Number | Name | Date | Kind |
---|---|---|---|
4456679 | Leyrer et al. | Jun 1984 | |
5322812 | Dixit et al. | Jun 1994 | |
5399527 | Tabara | Mar 1995 | |
5475253 | Look et al. | Dec 1995 | |
5484746 | Ichikawa et al. | Jan 1996 | |
5502000 | Look et al. | Mar 1996 | |
5543656 | Yen et al. | Aug 1996 | |
5565702 | Tamura et al. | Oct 1996 | |
5633194 | Selvakumar et al. | May 1997 | |
5786240 | Look et al. | Jul 1998 |
Entry |
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Ali Iranmanesh, Yakov Karpovich, Sukyoon Yoon, "Antifuse Reliability and Link Formation Models", pp. 90-94, IEEE 1994 International Integrated Reliability Workshop Final Report, sponsored by IEEE Electron Devices Society and the IEEE Reliability Society, 1994. |
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