ANTI-DRY HEATING METHOD, ATOMIZATION DRIVING CIRCUIT, ELECTRONIC ATOMIZATION APPARATUS, AND RELATED APPARATUS

Abstract

An anti-dry heating method for an electronic atomization apparatus includes: obtaining a first temperature change parameter corresponding to an atomization element within a suction time period, and obtaining a first overtemperature threshold corresponding to the atomization element, the first temperature change parameter being related to a temperature change trend of the atomization element within the suction time period; and performing a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.

Description

CROSS-REFERENCE TO PRIOR APPLICATION

Priority is claimed to Chinese Patent Application No. 202311516271.8, filed on Nov. 13, 2023, the entire disclosure of which is hereby incorporated by reference herein.

FIELD

This application relates to the field of atomization technologies, and in particular, to an anti-dry heating method, an atomization driving circuit, an electronic atomization apparatus, and a related apparatus.

BACKGROUND

An electronic atomization apparatus generally includes an atomizer and a power supply. The power supply is configured to provide electric energy for the atomizer. The atomizer is configured to heat an atomizable medium to produce an aerosol that may be used by a user. The electronic atomization apparatus may be widely applied to fields such as medical treatment, beauty treatment, and recreational smoking.

However, during atomization of an existing low-cost electronic atomization apparatus, since no detection apparatus such as a temperature sensor is arranged, effective detection cannot be performed due to an excessively high temperature in the atomizer as a result of poor liquid guiding of the atomizable medium, exhaustion of the atomizable medium, or the like. Therefore, components in the atomizer that are not resistant to high temperatures and impurities in the atomizable medium are easily damaged and pyrolyzed at high temperatures, so as not to produce a peculiar smell or a harmful gas to affect user experience.

SUMMARY

In an embodiment, the present invention provides an anti-dry heating method for an electronic atomization apparatus, the method comprising: obtaining a first temperature change parameter corresponding to an atomization element within a suction time period, and obtaining a first overtemperature threshold corresponding to the atomization element, the first temperature change parameter being related to a temperature change trend of the atomization element within the suction time period; and performing a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.

BRIEF DESCRIPTION OF THE DRAWINGS

Subject matter of the present disclosure will be described in even greater detail below based on the exemplary figures. All features described and/or illustrated herein can be used alone or combined in different combinations. The features and advantages of various embodiments will become apparent by reading the following detailed description with reference to the attached drawings, which illustrate the following:

FIG. 1 is a schematic flowchart of an embodiment of an anti-dry heating method according to this application.

FIG. 2 is a schematic flowchart of an embodiment of obtaining a first temperature change parameter corresponding to an atomization element within a suction time period in step S1 in FIG. 1.

FIG. 3 is a schematic flowchart of an embodiment of obtaining a second detection reference value corresponding to an atomization element within a suction learning time period in step S12 in FIG. 2.

FIG. 4 is a schematic flowchart of an embodiment before step S1 in FIG. 1.

FIG. 5 is a schematic flowchart of an embodiment of determining whether an atomizer is an empty atomizer in step S01 in FIG. 4.

FIG. 6 is a schematic flowchart of an embodiment of determining a second temperature change parameter corresponding to an atomization element within a suction learning time period in step S014 in FIG. 5.

FIG. 7 is a schematic flowchart of an embodiment of determining a second overtemperature determining parameter corresponding to an atomization element within a suction learning time period in step S014 in FIG. 5.

FIG. 8 is a schematic flowchart of an embodiment after a second detection reference value corresponding to an atomization element obtained within a suction learning time period in FIG. 2.

FIG. 9 is a schematic flowchart of an embodiment prior to use of an electronic atomization apparatus.

FIG. 10 is a schematic flowchart of an embodiment of step S001 in FIG. 9.

FIG. 11 is a structural block diagram of an embodiment of an atomization driving circuit according to this application.

FIG. 12 is a structural block diagram of another embodiment of an atomization driving circuit according to this application.

FIG. 13 is a schematic diagram of a circuit structure of an embodiment of an atomization driving circuit according to this application.

FIG. 14 is a schematic structural diagram of an embodiment of an electronic atomization apparatus according to this application.

FIG. 15 is a schematic diagram of a module of an embodiment of a computer-readable storage medium according to this application.

DETAILED DESCRIPTION

In an embodiment, the present invention provides an anti-dry heating method, an atomization driving circuit, an electronic atomization apparatus, and a related apparatus, which can resolve a problem that a low-cost electronic atomization apparatus cannot effectively detect an excessive temperature in an atomizer.

To resolve the foregoing problem, a technical solution provided in this application is as follows. An anti-dry heating method for an electronic atomization apparatus is provided. The method includes: obtaining a first temperature change parameter corresponding to an atomization element within a suction time period, and obtaining a first overtemperature threshold corresponding to the atomization element, where the first temperature change parameter is related to a temperature change trend of the atomization element within the suction time period; and performing a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.

In an embodiment, the obtaining a first temperature change parameter corresponding to an atomization element within a suction time period includes: obtaining a first detection value corresponding to the atomization element at a first moment within a current suction time period, obtaining a second detection value corresponding to the atomization element at a second moment within the current suction time period, and determining a first detection reference value corresponding to the atomization element within the current suction time period based on the first detection value and the second detection value; and obtaining a second detection reference value corresponding to the atomization element within a suction learning time period, and determining the first temperature change parameter corresponding to the atomization element within the current suction time period based on the first detection reference value and the second detection reference value, where the suction learning time period is located before the suction time period.

In an embodiment, the obtaining a second detection reference value corresponding to the atomization element within a suction learning time period includes: obtaining, in response to a quantity of a first quantity of reference suction time periods within the suction learning time period being greater than a first threshold, a first quantity of second detection reference values corresponding to the atomization element within the first quantity of reference suction time periods; and selecting, from the first quantity of second detection reference values, a second quantity of relatively large second detection reference values, calculating a first average value, and using the first average value as the second detection reference value corresponding to the atomization element within the suction learning time period, where the second quantity is less than or equal to the first quantity.

In an embodiment, the obtaining the second detection reference value corresponding to the atomization element within each of the reference suction time periods includes: obtaining a third detection value corresponding to the atomization element at a third moment within each reference suction time period, obtaining a fourth detection value corresponding to the atomization element at a fourth moment within each reference suction time period, and determining the second detection reference value corresponding to the atomization element within each reference suction time period based on the third detection value and the fourth detection value.

In an embodiment, before the obtaining a first temperature change parameter corresponding to an atomization element within a suction time period, and obtaining a first overtemperature threshold corresponding to the atomization element, the method further includes: detecting whether an atomizable medium exists in an atomizer in the electronic atomization apparatus; and performing a corresponding operation in response to no atomizable medium existing in the atomizer.

In an embodiment, the detecting whether an atomizable medium exists in an atomizer in the electronic atomization apparatus includes: obtaining a fifth detection value corresponding to a fifth moment within a suction triggering time period and a sixth detection value corresponding to a sixth moment within the suction triggering time period, where the suction triggering time period is located before the suction learning time period; determining a first overtemperature determining parameter corresponding to the atomization element within the suction triggering time period based on the fifth detection value and the sixth detection value; and determining, in response to the first overtemperature determining parameter corresponding to the atomization element being greater than a second overtemperature threshold within the suction triggering time period, that no atomizable medium exists in the atomizer.

