Apparatus and Method for Sensing and Converting Radio Frequency to Direct Current

Abstract

The apparatus and method thereof accurately sense and convert a radio frequency (RF) current signal to direct current (DC) independent of process variation and temperature, and without requiring high speed, high voltage amplifiers for its operation. The apparatus comprises an AC coupled circuit that couples the RF signal from the main device to a sense device with an N:M ratio, a low pass filter system that extracts the DC content of the RF current signal, and a negative feedback loop that forces the DC content of the main device and the sensed device to be equal. Exemplary embodiments include a current sensor that provides feedback to protect an RF power amplifier from over-current condition, and a RF power detection and control in a RF power amplifier (PA) that multiplies the sensed output current by the sensed output voltage to be used as a feedback to control the PA's bias.

Description

BACKGROUND OF THE INVENTION

1. Field of the Invention

The invention generally relates to current sensing applications, and more particularly to current sensing in radio frequency (RF) power amplifier.

2. Prior Art

Unlike current sensing in low speed circuit such as direct current to direct current (DC-DC) switching regulators or low dropout regulator (LDO), etc., the RF cellular power operates at very high-frequency, typically at frequencies above 1 GHz. Any analog circuits with feedback control loop to process high frequency will necessarily use lots of current and therefore decrease the efficiency of the system. Prior art examples the DC average current is sensed through an amplifier.

FIG. 1 depicts a prior art schematic diagram 100 of a DC average current sensed through an amplifier. The supply of the RF power amplifier 120 is not connected directly to the battery. Rather, it is regulated by a voltage regulator 110. With the RF choke inductor 124, the drain current of NMOS 126 is modulated with RF frequency, but the current through the voltage regulator 110 is the average DC current through MOS 126. Therefore, sensing this DC current is relatively simple with the current sense loop 130, where Isense_dc=Ivbat_dc/K, where K is the aspect ratio between the MOS 126 and the sense MOS 136 and Ivbat_dc is the DC current from the battery flowing through the inductor 124. The drawback of this prior solution is that the voltage regulator 110 consumes a large area and therefore also power, which results in overall power amplifier (PA) efficiency degradation.

In other prior art solutions that PA does not have the voltage regulator to control the supply, rather, the supply is connected directly to V_BAT. In order to sense the DC current, an off-chip external resistor Rsense (not shown) that is used connected between the RF choke inductor and the battery. The DC current drops across this resistor to create a sense voltage where Vsense=Idc×Rsense. Vsense is then brought back into chip to perform various signal processing controls. The drawback of this kind of solution is that the external resistor has to be very small, e.g., in the order of milliohms. This resistor can be expensive and consumes a large area. Also, when the sensed voltage is brought back into the chip, the accuracy may be compromised.

Therefore, in view of the deficiencies of the prior art, it would be advantageous to provide a solution that overcomes these deficiencies.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic diagram of a DC average current sensed through an amplifier.

FIG. 2 is a schematic diagram of the RF power amplifier section.

FIG. 3 is a schematic diagram of the RF power amplifier with a sensing circuitry in accordance with the principles of the invention.

FIGS. 4A and 4B are plots describing the wave forms at two nodes of the circuit.

FIGS. 5A and 5B are plots showing the accuracy of the invented circuit with respect to phase changes (5A) and supply voltage changes (5B).

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

The apparatus and method thereof accurately sense and convert a radio frequency (RF) current signal to direct current (DC) independent of process variation and temperature, and without requiring high speed, high voltage amplifiers for its operation. The apparatus comprises an AC coupled circuit that couples the RF signal from the main device to a sense device with an N:M ratio, a low pass filter system that extracts the DC content of the RF current signal, and a negative feedback loop that forces the DC content of the main device and the sensed device to be equal. Exemplary embodiments include a current sensor that provides feedback to protect an RF power amplifier from over-current condition, and a RF power detection and control in a RF power amplifier (PA) that multiplies the sensed output current by the sensed output voltage to be used as a feedback to control the PA's bias.

