A typical telecommunications network comprises a plurality of customer sites, and each site has customer premise equipment (CPE) for interfacing with a central office (CO). The CPE at each customer site is typically connected to the CO via one or more subscriber lines. Therefore, network components at the CO are configured to receive and terminate a plurality of subscriber lines that are routed to the CO from various customer sites.
The network components, such as a digital subscriber lines multiplexor (DSLAM) that receive and terminate subscriber lines usually multiplex signals received from the subscriber lines for transmission on fewer high-speed channels, such as, for example, asynchronous transfer mode (ATM) channels.
Connector 110 may further interface test equipment 114 via the connector 200. In this regard, a plurality of conductors 116 are terminated via the connector 110. The connector 110 then electrically connects to the connector 200 thereby interfacing the test equipment 114 to the connector 200. Thus, the test equipment 114 is interfaced with the network component 120 via the connector 110 and the connector 200.
Therefore, the connector 200 typically interfaces with the subscriber lines 104, the connector 110, and the network component 120. The connector 200 connects to the network component 120, e.g., a digital subscriber line access multiplexer (DSLAM), via connections 203. The network component 120 multiplexes signals received from the connections 203 onto a high-speed line 118, e.g., an asynchronous transfer mode (ATM) channel.
An exemplary connector 200 for connecting the subscriber lines 104 and the connector 110 to the network component 120 is a 710 modular connector manufactured by 3M™. Such a connector is manufactured in a variety of sizes configured to receive 5, 10, or 25 subscriber lines.
While the connector 110 can be used to interface the subscriber lines to the connector 200, typically the connector 110 is used to terminate conductors emanating from test equipment 114, as shown. For testing, the connector 110 is typically manually joined by a technician (not shown) to the connector 200. The technician visually aligns corresponding male and female components on the connectors connector 200 and 110 and squeezing the connectors together to establish the connection. Such a connection method lends itself to error because the connector 110 oftentimes breaks during disconnection.
Such problems are also inherent when testing the network component 120 either prior to shipment for use at a CO or at the CO during operation. In this regard, it is oftentimes inefficient to connect the connectors 200 and 110 only temporarily. For example, the connector 110 may terminate lines attached to test equipment 114 that is used prior to shipment of the network component 120 to ensure that the network component 120 is working properly. In such a scenario, the connector 200 may be connected to the connector 110 temporarily so that the network component 120 can be tested, which opens up the opportunity for the connector 110 to be damaged when disconnecting the connector 110 from the connector 200.
Further, if during operation, the network component 120 requires testing, the connector 110 is connected to the connector 200, and such connection enables the test equipment 114 to communicate with the network component 120. After testing is completed, the connector 110 is disconnected from the connector 200, and it is possible for the connector 110 to become damaged requiring replacement.
Furthermore, oftentimes the connector 200 that terminates the lines 203 from the network component 120 are protected with potting compound. In this regard, potting compound is inserted into openings (not show) that provide conductive connections in the connector 200 prior to shipping the network component 120 in order to protect the openings from damage, for example, damage that may result from moisture. Connector 200 can also be damaged during testing prior to shipping, because connector 110 connects to the potted openings thereby eliminating the potting material. Once the connector 110 connects to the connector 200 and eliminates the potting material, the connections are then exposed and can become damaged.
Such methods of testing the network component 120 reduce assurances that connectivity across the lines 203 connecting to the network component 120 are effective. Furthermore, such methods increase the chance that the connector 110 will become damaged during testing when separated from the other connector 200 that is connected to the subscriber lines 104 or test equipment 114.
Generally, the present disclosure provides an apparatus and method for interfacing to a network component, such as a digital subscriber line multiplexer (DSLAM), capable of multiplexing data from a plurality of digital subscriber lines (DSLs) onto a single high-speed line. Specifically, an apparatus in accordance with the present disclosure receives a connector 200 (
The apparatus of the present disclosure mechanically and systematically establishes connections between the various connections of the port interfacing with the test equipment and the plurality of wires connected to the network component. For exemplary purposes, the present disclosure is described in the context of testing a DSLAM having a plurality of 710 splice connectors for interfacing the DSLAM to a plurality of subscriber lines. However, other types of network components and other types of connectors are possible in other embodiments of the present disclosure.