In an embodiment, the detecting whether an atomizable medium exists in an atomizer in the electronic atomization apparatus further includes: determining, in response to the atomizable medium existing in the atomizer and a quantity of the first quantity of reference suction time periods being less than or equal to a first threshold, whether a second temperature change parameter corresponding to the atomization element within the suction learning time period is greater than the first overtemperature threshold, and determining whether a second overtemperature determining parameter corresponding to the atomization element within the suction learning time period is greater than a third overtemperature threshold; and determining, in response to the second temperature change parameter corresponding to the atomization element within the suction learning time period being greater than the first overtemperature threshold, and the second overtemperature determining parameter corresponding to the atomization element within the suction learning time period being greater than the third overtemperature threshold, that the atomizable medium exists in the atomizer and is consumed within the suction learning time period.

In an embodiment, the determining a second temperature change parameter corresponding to the atomization element within the suction learning time period includes: obtaining a first quantity of third detection reference values corresponding to the atomization element within the first quantity of reference suction time periods within the suction learning time period; selecting, from the first quantity of third detection reference values, a maximum of the third detection reference values as the third detection reference value corresponding to the atomization element within the suction learning time period; obtaining a seventh detection value corresponding to the atomization element at a seventh moment within a current reference suction time period and an eighth detection value corresponding to the atomization element at an eighth moment within the current reference suction time period, and determining a fourth detection reference value corresponding to the atomization element within a current suction learning time period based on the seventh detection value and the eighth detection value; and determining the second temperature change parameter corresponding to the atomization element within the suction learning time period based on the third detection reference value and the fourth detection reference value.

In an embodiment, the determining a second overtemperature determining parameter corresponding to the atomization element within the suction learning time period includes: obtaining a temperature corresponding to the atomization element at a different moment within one of the reference suction time periods within the suction learning time period; and determining the second overtemperature determining parameter corresponding to the atomization element within the suction learning time period based on the temperature corresponding to the atomization element at the different moment.

In an embodiment, after the obtaining a second detection reference value corresponding to the atomization element within a suction learning time period, the method further includes: using the second detection reference value corresponding to the atomization element obtained within the suction learning time period as a current second detection reference value; and calculating, in response to a difference between an initial resistance value of the atomization element that is sampled and a minimum resistance value of the atomization element that is obtained within the current suction time period being greater than a second threshold, a second average value of the current second detection reference value and the second detection reference value of the atomization element within the current suction time period, and using the second average value as the second detection reference value within a next suction time period.

In an embodiment, before the electronic atomization apparatus is used, the method further includes: detecting whether the atomizer in the electronic atomization apparatus is reliably connected to a power supply; and obtaining the first temperature change parameter corresponding to the atomization element within the suction time period in response to the atomizer being reliably connected to the power supply.

In an embodiment, the detecting whether the atomizer in the electronic atomization apparatus is reliably connected to a power supply includes: connecting the atomizer to the power supply, and sampling a resistance value of the atomization element in the atomizer, so as to obtain a detection value corresponding to the resistance value of the atomization element; and calculating a third average value of a third quantity of detection values that are obtained, and determining, in response to a difference between each of the third quantity of detection values that are obtained and the third average value being less than or equal to a third threshold, that the atomizer is reliably connected to the power supply.

In an embodiment, in response to the difference between at least one of the third quantity of detection values that are obtained the first time and the third average value being greater than the third threshold, and a number of times a difference between at least one of the third quantity of detection values that are subsequently obtained each time and the third average value corresponding to the at least one detection value is greater than the third threshold being greater than a fourth threshold, it is determined that the atomizer is unreliably connected to the power supply.

In an embodiment, before the sampling a resistance value of the atomization element in the atomizer, the method further includes: connecting the atomizer to the power supply, waiting for a first preset time, and sampling the resistance value of the atomization element in the atomizer after the first preset time.

To resolve the foregoing problem, another technical solution provided in this application is as follows. An atomization driving circuit is provided, which is configured for an electronic atomization apparatus and includes: a driving module, including an atomization element, where the driving module is configured to heat an atomizable medium; and a control module, connected to the driving module and configured to obtain a first temperature change parameter corresponding to an atomization element within a suction time period, and obtain a first overtemperature threshold corresponding to the atomization element, where the control module is further configured to perform a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.

In an embodiment, the control module includes a collection module and a control chip. The collection module is configured to collect a first detection value corresponding to the atomization element at a first moment within a current suction time period, and collect a second detection value corresponding to the atomization element at a second moment within the current suction time period, and the control chip is configured to determine a first detection reference value corresponding to the atomization element within the current suction time period based on the first detection value and the second detection value. The collection module is further configured to collect a third detection value corresponding to the atomization element at a third moment within each reference suction time period, and obtain a fourth detection value corresponding to the atomization element at a fourth moment within each reference suction time period, and the control chip is configured to determine a second detection reference value corresponding to the atomization element within each reference suction time period based on the third detection value and the fourth detection value. The control chip is further configured to determine the first temperature change parameter corresponding to the atomization element within the suction time period based on the first detection reference value and the second detection reference value corresponding to the atomization element within a suction learning time period, where the suction learning time period is located before the suction time period, and the second detection reference value corresponding to the atomization element within the suction learning time period is determined based on the second detection reference value corresponding to the atomization element within each reference suction time period.

To resolve the foregoing problem, still another technical solution provided in this application is as follows. An electronic atomization apparatus is provided, including a memory and a processor. The memory stores program instructions therein, and the processor retrieves the program instructions from the memory to perform the anti-dry heating method according to any one of the above embodiments.

To resolve the foregoing problem, still another technical solution provided in this application is as follows. A computer-readable storage medium is provided. The computer-readable storage medium is configured to store a control program. The control program, when executed by a processor, is configured to implement the anti-dry heating method according to any one of the above embodiments.

Different from the prior art, the beneficial effect of this application is that according to the anti-dry heating method provided in this application, the first temperature change parameter corresponding to the atomization element within the suction time period is obtained, and the first overtemperature threshold corresponding to the atomization element is obtained. The first temperature change parameter is related to a temperature change trend of the atomization element within the suction time period. In response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period, it is determined that the atomization element has a tendency of dry heating, and a corresponding operation is accordingly performed. For example, power output to the atomization element is reduced or stopped, and an alarm is given, to avoid a problem of dry heating of the atomization element and improve user experience.

Technical solutions in embodiments of this application are clearly and completely described below with reference to accompanying drawings in the embodiments of this application. Apparently, the described embodiments are merely some rather than all of the embodiments of this application. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments of this application without creative efforts shall fall within the protection scope of this application.

Terms “first”, “second”, “third”, and “fourth” in this application are merely intended for the purpose of description, and shall not be understood as an indication or implication of relative importance or implicit indication of a quantity of indicated technical features. Therefore, features defined with “first”, “second”, “third”, and “fourth” may explicitly or implicitly include at least one of the features. In description of this application, “a plurality of” means at least two, such as two and three, unless otherwise specifically defined. All directional indications (for example, up, down, a first direction, and a second direction) in the embodiments of this application are only used for explaining relative position relationships, movement situations, or the like among the various components in a specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indications change accordingly. In addition, terms “include”, “have”, and any variant thereof are intended to cover a non-exclusive inclusion.

The “embodiment” mentioned in the specification means that particular features, structures, or characteristics described with reference to the embodiments may be included in at least one embodiment of this application. The phrase appearing at various locations in this specification does not necessarily refer to a same embodiment, and is not an independent or alternative embodiment mutually exclusive of another embodiment. A person skilled in the art explicitly or implicitly understands that the embodiments described in the specification may be combined with other embodiments.

