The present invention relates to testing of storage batteries, and in particular storage batteries typically used in electric vehicles such as golf cars. More specifically, the present invention relates to electronic battery testers that measure a dynamic parameter of a battery and determine its capacity and fitness for further service.
Electronic battery testers are used to test storage batteries. Various examples of such testers are described in U.S. Pat. No. 3,873,911, issued Mar. 25, 1975, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE; U.S. Pat. No. 3,909,708, issued Sep. 30, 1975, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE; U.S. Pat. No. 4,816,768, issued Mar. 28, 1989, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE; U.S. Pat. No. 4,825,170, issued Apr. 25, 1989, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE WITH AUTOMATIC VOLTAGE SCALING; U.S. Pat. No. 4,881,038, issued Nov. 14, 1989, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE WITH AUTOMATIC VOLTAGE SCALING TO DETERMINE DYNAMIC CONDUCTANCE; U.S. Pat. No. 4,912,416, issued Mar. 27, 1990, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE WITH STATE-OF-CHARGE COMPENSATION; U.S. Pat. No. 5,140,269, issued Aug. 18, 1992, to Champlin, entitled ELECTRONIC TESTER FOR ASSESSING BATTERY/CELL CAPACITY; U.S. Pat. No. 5,343,380, issued Aug. 30, 1994, entitled METHOD AND APPARATUS FOR SUPPRESSING TIME VARYING SIGNALS IN BATTERIES UNDERGOING CHARGING OR DISCHARGING; U.S. Pat. No. 5,572,136, issued Nov. 5, 1996, entitled ELECTRONIC BATTERY TESTER WITH AUTOMATIC COMPENSATION FOR LOW STATE-OF-CHARGE; U.S. Pat. No. 5,574,355, issued Nov. 12, 1996, entitled METHOD AND APPARATUS FOR DETECTION AND CONTROL OF THERMAL RUNAWAY IN A BATTERY UNDER CHARGE; U.S. Pat. No. 5,585,416, issued Dec. 10, 1996, entitled APPARATUS AND METHOD FOR STEP-CHARGING BATTERIES TO OPTIMIZE CHARGE ACCEPTANCE; U.S. Pat. No. 5,585,728, issued Dec. 17, 1996, entitled ELECTRONIC BATTERY TESTER WITH AUTOMATIC COMPENSATION FOR LOW STATE-OF-CHARGE; U.S. Pat. No. 5,589,757, issued Dec. 31, 1996, entitled APPARATUS AND METHOD FOR STEP-CHARGING BATTERIES TO OPTIMIZE CHARGE ACCEPTANCE; U.S. Pat. No. 5,592,093, issued Jan. 7, 1997, entitled ELECTRONIC BATTERY TESTING DEVICE LOOSE TERMINAL CONNECTION DETECTION VIA A COMPARISON CIRCUIT; U.S. Pat. No. 5,598,098, issued Jan. 28, 1997, entitled ELECTRONIC BATTERY TESTER WITH VERY HIGH NOISE IMMUNITY; U.S. Pat. No. 5,656,920, issued Aug. 12, 1997, entitled METHOD FOR OPTIMIZING THE CHARGING LEAD-ACID BATTERIES AND AN INTERACTIVE CHARGER; U.S. Pat. No. 5,757,192, issued May 26, 1998, entitled METHOD AND APPARATUS FOR DETECTING A BAD CELL IN A STORAGE BATTERY; U.S. Pat. No. 5,821,756, issued Oct. 13, 1998, entitled ELECTRONIC BATTERY TESTER WITH TAILORED COMPENSATION FOR LOW STATE-OF-CHARGE; U.S. Pat. No. 5,831,435, issued Nov. 3, 1998, entitled BATTERY TESTER FOR JIS STANDARD; U.S. Pat. No. 5,914,605, issued Jun. 22, 1999, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 5,945,829, issued Aug. 31, 1999, entitled MIDPOINT BATTERY MONITORING; U.S. Pat. No. 6,002,238, issued Dec. 14, 1999, entitled METHOD AND APPARATUS FOR MEASURING COMPLEX IMPEDANCE OF CELLS AND BATTERIES; U.S. Pat. No. 6,037,751, issued Mar. 14, 2000, entitled APPARATUS FOR CHARGING BATTERIES; U.S. Pat. No. 6,037,777, issued Mar. 14, 2000, entitled METHOD AND APPARATUS FOR DETERMINING BATTERY PROPERTIES FROM COMPLEX IMPEDANCE/ADMITTANCE; U.S. Pat. No. 6,051,976, issued Apr. 18, 2000, entitled METHOD AND APPARATUS FOR AUDITING A BATTERY TEST; U.S. Pat. No. 6,081,098, issued Jun. 27, 2000, entitled METHOD AND APPARATUS FOR CHARGING A BATTERY; U.S. Pat. No. 6,091,245, issued Jul. 18, 2000, entitled METHOD AND APPARATUS FOR AUDITING A BATTERY TEST; U.S. Pat. No. 6,104,167, issued Aug. 15, 2000, entitled METHOD AND APPARATUS FOR CHARGING A BATTERY; U.S. Pat. No. 6,137,269, issued Oct. 24, 2000, entitled METHOD AND APPARATUS FOR ELECTRONICALLY EVALUATING THE INTERNAL TEMPERATURE OF AN ELECTROCHEMICAL CELL OR BATTERY; U.S. Pat. No. 6,163,156, issued Dec. 19, 2000, entitled ELECTRICAL CONNECTION FOR ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,172,483, issued Jan. 9, 2001, entitled METHOD AND APPARATUS FOR MEASURING COMPLEX IMPEDANCE OF CELL AND BATTERIES; U.S. Pat. No. 6,172,505, issued Jan. 9, 2001, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,222,369, issued Apr. 24, 2001, entitled METHOD AND APPARATUS FOR DETERMINING BATTERY PROPERTIES FROM COMPLEX IMPEDANCE/ADMITTANCE; U.S. Pat. No. 6,225,808, issued May 1, 2001, entitled TEST COUNTER FOR ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,249,124, issued Jun. 19, 2001, entitled ELECTRONIC BATTERY TESTER WITH INTERNAL BATTERY; U.S. Pat. No. 6,259,254, issued Jul. 10, 2001, entitled APPARATUS AND METHOD FOR CARRYING OUT DIAGNOSTIC TESTS ON BATTERIES