Claims
- 1. An optics system for spectroscopic analysis having an aperture image beam splitter comprising:
- a radiant energy source;
- a sample;
- first optics means to direct an incident radiant energy beam from the source to the sample, the first optics means being operative to focus the incident radiant energy at least at first and second sample images and at the sample;
- means to discard part of the incident radiant energy from the system while transmitting the rest of the incident radiant energy through the first optics means to the sample; and
- an intercepting mirror positioned between the first and second sample images at an aperture image plane;
- the first optics means directing some specularly reflected radiant energy from the sample back through the second sample image to the intercepting mirror, the intercepting mirror being operative to reflect the specularly reflected energy through second optics means to a detector.
- 2. An optics system for spectroscopic analysis as set forth in claim 1 wherein the aperture image plane constitutes an aperture stop for the optics system.
- 3. An optics system for spectroscopic analysis as set forth in claim 1 wherein said first optics means is operative to form an odd number of sample images between the intercepting mirror and the sample.
- 4. An optics system for spectroscopic analysis as set forth in claim 1 further including an adjustable mask at the second sample image.
- 5. An optics system for spectroscopic analysis as set forth in claim 1 wherein the intercepting mirror has a first mirrored side reflecting the specularly reflected energy from the sample to the second optics means and a second side constituting the means to discard, the intercepting mirror being positioned and sized to discard approximately one-half of the incident radiant energy beam.
- 6. A method for spectroscopic analysis of a sample comprising the steps of:
- directing incident radiant energy from a source to a sample;
- focusing the incident radiant energy at least at first and second sample images and at the sample;
- discarding part of the incident radiant energy from the system while transmitting the rest of the incident radiant energy to the sample;
- directing specularly reflected energy from the sample back toward the second and first sample images;
- intercepting the specularly reflected energy at an aperture image plane and
- directing the intercepted specularly reflected energy to a detector.
- 7. An optics system for spectroscopic analysis comprising:
- a radiant energy source;
- a sample;
- optics means to direct an incident radiant energy beam from the source to the sample, the optics being operative to focus the incident radiant energy beam at first and second sample image planes and at the sample;
- the optics means including an aperture image beam splitter positioned between the first and second sample image planes;
- the aperture image beam splitter being operative to discard part of the incident radiant energy beam from the system while transmitting the rest of the incident radiant energy beam through the second sample image plane to the sample and being further operative to transmit radiant energy reflected from the sample back through the second sample image plane to a detector.
- 8. The optics system of claim 7 wherein the aperture image beam splitter is semi-circular to discard one-half of the incident radiant energy beam while transmitting the other half of the incident radiant energy beam.
RELATED APPLICATIONS
The present application is a continuation of co-pending application Ser. No. 013,584 now abandoned filed on Feb. 11, 1987, which is a continuation-in-part of copending U.S. patent application Ser. No. 707,231, now U.S. Pat. No. 4,653,880, titled Reflective Beam Splitting Objective, filed Mar. 1, 1985, assigned to the assignee of the present application, incorporated herein by reference. Application Ser. No. 829,085, filed Feb. 13, 1986, assigned to the present assignee, discloses another type of aperture beam splitter. application Ser. No. 015,315, filed Feb. 17, 1987, assigned to the present assignee, discloses and claims a microscope that, inter alia, masks incident and reflected radiant energy at the same remote image plane.
US Referenced Citations (7)
Foreign Referenced Citations (2)
Number |
Date |
Country |
2722787 |
Nov 1978 |
DEX |
359783 |
Jan 1962 |
CHX |
Non-Patent Literature Citations (1)
Entry |
Analect, "Micro-FTIR Spectrometers and FTIR Microscopes" Advertising Brochure From Analect Instruments, Irvine Calif. |
Continuations (1)
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Number |
Date |
Country |
Parent |
13584 |
Feb 1987 |
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Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
707231 |
Mar 1985 |
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