As discussed with respect of the prior art, it is advantageous in term of efficiency and area for an RF PA not to have a voltage regulator, and have the drain of MOS 126 of the PA to connect directly to the battery through the RF choke inductor 124. In this configuration, it is better to sense the RF current without the sense resistor as discussed in the prior art. Accordingly the invention discloses sensing of the RF current without the voltage regulator and without the sense resistor. Therefore a brief discussion of the circuit shown in FIG. 2 is now due. For the MOS 226 in saturation the drain current is:

$I_d=\frac{1}{2}\frac{W}{L}\mu {C_{\mathrm{ox}}\left(V_{\mathrm{gs}}-V_t\right)}^2\left(1+\lambda V_{\mathrm{ds}}\right)$

The MOS 226 current in the linear region is:

$I_d=\frac{W}{L}\mu C_{\mathrm{ox}}\left[\left(V_{\mathrm{gs}}-V_t\right)V_{\mathrm{ds}}-0.5V_{\mathrm{ds}}^2\right]$

In either region, the drain current is a function of Vgs, Vds and W/L. Cox is the capacitance of the oxide layer of the MOS device. μ is the charge-carrier effective mobility of the MOS device. Vt is the threshold voltage of the MOS device. Vgs is the gate to source voltage of the MOS device. Vds is the drain to source voltage of the MOS device. L is a channel length modulation parameter that models current dependence on drain voltage due to the Early effect. Therefore, in order to replicate, or otherwise sense, the current accurately, Vgs and Vds need to be forced to be equal, and then drain current will be scaled according to W/L. There are several advantages using the RF sensing circuit suggested by the invention. Among others these include the fact that all the components are on-chip which results in better matching, accuracy of the RF current copied to the sense device, no need for a sense resistor in the main signal path resulting in increased efficiency, low power as the analog circuit feedback does not see the RF signals toggling at high frequencies typically larger than 1 GHz, and extracting the DC value of the sensed RF current and feeding that to an over current protection (OCP) loop.

Reference is now made to FIG. 3 that depicts an exemplary and non-limiting schematic diagram 300 of the RF PA 200 with a sensing circuitry 310 in accordance with the principles of the invention. NMOS 226 (see FIG. 2 for reference) is the main transistor 226 of the RF PA 200 with an aspect ratio N=W/L. NMOS 311 is the sense device of the sensing circuit 310, with an aspect ratio of M=W/L, and in a preferred embodiment of the invention M=1. Therefore, if the RF signals at Vds and Vgs of NMOS 226 and NMOS 311 are forced to be equal, then the RF current in NMOS 311 replicates accurately with a ratio of N:1 the RF current in NMOS 226. As the gate and the source of NMOS 226 and NMOS 311 are connected respectively, they have the same gate-source voltage (V_GS).

In order to force the drain-source voltage to be equal for both NMOS 226 and NMOS 311, it is noted that for high frequency, i.e., RF, the drain voltage of NMOS 226 has a DC component and AC components. Therefore, in this invention, the LPF1 is used to extract the dc-component from the high frequency RF signal at the drain of 226. The AC-coupling capacitor Cac 312 is used to couple the AC high frequency drain signal from NMOS 226 to NMOS 311. However, the capacitor 312 only couples the AC component without the DC component. In order to force the DC components at node X and Y, i.e., the drain nodes of NMOS 226 and NMOS 311 respectively, to be the same, a low pass filter LPF2 314 and a negative-feedback loop that consists of op-amp 315 and PMOS 316 are used. Essentially, the low-pass filter systems LPF1 313 and LPF2 314 and the op-amp feedback loop 316 force the DC components at node X and Y to be equal. It should be noted that LPF 313 and/or LPF 314 can be implemented as a simple filter, a zero order filter or an n^th degree filter where ‘n’ is an integer value of 1 or more. LPF 313 and/or LPF 314 can be implemented as either passive filters or active filters, without departing from the scope of the invention. It should be further noted that the op-amp 315 can be implemented simply as a common gate or common source amplifier, or as complicated as any type of operational amplifier, without departing from the scope of the invention.