AND FOR RAPIDLY CHARGING BATTERIES; U.S. Pat. No. 6,262,563, issued Jul. 17, 2001, entitled METHOD AND APPARATUS FOR MEASURING COMPLEX ADMITTANCE OF CELLS AND BATTERIES; U.S. Pat. No. 6,294,896, issued Sep. 25, 2001; entitled METHOD AND APPARATUS FOR MEASURING COMPLEX SELF-IMMITANCE OF A GENERAL ELECTRICAL ELEMENT; U.S. Pat. No. 6,294,897, issued Sep. 25, 2001, entitled METHOD AND APPARATUS FOR ELECTRONICALLY EVALUATING THE INTERNAL TEMPERATURE OF AN ELECTROCHEMICAL CELL OR BATTERY; U.S. Pat. No. 6,304,087, issued Oct. 16, 2001, entitled APPARATUS FOR CALIBRATING ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,310,481, issued Oct. 30, 2001, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,313,607, issued Nov. 6, 2001, entitled METHOD AND APPARATUS FOR EVALUATING STORED CHARGE IN AN ELECTROCHEMICAL CELL OR BATTERY; U.S. Pat. No. 6,313,608, issued Nov. 6, 2001, entitled METHOD AND APPARATUS FOR CHARGING A BATTERY; U.S. Pat. No. 6,316,914, issued Nov. 13, 2001, entitled TESTING PARALLEL STRINGS OF STORAGE BATTERIES; U.S. Pat. No. 6,323,650, issued Nov. 27, 2001, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,329,793, issued Dec. 11, 2001, entitled METHOD AND APPARATUS FOR CHARGING A BATTERY; U.S. Pat. No. 6,331,762, issued Dec. 18, 2001, entitled ENERGY MANAGEMENT SYSTEM FOR AUTOMOTIVE VEHICLE; U.S. Pat. No. 6,332,113, issued Dec. 18, 2001, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,351,102, issued Feb. 26, 2002, entitled AUTOMOTIVE BATTERY CHARGING SYSTEM TESTER; U.S. Pat. No. 6,359,441, issued Mar. 19, 2002, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,363,303, issued Mar. 26, 2002, entitled ALTERNATOR DIAGNOSTIC SYSTEM, U.S. Pat. No. 6,392,414, issued May 21, 2002, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,417,669, issued Jul. 9, 2002, entitled SUPPRESSING INTERFERENCE IN AC MEASUREMENTS OF CELLS, BATTERIES AND OTHER ELECTRICAL ELEMENTS; U.S. Pat. No. 6,424,158, issued Jul. 23, 2002, entitled APPARATUS AND METHOD FOR CARRYING OUT DIAGNOSTIC TESTS ON BATTERIES AND FOR RAPIDLY CHARGING BATTERIES; U.S. Pat. No. 6,441,585, issued Aug. 17, 2002, entitled APPARATUS AND METHOD FOR TESTING RECHARGEABLE ENERGY STORAGE BATTERIES; U.S. Pat. No. 6,445,158, issued Sep. 3, 2002, entitled VEHICLE ELECTRICAL SYSTEM TESTER WITH ENCODED OUTPUT; U.S. Pat. No. 6,456,045, issued Sep. 24, 2002, entitled INTEGRATED CONDUCTANCE AND LOAD TEST BASED ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,466,025, issued Oct. 15, 2002, entitled ALTERNATOR TESTER; U.S. Pat. No. 6,466,026, issued Oct. 15, 2002, entitled PROGRAMMABLE CURRENT EXCITER FOR MEASURING AC IMMITTANCE OF CELLS AND BATTERIES; U.S. Pat. No. 6,534,993, issued Mar. 18, 2003, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,544,078, issued Apr. 8, 2003, entitled BATTERY CLAMP WITH INTEGRATED CURRENT SENSOR; U.S. Pat. No. 6,556,019, issued Apr. 29, 2003, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,566,883, issued May 20, 2003, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 6,586,941, issued Jul. 1, 2003, entitled BATTERY TESTER WITH DATABUS; U.S. Pat. No. 6,597,150, issued Jul. 22, 2003, entitled METHOD OF DISTRIBUTING JUMP-START BOOSTER PACKS; U.S. Ser. No. 09/780,146, filed Feb. 9, 2001, entitled STORAGE BATTERY WITH INTEGRAL BATTERY TESTER; U.S. Ser. No. 09/756,638, filed Jan. 8, 2001, entitled METHOD AND APPARATUS FOR DETERMINING BATTERY PROPERTIES FROM COMPLEX IMPEDANCE/ADMITTANCE; U.S. Ser. No. 09/862,783, filed May 21, 2001, entitled METHOD AND APPARATUS FOR TESTING CELLS AND BATTERIES EMBEDDED IN SERIES/PARALLEL SYSTEMS; U.S. Ser. No. 09/960,117, filed Sep. 20, 2001, entitled IN-VEHICLE BATTERY MONITOR; U.S. Ser. No. 09/908,278, filed Jul. 18, 2001, entitled BATTERY CLAMP WITH EMBEDDED ENVIRONMENT SENSOR; U.S. Ser. No. 09/880,473, filed Jun. 13, 2001; entitled BATTERY TEST MODULE; U.S. Ser. No. 09/940,684, filed Aug. 27, 2001, entitled METHOD AND APPARATUS FOR EVALUATING STORED CHARGE IN AN ELECTROCHEMICAL CELL OR BATTERY; U.S. Ser. No. 60/330,441, filed Oct. 17, 2001, entitled ELECTRONIC BATTERY TESTER WITH RELATIVE TEST OUTPUT; U.S. Ser. No. 60/348,479, filed Oct. 29, 2001, entitled CONCEPT FOR TESTING HIGH POWER VRLA BATTERIES; U.S. Ser. No. 10/046,659, filed Oct. 29, 2001, entitled ENERGY MANAGEMENT SYSTEM FOR AUTOMOTIVE VEHICLE; U.S. Ser. No. 09/993,468, filed Nov. 14, 2001, entitled KELVIN CONNECTOR FOR A BATTERY POST; U.S. Ser. No. 09/992,350, filed Nov. 26, 2001, entitled ELECTRONIC BATTERY TESTER, U.S. Ser. No. 60/341,902, filed Dec. 19, 2001, entitled BATTERY TESTER MODULE; U.S. Ser. No. 10/042,451, filed Jan. 8, 2002, entitled BATTERY CHARGE CONTROL DEVICE, U.S. Ser. No. 10/073,378, filed Feb. 8, 2002, entitled METHOD AND APPARATUS USING A CIRCUIT MODEL TO EVALUATE CELL/BATTERY PARAMETERS; U.S. Ser. No. 10/093,853, filed Mar. 7, 2002, entitled