The connector 200 depicted in
As noted herein, an embodiment of the present disclosure is described with reference to receiving subscriber lines 104 comprising a pair of subscriber line conductors 308. However, in other embodiments, the connector 200 may receive any type of conductor 308, and establish a connection between such received subscriber line conductor 308 and conductor 203. Conductors 308 of the subscriber line 104 are described for exemplary purposes. The established connection between the conductors 308 and the conductors 203 is described in more detail with reference to a cross-sectional view of the connector 200 depicted in
Furthermore, the conductors 308 may be retained by a bridge (not shown) when each of the conductors 308 have been inserted into the subscriber line openings 306. In this regard, once the conductors 308, in accordance with the particular relevant application, have been inserted into the subscriber line openings 306, a presser tool (not shown) may be used to splice the wires to the connector 200 and the bridge may then be attached across each of the conductors 308 and subscriber line openings 306 to ensure retention of the conductors 308 by the connector 200.
Additionally, the connector 200 comprises test openings 304. The test openings 304 also provide access for establishing connection to the conductors 203. In this regard, the connector 200 may receive prongs (not shown) of another connector 110 (
Likewise, when the connector 110, e.g., a male connector, is inserted into the test opening 304, contact is made between the metal contact 402 and any conductor 116 that may be retained by the connector 110. Thus, a conductive path is established from the test equipment 114 to the conductor 203 by the contact 402 via the conductor 116.
Additionally, a conductor 308 (
The interface apparatus 500 generally comprises a connector-receiving unit 502, a handle-retaining device 504, a handle 508, a plurality of contact probes 512, a printed circuit board (PCB) 516, and an interface port 514.
The connector-receiving unit 502 receives the connector 200 depicted by
When the connector 200 is completely seated in the receiving unit 502, the connector 200 is positioned such that each of the subscriber line openings 306 is accessible to receive probes 512 when interface apparatus is engaged. In one embodiment, each probe 512 is spaced 0.138 inches apart from the center of the probe to the center of its adjacent probe. In another embodiment, the probes are clustered into five clusters often probes, and each cluster is 0.158 inches apart and each probe within each cluster is 0.138 inches apart center to center. In this regard, note that subscriber line openings 306 (
Furthermore, as described herein, the test openings 304 are shipped with a potting compound that protects such openings from damage from, for example, water. Because the probes are inserted into the subscriber line openings 306, as opposed to inserting a connector 110 into the test openings 304, the potting that is placed within the test openings 304 is left undisturbed. Thus, the network component 120 to which the connector is connected can be tested by the test equipment 114 (
In one embodiment, the receiving unit 502 further comprises a stop 506. Such stop 506 is spring loaded and, when relaxed, protrudes into the insertion path of the slot 906 in which the connector 200 inserted. Thus, once a connector 200 is inserted into the slot 906 and is fully seated therein, the stop 506 disallows any movement by the connector 200 in the positive x-direction after it has been inserted. Furthermore, the connector 200 is prevented from moving in the negative x-direction by the receiving unit 502, because the slot 906 recesses within the receiving unit 502. Such is illustrated in more detail with reference to
The stop 506 is described in more detail with reference to
The handle-retaining device 504 is rigidly affixed to a plate 510, which extends from the receiving unit 502. The handle-retaining device 504 comprises a movable hook 520, that engages and retains the handle 508 when the apparatus 500 is engaged. In this regard, “engaged” refers to a state in which the interface apparatus 500 is mechanically positioned to allow contact between the connector 200 inserted into the apparatus 500 and any test equipment 114 (
The probe elevator 518 is linearly connected to the receiving unit 502. Complementarily, the probe elevator 518 is pivotally connected to the handle 508. Thus, that when the handle 508 is engaged in the positive y-direction, the probe elevator 518 moves in a positive y-direction with respect to the apparatus 500.
In particular, when the handle 508 is moved toward the plate 510 of the apparatus 500, the probe elevator 518 moves in the positive y-direction. When the handle 508 is moved away from the plate 510, the probe elevator 518 moves in the negative y-direction. Such is described in more detail with reference to
The probe elevator 518 rigidly retains the plurality of contact probes 512. In this regard, the contact probes 512 are affixed to the probe elevator 518 and extend perpendicular to and through the probe elevator 518. The probes 512 are further attached to the PCB 516, which as described is rigidly affixed parallel to the probe elevator 518.
