Apparatus for testing a chip and methods of making and using the same

Abstract

An apparatus and method for testing an integrated circuit in a target electronic application, wherein the apparatus comprises a socket for receiving the integrated circuit, a modified commercial electronic product which models the target electronic application, and an electrical connection between the socket and the modified commercial electronic product. The method of testing an integrated circuit comprises placing an integrated circuit in a socket that is coupled to a circuit board substantially identical to that of a circuit board configured to include the integrated circuit, but which does not include the integrated circuit, and testing the integrated circuit. A method of making such a tester mechanically attaching a socket to a modified commercial electronic product and electrically connencting an integrated circuit and the modified commercial electronic product. This approach allows for cheaper, more comprehensive, and more accurate testing of an integrated circuit.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram showing the top view of a commercial electronic product.

FIG. 2 is a diagram showing an exemplary apparatus for testing an integrated circuit according to the present invention.

FIGS. 3A and 3B are diagrams showing other apparatus for testing an integrated circuit according to the present invention.

FIG. 4 is a diagram showing a single-chip socket of the present invention.

FIG. 5 is a diagram showing a multi-chip socket of the present invention.

FIGS. 6A, 6B, 6C, and 6D are diagrams showing example detector circuits of the present invention.

FIG. 7 is a diagram schematically representing a detector circuit of the present invention.

FIG. 8 is a diagram showing a top view of an apparatus of the present invention.

FIG. 9 is a diagram showing a side view of the apparatus of FIG. 8.

FIGS. 10A and 10B are diagrams showing an alternative embodiment of the present invention.

FIG. 11 is a diagram showing top view of yet another apparatus of the present invention.

FIG. 12 is a diagram showing a side view of another apparatus of the present invention.

FIG. 13 is a diagram showing detail of Area A of FIG. 12.

FIG. 14 is a diagram showing an other apparatus of the present invention.

FIG. 15 is a diagram showing an exemplary apparatus for testing an integrated circuit according to the present invention.

FIG. 16 is a diagram showing another exemplary apparatus for testing an integrated circuit according to the present invention.

FIG. 17 is a diagram showing yet another exemplary apparatus for testing an integrated circuit according to the present invention.

Claims

1. An apparatus for testing an integrated circuit, comprising: a) a socket configured to receive said integrated circuit;b) a modified commercial electronic product comprising a circuit board substantially identical to that of a commercial electronic product configured to include said integrated circuit, wherein said modified commercial electronic product does not include said integrated circuit; andc) a plurality of conductors electriclaly connecting at least one electrical contact of said integrated circuit and at least one electrical contact of said modified commercial electronic product.

2. The apparatus of claim 1, wherein said modified commercial electronic product further comprises substantially all electrical, mechanical, and/or electro-mechanical components that, when coupled to said integrated circuit, perfrom a predefined function of said commercial electronic product.

3. The apparatus of claim 1, further comprising a mechanical housing containing said circuit board.

4. The apparatus of claim 1, wherein said socket comprises: a) a seat configured to hold and align said integrated circuit; andb) a base comprising a mechanical support for said seat.

5. The apparatus of claim 4, wherein said socket is further configured to support a terminal of each of said plurality of conductors, each terminal contacting one of said electrical contact(s) of said integrated circuit.

6. The apparatus of claim 4, wherein said socket further comprises an upper cap configured to expose said seat and secure said integrated circuit in said seat.

7. The apparatus of claim 4, wherein said base comprises a mechanical support for more than one seat.

8. The apparatus of claim 6, further comprising a circuit configured to detect whether said integrated circuit is properly aligned in said seat.

9. The apparatus of claim 8, further comprising an indicator configured to indicate whether said integrated circuit is properly aligned in said seat.

10. The apparatus of claim 1, further comprising support structures for mechanically attaching said socket and said modified commercial electronic product.

11. The apparatus of claim 1, further comprising s stage for mechanically attaching said socket and said modified commercial electronic product.

12. The apparatus of claim 11, further comprising a first plurality of support structures for mechanically attaching said modified commercial electronic product and said stage.

13. The apparatus of claim 11, further comprising a second plurality of support structures for mechanically attaching said socket and said stage.

14. The apparatus of claim 11, wherein said stage comprises at least one void through which said plurality of conductors can pass without contacting said stage.