ELECTRONIC BATTERY TESTER WITH NETWORK COMMUNICATION; U.S. Ser. No. 60/364,656, filed Mar. 14, 2002, entitled ELECTRONIC BATTERY TESTER WITH LOW TEMPERATURE RATING DETERMINATION; U.S. Ser. No. 10/098,741, filed Mar. 14, 2002, entitled METHOD AND APPARATUS FOR AUDITING A BATTERY TEST; U.S. Ser. No. 10/112,114, filed Mar. 28, 2002; U.S. Ser. No. 10/109,734, filed Mar. 28, 2002; U.S. Ser. No. 10/112,105, filed Mar. 28, 2002, entitled CHARGE CONTROL SYSTEM FOR A VEHICLE BATTERY; U.S. Ser. No. 10/112,998, filed Mar. 29, 2002, entitled BATTERY TESTER WITH BATTERY REPLACEMENT OUTPUT; U.S. Ser. No. 10/119,297, filed Apr. 9, 2002, entitled METHOD AND APPARATUS FOR TESTING CELLS AND BATTERIES EMBEDDED IN SERIES/PARALLEL SYSTEMS; U.S. Ser. No. 60/379,281, filed May 8, 2002, entitled METHOD FOR DETERMINING BATTERY STATE OF CHARGE; U.S. Ser. No. 60/387,046, filed Jun. 7, 2002, entitled METHOD AND APPARATUS FOR INCREASING THE LIFE OF A STORAGE BATTERY; U.S. Ser. No. 10/177,635, filed Jun. 21, 2002, entitled BATTERY CHARGER WITH BOOSTER PACK; U.S. Ser. No. 10/207,495, filed Jul. 29, 2002, entitled KELVIN CLAMP FOR ELECTRICALLY COUPLING TO A BATTERY CONTACT; U.S. Ser. No. 10/200,041, filed Jul. 19, 2002, entitled AUTOMOTIVE VEHICLE ELECTRICAL SYSTEM DIAGNOSTIC DEVICE; U.S. Ser. No. 10/217,913, filed Aug. 13, 2002, entitled, BATTERY TEST MODULE; U.S. Ser. No. 60/408,542, filed Sep. 5, 2002, entitled BATTERY TEST OUTPUTS ADJUSTED BASED UPON TEMPERATURE; U.S. Ser. No. 10/246,439, filed Sep. 18, 2002, entitled BATTERY TESTER UPGRADE USING SOFTWARE KEY; U.S. Ser. No. 60/415,399, filed Oct. 2, 2002, entitled QUERY BASED ELECTRONIC BATTERY TESTER; and U.S. Ser. No. 10/263,473, filed Oct. 2, 2002, entitled ELECTRONIC BATTERY TESTER WITH RELATIVE TEST OUTPUT; U.S. Ser. No. 60/415,796, filed Oct. 3, 2002, entitled QUERY BASED ELECTRONIC BATTERY TESTER; U.S. Ser. No. 10/271,342, filed Oct. 15, 2002, entitled IN-VEHICLE BATTERY MONITOR; U.S. Ser. No. 10/270,777, filed Oct. 15, 2002, entitled PROGRAMMABLE CURRENT EXCITER FOR MEASURING AC IMMITTANCE OF CELLS AND BATTERIES; U.S. Ser. No. 10/310,515, filed Dec. 5, 2002, entitled BATTERY TEST MODULE; U.S. Ser. No. 10/310,490, filed Dec. 5, 2002, entitled ELECTRONIC BATTERY TESTER; U.S. Ser. No. 10/310,385, filed Dec. 5, 2002, entitled BATTERY TEST MODULE, U.S. Ser. No. 60/437,255, filed Dec. 31, 2002, entitled REMAINING TIME PREDICTIONS, U.S. Ser. No. 60/437,224, filed Dec. 31, 2002, entitled DISCHARGE VOLTAGE PREDICTIONS, U.S. Ser. No. 10/349,053, filed Jan. 22, 2003, entitled APPARATUS AND METHOD FOR PROTECTING A BATTERY FROM OVERDISCHARGE, U.S. Ser. No. 10/388,855, filed Mar. 14, 2003, entitled ELECTRONIC BATTERY TESTER WITH BATTERY FAILURE TEMPERATURE DETERMINATION, U.S. Ser. No. 10/396,550, filed Mar. 25, 2003, entitled ELECTRONIC BATTERY TESTER, U.S. Ser. No. 60/467,872, filed May 5, 2003, entitled METHOD FOR DETERMINING BATTERY STATE OF CHARGE, U.S. Ser. No. 60/477,082, filed Jun. 9, 2003, entitled ALTERNATOR TESTER, U.S. Ser. No. 10/460,749, filed Jun. 12, 2003, entitled MODULAR BATTERY TESTER FOR SCAN TOOL, U.S. Ser. No. 10/462,323, filed Jun. 16, 2003, entitled ELECTRONIC BATTERY TESTER HAVING A USER INTERFACE TO CONFIGURE A PRINTER, U.S. Ser. No. 10/601,608, filed Jun. 23, 2003, entitled CABLE FOR ELECTRONIC BATTERY TESTER, U.S. Ser. No. 10/601,432, filed Jun. 23, 2003, entitled BATTERY TESTER CABLE WITH MEMORY; U.S. Ser. No. 60/490,153, filed Jul. 25, 2003, entitled SHUNT CONNECTION TO A PCB FOR AN ENERGY MANAGEMENT SYSTEM EMPLOYED IN AN AUTOMOTIVE VEHICLE, which are incorporated herein in their entirety.
In general, prior art battery testers, that test storage batteries by measuring battery conductance, are capable of relatively accurately determining whether the batteries fall in a “good” or “bad” category with respect to short, high rate discharges. However, in certain applications, such as golf cars that are powered over an extended period of time by battery strings, determining battery and string conditions solely on the basis of battery conductance measurements may provide inadequate results.
The present invention is directed to the use of a dynamic battery parameter, coupled with battery recovery voltage differential (change in voltage after the battery is initially released from a load until some time later (for example, 10 seconds)), to determine battery capacity and fitness for further service. A method and apparatus for testing a storage battery is provided in which a battery is measured to obtain a battery dynamic parameter value such as conductance. The battery is measured to obtain an open circuit voltage and a recovery voltage differential after a brief applied load. A condition of the battery is determined as a function of the measured battery dynamic parameter, the open circuit voltage and the recovery voltage differential.
