X-ray assemblies and systems may generally include a cathode that directs a stream of electrons into a vacuum, and an anode that receives the electrons. When the electrons collide with a target on the anode, some of the energy may be emitted as x-rays, and some of energy may be released as heat. The emitted x-rays may be directed at samples to determine information about the samples. Unless otherwise indicated herein, the approaches described in this section are not prior art to the claims in this disclosure and are not admitted to being prior art by inclusion in this section.
Before any embodiments of the invention are explained in detail, it is to be understood that the invention is not limited in its application to the details of construction and the arrangement of components set forth in the following description or illustrated in the following drawings. The invention is capable of other embodiments and of being practiced or of being carried out in various ways. Numbers provided in flow charts and processes are provided for clarity in illustrating steps and operations and do not necessarily indicate a particular order or sequence. Unless otherwise defined, the term “or” can refer to a choice of alternatives (e.g., a disjunction operator, or an exclusive or) or a combination of the alternatives (e.g., a conjunction operator, and/or, a logical or, or a Boolean OR).
Disclosed embodiments relate generally to structures, methods, and systems to improve spectral purity of x-ray beams generated from an analytical x-ray tube by anode geometry and an anode shield. Disclosed embodiments also relate generally to an anode shield for a stationary x-ray tube.
Spectral purity of an analytical x-ray tube's x-ray beam can be compromised by some features of anode geometry. Specifically, if features of the anode geometry are conical in shape or perpendicular to the exit window of the x-ray tube, a probability exists that backscatter electrons will produce characteristic x-ray from these surfaces. If the surfaces are not constructed of the same materials as the focal spot impingement area (or target area), the x-rays generated from these surfaces will not be the characteristic x-rays intended from the tube resulting in a spectral contamination. The disclosed anode shield provides a means whereby the unwanted spectral contamination is measurable reduced.
Conventionally in a stationary anode x-ray tube, the anode includes a target and an anode base or substrate to support the target and conduct heat away from the target that is generated from electrons striking the target. Due to the relatively high cost and/or lower thermal conductivity of the target material of the target to the substrate materials used in the anode base or substrate, the composition of the target material typically differs from the substrate materials. Although the area of the target does not have to be large to generate x-rays, the heat produced by the target when x-rays are being generated can be significant which can increase the temperature of the target, which can evaporate the target material, degrade the target or the x-ray tubes, and/or melt other features of the anode if the generated heat is not conduct the heat away from the target area. Typically, mechanisms are used to cool or reduce the temperature of the target and conduct the heat away from the target, such as using high thermal conductivity materials, increasing the cross-sectional area of the anode volume around the target, and/or using liquid cooling anode features around the target.
U.S. Pat. No. 9,941,092 (“'092 Patent”), entitled “X-ray Assemblies and Coating,” granted on Apr. 10, 2018, which is incorporated by reference in its entirety, provides an example of a conventional anode with an increasing graduated cross-sectional area from the target 82 to the other end of the anode base or substrate 74 (as shown in FIGS. 2A and 3 of the '092 Patent). For example, a taper 88 is used between a first narrow portion 84 and a second wide portion 86 (as shown in FIGS. 2A and 3 of the '092 Patent).
As illustrated in the '092 Patent, only a portion of electrons emitted by an electron emitter that impact the target 82 may be absorbed by the target resulting in an emission of radiation (referred to as “primary x-rays”). The characteristics of the emitted radiation (e.g., wavelength, frequency and/or energy) may depend on the material of the target, the energy of the impacting electrons, the voltage of the x-ray tube, and/or other aspects. Some of the remaining electrons impacting the target may be backscattered instead of being absorbed by the target. Some of the x-rays generated by backscattered electrons (referred to as “backscattered x-rays”) may also exit the x-ray transmissive window of the x-ray tube along with the primary x-rays. As the target material may be different from the substrate material, the primary x-rays may have different radiation characteristics from the backscattered x-rays, which can have an adverse effect on the image or the spectroscopy, referred to as spectral contamination, as described in more detail below.