To improve market competitiveness, some existing manufacturers provide a low-cost electronic atomization apparatus. For example, costs of the apparatus are saved to some extent by removing a detection element such as a temperature sensor in an apparatus, thereby reducing a selling price, which helps improve the market competitiveness.

However, since the detection element such as the temperature sensor is removed from the low-cost electronic atomization apparatus, effective detection cannot be performed due to an excessively high temperature in the atomizer as a result of poor liquid guiding of the atomizable medium, exhaustion of the atomizable medium, or the like. Therefore, components in the atomizer that are not resistant to high temperatures and impurities in the atomizable medium are easily damaged and pyrolyzed at high temperatures, so as not to produce a peculiar smell or a harmful gas to affect user experience.

To resolve the problem, this application provides an anti-dry heating method for an electronic atomization apparatus. According to the method, anti-dry heating detection of the electronic atomization apparatus may be implemented without arranging a detection element such as a temperature sensor in the apparatus, thereby improving user experience.

This application is described in detail below with reference to the accompanying drawings and the embodiments.

Referring to FIG. 1, FIG. 1 is a schematic flowchart of an embodiment of an anti-dry heating method according to this application. The anti-dry heating method provided in this application includes the following steps.

Step S1: Obtain a first temperature change parameter ΔdK1 corresponding to an atomization element within a suction time period, and obtain a first overtemperature threshold ΔdKx corresponding to the atomization element.

Specifically, an electronic atomization apparatus generally includes an atomizer and a power supply. The power supply is configured to provide electric energy to the atomizer. The atomization element is arranged in the atomizer. The atomization element is configured to heat an atomizable medium stored in the atomizer under a power-on condition to produce an aerosol that may be used by a user.

A suction process is characterized as a suction time period. The first temperature change parameter ΔdK1 is related to a temperature change trend of the atomization element within the suction time period. The first overtemperature threshold ΔdKx is a threshold for determining whether dry heating (overtemperature) occurs in the atomization element within the suction time period. The first overtemperature threshold ΔdKx may be obtained in advance through experiments.

Step S2: Perform a corresponding operation in response to the first temperature change parameter ΔdK1 being greater than the first overtemperature threshold ΔdKx within the suction time period.

Specifically, in response to the first temperature change parameter ΔdK1 being greater than the first overtemperature threshold ΔdKx within the suction time period, it indicates that the atomization element has a tendency of dry heating, or a situation of dry heating has occurred within the suction time period. Therefore, the corresponding operation needs to be performed on the atomizer. For example, output power of the power supply to the atomizer is reduced, and power output of the power supply to the atomizer is stopped. In addition, an alarm may also be given. An alarm, including but not limited to an acousto-optic alarm, a vibrating alarm, or the like, may be given to alert the user, thereby preventing components in the atomizer that are not resistant to high temperatures and impurities in the atomizable medium from being damaged and pyrolyzed at high temperatures as a result of dry heating (overtemperature) of the atomizer, so as not to produce a peculiar smell or a harmful gas to affect user experience.

Certainly, in response to the first temperature change parameter ΔdK1 being less than or equal to the first overtemperature threshold ΔdKx within the suction time period, it indicates that the atomization element has no tendency of dry heating within the suction time period, and may be normally atomized. Therefore, the power supply may normally output power to the atomization element.

Referring to FIG. 2, FIG. 2 is a schematic flowchart of an embodiment of obtaining a first temperature change parameter corresponding to an atomization element within a suction time period in step S1 in FIG. 1. In an embodiment, the obtaining a first temperature change parameter ΔdK1 corresponding to an atomization element within a suction time period includes the following steps.

Step S11: Obtain a first detection value ADC1 corresponding to the atomization element at a first moment within a current suction time period, obtain a second detection value ADC2 corresponding to the atomization element at a second moment within the current suction time period, and determine a first detection reference value dK1 corresponding to the atomization element within the current suction time period based on the first detection value ADC1 and the second detection value ADC2.

Specifically, in a circuit system composed of an atomizer and a power supply, the circuit system is designed with a resistance detection circuit. Calculation of a resistance value of the atomization element satisfies Rx=R0+K*ADC, where Rx is a current resistance value of the atomization element, R0 is an initial resistance value of the atomization element, and K is a coefficient determined by an actual circuit. Value ranges and types of R0 and K are not limited, and ADC is a detection value obtained during resistance sampling.

In addition, according to the characteristic of a temperature coefficient of resistance (TCR) of a resistor, the resistance value of the atomization element satisfies the following resistance calculation within the suction time period:

Current resistance=(current temperature−initial temperature)*initial resistance value*TCR coefficient+initial resistance value.

The current resistance value is set to Rx, the current temperature is set to Tx, the initial resistance value is set to R0, the initial temperature is set to T0, and the conversion is as follows:

$\mathrm{Rx}=\left(\mathrm{Tx}-T0\right)*R0*\mathrm{TCR}+R0,\mathrm{and}\mathrm{Tx}=\left(Rx-R0\right)/\mathrm{TCR}/R0+T0.$

Therefore, Rx=R0+K*ADC=(Tx−T0)*R0*TCR+R0 is obtained.

Based on the foregoing calculation principle, for example, within the current suction time period, a resistance value being R1 and a temperature being T1 at a first moment t1 are obtained, a corresponding detection value ADC is the first detection value ADC1, a resistance value being R2 and a temperature being T2 at a second moment t2 are obtained, and the corresponding detection value ADC is the second detection value ADC2, where the second moment t2 is located after the first moment t1.

The following expressions are obtained based on Rx=R0+K*ADCx=(Tx−T0)*R0*TCR+R0.

$\begin{array}{cc}R1=\left(T1-T0\right)*R0*\mathrm{TCR}+R0=R0+K*\mathrm{ADC}1;& \mathrm{Expression}1\end{array}$ $\begin{array}{cc}R2=\left(T2-T0\right)*R0*\mathrm{TCR}+R0=R0+K*\mathrm{ADC}2;& \mathrm{Expression}2\end{array}$

• • the first detection reference value dK1 is obtained by subtracting Expression 1 from Expression 2:

$\begin{array}{cc}\mathrm{dK}1=R2-R1=\left(T2-T1\right)*R0*\mathrm{TCR}=K*\left(\mathrm{ADC}2-\mathrm{ADC}1\right).& \mathrm{Expression}3\end{array}$

It may be obtained based on Expression 3 that as long as the first detection value ADC1 corresponding to the atomization element at the first moment t1 within the current suction time period and the second detection value ADC2 corresponding to the atomization element at the second moment t2 within the current suction time period are obtained, the first detection reference value dK1 corresponding to the atomization element within the current suction time period is determined based on the first detection value ADC1 and the second detection value ADC2.

Step S12: Determine the first temperature change parameter ΔdK1 corresponding to the atomization element within the current suction time period based on the first detection reference value dK1 and a second detection reference value dK2 corresponding to the atomization element obtained within the suction learning time period.

The second detection reference value dK2 has a learning process. Specifically, a plurality of suction behaviors of a user are divided into at least two stages: the suction learning time period and the suction time period. The suction learning time period is located before the suction time period, and is configured for obtaining the second detection reference value dK2.

Referring to FIG. 3, FIG. 3 is a schematic flowchart of an embodiment of obtaining a second detection reference value corresponding to an atomization element within a suction learning time period in step S12 in FIG. 2. In an embodiment, the obtaining a second detection reference value dK2 corresponding to an atomization element within a suction learning time period includes the following steps.

