softening temperature to enclose the Rb segments, in accordance with the present invention;
d is a schematic diagram illustrating a fourth step in the process for making Rb-wax micropackets, the now sealed wax enclosure is released from the wafer assemblies in an HF environment, in accordance with the present invention;
a is a schematic diagram illustrating a preliminary step in the process for making Rb vapor cells from Rb-wax micropackets, cavities are formed in the silicon substrate and an anodic bond to Pyrex is performed in a vacuum chamber with buffer gas, in accordance with the present invention;
b is a schematic diagram illustrating an intermediate step in the process for making Rb vapor cells from Rb-wax micropackets, wax-Rb micropackets are attached on the SixNymembranes by heating the wax to softening temperature, in accordance with the present invention;
c is a schematic diagram illustrating a finishing step in the process for making Rb vapor cells from Rb-wax micropackets, a laser on an X-Y stage is used to ablate the SixNymembrane and wax and then releases Rb into the cavity to form an Rb vapor cell, in accordance with the present invention;
a, illustrates, a scanning electron microscope (SEM) view of a vapor cell formed using the processes of
b schematically illustrates, in cross section, a SixNymembrane supporting or carrying an adhered Rb-wax micropacket positioned adjacent the cavity positioned to form an Rb vapor cell, in accordance with the present invention;
c illustrates, photographically, from the Pyrex side, an Rb vapor cell showing the Rb, in accordance with the present invention;
a is a schematic diagram illustrating a preliminary step in the process for making Rb vapor cells from Rb-wax micropackets enclosed in glass tube, a wax-Rb micropacket is inserted into the hollow interior or lumen of a thin glass tube, in accordance with the present invention;
b is a schematic diagram illustrating a next step in the process for making Rb vapor cells from Rb-wax micropackets enclosed in glass tube, the glass tube is pumped down and backfilled with buffer gas, in accordance with the present invention;
c is a schematic diagram illustrating a next step in the process for making Rb vapor cells from Rb-wax micropackets enclosed in glass tube, the glass tube is segmented or glass blown to form individual glass cells with each cell enclosing a single wax-Rb micropacket, in accordance with the present invention;
d is a schematic diagram illustrating individual glass cells made using the process steps of
Turning now to a more detailed description of the invention, the process for Alkali-Metal Wax Micropacket Fabrication,
Referring to
A thin uniform layer of wax 16 is deposited on top of the SiO2 layer 10 in the following way. The handling wafer 12 is placed on a hotplate with a level surface inside a nitrogen ambience glove box with low levels of oxygen and humidity within a few part per million. A measured amount of solid wax 16 is placed on the wafer 12, melted and spread using a microscope glass slide. The wafer is held above the melting point for a few minutes and rapidly cooled to ensure a uniform thickness (˜0.25 mm) of the resulting wax layer 16. An array of pins is poked or pushed downwardly into the wax layer to indent, impress or form wax indentations, dimples or divides 18 after heating the wafer 12 to the wax softening temperature. The pins or other indenting members define evenly spaced dimples, indentations or divides 18 separated by sidewalls 19 having a selected spacing and orientation. The divides 18 are made using pogo pin array after the wax 16 is heated to the wax softening temperature. For example, if wax layer 16 is two mm thick, each dimple or divide 18 may be one to one and a half mm deep. The exact dimensions of the divide 18 is less critical since the wax will melt around the rubidium to sandwich it in the steps described below.
Precise amounts of liquid rubidium (e.g., Rb87) are micro-pipetted onto the wax divides 18 using an X-Y-stage and a syringe pump to define a selected number of individual liquid Rb87 segments or balls 20 as shown in
Turning now to
An upper indented, wax layered wafer assembly 22 also comprises a substantially identical silicon dioxide (SiO2) layer 10 deposited on a 4-inch silicon handle wafer 12 that has a plurality of evenly spaced through-wafer holes (or vents or vias) 14 etched through using deep reactive ion etching (DRIE) on the back side to serve as etch holes for the release process. Upper wafer assembly also has substantially identically spaced indentations or divides 18 separated by sidewalls 19 having the same selected spacing and orientation as for the lower wafer assembly described above and identified (in
The lower wafer assembly 24, as seen in
The wafer-sandwich is then dipped in HF to release the sealed, multi-segment wax enclosure 26 from the silicon handlers 12, as best seen in
Alternative embodiments of the method are also possible to fabricate alkali metal-wax micropackets. Another simple method would be to evaporate a thin layer of wax directly on precise quantities of alkali metals or dip coating alkali metals by rapidly immersing in molten wax.
