Analytical instrument

Information

  • Patent Grant
  • D877926
  • Patent Number
    D877,926
  • Date Filed
    Friday, September 14, 2018
    6 years ago
  • Date Issued
    Tuesday, March 10, 2020
    5 years ago
  • Inventors
    • Tanaka; Koji
  • Original Assignees
  • Examiners
    • Doan; Anhdao
    Agents
    • Nakanishi IP Associates, LLC
  • US Classifications
    Field of Search
    • US
    • D24 164-169
    • D24 186
    • D24 107
    • D24 216
    • D24 231-233
    • D10 81
    • CPC
    • A61B5/14532
    • A61B5/14865
    • A61B2560/0412
    • A61B2560/0443
    • A61B2560/0462
    • A61M25/0606
    • A61M25/0631
  • International Classifications
    • 2401
    • Term of Grant
      15Years
Abstract
Description


FIG. 1 is a front, top, and right side perspective view of an analytical instrument;



FIG. 2 is a front elevation view thereof;



FIG. 3 is a rear elevation view thereof;



FIG. 4 is a left side elevation view thereof;



FIG. 5 is a right side elevation view thereof;



FIG. 6 is a top plan view thereof; and,



FIG. 7 is a bottom plan view thereof.


The broken lines represent portions of the analytical instrument and form no part of the claimed design. The dot-dashed line represents a boundary between the claimed portion and non-claimed portion which forms no part of the claimed design.


Claims
  • The ornamental design for an analytical instrument, as shown and described.
Priority Claims (1)
Number Date Country Kind
D2018-005602 Mar 2018 JP national
US Referenced Citations (8)
Number Name Date Kind
D467349 Niedbala Dec 2002 S
D474280 Niedbala May 2003 S
D689193 Shinohara Sep 2013 S
D822844 Smith Jul 2018 S
D827859 Mathers Sep 2018 S
D848880 Smith May 2019 S
D854188 Schaeken Jul 2019 S
D857903 Esfandiari Aug 2019 S