“Form Factor's Wafer-Level Packaging and Whole-Wafer Test Technologies”, Printed from www.formfactor.com on Mar. 20, 2002. |
“Form Factor Introduces an Integrated Process for Wafer-Level Packing, Burn-in Test and Module Level Assembly”, IEEE/IMAPS International Symposium on Advanced Packaging Materials, Mar. 1990. |
“Integrated Fober Optic Transmitters and Receivers for SONET/ATM Applications”, Tran V. Muoi, IEEE 1995, pp 1092-1095. |
“Multigigabit Multichannel Optical Interconnection Modules for Asynchronous Transfer Mode Switching Systems”, Arai et al, IEEE 1995, pp 558-564. |
“Silicon Waferboard-Based Single-Mode Optical Fiber Interconnects”, Haugsjaa et al., IEEE 1996, pp 90-97. |
NEC Laser Array. |
NTT Self-Aligned Assembly. |
“40G Parallel Optical Modules”, Corona Optical Systems, www.coronasys.com. |