In accordance with the present invention, battery tester 10 combines prediction of battery capacity from a battery dynamic parameter, such as battery conductance, along with an additional judgment based on a recovery voltage differential. As used herein, the recovery voltage differential is the change in voltage after the battery is initially released from a load until some time later (for example, 10 seconds). Again, there is no load from the beginning to the end of the recovery period. Although the example embodiments of the present invention described herein relate to battery capacity predictions from battery conductance measurements and recovery voltage differential, dynamic parameters other than battery conductance may be utilized without departing from the spirit and scope of the invention. Examples of other dynamic parameters include dynamic resistance, admittance, impedance, reactance, susceptance or their combinations.
Using the above predictions as well as determining conditions that would be cause for failure, such as shorting, tester 10 makes a determination of the capacity of battery 12 from unique characteristics (such as maximum battery capacity, the battery resistance limit, minimum open circuit voltage of the battery, etc.) corresponding to the particular type of battery (for example, TROJAN T-105 6V golf car battery). These values can be compared to a passing level of standard capacity testing (the time in minutes that a fully charged battery can run at 75 amps to 1.75V per cell) that the user specifies (inputs via input 18) as needed for battery 12. A condition of battery 12, determined based on the comparison of the predicted capacity value(s) and the passing level of capacity, is provided to the user via output 72.
In addition to being able to carry out the above-described functions, in some embodiments, tester 10 also includes a string function. In other words, tester 10 is capable of testing each battery of multiple batteries in battery string 11 one at a time. After the last battery is tested, the entire string is analyzed to determine if individual batteries are out of balance in voltage or capacity with respect to the rest of the string. If so, there may be operational problems that could develop even though all the batteries in the string meet the specification (have capacities above the minimum passing level of capacity). Out of balance batteries are thus noted by test circuitry 16 and a suitable output is provided to the user via output 72. Of course, a “bad” battery (battery having a capacity below the minimum passing level of capacity) will always be out of balance and out of specification.
Circuitry 16 operates in accordance with one embodiment of the present invention and determines the conductance (G) of battery 12, the open circuit voltage (OCV) between terminals 22 and 24 of battery 12, a load voltage, a load resistance and the recovery voltage differential. Circuitry 16 includes current source 50, differential amplifier 52, analog-to-digital converter 54, microprocessor 56 and a load circuit with associated switch S, which is controlled by microprocessor 56 such that load RL can be applied to battery 12 for a predetermined time period. Amplifier 52 is capacitively coupled to battery 12 through capacitors C1 and C2. Amplifier 52 has an output connected to an input of analog-to-digital converter 54. Microprocessor 56 is connected to system clock 58, memory 60 and analog-to-digital converter 54. Microprocessor 56 is also capable of receiving inputs or information from input device 18. Microprocessor 56 also connects to output device 72.
In operation, current source 50, which is electrically coupled to battery 12 by switch S, is controlled by microprocessor 56 and provides a current I in the direction shown by the arrow in
Circuitry 16 is connected to battery 12 through a four-point connection technique known as a Kelvin connection. This Kelvin connection allows current I to be injected into battery 12 through a first pair of terminals while the voltage V across the terminals 22 and 24 is measured by a second pair of connections. Because very little current flows through amplifier 52, the voltage drop across the inputs to amplifier 52 is substantially identical to the voltage drop across terminals 22 and 24 of battery 12. The output of differential amplifier 52 is converted to a digital format and is provided to microprocessor 56. Microprocessor 56 operates at a frequency determined by system clock 58 and in accordance with programming instructions stored in memory 60.
Microprocessor 56 determines the conductance of battery 12 by applying a current pulse I using current source 50. The microprocessor determines the change in battery voltage due to the current pulse I using amplifier 52 and analog-to-digital converter 54. The value of current I generated by current source 50 is known and is stored in memory 60. Microprocessor 56 calculates the conductance (G) (or reciprocally the resistance (R)) of battery 12 using the following equation:
where ΔI is the change in current flowing through battery 12 due to current source 50 and ΔV is the change in battery voltage due to applied current ΔI. Microprocessor 56 also uses other information input from input device 18 provided by the tester user. This information includes the particular type of battery, the passing level of battery capacity, etc.
Under the control of microprocessor 56, test circuitry 16 determines a condition of battery 12 as a function of the measured battery dynamic parameter (determined from Equation 1 above), the OCV (measured between the terminals of the battery as described above), the recovery voltage differential and the passing level of battery capacity entered by the user.
It should be noted that the recovery voltage differential is determined by test circuitry 16, with the help of microprocessor 56, by first applying load RL on the battery for a period of time (10 seconds, for example). The battery voltage and current is measured at the end of the time period. Load RL is turned off by microprocessor 56, which controls operation of switch S. A first unloaded voltage is measured after a short delay. A second unloaded voltage is then measured after an additional wait period. The difference between the first unloaded voltage and the second unloaded voltage is the recovery voltage differential. All the above measurements are carried out under the control of microprocessor 56. Also, microprocessor 56 carries out all the above computations.
R2(N)=(VBB1−V10)/I10 Equation 2
BBV(N)=VBB2−VBB1 Equation 3
DF=FN(V5(N), BTYPE) Equation 4
BBLIMIT(N)=BBLIMIT*DF Equation 5
where, V10 is a load voltage at 10 seconds, I10 is a load current at 10 seconds, VBB1 is an unloaded voltage at 10.5 seconds, R2(N) is the load resistance of the presently tested battery, VBB2 is an unloaded voltage at the end of 20 seconds, BBV(N) is a recovery voltage differential of the presently tested battery, DF is the discharge factor which is a mathematical function (FN) of voltage and battery type, and BBLIMIT(N) is a recovery voltage differential limit. At step 458, a determination is made as to whether CAP(N) is greater than the maximum battery capacity (CAPMAX). If this condition is satisfied, at step 460, a determination is made as to whether BBV(N) is greater than a fraction of BBLIMIT(N) [BBV(N)>0.8*BBLIMIT(N), for example] and whether BBV(N) is less than or equal to BBLIMIT(N). If this condition is satisfied, at step 462, CAP(N) is updated to a fraction of its original value [CAP(N)=0.85*CAP(N), for example, to accommodate new batteries that have not cycled up to normal capacity] and control passes to step 468. If the condition at step 460 is not satisfied, control passes to step 466 where CAP(N) is set equal to CAPMAX and control passes to step 468. Referring back to step 458, if the condition at this step is not satisfied, control also passes to step 468. At step 468, a determination is made as to whether V5(N) is less than VLOW and whether the battery charge has been questioned (CQ=0?). If the condition at step 468 is not satisfied, then control passes, via step 482, to the battery condition procedure (
Instructions for carrying out the above procedure (
Although the present invention has been described with reference to preferred embodiments, workers skilled in the art will recognize that changes may be made in form and detail without departing from the spirit and scope of the invention. Also, if battery temperature experiences large variations from normal room ambient conditions, a correction factor can be applied to the results using manual or automatic battery temperature input. For example, although the above embodiments have been described in connection with golf car batteries, the battery testing techniques of the present invention can be utilized for testing a number of different types of batteries, without departing from the scope and spirit of the present invention.