Therefore, when the handle 508 is actuated and the probe elevator 518 moves in a positive y-direction toward the receiving unit 502, as described hereinabove, the plurality of probes 512 and the PCB to which the probes 512 are attached also moves in a positive y-direction toward the receiving unit 502. When the handle 508 is actuated, it is lifted in the positive y-direction and rotated about the x-axis such that it is displaced also in the negative z-direction such that it is coupled to the handle-retaining device 504.
Therefore, the probes 512 extend up through the receiving unit via openings (not shown) in the receiving unit 502, and the probes 512 insert into the subscriber line openings 306 and contact the metal contact 402 (
As described with reference to
As described herein with reference to
Thus, when the handle 508 is lifted in a positive y-direction with respect to the apparatus 500, the linkage 610 moves about connection 608 causing the elevator 518 to move in a positive y-direction toward the receiving unit 502. Further, as the handle 508 moves in the positive y-direction, the linkage 610 moves about connections 604 and 606 thereby lifting the elevator 518 toward the receiving unit 502 and allowing the handle 508 to move toward the handle-retaining device 504. The handle 508 is lifted in the positive y-direction and rotates about the x-axis such that the handle 508 is displaced in the negative z-direction until it is coupled to the handle-retaining device 504. Retention of the handle 508 by the handle-retaining device 504 is described further in detail with reference to
The probe elevator 518 further comprises a rod 1104 that is rigidly affixed perpendicular to the probe elevator 518. Such rod 1104 extends through the receiving unit 502 and works in conjunction with a plunger assembly 900 (
In one embodiment of the apparatus 500, the shape of the receiving unit 502 is tapered as illustrated in
Furthermore, each of the probes 512 is preferably soldered to or is otherwise electrically connected with electrical contacts (not shown) on the PCB 516. The PCB further comprises electrical routings from each of the probes 512 to corresponding connections (not shown) associated with the port 514.
Therefore, when a cable connector (not shown) is inserted into the port, test equipment 114 (
In one embodiment, the port 514 is a port and the test equipment comprises a cable that is terminated via a connector, e.g., a “champ” connector. However, other types of ports and other types of connectors are possible in other embodiments of the present disclosure.
In the engaged position, the handle 508 is lifted and placed within the recession 610 of the hook 520. The spring loaded action of the hook 520 retains the handle 508 in the lifted position.
Additionally, when the apparatus 500 is in the engaged position as illustrated in
The receiving unit 502 preferably comprises the slot 906 that is formed to receive the connector 200. In addition, the receiving unit 502 comprises a plunger assembly 900 that is affixed to the stop 506 described hereinabove and a limit switch 902.
Note that the slot 906 of the receiving unit 502 is shaped in accordance with the connector 200. In this regard, the connector 200 is made of a deformable material such that connector 200 have a propensity to bend or bow. However, because the shape of the receiving unit 502 conforms to the normal shape of the connector 200, when the connector 200 is inserted into the slot 906, and bend or bow in the connector 200 from connector use 200 is remedied by the slot 906.
Furthermore, as noted herein, the connector 200 can be implemented in a variety of sizes. In this regard, as the number of necessary conductors 308 needed for an application decreases, so does the length of the connector 200. However, the slot 906 is sized so that it can accept the longest size of the connector 200, one that receives twenty-five subscriber lines 104, i.e., fifty conductors 308. However, a conductor that receives only five subscriber lines 104, i.e., ten conductors 308, is much shorter in length that the twenty-five subscriber line connector 200. Therefore, the slot 906 can also be to receive such shorter connectors 200. Prior to inserting the shorter connector 200, a dummy connector (not shown) can be inserted into to the slot 906 that accounts for the reduced length of the shorter connector 200. The dummy connector can then be followed by the shorter connector 200, and the shorter connector 200 can serve to interface test equipment 114 (
Generally, the plunger assembly 900 ensures that the connector 200 is completely seated within the slot 906. In this regard, if the connector 200 is not completely seated within the slot 906, a user will be unable to move the handle 508 in a positive y-direction in order to engage the probes 512 and the connector 200. In this regard, if the connector 200 is not completely seated within the slot 906 alignment of the probes 512 (
Furthermore, the limit switch 902 generally provides a safeguard to ensure that power is not present at the probes 512 until a connector 200 is inserted into the slot 906. Ensuring such reduces or eliminates the risk of accidental electrical shock of a user prior to a connector 200 being inserted into the slot 906. The limit switch is described in more detail with reference to
Prior to insertion of a connector 200 into the slot 906, a user (not shown) actuates the plunger assembly 900. Such actuation is described in more detail with reference to
When the plunger assembly 900 is actuated, the stop 506 recedes from the path of the slot 906 thereby allowing the connector 200 to be inserted into the slot 906. The user may continue to actuate the assembly 900 until the connector 200 is completely seated within the slot 906. In this regard, when the user quits applying force to the assembly 900, the stop 506 protrudes back out into the path of the slot 506 if the connector 200 is completely seated.