Step 121: Obtain, in response to a quantity of a first quantity of reference suction time periods within the suction learning time period being greater than a first threshold X1, a first quantity of second detection reference values dK2 corresponding to the atomization element within the first quantity of reference suction time periods.

Specifically, the suction learning time period includes the first quantity of reference suction time periods. Each reference suction time period represents a suction process. It may be understood that, if the quantity of the first quantity of reference suction time periods within the suction learning time period is less than or equal to a set first threshold X1, it represents that a learning specimen within the suction learning time period cannot achieve a learning objective. If the quantity of the first quantity of reference suction time periods within the suction learning time period is greater than the set first threshold X1, it represents that the learning specimen within the suction learning time period can achieve the learning objective. Then the first quantity of second detection reference values dK2 corresponding to the atomization element within the first quantity of reference suction time periods are obtained, to determine the second detection reference values dK2 corresponding to the atomization element within the suction learning time period.

In an embodiment, if a duration of the reference suction time period is less than a preset duration, it is considered that the reference suction time period is invalid and the learning objective cannot be achieved.

In an embodiment, a manner of determining the second detection reference value dK2 corresponding to the atomization element within the suction learning time period is substantially the same as the above manner of obtaining the first detection reference value dK1 corresponding to the atomization element within the suction time period, and specifically includes:

• • obtaining a third detection value ADC3 corresponding to the atomization element at a third moment within each reference suction time period, obtaining a fourth detection value ADC4 corresponding to the atomization element at a fourth moment within each reference suction time period, and determining the second detection reference value dK2 corresponding to the atomization element within each reference suction time period based on the third detection value ADC3 and the fourth detection value ADC4.

It should be noted that, in this step, each reference suction time period is an effective suction time period.

A reference suction time period is used as an example. Within the reference suction time period, a resistance value being R3 and a temperature being T3 at a third moment t3 are obtained, a corresponding detection value ADC is the third detection value ADC3, a resistance value being R4 and a temperature being T4 at a fourth moment t4 are obtained, and the corresponding detection value ADC is the fourth detection value ADC4. The fourth moment t4 is located after the third moment t3.

The following expressions are obtained based on Rx=R0+K*ADCx=(Tx−T0)*R0*TCR+R0.

$\begin{array}{cc}R3=\left(T3-T0\right)*R0*\mathrm{TCR}+R0=R0+K*\mathrm{ADC}3;& \mathrm{Expression}4\end{array}$ $\begin{array}{cc}R4=\left(T4-T0\right)*R0*\mathrm{TCR}+R0=R0+K*\mathrm{ADC}4;& \mathrm{Expression}5\end{array}$

• • the second detection reference value dK2 is obtained by subtracting Expression 4 from Expression 5:

$\begin{array}{cc}\mathrm{dK}2=R4-R3=\left(T4-T3\right)*R0*\mathrm{TCR}=K*\left(\mathrm{ADC}4-\mathrm{ADC}3\right).& \mathrm{Expression}6\end{array}$

It may be obtained based on Expression 6 that as long as the third detection value ADC3 corresponding to the atomization element at the third moment t3 within each reference suction time period and the fourth detection value ADC4 corresponding to the atomization element at the fourth moment t4 within each reference suction time period are obtained, the second detection reference value dK2 corresponding to the atomization element within each reference suction time period is determined based on the third detection value ADC3 and the fourth detection value ADC4.

Step 122: Select, from the first quantity of second detection reference values dK2, a second quantity of relatively large second detection reference values dK2, calculate a first average value, and use the first average value as the second detection reference value dK2, where the second quantity is less than or equal to the first quantity.

Specifically, the first quantity of second detection reference values dK2 that are obtained are arranged in ascending order or in descending order. Then a maximum of the second quantity of second detection reference values dK2 is successively selected, an average value of the second quantity of second detection reference values dK2 is calculated as the first average value, and the first average value is used as the second detection reference value dK2 corresponding to the atomization element within the suction learning time period.

Then the first temperature change parameter ΔdK1 corresponding to the atomization element within the current suction time period is determined based on the first detection reference value dK1 corresponding to the atomization element within the current suction time period and the second detection reference value dK2 corresponding to the atomization element within the suction learning time period.

Specifically, the first temperature change parameter ΔdK1 is obtained by Equation 7:

$\begin{array}{cc}\Delta \mathrm{dK}1=\mathrm{dK}1/\mathrm{dK}2=\left(\mathrm{ADC}2-\mathrm{ADC}1\right)/\left(\mathrm{ADC}4-\mathrm{ADC}3\right)=\left(T2-T1\right)/\left(T4-T3\right).& \mathrm{Equation}7\end{array}$

It may be obtained based on Expression 7 that a value of the first temperature change parameter ΔdK1 is independent of a value of the TCR of the atomization element and the initial resistance value of the atomization element, and is not affected by a sampling error caused by a resistance detection circuit and a system error composed of the power supply and the atomizer. Only a change of the resistance value needs to meet a change of ADC collection.

Referring to FIG. 4, FIG. 4 is a schematic flowchart of an embodiment before step S1 in FIG. 1. In an embodiment, before step S1, the method further includes the following steps.

Step S01: Detect whether an atomizable medium exists in an atomizer in an electronic atomization apparatus. Specifically, before a suction time period, overtemperature may occur in two cases. One case is that the atomizer is an empty atomizer without liquid injection, and the other is that the atomizable medium exists in the atomizer, but the atomizable medium is consumed before the end of the suction learning time period.

Step S02: Perform a corresponding operation in response to no atomizable medium existing in the atomizer. In response to the atomizer being the empty atomizer without liquid injection or the atomizable medium being consumed before the end of the suction learning time period, the corresponding operation is performed on the atomizer. For example, output power of the power supply to the atomizer is reduced, and power output of the power supply to the atomizer is stopped. In addition, an alarm may also be given. An alarm, including but not limited to an acousto-optic alarm, a vibrating alarm, or the like, may be given to alert the user, thereby preventing components in the atomizer that are not resistant to high temperatures and impurities in the atomizable medium from being damaged and pyrolyzed at high temperatures as a result of dry heating (overtemperature) of the atomizer, so as not to produce a peculiar smell or a harmful gas to affect user experience.

Referring to FIG. 5, FIG. 5 is a schematic flowchart of an embodiment of determining whether an atomizer is an empty atomizer in step S01 in FIG. 4. In an embodiment, the determining whether an atomizer is an empty atomizer includes the following steps.

Step S011: Obtain a fifth detection value ADC5 corresponding to a fifth moment within a suction triggering time period and a sixth detection value ADC6 corresponding to a sixth moment within the suction triggering time period. The suction triggering time period is located before the reference suction time period, for example, a time period when a user sucks the atomizer first time. Then the fifth detection value ADC5 corresponding to a fifth moment t5 within the suction triggering time period and the sixth detection value ADC6 corresponding to a sixth moment t6 within the suction triggering time period are obtained. The fifth moment t5 precedes the sixth moment t6.

Step S012: Determine a first overtemperature determining parameter ΔdK-1 corresponding to the atomization element within the suction triggering time period based on the fifth detection value ADC5 and the sixth detection value ADC6.

Specifically, the first overtemperature determining parameter ΔdK-1 is obtained based on Equation 8.

