Analytical measuring instrument

Information

  • Patent Grant
  • D748509
  • Patent Number
    D748,509
  • Date Filed
    Tuesday, October 28, 2014
    9 years ago
  • Date Issued
    Tuesday, February 2, 2016
    8 years ago
  • US Classifications
    Field of Search
    • US
    • D10 78
    • D10 81
    • CPC
    • G01N33/48785
    • G01N33/48
    • G01N33/483
    • G01N2201/31
    • G01N2201/022
    • G01N2201/0221
    • G01N2201/0222
    • G01N2201/0223
    • G01N2201/0224
    • G01N2201/0225
    • G01N2201/0226
    • G01N2201/0227
    • G01N2201/0228
    • G01N2223/50
  • International Classifications
    • 1004
    • Term of Grant
      14Years
Abstract
Description


FIG. 1 is a front perspective view of the analytical measuring instrument;



FIG. 2 is a top plan view of the FIG. 1 device;



FIG. 3 is a bottom plan view of the FIG. 1 device;



FIG. 4 is a left side elevation view of the FIG. 1 device;



FIG. 5 is a right side elevation view of the FIG. 1 device;



FIG. 6 is a rear elevation view of the FIG. 1 device; and,



FIG. 7 is a front elevation view of the FIG. 1 device.


The broken lines are for illustrating functional features and form no part of the claimed design.


Claims
  • The ornamental design for an analytical measuring instrument, as shown and described.
Priority Claims (1)
Number Date Country Kind
002455261 Apr 2014 EM regional
US Referenced Citations (8)
Number Name Date Kind
D453905 Cheng Feb 2002 S
D462024 Nardo et al. Aug 2002 S
D718161 Derr Nov 2014 S
D727764 Nothacker et al. Apr 2015 S
D731341 Kobayakawa Jun 2015 S
D732411 Waaler et al. Jun 2015 S
20100041156 Brenneman et al. Feb 2010 A1
20130121875 Hsu et al. May 2013 A1