| Number | Date | Country | Kind |
|---|---|---|---|
| 195 10 753.5 | Mar 1995 | DEX |
| Number | Name | Date | Kind |
|---|---|---|---|
| 5214490 | Abe et al. | May 1993 | |
| 5410157 | Davis | Apr 1995 |
| Number | Date | Country |
|---|---|---|
| 0358331A2 | Mar 1990 | EPX |
| 1191390 | Apr 1965 | DEX |
| 1611378 | Dec 1970 | DEX |
| 2751422A1 | Jun 1978 | DEX |
| 3510328A1 | Oct 1985 | DEX |
| 3916405A1 | Nov 1989 | DEX |
| 3825295A1 | Feb 1990 | DEX |
| 4040494A1 | Jun 1991 | DEX |
| 4207070A1 | Sep 1993 | DEX |
| 3713525C2 | Jan 1994 | DEX |
| 4101436C2 | Feb 1994 | DEX |
| 3926660C2 | Apr 1994 | DEX |
| 4308620A1 | Sep 1994 | DEX |
| Entry |
|---|
| Patents Abstracts of Japan-Paper Thickness Detector--P-750 Aug. 29, 1988, vol. 12/No. 317. |
| Patents Abstracts of Japan-Inspecting Device of Surface State--P-297 Aug. 29, 1984, vol. 8/No. 188. |