$\begin{array}{cc}\Delta dK-1=\mathrm{ADC}6/\mathrm{ADC}5& \mathrm{Equation}8\end{array}$

Step S013: Determine, in response to the first overtemperature determining parameter ΔdK-1 corresponding to the atomization element being greater than a second overtemperature threshold ΔdKy within the suction triggering time period, that no atomizable medium exists in the atomizer.

Specifically, the second overtemperature threshold value ΔdKy is a fixed value, which is configured to determine whether the atomizer is the empty atomizer within the suction triggering time period, which may be determined through experiments.

If the first overtemperature determining parameter ΔdK-1 corresponding to the atomization element is greater than the second overtemperature threshold ΔdKy within the suction triggering time period, it is determined that no atomizable medium exists in the atomizer and the atomizer is an empty atomizer. If the first overtemperature determining parameter ΔdK-1 corresponding to the atomization element is less than or equal to the second overtemperature threshold ΔdKy within the suction triggering time period, it is determined that an atomizable medium exists in the atomizer and the atomizer is not an empty atomizer.

Based on the determining that the atomizer is not the empty atomizer, it further needs to be determined whether the atomizable medium in the atomizer is consumed before the end of the suction learning time period, that is, it is determined whether the atomizer is an atomizer in which the atomizable medium is about to be consumed. The step includes the following step.

Step S014: Determine, in response to the atomizable medium existing in the atomizer and a quantity of a first quantity of reference suction time periods being less than or equal to a first threshold X1, whether a second temperature change parameter ΔdK2 corresponding to the atomization element within the suction learning time period is greater than a first overtemperature threshold ΔdKx, and determine whether a second overtemperature determining parameter ΔdK-2 corresponding to the atomization element within the suction learning time period is greater than a third overtemperature threshold.

Specifically, if the quantity of the first quantity of reference suction time periods within the suction learning time period is less than or equal to the first threshold X1, the first quantity of reference suction time periods is not enough to obtain a temperature change trend corresponding to the atomization element within the suction learning time period due to shortage of specimens. Therefore, in this embodiment, two conditions need to be met to determine whether dry heating occurs within the suction learning time period. The first condition is to determine whether the second temperature change parameter ΔdK2 corresponding to the atomization element within the suction learning time period is greater than the first overtemperature threshold ΔdKx, and the second condition is to determine whether the second overtemperature determining parameter ΔdK-2 corresponding to the atomization element within the suction learning time period is greater than a third overtemperature threshold.

Referring to FIG. 6, FIG. 6 is a schematic flowchart of an embodiment of determining a second temperature change parameter corresponding to an atomization element within a suction learning time period in step S014 in FIG. 5. In an embodiment, the determining a second temperature change parameter ΔdK2 corresponding to an atomization element within a suction learning time period includes the following steps.

Step S0141: Obtain a first quantity of third detection reference values dK3 corresponding to the atomization element within the first quantity of reference suction time periods within the suction learning time period.

Specifically, the third detection reference value dK3 corresponding to the atomization element within each reference suction time period is obtained in the same manner as the foregoing second detection reference value dK2. Details are not described herein.

Step S0142: Select, from the first quantity of third detection reference values dK3, a maximum of the third detection reference values dK3 as the third detection reference value dK3 corresponding to the atomization element within the suction learning time period.

Specifically, the first quantity of third detection reference values dK3 that are obtained are arranged in ascending order or in descending order. Then the maximum of the third detection reference values dK3 is selected as the third detection reference value dK3 corresponding to the atomization element within the suction learning time period.

Step S0143: Obtain a seventh detection value ADC7 corresponding to the atomization element at a seventh moment within a current reference suction time period and an eighth detection value ADC8 corresponding to the atomization element at an eighth moment within the current reference suction time period, and determine a fourth detection reference value dK4 corresponding to the atomization element within the current suction learning time period based on the seventh detection value ADC7 and the eighth detection value ADC8.

Specifically, the seventh detection value ADC7 corresponding to the seventh moment t7 within the current reference suction time period and the eighth detection value ADC8 corresponding to the eighth moment t8 within the suction triggering time period are obtained. The seventh moment t7 precedes the eighth moment t8.

The fourth detection reference value dK4 is obtained based on Equation 9.

$\begin{array}{cc}\mathrm{dK}4=K*\left(\mathrm{ADC}8-\mathrm{ADC}7\right).& \mathrm{Expression}9\end{array}$

Step S0144: Determine the second temperature change parameter ΔdK2 corresponding to the atomization element within the suction learning time period based on the third detection reference value dK3 and the fourth detection reference value dK4.

Specifically, the second temperature change parameter ΔdK2 is obtained based on Equation 10.

$\begin{array}{cc}\Delta dK2=\mathrm{dK}4/\mathrm{dK}3.& \mathrm{Equation}10\end{array}$

The second temperature change parameter ΔdK2 is related to a temperature change trend of the atomization element within the suction learning time period.

Referring to FIG. 7, FIG. 7 is a schematic flowchart of an embodiment of determining a second overtemperature determining parameter corresponding to an atomization element within a suction learning time period in step S014 in FIG. 5. In an embodiment, the step of determining a second overtemperature determining parameter ΔdK-2 corresponding to an atomization element within a suction learning time period includes the following steps.

Step S0145: Obtain a temperature corresponding to the atomization element at a different moment within a reference suction time period within the suction learning time period.

For example, within the reference suction time period, a temperature corresponding to the atomization element at a ninth moment t9, a temperature corresponding to the atomization element at a tenth moment t10, a temperature corresponding to the atomization element at an eleventh moment t11, and a temperature corresponding to the atomization element at a twelfth moment t12 are obtained.

The ninth moment t9 precedes the tenth moment t10, the tenth moment t10 precedes the eleventh moment t11, and the eleventh moment t11 precedes the twelfth moment t12.

The temperature corresponding to the atomization element at a corresponding moment may be determined based on a detection value ADC, an initial resistance value, a TCR coefficient, and the like corresponding to the atomization element at the corresponding moment that are obtained.

Step S0146: Determine the second overtemperature determining parameter ΔdK-2 corresponding to the atomization element within the suction learning time period based on the temperature corresponding to the atomization element at the different moment.

Specifically, the second overtemperature determining parameter ΔdK-2 is obtained based on Equation 11:

$\Delta dK-2=\left(T12-T11\right)/\left(T10-T9\right).$

Step S015: Determine, in response to the second temperature change parameter ΔdK2 corresponding to the atomization element within the suction learning time period being greater than a first overtemperature threshold ΔdKx, and the second overtemperature determining parameter ΔdK-2 corresponding to the atomization element within the suction learning time period being greater than a third overtemperature threshold, that the atomizable medium exists in the atomizer and is consumed within the suction learning time period.

Referring to FIG. 8, FIG. 8 is a schematic flowchart of an embodiment of obtaining a second detection reference value corresponding to an atomization element within a suction learning time period in FIG. 2. In an embodiment, after the obtaining a second detection reference value dK2 corresponding to an atomization element within a suction learning time period, the method further includes the following steps.

Step S123: Use the second detection reference value dK2 corresponding to the atomization element obtained within the suction learning time period as a current second detection reference value dK2.

For example, the second detection reference value dK2 corresponding to the atomization element obtained within the suction learning time period is used as the second detection reference value dK2 within a first suction time period.

Step S124: Calculate, in response to a difference between an initial resistance value of the atomization element that is sampled and a minimum resistance value of the atomization element that is obtained within the current suction time period being greater than a second threshold X2, a second average value of the current second detection reference value dK2 and the second detection reference value dK2 of the atomization element within the current suction time period, and use the second average value as the second detection reference value dK2 within a next suction time period.