A conventional approach to reduce spectral contamination from the substrate material of the anode base or substrate is to use a coating of a target material on surfaces near the target, such as the first portion 84 (not covered by the target 82) and taper 88, as illustrated in the '092 Patent. The coating can be applied by electroplating. Unfortunately, electroplating a target material may not produce a thick enough layer to block the x-rays generated by the substrate materials below the coating that can cause spectral contamination. For example, electroplating rhodium (Rh) may only produce a 1.5 micrometer (μm or micron) coating before the coating exhibits undesirable characteristics, such as flaking at operating temperatures of the x-ray tube. A thickness of 50 microns of rhodium may be needed to shield over 99.9% of radiation from backscatter x-rays generated from copper below the rhodium. Thermal spraying (e.g., plasma spraying), chemical vapor deposition (CVD), plasma-enhanced CVD (PECVD), physical vapor deposition (PVD), sputtering or sputter deposition, and high velocity oxygen fuel spraying (HVOF) may be used to produce thicker coatings than electroplating without undesirable characteristics, but the processing costs may be much higher than electroplating and thus increase the cost of manufacturing the anode.
In another example, conventional anodes may use an anode sleeve 30 or 30' to cover a portion of an anode substrate 17 of a stationary anode structure 16, as illustrated by U.S. Pat. No. 6,690,765 (“765 Patent”), entitled “Sleeve for a Stationary Anode in an X-ray Tube,” granted on Feb. 10, 2004, which is incorporated by reference in its entirety. An anode sleeve may be more difficult and costlier to manufacture than using an anode shield as described below as the anode sleeve covers more surfaces.
The cathode assembly 236 can include an electron emission face 246 and an electron source, such as electron emitter 262 (e.g., cathode filament) and a focusing slot 264, configured to emit electrons, and focusing electrode 260. The focusing electrode 260 may be configured to focus electrons travelling from the electron emission face 246 to the target 282. The focusing electrode 260 can include a substantially geometrically continuous surface 220 (e.g., without corner or sharp edges) facing at least a first portion 284 and a second portion 286 of an anode substrate 274 of the anode assembly 238.
The anode assembly 238 or anode is configured to generated x-rays from electrons striking the target 282. The anode 238 can include a substrate 274 including a substrate material with a first portion 284 with a first cross-sectional dimension 294 and a second portion 286 with a second cross-sectional dimension 296 greater than the first cross-sectional dimension 294, and a target 282 including a target material attached to a first surface of the first portion 284 of the substrate 274, and an anode shield 272 including a shield material attached to a second surface of the second portion 286 of the substrate 274. The substrate material differs from the target material and the shield material.
The target is formed of materials that generate significant x-rays when high energy electrons strike the target materials. Similarly, the shield materials used in the anode shield 272 may use materials similar to the target materials. For example, target material and shield materials can include scandium (Sc), titanium (Ti), cobalt (Co), molybdenum (Mo), rhodium (Rh), palladium (Pd), tungsten (W), platinum (Pt), niobium carbide (NbC or Nb2C), tantalum carbide (TaCx), or combinations thereof. In an example, the target material and the shield material comprise substantially the same material. As a result, the anode shield 272 using similar materials as the target 282, the anode shield 272 may also be referred to as a stepped target or a target shield and the anode 238 may be referred to as a shielded anode. Substantially the same material can refer to a material that has 90%, 95%, or 99% the same chemical composition as another material.
Material properties of a good substrate material for x-ray tube and vacuum environments include a high melting point for use in high temperature environments, high thermal conductivity to conduct heat away from the target, and low material cost to improve profitability in manufacture. The melting point is the temperature at which a material changes state from solid to liquid. Thermal conductivity is a measure of a material's ability to conduct heat. Suitable substrate materials with the properties listed include copper (Cu), silver (Ag), pyrolytic carbon or pyrolytic graphite (C), or combinations thereof. Copper has a melting point of 1084.62° Celsius (C) or 1357.77 Kelvin (K) and a thermal conductivity of 401 watts per meter-kelvin (W/(m·K)). Silver (Ag) has a melting point of 961.78° C. or 1244.93 Kelvin (K) and a thermal conductivity of 429 W/(m·K). Pyrolytic carbon or pyrolytic graphite (C) has thermal conductivity at 700° C. of 1.2-4.6 W/(m·K) perpendicular to the deposition plane and 150-310 W/(m·K) parallel to the deposition plane. Pyrolytic carbon (or pyrolytic graphite) is a material similar to graphite, but with some covalent bonding between its graphene sheets, which more thermally conductive along the cleavage plane than graphite, making a good planar thermal conductor.
