Claims
- 1. An apparatus for analyzing a machine fluid used in a machine, comprising at least one meter placed proximate said machine and in contact with said machine fluid for measuring at least one parameter related to said machine fluid, wherein said at least one parameter is a standard laboratory analysis parameter.
- 2. The apparatus as recited in claim 1, further comprising a microprocessor for controlling said at least one meter and for collecting data from said at least one meter.
- 3. The apparatus as recited in claim 2, further comprising a two-way communicator connected to said microprocessor for receiving interrogation signals and for transmitting data, thereby obtaining an in situ machine fluid analysis.
- 4. The apparatus as recited in claim 1, wherein said at least one meter is a viscometer.
- 5. The apparatus as recited in claim 4, wherein said viscometer has a dynamic range from about 10 cST to about 60 cST with an absolute uncertainty of no greater than about ±1%.
- 6. The apparatus as recited in claim 1, wherein said at least one meter is an X-ray fluorescence meter.
- 7. The apparatus as recited in claim 6, wherein said X-ray fluorescence meter comprises:
an X-ray source providing X-rays in an energy range from about 5 KeV to about 30 KeV; a flow path past said X-ray source for flowing said machine fluid therethrough for intercepting said X-rays and producing an X-ray fluorescence signal; and an X-ray detector for receiving said X-ray fluorescence signal.
- 8. The apparatus as recited in claim 7, wherein said flow path is provided by a thin-walled tube of low element weight composition.
- 9. The apparatus as recited in claim 1, wherein said at least one meter is an optical meter.
- 10. The apparatus as recited in claim 9, wherein said optical meter comprises:
an optical energy source for passing optical energy through said machine fluid; a bandpass filter for filtering said optical energy from said machine fluid; and an optical detector for receiving said filtered optical energy, wherein said optical meter has no optical dispersive element between said optical energy source and said optical detector.
- 11. The apparatus as recited in claim 10, wherein said machine fluid is passed through a tubular sample cell.
- 12. The apparatus as recited in claim 10, wherein said machine fluid is passed over a planar sample cell.
- 13. The apparatus as recited in claim 10, wherein said optical energy source includes a non-coherent radiator in combination with a collector.
- 14. The apparatus as recited in claim 10, wherein said optical energy source is a coherent radiator.
- 15. The apparatus as recited in claim 14, wherein said coherent radiator comprises a quantum cascade laser.
- 16. The apparatus as recited in claim 1, wherein said at least one meter is a particulate meter.
- 17. An apparatus for analyzing a machine fluid used in a machine, comprising at least one meter placed proximate said machine and in contact with said machine fluid for measuring at least one parameter related to said machine fluid, said at least one meter is selected from the group consisting of viscometer, element meter, optical meter, particulate meter, and combinations thereof.
- 18. The apparatus as recited in claim 17, further comprising a microprocessor for controlling said at least one meter and for collecting data from said at least one meter.
- 19. The apparatus as recited in claim 18, further comprising a two-way communicator connected to said microprocessor for receiving interrogation signals and for transmitting data, thereby obtaining an in situ machine fluid analysis.
- 20. The apparatus as recited in claim 17, wherein said viscometer has a dynamic range from about 10 cST to about 60 cST with an uncertainty of no greater than about ±1%.
- 21. The apparatus as recited in claim 17, wherein said element meter is an X-ray fluorescence meter comprising:
an X-ray source providing X-rays in an energy range from about 5 KeV to about 30 KeV; a flow path past said X-ray source for flowing said machine fluid therethrough for intercepting said X-rays and producing an X-ray fluorescence signal; and an X-ray detector for receiving said X-ray fluorescence signal.
- 22. The apparatus as recited in claim 21, wherein said flow path is provided by a thin-walled tube of low element weight composition.
- 23. The apparatus as recited in claim 17, wherein said optical meter comprises:
an optical energy source for passing optical energy through said machine fluid; a bandpass filter for filtering said optical energy from said machine fluid; and an optical detector for receiving said filtered optical energy, wherein said optical meter having no optical dispersive element between said optical energy source and said optical detector.
- 24. The apparatus as recited in claim 23, wherein said machine fluid is passed through a tubular sample cell.
- 25. The apparatus as recited in claim 23, wherein said machine fluid is passed over a planar sample cell.
- 26. The apparatus as recited in claim 23, wherein said optical energy source includes a non-coherent radiator in combination with a collector.
- 27. The apparatus as recited in claim 23, wherein said optical energy source is a coherent radiator.
- 28. The apparatus as recited in claim 27, wherein said coherent radiator comprises a quantum cascade laser.
- 29. An apparatus for analyzing a process fluid used in an industrial process line, comprising at least one meter placed proximate said industrial process line and in contact with said process fluid for measuring at least one parameter related to said process fluid, said at least one meter is selected from the group consisting of viscometer, element meter, optical meter, particulate meter, and combinations thereof.
- 30. A limited range high precision viscometer for measuring viscosity of a machine fluid in the range of 10 cST to about 20 cST with an absolute uncertainty of no greater than about ±1%, comprising:
a tube; a differential pressure transducer mounted on both ends of the tube for measuring a differential pressure drop along the length of said tube; and a flowmeter in line with said tube.