However, the user may elect to let go of the assembly 900 prior to the connector 200 being fully seated within the slot 906. In such a case, the stop 506 is spring-loaded and positioned such that when the user lets go of the assembly 900 the stop 506 contacts the connector 200 until the connector 200 is fully seated as it is being slid into the slot 906. When it is fully seated within the slot 906 and is completely inserted and positioned correctly with respect to the probes 512 on the probe elevator 518, the stop 506 protrudes out into the path of the slot 906 via its spring-loaded characteristic.
Thus, as is illustrated in
The plunger assembly 900 is hereafter described in more detail with reference to
The plunger assembly 900 further comprises guide heads 1114 and 1112 that are attached to the receiving unit 502 and extend through the openings 1110 and 1108. The guide heads 1114 and 1112 guide the plunger assembly as it is being actuated by a user described further herein.
Further, the plunger assembly 900 comprises an opening 1120 through which the movable rod 1104 protrudes when the handle 508 is in the engaged position as described hereinabove. When the handle 508 is in the disengaged position, the rod 1104 recedes within the opening 1120 such that it is flush with the slidable base 1106 when the handle 508 is in the disengaged position as described hereinabove. Thus, the movable rod 1104 ensures that the slidable base 1106 can not be moved while the probes 512 are engaged with the connector 200. In this regard, if the rod 1104 is protruding through the opening 1120, then the slidable base 1106 cannot be moved by actuation of the tab 1100.
When a user of the apparatus 500 desires to insert a connector 200 into the slot 906 of the receiving unit 502, the user pushes on the tab 1100 in a negative z-direction away from the stop 506. When the user pushes the tab 1100, the base 1106 moves in the direction that the tab is being pushed. The guides 1112 and 1114 slide in the openings 1108 and 1110 thereby guiding the base 1106 in the direction of the pushed tab 1100. As will be described further herein, when the connector 200 is being inserted into the slot 906 (
As described hereinabove, the base 1106 is rigidly connected to the stop 506. Therefore, when the user pushes on the tab 1100 and moves the base 1106, the stop 506 is moved out of the path of the slot 906 so that the connector 200 can be inserted into the slot 906. Once the connector 200 is completely within the slot 906 such that the stop 506 springs back into the path of the connector 200, the stop 506 prohibits movement of the connector 200 in a horizontal direction, as described hereinabove.
After insertion of the connector 200, the user lifts the handle 508, as indicated in
With reference to
The wires 1400 and 1402 are connected to a jump connector 1404. Such connection to the connector 1404 can be used in a variety of ways depending upon the application of the apparatus 500. For example, a computer and/or other electronics (not shown) may be interfaced with the connector 1404 and/or the wires 1400 and 1402. Thus, when there is a short detected across the wires 1402 and 1400, the computer and/or the electronics can be configured to turn on power going to the probes 512 or transmit signals through the probes 512. In this regard, power is originating through the port 514 via the connector (not shown) that is connected to the port 514. When the switch 902 is deactivated, the test equipment is disables from communicating with probes 512 through the port 514. Note that the switch generally detects whether there is a connector 200 inserted in slot 906.
To the contrary, when the switch 902 is not depressed by a connector 200 in the slot 906 thereby breaking a conductive path, i.e., when the connector 200 is not present in the slot 906, then the computer and/or electronics can turn power off that is being provided to the probes 512. Note that the power may be provided by a cable terminator (not shown), such as, for example, a “champ” connector, inserted into the port 514. Regardless of the source of the power, the switch 902 provides a detectable parameter for indicating whether there is a connector 200 in the slot 906. Depending upon the application of the apparatus 500, detection of a connector 200 in the slot 906 might be used to cause power to be shut off from the probes 512.
Number | Name | Date | Kind |
---|---|---|---|
5147218 | Matthews et al. | Sep 1992 | A |
6682363 | Chang | Jan 2004 | B1 |