This application is a continuation-in-part of U.S. Ser. No. 60/049,013 filed Jun. 9, 1997 entitled “APPARATUS AND METHODS FOR CORRECTING FOR ELECTROKINETIC EFFECTS IN MICROFLUIDIC SYSTEMS” by Kopf-Sill and Parce and U.S. Ser. No. 60/076,468 filed Mar. 2, 1998 “HIGH THROUGHPUT SCREENING APPLICATIONS OF MICROFLUIDIC SYSTEMS” by Cohen et al. the present application claims priority to each of these applications and incorporates each of the applications herein in their entirety for all purposes.
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PCT/US98/11969 | WO | 00 |
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WO98/56956 | 12/17/1998 | WO | A |
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WO 9900649 | Jan 1999 | WO |
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Number | Date | Country | |
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60/076468 | Mar 1998 | US | |
60/049013 | Jun 1997 | US |