Number | Name | Date | Kind |
---|---|---|---|
2000665 | Neal | May 1935 | A |
2514745 | Dalzell | Jul 1950 | A |
3356936 | Smith | Dec 1967 | A |
3562634 | Latner | Feb 1971 | A |
3593099 | Scholl | Jul 1971 | A |
3607673 | Seyl | Sep 1971 | A |
3652341 | Halsall et al. | Mar 1972 | A |
3676770 | Sharaf et al. | Jul 1972 | A |
3729989 | Little | May 1973 | A |
3750011 | Kreps | Jul 1973 | A |
3753094 | Furuishi et al. | Aug 1973 | A |
3796124 | Crosa | Mar 1974 | A |
3808522 | Sharaf | Apr 1974 | A |
3811089 | Strezelewicz | May 1974 | A |
3873911 | Champlin | Mar 1975 | A |
3876931 | Godshalk | Apr 1975 | A |
3886443 | Miyakawa et al. | May 1975 | A |
3889248 | Ritter | Jun 1975 | A |
3906329 | Bader | Sep 1975 | A |
3909708 | Champlin | Sep 1975 | A |
3936744 | Perlmutter | Feb 1976 | A |
3946299 | Christianson et al. | Mar 1976 | A |
3947757 | Grube et al. | Mar 1976 | A |
3969667 | McWilliams | Jul 1976 | A |
3979664 | Harris | Sep 1976 | A |
3984762 | Dowgiallo, Jr. | Oct 1976 | A |
3984768 | Staples | Oct 1976 | A |
3989544 | Santo | Nov 1976 | A |
4008619 | Alcaide et al. | Feb 1977 | A |
4023882 | Pettersson | May 1977 | A |
4024953 | Nailor, III | May 1977 | A |
4047091 | Hutchines et al. | Sep 1977 | A |
4053824 | Dupuis et al. | Oct 1977 | A |
4056764 | Endo et al. | Nov 1977 | A |
4070624 | Taylor | Jan 1978 | A |
4080560 | Abert | Mar 1978 | A |
4086531 | Bernier | Apr 1978 | A |
4112351 | Back et al. | Sep 1978 | A |
4114083 | Benham et al. | Sep 1978 | A |
4126874 | Suzuki et al. | Nov 1978 | A |
4160916 | Papasideris | Jul 1979 | A |
4178546 | Hulls et al. | Dec 1979 | A |
4193025 | Frailing et al. | Mar 1980 | A |
4207611 | Gordon | Jun 1980 | A |
4217645 | Barry et al. | Aug 1980 | A |
4280457 | Bloxham | Jul 1981 | A |
4297639 | Branham | Oct 1981 | A |
4315204 | Sievers et al. | Feb 1982 | A |
4316185 | Watrous et al. | Feb 1982 | A |
4322685 | Frailing et al. | Mar 1982 | A |
4351405 | Fields et al. | Sep 1982 | A |
4352067 | Ottone | Sep 1982 | A |
4360780 | Skutch, Jr. | Nov 1982 | A |
4361809 | Bil et al. | Nov 1982 | A |
4363407 | Buckler et al. | Dec 1982 | A |
4369407 | Korbell | Jan 1983 | A |
4379989 | Kurz et al. | Apr 1983 | A |
4379990 | Sievers et al. | Apr 1983 | A |
4385269 | Aspinwall et al. | May 1983 | A |
4390828 | Converse et al. | Jun 1983 | A |
4392101 | Saar et al. | Jul 1983 | A |
4396880 | Windebank | Aug 1983 | A |
4408157 | Beaubien | Oct 1983 | A |
4412169 | Dell'Orto | Oct 1983 | A |
4423378 | Marino et al. | Dec 1983 | A |
4423379 | Jacobs et al. | Dec 1983 | A |
4424491 | Bobbett et al. | Jan 1984 | A |
4459548 | Lentz et al. | Jul 1984 | A |
4514694 | Finger | Apr 1985 | A |
4520353 | McAuliffe | May 1985 | A |
4564798 | Young | Jan 1986 | A |
4620767 | Woolf | Nov 1986 | A |
4633418 | Bishop | Dec 1986 | A |
4659977 | Kissel et al. | Apr 1987 | A |
4663580 | Wortman | May 1987 | A |
4665370 | Holland | May 1987 | A |
4667143 | Cooper et al. | May 1987 | A |
4667279 | Maier | May 1987 | A |
4678998 | Muramatsu | Jul 1987 | A |
4679000 | Clark | Jul 1987 | A |
4680528 | Mikami et al. | Jul 1987 | A |
4686442 | Radomski | Aug 1987 | A |
4697134 | Burkum et al. | Sep 1987 | A |
4707795 | Alber et al. | Nov 1987 | A |
4709202 | Koenck et al. | Nov 1987 | A |
4710861 | Kanner | Dec 1987 | A |
4719428 | Liebermann | Jan 1988 | A |
4723656 | Kiernan et al. | Feb 1988 | A |
4743855 | Randin et al. | May 1988 | A |
4745349 | Palanisamy et al. | May 1988 | A |
4816768 | Champlin | Mar 1989 | A |
4820966 | Fridman | Apr 1989 | A |
4825170 | Champlin | Apr 1989 | A |
4847547 | Eng, Jr. et al. | Jul 1989 | A |
4849700 | Morioka et al. | Jul 1989 | A |
4874679 | Miyagawa | Oct 1989 | A |
4876495 | Palanisamy et al. | Oct 1989 | A |
4881038 | Champlin | Nov 1989 | A |
4888716 | Ueno | Dec 1989 | A |
4912416 | Champlin | Mar 1990 | A |
4913116 | Katogi et al. | Apr 1990 | A |
4926330 | Abe et al. | May 1990 | A |
4929931 | McCuen | May 1990 | A |
4931738 | MacIntyre et al. | Jun 1990 | A |
4933845 | Hayes | Jun 1990 | A |
4934957 | Bellusci | Jun 1990 | A |
4937528 | Palanisamy | Jun 1990 | A |
4947124 | Hauser | Aug 1990 | A |
