This application is a continuation-in-part of U.S. Ser. No. 60/049,013 filed Jun. 9,1997 entitled “APPARATUS AND METHODS FOR CORRECTING FOR ELECTROKINETIC EFFECTS IN MICROFLUIDIC SYSTEMS” by Kopf-Sill and Parce and U.S. Ser. No. 60/076,468 filed Mar. 2, 1998 “HIGH THROUGHPUT SCREENING APPLICATIONS OF MICROFLUIDIC SYSTEMS” by Cohen et al.; the present application claims priority to each of these applications and incorporates each of the applications herein in their entirety for all purposes.
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Number | Date | Country |
---|---|---|
WO 9604547 | Feb 1996 | WO |
WO 9702357 | Jan 1997 | WO |
WO 9800231 | Jan 1998 | WO |
WO 9800705 | Jan 1998 | WO |
WO 9800707 | Jan 1998 | WO |
WO 9802728 | Jan 1998 | WO |
WO 9805424 | Feb 1998 | WO |
WO 9822811 | May 1998 | WO |
WO 9845481 | Oct 1998 | WO |
WO 9845929 | Oct 1998 | WO |
WO 9846438 | Oct 1998 | WO |
WO 9849548 | Nov 1998 | WO |
WO 9855852 | Dec 1998 | WO |
WO 9856956 | Dec 1998 | WO |
WO 9900649 | Jan 1999 | WO |
WO 9910735 | Mar 1999 | WO |
WO 9912016 | Mar 1999 | WO |
WO 9916162 | Apr 1999 | WO |
WO 9919056 | Apr 1999 | WO |
WO 9919516 | Apr 1999 | WO |
WO 9929497 | Jun 1999 | WO |
WO 9956954 | Nov 1999 | WO |
Entry |
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Number | Date | Country | |
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60/049013 | Jun 1997 | US | |
60/076468 | Mar 1998 | US |