- 31. An optical meter for measuring an optical property of a machine fluid, comprising:
an optical energy source for passing optical energy through said machine fluid; a bandpass filter for filtering said optical energy from said machine fluid; and an optical detector for receiving said filtered optical energy, wherein said optical meter has no optical dispersive element between said optical energy source and said optical detector.
- 32. The optical meter as recited in claim 31, wherein said machine fluid is passed through a tubular sample cell.
- 33. The optical meter as recited in claim 31, wherein said machine fluid is passed over a planar sample cell.
- 34. The optical meter as recited in claim 31, wherein said optical energy source includes a non-coherent radiator in combination with a collector.
- 35. The optical meter as recited in claim 31, wherein said optical energy source is a coherent radiator.
- 36. The optical meter as recited in claim 35, wherein said coherent radiator comprises a quantum cascade laser.
- 37. A system for determining on-board real time parameters of fluid systems relating to the health of an engine whereby a plurality of sensors are placed proximate the engine such that a plurality of standard laboratory analysis procedures are determined on-board the engine, with such characteristics being transmitted to a remote observer of engine health.
- 38. The system as recited in claim 37, wherein the plurality of sensors are selected from the group consisting of viscometer, element meter, optical meter, particulate meter and combinations thereof.
- 39. The system as recited in claim 37, further comprising a microprocessor for controlling said plurality of sensors and for collecting data from said plurality of sensors.
- 40. The system as recited in claim 38, wherein said viscometer has a dynamic range from about 10 cST to about 60 cST with an absolute uncertainty of no greater than about ±1%.
- 41. The system as recited in claim 38, wherein said element meter is an X-ray fluorescence meter comprising:
an X-ray source providing X-rays in an energy range from about 5 KeV to about 30 KeV; a flow path past said X-ray source for flowing said machine fluid therethrough for intercepting said X-rays and producing an X-ray fluorescence signal; and an X-ray detector for receiving said X-ray fluorescence signal.
- 42. The system as recited in claim 41, wherein said flow path is provided by a thin-walled tube of low element weight composition.
- 43. The system as recited in claim 38, wherein said optical meter comprises:
an optical energy source for passing optical energy through said machine fluid; a bandpass filter for filtering said optical energy from said machine fluid; and an optical detector for receiving said filtered optical energy, wherein said optical meter has no optical dispersive element between said optical energy source and said optical detector.
- 44. An X-ray fluorescent element meter for measuring the concentration of elements of a fluid comprising:
an X-ray source providing X-rays in an energy range from about 5 KeV to about 30 KeV; a flow path past said X-ray source for flowing said fluid therethrough for intercepting said X-rays and producing an X-ray fluorescence signal; an X-ray detector for receiving said X-ray fluorescence signal; a multi-channel analyzer for counting the number of X-ray photons in specific energy ranges; and software for quantitative determination of the relative and absolute concentrations of elements in said fluid.
- 45. The X-ray fluorescence element meter as recited in claim 44, wherein said flow path is provided by a thin-walled tube of low element weight composition.
- 46. The X-ray fluorescence element meter as recited in claim 44, wherein said fluid is a machine fluid.
- 47. The X-ray fluorescence element meter as recited in claim 44, wherein said fluid is an industrial process fluid.
- 48. The X-ray fluorescence element meter as recited in claim 44, wherein the flow of the fluid is intermittent.
- 49. The X-ray fluorescence element meter as recited in claim 44, wherein the flow of the fluid is continuous.
- 50. A method of analyzing a fluid used in a system, comprising the steps of:
placing at least one meter proximate said system and in contact with said fluid for measuring at least one parameter related to said fluid, wherein said at least one meter is selected from the group consisting of viscometer, element meter, optical meter, particulate meter, and combinations thereof.
- 51. The method of claim 50, wherein said system is a machine and said fluid is a machine fluid.
- 52. The method of claim 50, wherein said system is an industrial process line and said fluid is a process fluid.
- 53. A method of measuring the concentration of elements of a fluid using X-ray fluorescence comprising the steps of:
providing a flow path past an X-ray source for flowing said fluid therethrough for intercepting X-rays from said X-ray source; providing said fluid in said flow path; radiating said fluid with said X-rays; detecting said X-rays; counting the number of X-ray photons in specific energy ranges; and determining the relative and absolute concentrations of elements in said fluid.
- 54. The method of claim 53, wherein providing said fluid in said flow path comprises flowing said fluid intermittently in said flow path.
- 55. The method of claim 53, wherein providing said fluid in said flow path comprises flowing said fluid continuously in said flow path.
- 56. The method of claim 53, wherein said fluid is a machine fluid.
- 57. The method of claim 53, wherein said fluid is a process fluid.
- 58. The method of claim 53, wherein said flow path is provided by a thin-walled tube of low element weight composition.
CROSS REFERENCES TO RELATED APPLICATIONS
[0001] This application is a continuation-in-part of application Ser. No. 09/447,036 filed Nov, 19, 1999.
Continuations (1)
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Number |
Date |
Country |
Parent |
09776109 |
Feb 2001 |
US |
Child |
10339811 |
Jan 2003 |
US |
Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
09447036 |
Nov 1999 |
US |
Child |
09776109 |
Feb 2001 |
US |