4949046 | Seyfang | Aug 1990 | A |
4956597 | Heavey et al. | Sep 1990 | A |
4968941 | Rogers | Nov 1990 | A |
4968942 | Palanisamy | Nov 1990 | A |
5004979 | Marino et al. | Apr 1991 | A |
5032825 | Kuznicki | Jul 1991 | A |
5037778 | Stark et al. | Aug 1991 | A |
5047722 | Wurst et al. | Sep 1991 | A |
5081565 | Nabha et al. | Jan 1992 | A |
5087881 | Peacock | Feb 1992 | A |
5095223 | Thomas | Mar 1992 | A |
5108320 | Kimber | Apr 1992 | A |
5126675 | Yang | Jun 1992 | A |
5140269 | Champlin | Aug 1992 | A |
5144218 | Bosscha | Sep 1992 | A |
5144248 | Alexandres et al. | Sep 1992 | A |
5159272 | Rao et al. | Oct 1992 | A |
5160881 | Schramm et al. | Nov 1992 | A |
5170124 | Blair et al. | Dec 1992 | A |
5179335 | Nor | Jan 1993 | A |
5194799 | Tomantschger | Mar 1993 | A |
5204611 | Nor et al. | Apr 1993 | A |
5214370 | Harm et al. | May 1993 | A |
5214385 | Gabriel et al. | May 1993 | A |
5241275 | Fang | Aug 1993 | A |
5254952 | Salley et al. | Oct 1993 | A |
5266880 | Newland | Nov 1993 | A |
5281919 | Palanisamy | Jan 1994 | A |
5281920 | Wurst | Jan 1994 | A |
5295078 | Stich et al. | Mar 1994 | A |
5298797 | Redl | Mar 1994 | A |
5300874 | Shimamoto et al. | Apr 1994 | A |
5302902 | Groehl | Apr 1994 | A |
5313152 | Wozniak et al. | May 1994 | A |
5315287 | Sol | May 1994 | A |
5321626 | Palladino | Jun 1994 | A |
5321627 | Reher | Jun 1994 | A |
5323337 | Wilson et al. | Jun 1994 | A |
5325041 | Briggs | Jun 1994 | A |
5331268 | Patino et al. | Jul 1994 | A |
5336993 | Thomas et al. | Aug 1994 | A |
5338515 | Dalla Betta et al. | Aug 1994 | A |
5339018 | Brokaw | Aug 1994 | A |
5343380 | Champlin | Aug 1994 | A |
5347163 | Yoshimura | Sep 1994 | A |
5352968 | Reni et al. | Oct 1994 | A |
5365160 | Leppo et al. | Nov 1994 | A |
5365453 | Startup et al. | Nov 1994 | A |
5369364 | Renirie et al. | Nov 1994 | A |
5381096 | Hirzel | Jan 1995 | A |
5410754 | Klotzbach et al. | Apr 1995 | A |
5412308 | Brown | May 1995 | A |
5412323 | Kato et al. | May 1995 | A |
5426371 | Salley et al. | Jun 1995 | A |
5426416 | Jefferies et al. | Jun 1995 | A |
5432025 | Cox | Jul 1995 | A |
5432426 | Yoshida | Jul 1995 | A |
5434495 | Toko | Jul 1995 | A |
5435185 | Eagan | Jul 1995 | A |
5442274 | Tamai | Aug 1995 | A |
5445026 | Eagan | Aug 1995 | A |
5449996 | Matsumoto et al. | Sep 1995 | A |
5449997 | Gilmore et al. | Sep 1995 | A |
5451881 | Finger | Sep 1995 | A |
5453027 | Buell et al. | Sep 1995 | A |
5457377 | Jonsson | Oct 1995 | A |
5469043 | Cherng et al. | Nov 1995 | A |
5485090 | Stephens | Jan 1996 | A |
5488300 | Jamieson | Jan 1996 | A |
5519383 | De La Rosa | May 1996 | A |
5528148 | Rogers | Jun 1996 | A |
5537967 | Tashiro et al. | Jul 1996 | A |
5541489 | Dunstan | Jul 1996 | A |
5546317 | Andrieu | Aug 1996 | A |
5548273 | Nicol et al. | Aug 1996 | A |
5550485 | Falk | Aug 1996 | A |
5561380 | Sway-Tin et al. | Oct 1996 | A |
5562501 | Kinoshita et al. | Oct 1996 | A |
5563496 | McClure | Oct 1996 | A |
5572136 | Champlin | Nov 1996 | A |
5574355 | McShane et al. | Nov 1996 | A |
5578915 | Crouch, Jr. et al. | Nov 1996 | A |
5583416 | Klang | Dec 1996 | A |
5585728 | Champlin | Dec 1996 | A |
5589757 | Klang | Dec 1996 | A |
5592093 | Klingbiel | Jan 1997 | A |
5592094 | Ichikawa | Jan 1997 | A |
5596260 | Moravec et al. | Jan 1997 | A |
5598098 | Champlin | Jan 1997 | A |
5602462 | Stich et al. | Feb 1997 | A |
5606242 | Hull et al. | Feb 1997 | A |
5614788 | Mullins et al. | Mar 1997 | A |
5621298 | Harvey | Apr 1997 | A |
5633985 | Severson et al. | May 1997 | A |
5637978 | Kellett et al. | Jun 1997 | A |
5642031 | Brotto | Jun 1997 | A |
5650937 | Bounaga | Jul 1997 | A |
5652501 | McClure et al. | Jul 1997 | A |
5653659 | Kunibe et al. | Aug 1997 | A |
5654623 | Shiga et al. | Aug 1997 | A |
5656920 | Cherng et al. | Aug 1997 | A |
5661368 | Deol et al. | Aug 1997 | A |
5675234 | Greene | Oct 1997 | A |
5677077 | Faulk | Oct 1997 | A |
5699050 | Kanazawa | Dec 1997 | A |
5701089 | Perkins | Dec 1997 | A |
5705929 | Caravello et al. | Jan 1998 | A |
5707015 | Guthrie | Jan 1998 | A |
5710503 | Sideris et al. | Jan 1998 | A |
5711648 | Hammerslag | Jan 1998 | A |