The major advantage of this invention is that after the low pass filter, the signal is DC. The negative feedback loop processes only a DC signal not the high frequency RF signal. Hence, the op-amp 315 does not have to have high bandwidth and therefore does not consume much current. It should be noted that PMOS 316 can be either a PMOS, or NMOS transistor circuitry, and the input sign of opt 315 would be swapped to maintain a negative feedback loop to force the voltages at nodes X and Y to be the same. The sensed RF current going through NMOS 311 passes through a DC extraction circuit 317 which can be as simple as a resistor and capacitor connected in parallel to provide a DC current that is equivalent to a DC average content of the sensed RF current going through NMOS 311. The wave forms shown with respect of nodes “X” and “Y” in FIG. 4A and FIG. 4B respectively, are examples for a RF PA simulation where the voltage standing-wave ratio (VSWR) angle is changed. As a result the current through the main NMOS 226 changes. FIGS. 5A and 5B depict exemplary and non-limiting plots 410 and 420 that show the accuracy of the circuit 300 of this invention. The scale down aspect ratio between NMOS 226 and NMOS 311 is N=870, the VSWR angle is changed and supply battery voltage level is changed.

It should be noted that NMOS 226 is at the output stage X of a PA and therefore may have a cascode of transistors. While the embodiment discussed hereinabove pertain to the case where the output of the cascode is used for the purpose discussed herein, it is also possible to connect Cac 312 and LPF 313 at any source-to-drain connection between two NMOS transistors forming such a cascode of the PA output stage.

While the disclosed invention is described hereinabove with respect to specific exemplary embodiments, it is noted that other implementations are possible that provide the advantages described hereinabove, and which do not depart from the spirit of the inventions disclosed herein. Such embodiments are specifically included as part of this invention disclosure which should be limited only by the scope of its claims. Furthermore, the apparatus disclosed in the invention may be implemented as a semiconductor device on a monolithic semiconductor.

Claims

1. A circuit embodied on an integrated circuit (IC) comprising: an output stage of a power amplifier (PA), the output stage comprising a first NMOS transistor having a first W-over-L ratio; anda sensing circuit to accurately replicate both direct current and alternate current of an RF current flowing through the output stage, the sensing circuit comprising a second NMOS transistor having a second W-over-L ratio, the first W-over-L ratio being larger than the first W-over-L ratio.

2. The circuit of claim 1, wherein the first W-over-L ratio is larger than one and the second W-over-L ratio is equal to one.

3. The circuit of claim 1, wherein the sensing circuit is designed to ensure that the gate-to-source voltage of the second NMOS is equal to the gate-to-source voltage of the first NMOS.

4. The circuit of claim 1, wherein the sensing circuit is designed to ensure that the drain-to-source voltage of the second NMOS is equal to the drain-to-source voltage of the first NMOS.

5. The circuit of claim 1, wherein the sensing circuit further comprises a first low-pass filter (LPF) to filter the DC component at the drain of the first NMOS and a second LPF to filter the DC component at the drain of the second NMOS.

6. The circuit of claim 5, wherein the output of the first LPF and the output of the second LPF are coupled to inputs of an amplifier that controls a MOS device that provides current for operation of the second NMOS device.

7. The circuit of claim 6, wherein the LPF is one of: a zero order filter, an nth order filter.

8. The circuit of claim 6, wherein the LPF is one of: an active filter, a passive filter.

9. The circuit of claim 6, wherein the operational amplifier is one of: an operational amplifier, a common gate amplifier, a common source amplifier.

10. The circuit of claim 1, wherein a capacitor is connected between the drain of the first NMOS and the drain of the second NMOS to ensure that the AC component of the RF signal is equal for both.

11. A method of sensing and converting a radio frequency signal to direct current in an output stage of a power amplifier (PA), the output stage having a first NMOS transistor, comprising: replicating in a second NMOS transistor having its source coupled to the source of the first NMOS transistor and having its gate coupled to the gate of the first NMOS, a fraction of both the direct current and alternating current of an RF current through the first NMOS;low pass filtering the drain voltage of the first NMOS transistor to provide a first DC filter output;low pass filtering the drain voltage of the second NMOS transistor to provide a second DC filter output; andcontrolling the average current through the second CMOS transistor to cause the first and second DC filter outputs to be equal to provide a drain source voltage on the second NMOS that is equal to the drain source voltage on the first NMOS transistor;whereby the direct current in the second NMOS is proportional to the direct current in the first CMOS transistor.

12. The method of claim 11 wherein the low pass filtering is done using one of: a zero order filter, an nth order filter.

13. The method of claim 12 wherein the low pass filtering is done using one of: an active filter, a passive filter.

14. The method of claim 11, further comprising: coupling a capacitor between the drain of the first NMOS and the drain of the second NMOS to ensure that the AC component of the RF signal is equal for both the first NMOS and the second NMOS.