Specifically, the minimum resistance value of the atomization element is obtained. After the second detection reference value dK2 is successfully obtained the first time, and after the initial resistance value of the atomization element is less than the minimum resistance value obtained before by a specific value within a subsequent suction time period, the second average value of the current second detection reference value dK2 and the second detection reference value dK2 obtained within the current suction time period is calculated. The second average value is used as the second detection reference value dK2 within the next suction time period. The initial resistance value of the atomization element within the suction time period is updated to a latest minimum resistance value, to implement dynamic correction of the second detection reference value dK2.

Referring to FIG. 9, FIG. 9 is a schematic flowchart of an embodiment prior to use of an electronic atomization apparatus. In an embodiment, before the electronic atomization apparatus is used, for example, before a user triggers a suction behavior, the method further includes the following steps.

Step S001: Detect whether an atomizer in the electronic atomization apparatus is reliably connected to a power supply.

Referring to FIG. 10, FIG. 10 is a schematic flowchart of an embodiment of step S001 in FIG. 9. In an embodiment, step S001 includes the following steps.

Step S0011: Connect the atomizer to the power supply, and sample a resistance value of the atomization element in the atomizer, so as to obtain a detection value ADC corresponding to the resistance value of the atomization element.

Specifically, after the atomizer is connected to the power supply, the resistance value of the atomization element is sampled based on a preset collection frequency, thereby obtaining the detection values ADC corresponding to resistance values of a plurality of atomization elements based on a preset frequency.

Step S0012: Calculate a third average value of a third quantity of detection values ADC that are obtained, and determine, in response to a difference between each of the third quantity of detection values ADC that are obtained and the third average value being less than or equal to a third threshold X3, that the atomizer is reliably connected to the power supply.

Specifically, after the detection values ADC corresponding to the resistance values of the plurality of atomization elements are obtained, the third average value of the third quantity of detection values ADC that are finally obtained is calculated.

If the difference between each of the third quantity of detection values ADC that are obtained and the third average value is less than or equal to the third threshold X3, it is determined that the atomizer is reliably connected to the power supply.

Step S002: Obtain a first temperature change parameter ΔdK1 corresponding to the atomization element within the suction time period in response to the atomizer being reliably connected to the power supply.

In an embodiment, to avoid a system error, this embodiment further includes: determining, in response to the difference between at least one of the third quantity of detection values ADC that are obtained the first time and the third average value being greater than the third threshold X3, and a number of times a difference between at least one of the third quantity of detection values ADC that are subsequently obtained each time and the third average value corresponding to the at least one detection value is greater than the third threshold X3 being greater than a fourth threshold X4, that the atomizer is unreliably connected to the power supply.

Specifically, if the difference between any one of the third quantity of detection values ADC that are obtained the first time and the calculated third average value of the detection values is greater than the third threshold X3, a third quantity of consecutive detection values ADC among the detection values ADC that are subsequently obtained a plurality of times are considered as a group. A third average value corresponding to each group is calculated. If a difference between at least one detection value ADC in each group and a third average value corresponding to the at least one detection value is greater than the third threshold X3, and a group quantity for a plurality of groups of third quantities of detection values ADC is greater than the fourth threshold X4, it is determined that the atomizer is unreliably connected to the power supply. In this case, subsequent anti-dry heating detection cannot be performed, and the user needs to reinstall the atomizer or perform corresponding connection trouble removal.

In an embodiment, before the sampling a resistance value of the atomization element in the atomizer, the method further includes: connecting the atomizer to the power supply, waiting for a first preset time, and sampling the resistance value of the atomization element in the atomizer after the first preset time.

Specifically, an objective of waiting for the first preset time is to avoid a parameter fluctuation when the atomizer is just plugged into the power supply, so as to avoid affecting accuracy of resistance sampling. In addition, waiting for the first preset time may prevent impact of a residual temperature of the atomizer on detection of the resistance value.

Specifically, according to the anti-dry heating method provided in this application, the first temperature change parameter ΔdK1 corresponding to the atomization element within the suction time period is obtained, and the first overtemperature threshold ΔdKx corresponding to the atomization element is obtained. In response to the first temperature change parameter ΔdK1 being greater than the first overtemperature threshold ΔdKx within the suction time period, it is determined that the atomization element has a tendency of dry heating, and a corresponding operation is accordingly performed. For example, power output to the atomization element is reduced or stopped, and an alarm is given, to avoid a problem of dry heating of the atomization element in a low-cost atomizer and improve user experience.

Referring to FIG. 11, FIG. 11 is a structural block diagram of an embodiment of an atomization driving circuit according to this application. This application further provides an atomization driving circuit 100 for an electronic atomization apparatus, including a driving module 10 and a control module 20.

The driving module 10 includes an atomization element. The atomization element is configured to heat an atomizable medium. The control module 20 is connected to the driving module 10, and is configured to obtain a first temperature change parameter ΔdK1 corresponding to an atomization element within a suction time period, and obtain a first overtemperature threshold ΔdKx corresponding to the atomization element. The control module 20 is further configured to perform a corresponding operation in response to the first temperature change parameter ΔdK1 being greater than the first overtemperature threshold ΔdKx within the suction time period.

For the obtaining the first temperature change parameter ΔdK1 corresponding to the atomization element within the suction time period by the control module 20, reference may be made to the method for obtaining the first temperature change parameter ΔdK1 corresponding to the atomization element within the suction time period provided in any one of the foregoing embodiments of the anti-dry heating method.

Referring to FIG. 12, FIG. 12 is a structural block diagram of another embodiment of an atomization driving circuit according to this application. In an embodiment, the control module 20 includes a collection module 21 and a control chip 22.

The collection module 21 is provided with a resistance detection circuit, and is configured to collect a first detection value ADC1 corresponding to an atomization element at a first moment within a current suction time period and a second detection value ADC2 corresponding to the atomization element at a second moment within the current suction time period. The control chip 22 is configured to determine a first detection reference value dK1 corresponding to the atomization element within the current suction time period based on the first detection value ADC1 and the second detection value ADC2.

The collection module 21 is further configured to collect a third detection value ADC3 corresponding to the atomization element at a third moment within each reference suction time period, and obtain a fourth detection value ADC4 corresponding to the atomization element at a fourth moment within each reference suction time period. The control chip 22 is configured to determine a second detection reference value dK2 corresponding to the atomization element within each reference suction time period based on the third detection value ADC3 and the fourth detection value ADC4. The reference suction time period is located before the suction time period.

The control chip 22 is further configured to determine a first temperature change parameter ΔdK1 corresponding to the atomization element within the suction time period based on the first detection reference value dK1 and the second detection reference value dK2 corresponding to the atomization element within a suction learning time period. The reference suction time period is located within the suction time period, and the suction learning time period is located before the suction time period. The second detection reference value dK2 corresponding to the atomization element within the suction learning time period is determined based on the second detection reference value dK2 corresponding to the atomization element within each reference suction time period.

Specifically, in the atomization driving circuit 100 provided in this application, the control module 20 is configured to obtain the first temperature change parameter ΔdK1 corresponding to the atomization element within the suction time period through the collection module 21, and obtain a first overtemperature threshold ΔdKx corresponding to the atomization element. In response to the first temperature change parameter ΔdK1 being greater than the first overtemperature threshold ΔdKx within the suction time period, it is determined that the atomization element has a tendency of dry heating, and a corresponding operation is accordingly performed. For example, power output to the atomization element is reduced or stopped, and an alarm is given, to avoid a problem of dry heating of the atomization element in a low-cost atomizer and improve user experience.

