Number | Name | Date | Kind |
---|---|---|---|
4336685 | Einstein | Jun 1982 | |
4803096 | Kuhn et al. | Feb 1989 | |
4888229 | Paley et al. | Dec 1989 | |
4975317 | Kuhn et al. | Dec 1990 | |
4981718 | Kuhn et al. | Jan 1991 | |
5030508 | Kuhn et al. | Jul 1991 | |
5071699 | Pappas et al. | Dec 1991 | |
5093190 | Kwok et al. | Mar 1992 | |
5151321 | Reeves et al. | Sep 1992 | |
5229181 | Daiber et al. | Jul 1993 | |
5271995 | Paley et al. | Dec 1993 | |
5324579 | Sassa et al. | Jun 1994 | |
5407699 | Myers | Apr 1995 | |
5460655 | Pisacane et al. | Oct 1995 | |
5494609 | Kulkarni et al. | Feb 1996 |
Number | Date | Country |
---|---|---|
3834 526 | Apr 1990 | DEX |
Entry |
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Microelectronic Manufacturing and Testing, vol. 8, No. 3 1985 Desk Manual, pp. 37-38. |