In an example, the substrate material has a melting point greater than 900° C. In an example, the substrate material has a thermal conductivity greater than 300 W/(m·K).
The target 282 may be coupled to the first portion 284 of the substrate 274 by brazing. Brazing the target 282 may be advantageous because brazing may facilitate tighter control of tolerances, facilitate uniform heating of the materials, decrease thermal distortion of the joined materials, and/or facilitate producing clean joints. Similarly, the anode shield 272 may be coupled to a planar surface 226 (
Analytical x-ray tubes may be used to generate x-ray fluorescence (XRF), which is the emission of characteristic “secondary” (or fluorescent) x-rays from a material that has been excited by being bombarded with high-energy x-rays or gamma rays. The XRF phenomenon is widely used for elemental analysis and chemical analysis. X-ray spectroscopy refers to several spectroscopic techniques for characterization of materials by using x-ray excitation. When an electron from the inner shell of an atom is excited by the energy of a photon, such as an x-ray, the electron moves to a higher energy level. When electron returns back to the low energy level, the energy which electron previously gained by the excitation is emitted as a photon which has a wavelength that is characteristic for the element, which can include several characteristic wavelengths per element. In x-ray spectroscopy, the alpha line is often the primary spectral line (from the various spectral lines that are characteristic to elements) of interest in many industrial applications. For example, K-alpha emission lines result when an electron transitions to the innermost “K” shell (principal quantum number 1) from a 2p orbital of the second or “L” shell (with principal quantum number 2). K-alpha emission is composed of two spectral lines, K-alpha1 and K-alpha2. The K-alpha1 emission is higher in energy and thus has a lower wavelength than the K-alpha2 emission. A larger number of electrons follow the K-alpha1 transition (L33 →K) relative to the K-alpha2 (L2→K) transition which causes the K-alpha1 emission to be more intense than K-alpha2. K-beta emissions, similar to K-alpha emissions, result when an electron transitions to the innermost “K” shell (principal quantum number 1) from a 3p orbital of the third or “M” shell (with principal quantum number 3). The energy generated by the K-beta emissions is typically less than the K-alpha emissions. The Siegbahn notation and International Union of Pure and Applied Chemistry (IUPAC) notation are used in x-ray spectroscopy to name the spectral lines that are characteristic to elements.
In
Some embodiments include an anode, comprising: a substrate 274 including a substrate material, comprising: a first portion 284 with a first cross-sectional dimension 294, and a second portion 286 with a second cross-sectional dimension 296 greater than the first cross-sectional dimension 294; a target 282 including a target material attached to a first surface 224 of the first portion 284 of the substrate; and an anode shield 272 including a shield material attached to a second surface of the second portion 286 of the substrate, where the substrate material differs from the target material and the shield material.
In some embodiments, the target 282 is brazed to the first portion 284 of the substrate 274, and the anode shield 272 is brazed to the second portion 286 of the substrate 274. In some embodiments, the anode further comprises a braze material between the anode shield 272 and a planar second portion surface 226 of the second portion 286.
In some embodiments, the anode shield 272 is an annular elliptical cylinder, an elliptical cylindrical shell, or a hollow elliptical conical frustum. In some embodiments, a planar target surface 212 of the target 282 is substantially parallel to a planar shield surface 216 of the anode shield 272. In some embodiments, the first portion 284 and a second portion 286 of the substrate form elliptic cylinders with substantially parallel surfaces. In some embodiments, a planar first portion surface 224 of the first portion 284 of the substrate is substantially orthogonal to a side surface 214 of the first portion 284.