5717336 | Basell et al. | Feb 1998 | A |
5717937 | Fritz | Feb 1998 | A |
5739667 | Matsuda et al. | Apr 1998 | A |
5745044 | Hyatt, Jr. et al. | Apr 1998 | A |
5747909 | Syverson et al. | May 1998 | A |
5747967 | Muljadi et al. | May 1998 | A |
5754417 | Nicollini | May 1998 | A |
5757192 | McShane et al. | May 1998 | A |
5760587 | Harvey | Jun 1998 | A |
5772468 | Kowalski et al. | Jun 1998 | A |
5773978 | Becker | Jun 1998 | A |
5780974 | Pabla et al. | Jul 1998 | A |
5780980 | Naito | Jul 1998 | A |
5789899 | van Phuoc et al. | Aug 1998 | A |
5793359 | Ushikubo | Aug 1998 | A |
5796239 | van Phuoc et al. | Aug 1998 | A |
5808469 | Kopera | Sep 1998 | A |
5818234 | McKinnon | Oct 1998 | A |
5821756 | McShane et al. | Oct 1998 | A |
5821757 | Alvarez et al. | Oct 1998 | A |
5825174 | Parker | Oct 1998 | A |
5831435 | Troy | Nov 1998 | A |
5850113 | Weimer et al. | Dec 1998 | A |
5862515 | Kobayashi et al. | Jan 1999 | A |
5865638 | Trafton | Feb 1999 | A |
5872443 | Williamson | Feb 1999 | A |
5872453 | Shimoyama et al. | Feb 1999 | A |
5895440 | Proctor et al. | Apr 1999 | A |
5912534 | Benedict | Jun 1999 | A |
5914605 | Bertness | Jun 1999 | A |
5927938 | Hammerslag | Jul 1999 | A |
5929609 | Joy et al. | Jul 1999 | A |
5939855 | Proctor et al. | Aug 1999 | A |
5939861 | Joko et al. | Aug 1999 | A |
5945829 | Bertness | Aug 1999 | A |
5951229 | Hammerslag | Sep 1999 | A |
5961561 | Wakefield, II | Oct 1999 | A |
5961604 | Anderson et al. | Oct 1999 | A |
5969625 | Russo | Oct 1999 | A |
5978805 | Carson | Nov 1999 | A |
5982138 | Krieger | Nov 1999 | A |
6002238 | Champlin | Dec 1999 | A |
6005759 | Hart et al. | Dec 1999 | A |
6008652 | Theofanopoulos et al. | Dec 1999 | A |
6009369 | Boisvert et al. | Dec 1999 | A |
6016047 | Notten et al. | Jan 2000 | A |
6031354 | Wiley et al. | Feb 2000 | A |
6031368 | Klippel et al. | Feb 2000 | A |
6037751 | Klang | Mar 2000 | A |
6037777 | Champlin | Mar 2000 | A |
6037778 | Makhija | Mar 2000 | A |
6046514 | Rouillard et al. | Apr 2000 | A |
6051976 | Bertness | Apr 2000 | A |
6055468 | Kaman et al. | Apr 2000 | A |
6061638 | Joyce | May 2000 | A |
6064372 | Kahkoska | May 2000 | A |
6072299 | Kurle et al. | Jun 2000 | A |
6072300 | Tsuji | Jun 2000 | A |
6081098 | Bertness et al. | Jun 2000 | A |
6081109 | Seymour et al. | Jun 2000 | A |
6091238 | McDermott | Jul 2000 | A |
6091245 | Bertness | Jul 2000 | A |
6094033 | Ding et al. | Jul 2000 | A |
6094053 | Harvey | Jul 2000 | A |
6104167 | Bertness et al. | Aug 2000 | A |
6114834 | Parise | Sep 2000 | A |
6137269 | Champlin | Oct 2000 | A |
6140797 | Dunn | Oct 2000 | A |
6144185 | Dougherty et al. | Nov 2000 | A |
6150793 | Lesesky et al. | Nov 2000 | A |
6158000 | Collins | Dec 2000 | A |
6161640 | Yamaguchi | Dec 2000 | A |
6163156 | Bertness | Dec 2000 | A |
6167349 | Alvarez | Dec 2000 | A |
6172483 | Champlin | Jan 2001 | B1 |
6172505 | Bertness | Jan 2001 | B1 |
6181545 | Amatucci et al. | Jan 2001 | B1 |
6211651 | Nemoto | Apr 2001 | B1 |
6215275 | Bean | Apr 2001 | B1 |
6222342 | Eggert et al. | Apr 2001 | B1 |
6222369 | Champlin | Apr 2001 | B1 |
D442503 | Lundbeck et al. | May 2001 | S |
6225808 | Varghese et al. | May 2001 | B1 |
6236332 | Conkright et al. | May 2001 | B1 |
6238253 | Qualls | May 2001 | B1 |
6242887 | Burke | Jun 2001 | B1 |
6249124 | Bertness | Jun 2001 | B1 |
6250973 | Lowery et al. | Jun 2001 | B1 |
6254438 | Gaunt | Jul 2001 | B1 |
6259170 | Limoge et al. | Jul 2001 | B1 |
6259254 | Klang | Jul 2001 | B1 |
6262563 | Champlin | Jul 2001 | B1 |
6263268 | Nathanson | Jul 2001 | B1 |
6274950 | Gottlieb et al. | Aug 2001 | B1 |
6275008 | Arai et al. | Aug 2001 | B1 |
6294896 | Champlin | Sep 2001 | B1 |
6294897 | Champlin | Sep 2001 | B1 |
6304087 | Bertness | Oct 2001 | B1 |
6307349 | Koenck et al. | Oct 2001 | B1 |
6310481 | Bertness | Oct 2001 | B2 |
6313607 | Champlin | Nov 2001 | B1 |
6313608 | Varghese et al. | Nov 2001 | B1 |
6316914 | Bertness | Nov 2001 | B1 |
6323650 | Bertness et al. | Nov 2001 | B1 |
6329793 | Bertness et al. | Dec 2001 | B1 |
6331762 | Bertness | Dec 2001 | B1 |
6332113 | Bertness | Dec 2001 | B1 |