Referring to FIG. 13, FIG. 13 is a schematic diagram of a circuit structure of an embodiment of an atomization driving circuit according to this application. In an embodiment, a driving module 10 includes a first switch Q1, an atomization element R, and a first resistor R1. A collection module 21 includes a second switch Q2, a comparator A, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a seventh resistor R7, an eighth resistor R8, and a ninth resistor R9.

A first path end of the first switch Q1, a first path end of the second switch Q2, a first end of the first resistor R1, and a first end of the second resistor R2 are connected to an output terminal VCC BAT of a power supply. A second end of the first switch Q1 is connected to a first end of the atomization element R. A second end of the atomization element R is grounded. A second end of the first resistor R1 and a control terminal of the first switch Q1 are connected to a power output port PWM HEAT of the control chip 22. A second end of the second resistor R2 and a control terminal of the second switch Q2 are connected to a switch reset port RES CHECK of the control chip 22. A second path end of the second switch Q2 is connected to a first end of the third resistor R3. A second end of the third resistor R3 is connected to a first end of the fourth resistor R4 and the first end of the atomization element R. A second end of the fourth resistor R4 is connected to a first input terminal of the comparator A. A second input terminal of an amplifier is connected to a first end of the fifth resistor R5 and a first end of the ninth resistor R9. An output terminal of the amplifier is connected to a second end of the ninth resistor R9 and a first end of the eighth resistor R8. A second end of the eighth resistor R8 is connected to a resistance detection port ADC of the control chip 22. A second end of the fifth resistor R5 is connected to a first end of the sixth resistor R6 and a first end of the seventh resistor R7. A second end of the sixth resistor R6 and a second end of the seventh resistor R7 are grounded.

In an embodiment, the atomization driving circuit 100 further includes a fault detection module 30. Specifically, the fault detection module 30 is configured to detect whether a short-circuit fault occurs in the atomization element R during heating. In an embodiment, the fault detection module 30 includes a tenth resistor R10. A first end of the tenth resistor R10 is connected to a fault detection port HETA V of the control chip 22, and a second end of the tenth resistor R10 is connected to the first end of the atomization element R.

Referring to FIG. 14, FIG. 14 is a schematic structural diagram of an embodiment of an electronic atomization apparatus according to this application. An electronic atomization apparatus 200 includes a memory 201 and a processor 202. The memory 201 has program instructions stored therein. The processor 202 invokes the program instructions from the memory 201 to perform the anti-dry heating method provided in any one of the foregoing embodiments.

The processor 202 may be further referred to as a central processing unit (CPU). The processor 202 may be an integrated circuit chip and has a signal processing capability. The processor 202 may further be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA) or another programmable logic device, a discrete gate or a transistor logic device, or a discrete hardware component. The general-purpose processor may be a microprocessor, or the processor 202 may also be any conventional processor, or the like. The memory 201 may be a memory stick, a TF card, or the like, and may store all information in an electronic device of a device, including input original data, a computer program, an intermediate running result, and a final running result, all of which are stored in the memory 201. The memory stores and retrieves the information based on a location specified by a controller. With the memory 201, the electronic device has a memory function to ensure normal operation. The memory 201 of the electronic device may be divided into a main memory (internal memory) and an auxiliary memory (external memory) according to the use, and may also be classified into an external storage and an internal storage. The external memory is usually a magnetic medium, an optical disk, or the like, which can store information for a long time. The internal memory refers to a storage component on a mainboard, which is configured to store data and programs that are being executed currently, but merely configured to store the programs and the data temporarily. The data is lost when the power is turned off or a power failure occurs.

Referring to FIG. 15, FIG. 15 is a schematic diagram of a module of an embodiment of a computer-readable storage medium according to this application. This application further provides a computer-readable storage medium 300. The computer-readable storage medium 300 is configured to store a control program 301. The control program 301, when executed by a processor 202, is configured to implement the anti-dry heating method according to any one of the foregoing embodiments.

In a plurality of embodiments provided in this application, it should be understood that the disclosed system, apparatus, and method may be implemented in other manners. For example, the apparatus embodiments described above are merely examples. For example, division of units is merely logical function division and may be another division manner during actual implementation. For example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted or not executed. In addition, the displayed or discussed mutual coupling or direct coupling or communication connection may be implemented through some interfaces. Indirect coupling or communication connection between the apparatuses or units may be implemented in electronic, mechanical, or other forms.

In addition, the functional units in the embodiments of this application may be integrated into one processing unit, or each of the units may exist alone physically, or two or more units may be integrated into one unit. The integrated unit may be implemented in a form of hardware, or may be implemented in a form of a software functional unit.

The foregoing descriptions are merely implementations of this application, and are not intended to limit the patent scope of this application. All equivalent structures or process changes made according to the content of this specification and accompanying drawings in this application or direct or indirect application in other related technical fields shall fall within the protection scope of this application.

While the invention has been illustrated and described in detail in the drawings and foregoing description, such illustration and description are to be considered illustrative or exemplary and not restrictive. It will be understood that changes and modifications may be made by those of ordinary skill within the scope of the following claims. In particular, the present invention covers further embodiments with any combination of features from different embodiments described above and below. Additionally, statements made herein characterizing the invention refer to an embodiment of the invention and not necessarily all embodiments.

The terms used in the claims should be construed to have the broadest reasonable interpretation consistent with the foregoing description. For example, the use of the article “a” or “the” in introducing an element should not be interpreted as being exclusive of a plurality of elements. Likewise, the recitation of “or” should be interpreted as being inclusive, such that the recitation of “A or B” is not exclusive of “A and B,” unless it is clear from the context or the foregoing description that only one of A and B is intended. Further, the recitation of “at least one of A, B and C” should be interpreted as one or more of a group of elements consisting of A, B and C, and should not be interpreted as requiring at least one of each of the listed elements A, B and C, regardless of whether A, B and C are related as categories or otherwise. Moreover, the recitation of “A, B and/or C” or “at least one of A, B or C” should be interpreted as including any singular entity from the listed elements, e.g., A, any subset from the listed elements, e.g., A and B, or the entire list of elements A, B and C.

Claims

1. An anti-dry heating method for an electronic atomization apparatus, the method comprising: obtaining a first temperature change parameter corresponding to an atomization element within a suction time period, and obtaining a first overtemperature threshold corresponding to the atomization element, the first temperature change parameter being related to a temperature change trend of the atomization element within the suction time period; andperforming a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.

2. The method of claim 1, wherein obtaining a first temperature change parameter corresponding to an atomization element within a suction time period comprises: obtaining a first detection value corresponding to the atomization element at a first moment within a current suction time period, obtaining a second detection value corresponding to the atomization element at a second moment within the current suction time period, and determining a first detection reference value corresponding to the atomization element within the current suction time period based on the first detection value and the second detection value; andobtaining a second detection reference value corresponding to the atomization element within a suction learning time period, and determining the first temperature change parameter corresponding to the atomization element within the current suction time period based on the first detection reference value and the second detection reference value,wherein the suction learning time period occurs before the suction time period.