15. The apparatus of claim 11, wherein said stage comprises an electrical circuit.

16. The apparatus of claim 1, wherein said modified commercial electronic product further comprises an input and/or output port.

17. The apparatus of claim 1, further comprising a power source connected to said modified commercial electronic product.

18. An apparatus for testing an integrated circuit, comprising: a) a power source;b) a switch;c) a tester comprising a socket configured to recieve said integrated ciruit, a circuit board substantially identical to that of a commercial electronic product configured to include said integrated ciruit, a plurality of conductors electrically connecting at least one electrical contact of said integrated circuit and at least one electrical contact of said circuit board; andd) a circuit configured to detect (i) whether said integrated circuit is properly aligned in said socket and/or (ii) the voltage at and/or current through one or more predetermined terminals of said tester.

19. The apparatus of claim 18, wherein said circuit is further configured to open said switch if (i) said integrated circuit is not properly aligned in said socket and/or (ii)the voltage at and/or current through one or more predetermined terminals of said tester is outside of a predetermined range of values.

20. The apparatus of claim 18, further comprising an indicator configured to indicate (i) whether said integrated circuit is properly aligned in said socket and/or (ii) the voltage at and/or current through one or more predetermined terminals of said tester.

21. The apparatus of claim 18, further comprising logic configured to open said switch if (i) said integrated circuit is not properly aligned in said seat and/or (ii) the voltage at and/or current through one or more predetermined terminals of said tester from said power source is outside of a predetermined range of values.

22. The apparatus of claim 21, wherein said logic is further coupled to said tester through an input and/or output port and configured to control said tester corresponding to a program.

23. The apparatus of claim 22, further comprising a memory element configured to record one or more results of said propgam.

24. The apparatus of claim 22, further comprising an indicator configured to indicate one or more results of said program.

25. The apparatus of claim 22, further comprising an automated chip loader, coupled to said circuit, configured to load and unload said integrated circuit corresponding to said program.

26. A method of testing an integrated circuit, comprising: a) placing said integrated circuit in a socket which is mechanically coupled to a modified commercial electronic product, said modified commercial electronic product comprising a circuit board substantially identical to that of a commercial electronic product configured to include said integrated circuit, but which does not include said integrated circuit; andb) testing said integrated circuit.

27. The method of claim 26, further comprising connecting said modified commercial electronic product to a power source.

28. The method of claim 27, further comprising indicating the voltage at and/or current through one or more predetermined terminal of said modified commercial electronic product.

29. The method of claim 26, further comprising detecting whether said integrated ciruit is properly placed in said socket.

30. The method of claim 29, further comprising indicating whether said integrated circuit is properly placed in said socket.

31. The method of claim 27, further comprising electrically disconnecting said modified commercial electronic product from said power source when (i) said integrated circuit is not properly placed in said socket and/or (ii) the voltage at and/or current through one or more predetermined terminal of said modified commercial electronic product is outside of a predetermined range of values.

32. The method of claim 26, wherein testing said integrated circuit comprises executing a program controlled by a processor and/or external computer.

33. The method of claim 32, further comprising automatically loading and unloading said integrated circuit into and/or output of said socket.

34. The method of claim 32, further comprisng indicating one or more results of said program.

35. A method of making an integrated circuit tester, comprising: a) mechanically attaching a socket to a modfied commercial electronic product, said modified commercial electronic product comprising a circuit board substantially identical to that of a commercial electronic product configured to include said integrated circuit, but which does not include integrated circuit; andb) configuring a plurality of conductors to electrically connect at least one electrical contact of said integrated circuit and at least one electrical contact of said modified commercial electronic product when said integrated circuit is in said socket.

36. The method of claim 35, wherein mechanically attaching said socket to said modified commercial electronic product comprises connecting one or more support structures to said modified commerical electronic product in a passive/and or non-conductive area.

37. The method of claim 36, further comprisng modifying said commercial electronic product such that one or more of said support structures mechanically attach to said modified commercial electronic product in a passive and/or non-conductive area.

38. The method of claim 35, further comprising modifying said commercial electronic product such that one or more electrical contacts of said modified commercial electronic product electrically connect to one or more electricl contact of said integrated circuit.