6346795 | Haraguchi et al. | Feb 2002 | B2 |
6347958 | Tsai | Feb 2002 | B1 |
6351102 | Troy | Feb 2002 | B1 |
6356042 | Kahlon et al. | Mar 2002 | B1 |
6359441 | Bertness | Mar 2002 | B1 |
6359442 | Henningson et al. | Mar 2002 | B1 |
6363303 | Bertness | Mar 2002 | B1 |
RE37677 | Irie | Apr 2002 | E |
6384608 | Namaky | May 2002 | B1 |
6388448 | Cervas | May 2002 | B1 |
6392414 | Bertness | May 2002 | B2 |
6396278 | Makhija | May 2002 | B1 |
6411098 | Laletin | Jun 2002 | B1 |
6417669 | Champlin | Jul 2002 | B1 |
6424157 | Gollomp et al. | Jul 2002 | B1 |
6424158 | Klang | Jul 2002 | B2 |
6441585 | Bertness | Aug 2002 | B1 |
6445158 | Bertness et al. | Sep 2002 | B1 |
6449726 | Smith | Sep 2002 | B1 |
6456045 | Troy et al. | Sep 2002 | B1 |
6466025 | Klang | Oct 2002 | B1 |
6466026 | Champlin | Oct 2002 | B1 |
6495990 | Champlin | Dec 2002 | B2 |
6526361 | Jones et al. | Feb 2003 | B1 |
6531848 | Chitsazan et al. | Mar 2003 | B1 |
6534993 | Bertness | Mar 2003 | B2 |
6544078 | Palmisano et al. | Apr 2003 | B2 |
6556019 | Bertness | Apr 2003 | B2 |
6566883 | Vonderhaar et al. | May 2003 | B1 |
6570385 | Roberts et al. | May 2003 | B1 |
6577107 | Kechmire | Jun 2003 | B2 |
6586941 | Bertness et al. | Jul 2003 | B2 |
6597150 | Bertness et al. | Jul 2003 | B1 |
6600815 | Walding | Jul 2003 | B1 |
6618644 | Bean | Sep 2003 | B2 |
6621272 | Champlin | Sep 2003 | B2 |
6623314 | Cox et al. | Sep 2003 | B1 |
6628011 | Droppo et al. | Sep 2003 | B2 |
6629054 | Makhija et al. | Sep 2003 | B2 |
6633165 | Bertness | Oct 2003 | B2 |
6667624 | Raichle et al. | Dec 2003 | B1 |
6679212 | Kelling | Jan 2004 | B2 |
6696819 | Bertness | Feb 2004 | B2 |
6707303 | Bertness et al. | Mar 2004 | B2 |
6737831 | Champlin | May 2004 | B2 |
6759849 | Bertness | Jul 2004 | B2 |
6777945 | Roberts et al. | Aug 2004 | B2 |
6781382 | Johnson | Aug 2004 | B2 |
6784637 | Raichle et al. | Aug 2004 | B2 |
6788025 | Bertness et al. | Sep 2004 | B2 |
6788069 | Vacher | Sep 2004 | B2 |
6795782 | Bertness et al. | Sep 2004 | B2 |
6805090 | Bertness et al. | Oct 2004 | B2 |
6806716 | Bertness et al. | Oct 2004 | B2 |
6825669 | Raichle et al. | Nov 2004 | B2 |
6842707 | Raichle et al. | Jan 2005 | B2 |
20020010558 | Bertness et al. | Jan 2002 | A1 |
20020171428 | Bertness | Nov 2002 | A1 |
20020176010 | Wallach et al. | Nov 2002 | A1 |
20030025481 | Bertness | Feb 2003 | A1 |
20030036909 | Kato | Feb 2003 | A1 |
20030184262 | Makhija | Oct 2003 | A1 |
20030184306 | Bertness et al. | Oct 2003 | A1 |
20030194672 | Roberts et al. | Oct 2003 | A1 |
20040000590 | Raichle et al. | Jan 2004 | A1 |
20040000893 | Raichle et al. | Jan 2004 | A1 |
20040002824 | Raichle et al. | Jan 2004 | A1 |
20040002825 | Raichle et al. | Jan 2004 | A1 |
20040049361 | Hamdan et al. | Mar 2004 | A1 |
20040051533 | Namaky | Mar 2004 | A1 |
20040054503 | Namaky | Mar 2004 | A1 |
Number | Date | Country |
---|---|---|
0 022 450 | Jan 1981 | EP |
0 637 754 | Feb 1995 | EP |
0 772 056 | May 1997 | EP |
2 749 397 | Dec 1997 | FR |
2 029 586 | Mar 1980 | GB |
2 088 159 | Jun 1982 | GB |
2 246 916 | Oct 1990 | GB |
2 387 235 | Oct 2003 | GB |
59-17892 | Jan 1984 | JP |
59-17893 | Jan 1984 | JP |
59-17894 | Jan 1984 | JP |
59017894 | Jan 1984 | JP |
59215674 | Dec 1984 | JP |
60225078 | Nov 1985 | JP |
62-180284 | Aug 1987 | JP |
63027776 | Feb 1988 | JP |
03274479 | Dec 1991 | JP |
03282276 | Dec 1991 | JP |
4-8636 | Jan 1992 | JP |
04095788 | Mar 1992 | JP |
04131779 | May 1992 | JP |
04372536 | Dec 1992 | JP |
5216550 | Aug 1993 | JP |
7-128414 | May 1995 | JP |
09061505 | Mar 1997 | JP |
10056744 | Feb 1998 | JP |
10232273 | Sep 1998 | JP |
11103503 | Apr 1999 | JP |
2089015 | Aug 1997 | RU |
WO 9322666 | Nov 1993 | WO |
WO 9405069 | Mar 1994 | WO |
WO 9744652 | Nov 1997 | WO |
WO 9804910 | Feb 1998 | WO |
WO 9858270 | Dec 1998 | WO |
WO 9923738 | May 1999 | WO |
WO 0016083 | Mar 2000 | WO |
WO 0062049 | Oct 2000 | WO |
WO 0067359 | Nov 2000 | WO |
WO 0159443 | Feb 2001 | WO |
WO 0116614 | Mar 2001 | WO |
WO 0116615 | Mar 2001 | WO |
WO 0151947 | Jul 2001 | WO |
Number | Date | Country | |
---|---|---|---|
20060125482 A1 | Jun 2006 | US |