The use of alkali metal-wax micropackets to enclose alkali metals has the following advantages. First, it allows for the formation of pure alkali metal inside the final vapor cells. This is extremely important and currently the main limitation for the long term stability of CSACs. Second, it results in precise amounts of alkali metal needed for each type of vapor cell. This ensures reproducibility in the vapor cell performance and keeps the wastage of expensive alkali metals to a minimum. Third, the ease of fabrication and handling holds potential for inexpensive fabrication of CSAC vapor cells. The Rb-wax micropackets 30 enable decoupling of MEMS fabrication for the rest of the vapor cell (such as cell fabrication, anodic bonding and buffer gas filling) from the stringent requirements of handling alkali metals. Additionally, for applications outside of CSAC, the use of Rb-wax micropackets is an easy, inexpensive and safe way for packaging and transporting precise amounts of pure alkali metals.
Once the micropackets 30 are made, all the processes occur at room temperature, and so the rubidium is in the solid phase.
A simple method of forming vapor cells using the Rb-wax micropackets is illustrated in
As best seen in
The time history for laser ablation using a Coherent™ 355 nm laser system is shown in Table 1. For large ablation times (>5 sec), the wax is ablated all the way through and results in the Rb to react immediately with the atmosphere. For ablation times of ˜4 sec, the Rb is released and the wax forms a coating around the cavity. Although we have not verified the effects of the wax wall coating, we can conjecture that by carefully optimizing the ablation times and laser parameters, it is possible to form a thin uniform coating along the walls of the cavity that would result in increasing the coherence lifetimes of the alkali metals inside the vapor cells formed using this process.
The correct specification of the ambient environment should include the composition of the gases used and the total pressure at a given temperature. A typical ambient condition used in vapor cells in CSAC is neon gas or argon gas at 10 torr of pressure at 25 degree C. In the exemplary embodiment xenon gas is used at 10 torr pressure. Again, this may vary from sub-milli-torr pressure to several 10s of torrs of pressure, depending on the design of the vapor cell for use in specific CSACs.
The quantity or amount of Rb released into the cell has not been measured or controlled as of this writing, but a current estimate is that more than 90% of the rubidium segment 20 in the wax packet 30 is released into the cavity 44 of the vapor cell 52 as a result of the ablation process step.
a shows an SEM of a vapor cell 52 fabricated using Rb-wax micropackets 30.
The vapor cells (e.g., 30) may range from 1 mm×1 mm×500 microns (length×width ×height) to 5 mm×5 mm×1 mm. The cavities are defined in silicon using silicon micromachining but are enclosed using Pyrex.
Alternative embodiments include other methods of forming vapor cells fabricated using alkali-metal wax micropackets 30 that are suitable for use in CSACs. One method is to enclose the alkali metal-wax micropacket 30 inside a thin glass tube 60 or hollow core fibers as shown in
It will be appreciated by those having skill in these arts that the present invention makes available a method of making alkali-metal vapor cells by first forming microscale-wax micropackets with alkali metals inside. This invention allows fabrication of vapor cells at low cost and in a batch fabricated manner. The method reduces the cost of making chip-scale atomic clocks and allows shipping of alkali vapor packets without contamination issues, thereby creating a technology for alkali-metal vendors to provide small packets of alkali metals.
Having described preferred embodiments of a new and improved method, it is believed that other modifications, variations and changes will be suggested to those skilled in the art in view of the teachings set forth herein. It is therefore to be understood that all such variations, modifications and changes are believed to fall within the scope of the present invention as defined by the appended claims.
This application is a continuation of and claims priority to the filing date of U.S. provisional application Ser. No. 60/687,306, filed Jun. 6, 2005, the entire disclosure of which is hereby incorporated herein by reference. This application is also related to commonly owned U.S. provisional application Ser. No. 60/679,979, entitled RADIOACTIVE DECAY BASED STABLE TIME OR FREQUENCY REFERENCE SIGNAL SOURCE and filed May 12, 2005, the entire disclosure of which is also incorporated herein by reference.
The present invention was made at least partially with Government funds under DARPA Grant No. NBCH 1020005. The US Government may have rights in this patent.
Number | Name | Date | Kind |
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6255647 | Vanier et al. | Jul 2001 | B1 |
Number | Date | Country | |
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20070034809 A1 | Feb 2007 | US |
Number | Date | Country | |
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60687306 | Jun 2005 | US |