Analyte test meter docking station

Information

  • Patent Grant
  • D601258
  • Patent Number
    D601,258
  • Date Filed
    Friday, July 25, 2008
    16 years ago
  • Date Issued
    Tuesday, September 29, 2009
    15 years ago
  • US Classifications
    Field of Search
    • US
    • D24 107
    • D24 158
    • D24 165-169
    • D24 186
    • D24 232
    • D10 70
    • D10 78
    • D10 81
    • D10 98
    • D10 104
    • D14 149
    • D14 151
    • D14 168
    • D14 253
    • D14 341
    • D14 371
    • D14 374-375
    • 600 309000
    • 600 316000
    • 600 322000
    • 600 365000
    • 600 368000
    • 422 056-058
    • 422 061000
    • 422 068100
    • 422 102000
    • 422 104000
    • 435 016000
    • 436 168-169
    • 436 183000
    • 455 404100
    • 379 428400
    • 379 441000
    • 379 446000
    • 379 454-455
  • International Classifications
    • 2401
    • Term of Grant
      14Years
Abstract
Description


FIG. 1 is a top, front and right side perspective view of an analyte test meter docking station;



FIG. 2 is a top, rear and left side perspective view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a front elevational view thereof;



FIG. 5 is a rear elevational view thereof;



FIG. 6 is a bottom plan view thereof;



FIG. 7 is a left side elevational view thereof; and,



FIG. 8 is a right side elevational view thereof.


Claims
  • We claim the ornamental design for an analyte test meter docking station, as shown and described.
US Referenced Citations (13)
Number Name Date Kind
D275482 Coons et al. Sep 1984 S
D277662 Huntington et al. Feb 1985 S
D320991 Nagai et al. Oct 1991 S
D363284 Solomita Oct 1995 S
D388434 Lepack Dec 1997 S
D389159 Patterson et al. Jan 1998 S
D441713 Gartrell May 2001 S
D452564 Micinski et al. Dec 2001 S
D462771 Weber Sep 2002 S
D466516 Peiker Dec 2002 S
D474737 Yoshida May 2003 S
D538433 Lorimer et al. Mar 2007 S
D541741 Yosef et al. May 2007 S