Claims
- 1. A detection system for use during analysis of a specific binding complex, the specific binding complex being carried on a reaction surface of a substrate, the detection system comprising:
- a source of analytical radiation;
- means directing said analytical radiation through said substrate reaction surface while causing said analytical radiation to converge at said reaction surface;
- semiconductor means responsive to the analytical radiation passing through said reaction surface for providing a signal representative thereof; and
- means for processing said signal.
- 2. A detection system for use during analysis of a specific binding complex, the specific binding complex being carried on a reaction surface of a substrate, the detection system comprising:
- a source of analytical radiation;
- means directing said analytical radiation through said substrate reaction surface while causing said analytical radiation to converge at said reaction surface;
- means responsive to the analytical radiation passing through said reaction surface for providing a signal representative thereof, said analytical radiation responsive means comprising radiation gathering means and means establishing a pattern representative of gathered radiation wherein said pattern establishing means comprises an array of elements responsive to said analytical radiation; and said analytical radiation responsive elements comprises semiconductor mean; and
- means for processing said signal.
Parent Case Info
This is a continuation of application Ser. No. 07/484,439, filed Feb. 20, 1990 which is a continuation of application Ser. No. 07/342,715, filed apr. 24, 1989, which is turn is a continuation of application Ser. No. 07/013,637, filed Feb. 11, 1987, all of which are now abandoned.
US Referenced Citations (6)
Continuations (3)
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Number |
Date |
Country |
Parent |
484439 |
Feb 1990 |
|
Parent |
342715 |
Apr 1989 |
|
Parent |
13637 |
Feb 1987 |
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