Claims
- 1. A degradation detecting apparatus comprising means for applying a magnetic field to a measuring object including an exciting coil in the form of a superconducting system and an exciting power source connected thereto, and a magnetization characteristic measuring device for measuring a magnetization characteristic of said measuring object so as to detect the degree of degradation of said measuring object on the basis of a change in said magnetization characteristic of said measuring object due to application of said magnetic field, said magnetization characteristic measuring device including a magnetization sensor disposed at the center of said exciting coil, said sensor being operable at low temperatures, a fluidtight container of a heat insulating material containing the entirety of at least said exciting coil and said magnetization sensor, and a cooling system for cooling the superconducting system, said detecting apparatus further comprising means for previously computing relation between the magnetization characteristic and degradation of a reference object and for comparing the detected magnetization characteristic of said measuring object with said relation to decide the degree of degradation of said measuring object at the time of detection, wherein said means for previously computing the relation between the magnetization characteristic and degradation of said reference object and for comparing the detected magnetization characteristic of said measuring objects with said relation to decide the degree of degradation of said measuring object at the time of detection includes storage means for storing a data base of previously acquired data of the relation between changes in the magnetization characteristic an degradation of said reference object, a first arithmetic processing part for estimating magnetization characteristic of said measuring object in an as-received material on the basis of the data stored in said data base, and a second arithmetic processing part computing the change from said estimated magnetization characteristic to said detected magnetization characteristic on the basis of the data stored in said data base to generate the degree of degradation of said measuring object as an output.
Priority Claims (3)
Number |
Date |
Country |
Kind |
62-234828 |
Sep 1987 |
JPX |
|
62-277445 |
Nov 1987 |
JPX |
|
62-305656 |
Dec 1987 |
JPX |
|
Parent Case Info
This is a divisional of application Ser. No. 247,414, filed Sep. 21, 1988, now U.S. Pat. No. 5,059,903.
US Referenced Citations (5)
Foreign Referenced Citations (4)
Number |
Date |
Country |
0141653 |
Nov 1980 |
JPX |
0028859 |
Feb 1986 |
JPX |
0119756 |
May 1989 |
JPX |
0078983 |
Mar 1990 |
JPX |
Non-Patent Literature Citations (2)
Entry |
Nave et al.; Micromagnetic susceptometer, Rev. Sci. Instrum., vol. 51, No. 5, May 1980, pp. 591-596. |
Ishizuka et al.; A Squid Magnetometer . . . around the Magnetic Phase Transition Point, Japanese Jour. of Appl. Physics, vol. 19, No. 4 Apr. 1980 pp. 639-646. |
Divisions (1)
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Number |
Date |
Country |
Parent |
247414 |
Sep 1988 |
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