In some embodiments, a planar first portion surface 224 of the first portion 284 of the substrate has an angle Φ between 85° and 95° with a side surface 214 of the first portion 284. In some embodiments, a planar first portion surface 224 of the first portion 284 of the substrate has an angle Φn less than 90° with a side surface 214 of the first portion 284.
In some embodiments, a thickness of the target material is greater than a thickness of the shield material. In some embodiments, a thickness of the shield material is greater than 20 microns (μm). In some embodiments, a thickness of the shield material blocks over 99% of K radiation emitted from the substrate material beneath the anode shield 272.
In some embodiments, the substrate material comprises copper (Cu), silver (Ag), pyrolytic carbon or pyrolytic graphite, or combinations thereof. In some embodiments, the target material and the shield material each comprises scandium (Sc), titanium (Ti), cobalt (Co), molybdenum (Mo), rhodium (Rh), palladium (Pd), tungsten (W), platinum (Pt), niobium carbide (NbC or Nb2C), tantalum carbide (TaCx), or combinations thereof. In some embodiments, the target material and the shield material comprise substantially the same material. In some embodiments, the target material and the shield material have a K-alpha1 (Kα1) energy level 1.5 times greater than the K-alpha1 energy level of the substrate material. In some embodiments, a planar shield surface 216 and an outside side surface of the anode shield 272 has a bevel.
Some embodiments include an x-ray tube comprising: a vacuum enclosure 234 including an x-ray transmissive window 232 covering an opening 228 in the vacuum enclosure; a cathode assembly 236 disposed within the vacuum enclosure, the cathode assembly including an electron source 262 configured to emit electrons; and an anode previously described disposed within the vacuum enclosure, the anode configured to generated x-rays from electrons striking the target 282.
In some embodiments, the cathode assembly 236 further comprises focusing electrode including a substantially geometrically continuous surface 220 facing the first portion 284 and the second portion 286 of the substrate. In some embodiments, the opening 228 in the vacuum enclosure has opening cross-sectional dimension within 20% of the second cross-sectional dimension of the second portion 286.
Some embodiments use a method of manufacturing an anode, where the method comprises: providing a substrate including a substrate material; brazing a target 282 including a target material to the substrate; and forming a first portion 284 of the substrate 274 with a first cross-sectional area, and a second portion 286 with a second cross-sectional area greater than the first cross-sectional area, wherein the target is brazed to a planar first portion surface 224 of the first portion 286; and brazing an anode shield 272 including a shield material to a planar second portion surface 226 of the second portion 286.
In some embodiments, forming the first portion 284 and the second portion 286 of the substrate 274 includes machining the first portion 284 to a smaller cross-sectional dimension than the second portion 286. In some embodiments, brazing the anode shield includes adding a braze material to adhere the substrate 274 to the anode shield 272. In some embodiments, at least one non-transitory machine-readable storage medium comprising a plurality of instructions are adapted to be executed to implement the method above.
Some embodiments include an anode, comprising: a target means including a target material for generating x-rays when electrons strike the target; a substrate means including a substrate material for supporting the target and conducting heat away from the target, wherein substrate means has a first cross-sectional dimension smaller than a second cross-sectional dimension; an anode shielding means including a shield material for blocking backscatter x-rays generated from the second cross-sectional dimension non-overlapping with first cross-sectional dimension of the substrate means. The substrate material differs from the target material and the shield material. Examples of target means include the target 282. Examples of substrate means include the substrate 274, the first portion 284, the second portion 286, the tapered portion 290, and the third portion 292. In an example, the second cross-sectional dimension 296 non-overlapping with first cross-sectional dimension 294 refers to the area of the second portion 286 not covered by the first portion 284. Examples of anode shielding means include the anode shield 272, 272A, 272B, 272C.
In some examples, the substrate material of substrate means has a melting point greater than 900° C. In some examples, the substrate material of substrate means has a thermal conductivity greater than 300 W/(m·K). In some examples, the target material and the shield material have a K-alpha1 (Kα1) energy level 50% greater than the K-alpha1 energy level of the substrate material. In some examples, a thickness of the shield material blocks over 99% of K radiation emitted from the substrate material of the anode shielding means.