3. The method of claim 2, wherein obtaining a second detection reference value corresponding to the atomization element within the suction learning time period comprises: obtaining, in response to a quantity of a first quantity of reference suction time periods within the suction learning time period being greater than a first threshold, a first quantity of second detection reference values corresponding to the atomization element within the first quantity of reference suction time periods; andselecting, from the first quantity of second detection reference values, a second quantity of relatively large second detection reference values, calculating a first average value, and using the first average value as the second detection reference value corresponding to the atomization element within the suction learning time period,wherein the second quantity is less than or equal to the first quantity.

4. The method of claim 3, wherein obtaining the second detection reference value corresponding to the atomization element within each of the reference suction time periods comprises: obtaining a third detection value corresponding to the atomization element at a third moment within each reference suction time period, obtaining a fourth detection value corresponding to the atomization element at a fourth moment within each reference suction time period, and determining the second detection reference value corresponding to the atomization element within each reference suction time period based on the third detection value and the fourth detection value.

5. The method of claim 1, wherein, before obtaining a first temperature change parameter corresponding to an atomization element within the suction time period, and obtaining the first overtemperature threshold corresponding to the atomization element, the method further comprises: detecting whether an atomizable medium exists in an atomizer in the electronic atomization apparatus; andperforming a corresponding operation in response to no atomizable medium existing in the atomizer.

6. The method of claim 5, wherein detecting whether the atomizable medium exists in the atomizer in the electronic atomization apparatus comprises: obtaining a fifth detection value corresponding to a fifth moment within a suction triggering time period and a sixth detection value corresponding to a sixth moment within the suction triggering time period, the suction triggering time period occurring before the suction learning time period;determining a first overtemperature determining parameter corresponding to the atomization element within the suction triggering time period based on the fifth detection value and the sixth detection value; anddetermining, in response to the first overtemperature determining parameter corresponding to the atomization element being greater than a second overtemperature threshold within the suction triggering time period, that no atomizable medium exists in the atomizer.

7. The method of claim 6, wherein detecting whether the atomizable medium exists in the atomizer in the electronic atomization apparatus comprises: determining, in response to the atomizable medium existing in the atomizer and a quantity of the first quantity of reference suction time periods being less than or equal to a first threshold, whether a second temperature change parameter corresponding to the atomization element within the suction learning time period is greater than the first overtemperature threshold, and determining whether a second overtemperature determining parameter corresponding to the atomization element within the suction learning time period is greater than a third overtemperature threshold; anddetermining, in response to the second temperature change parameter corresponding to the atomization element within the suction learning time period being greater than the first overtemperature threshold, and the second overtemperature determining parameter corresponding to the atomization element within the suction learning time period being greater than the third overtemperature threshold, that the atomizable medium exists in the atomizer and is consumed within the suction learning time period.

8. The method of claim 7, wherein determining the second temperature change parameter corresponding to the atomization element within the suction learning time period comprises: obtaining a first quantity of third detection reference values corresponding to the atomization element within the first quantity of reference suction time periods within the suction learning time period;selecting, from the first quantity of third detection reference values, a maximum of the third detection reference values as the third detection reference value corresponding to the atomization element within the suction learning time period;obtaining a seventh detection value corresponding to the atomization element at a seventh moment within a current reference suction time period and an eighth detection value corresponding to the atomization element at an eighth moment within the current reference suction time period, and determining a fourth detection reference value corresponding to the atomization element within a current suction learning time period based on the seventh detection value and the eighth detection value; anddetermining the second temperature change parameter corresponding to the atomization element within the suction learning time period based on the third detection reference value and the fourth detection reference value.

9. The method of claim 7, wherein determining the second overtemperature determining parameter corresponding to the atomization element within the suction learning time period comprises: obtaining a temperature corresponding to the atomization element at a different moment within one of the reference suction time periods within the suction learning time period; anddetermining the second overtemperature determining parameter corresponding to the atomization element within the suction learning time period based on the temperature corresponding to the atomization element at the different moment.

10. The method of claim 2, wherein, after obtaining the second detection reference value corresponding to the atomization element within the suction learning time period, the method further comprises: using the second detection reference value corresponding to the atomization element obtained within the suction learning time period as a current second detection reference value; andcalculating, in response to a difference between an initial resistance value of the atomization element that is sampled and a minimum resistance value of the atomization element that is obtained within the current suction time period being greater than a second threshold, a second average value of the current second detection reference value and the second detection reference value of the atomization element within the current suction time period, and using the second average value as the second detection reference value within a next suction time period.

11. The method of claim 1, wherein, before the electronic atomization apparatus is used, the method further comprises: detecting whether the atomizer in the electronic atomization apparatus is reliably connected to a power supply; andobtaining the first temperature change parameter corresponding to the atomization element within the suction time period in response to the atomizer being reliably connected to the power supply.

12. The method of claim 11, wherein detecting whether the atomizer in the electronic atomization apparatus is reliably connected to the power supply comprises: connecting the atomizer to the power supply, and sampling a resistance value of the atomization element in the atomizer so as to obtain a detection value corresponding to the resistance value of the atomization element; andcalculating a third average value of a third quantity of detection values that are obtained, and determining, in response to a difference between each of the third quantity of detection values that are obtained and the third average value being less than or equal to a third threshold, that the atomizer is reliably connected to the power supply.

13. The method of claim 12, further comprising: determining, in response to the difference between at least one of the third quantity of detection values that are obtained the first time and the third average value being greater than the third threshold, and a number of times a difference between at least one of the third quantity of detection values that are subsequently obtained each time and the third average value corresponding to the at least one detection value is greater than the third threshold being greater than a fourth threshold, that the atomizer is unreliably connected to the power supply.

14. The method of claim 12, wherein, before sampling the resistance value of the atomization element in the atomizer, the method further comprises: connecting the atomizer to the power supply, waiting for a first preset time, and sampling the resistance value of the atomization element in the atomizer after the first preset time.

15. An atomization driving circuit for an electronic atomization apparatus, comprising: a driving module comprising an atomization element, the driving module being configured to heat an atomizable medium; anda control module connected to the driving module and configured to obtain a first temperature change parameter corresponding to the atomization element within a suction time period, and obtain a first overtemperature threshold corresponding to the atomization element,wherein the control module is configured to perform a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.

16. The atomization driving circuit of claim 15, wherein the control module comprises a collection module and a control chip, wherein the collection module is configured to collect a first detection value corresponding to the atomization element at a first moment within a current suction time period, and collect a second detection value corresponding to the atomization element at a second moment within the current suction time period, and the control chip is configured to determine a first detection reference value corresponding to the atomization element within the current suction time period based on the first detection value and the second detection value,wherein the collection module is configured to collect a third detection value corresponding to the atomization element at a third moment within each reference suction time period, and obtain a fourth detection value corresponding to the atomization element at a fourth moment within each reference suction time period, and the control chip is configured to determine a second detection reference value corresponding to the atomization element within each reference suction time period based on the third detection value and the fourth detection value, andwherein the control chip is configured to determine the first temperature change parameter corresponding to the atomization element within the suction time period based on the first detection reference value and the second detection reference value corresponding to the atomization element within a suction learning time period, the suction learning time period occurring before the suction time period, and the second detection reference value corresponding to the atomization element within the suction learning time period is determined based on the second detection reference value corresponding to the atomization element within each reference suction time period.

17. An electronic atomization apparatus, comprising: a memory configured to store program instructions; anda processor configured to retrieve the program instructions from the memory to perform the anti-dry heating method of claim 1.

18. A computer-readable storage medium configured to store a control program, wherein the control program, when executed by a processor, is configured to implement the anti-dry heating method of claim 1.