The summary provided above is illustrative and is not intended to be in any way limiting. In addition to the examples described above, further aspects, features, and advantages of the invention will be made apparent by reference to the drawings, the following detailed description, and the appended claims.
Reference throughout this specification to an “example” or an “embodiment” means that a particular feature, structure, or characteristic described in connection with the example is included in at least one embodiment of the invention. Thus, appearances of the words an “example” or an “embodiment” in various places throughout this specification are not necessarily all referring to the same embodiment.
Furthermore, the described features, structures, or characteristics may be combined in a suitable manner in one or more embodiments. In the following description, numerous specific details are provided (e.g., examples of layouts and designs) to provide a thorough understanding of embodiments of the invention. One skilled in the relevant art will recognize, however, that the invention can be practiced without one or more of the specific details, or with other methods, components, layouts, etc. In other instances, well-known structures, components, or operations are not shown or described in detail to avoid obscuring aspects of the invention.
The claims following this written disclosure are hereby expressly incorporated into the present written disclosure, with each claim standing on its own as a separate embodiment. This disclosure includes all permutations of the independent claims with their dependent claims. Moreover, additional embodiments capable of derivation from the independent and dependent claims that follow are also expressly incorporated into the present written description. These additional embodiments are determined by replacing the dependency of a given dependent claim with the phrase “any of the claims beginning with claim [x] and ending with the claim that immediately precedes this one,” where the bracketed term “[x]” is replaced with the number of the most recently recited independent claim. For example, for the first claim set that begins with independent claim 1, claim 3 can depend from either of claims 1 and 2, with these separate dependencies yielding two distinct embodiments; claim 4 can depend from any one of claim 1, 2, or 3, with these separate dependencies yielding three distinct embodiments; claim 5 can depend from any one of claim 1, 2, 3, or 4, with these separate dependencies yielding four distinct embodiments; and so on.
Recitation in the claims of the term “first” with respect to a feature or element does not necessarily imply the existence of a second or additional such feature or element. Elements specifically recited in means-plus-function format, if any, are intended to be construed to cover the corresponding structure, material, or acts described herein and equivalents thereof in accordance with 35 U.S.C. § 112(f). Embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows.
Number | Name | Date | Kind |
---|---|---|---|
3819971 | Kaplan | Jun 1974 | A |
4870671 | Hershyn | Sep 1989 | A |
6393099 | Miller | May 2002 | B1 |
6690765 | Miller | Feb 2004 | B1 |
9941092 | Greenland et al. | Apr 2018 | B2 |
20160163497 | Greenland | Jun 2016 | A1 |
Number | Date | Country |
---|---|---|
2001-148226 | May 2001 | JP |
2005-190877 | Jul 2005 | JP |
2016-111019 | Jun 2016 | JP |
Entry |
---|
Japanese Patent Application No. 2020-141130, Notice of Reasons for Rejection, dated Aug. 3, 2021. |
Japanese Patent Application No. 2020-141130, Notice of Reasons for Rejection (translation), dated Aug. 3, 2021. |
Japanese Patent Application No. 2020-141130, Search Report, dated Jun. 23, 2021. |
Japanese Patent Application No. 2020-141130, Search Report (translation), dated Jun. 23 2021. |
Japanese Patent Application No. 2020-141130, Written Opinion, dated Jan. 4, 2022. |
Japanese Patent Application No. 2020-141130, Written Opinion (translation), dated Jan. 4, 2022. |
Japanese Patent Application No. 2020-141130, Written Amendment dated Jan. 4, 2022. |
Japanese Patent Application No. 2020-141130, Written Amendment (translation), dated Jan. 4, 2022. |
Japanese Patent Application No. 2020-141130, Decision to Grant, dated Apr. 5, 2022. |
Japanese Patent Application No. 2020-141130, Decision to Grant (translation), dated Apr. 5, 2022. |
Number | Date | Country | |
---|---|---|---|
62890581 | Aug 2019 | US |