Claims
- 1. An aqueous electroless nickel plating bath comprising nickel ions and hypophosphite ions in an amount sufficient to chemically deposit nickel and an amount of a sulfonium betaine compound sufficient to control the rate of nickel deposition and the concentration of phosphorus in the nickel deposit, said sulfonium betaine compound corresponding to the structural formula: ##STR3## Wherein: R.sub.1, R.sub.2, R.sub.3 and R.sub.4 are the same or different and are H, C.sub.1 -C.sub.6 alkyl radicals, C.sub.1 -C.sub.6 hydroxy alkyl radicals,
- R is the same or different and is H or OH, and
- n is an integer of from 1 to 5,
- as well as mixtures thereof.
- 2. The bath as defined in claim 1 further including a complexing agent present in an amount sufficient to complex said nickel ions present and to solubilize any hypophosphite degradation products present in said bath.
- 3. The bath as defined in claim 1 having a pH of about 4 to about 10.
- 4. The bath as defined in claim 1 further including a buffering agent.
- 5. The bath as defined in claim 1 in which said sulfonium betaine compound is present in an amount of at least about 1 up to about 200 micro mol/l.
- 6. The bath as defined in claim 1 having a pH of about 4 to about 7 and in which said sulfonium betaine compound is present in an amount of about 20 to about 120 micro mol/l.
- 7. The bath as defined in claim 1 having a pH of about 7 to about 10 and in which said sulfonium betaine compound is present in an amount of about 2 to about 25 micro mol/l.
- 8. The bath as defined in claim 1 in which said nickel ions are present in an amount of about 1 to about 15 g/l.
- 9. The bath as defined in claim 1 in which said hypophosphite ions are present in an amount of about 2 to about 40 g/l.
- 10. The bath as defined in claim 1 in which said nickel ions are present in an amount of about 1 to about 15 g/l, said hypophosphite ions are present in an amount of about 2 to about 40 g/l, and said sulfonium betaine compound is present in an amount of at least about 1 up to about 200 micro mol/l.
- 11. The bath as defined in claim 10 further containing a complexing agent present in an amount up to about 200 g/l.
- 12. The bath as defined in claim 11 further containing a complexing agent present in an amount of about 20 to about 40 g/l.
- 13. The bath as defined in claim 10 further containing a buffering agent present in an amount up to about 30 g/l.
- 14. The bath as defined in claim 1 in which said sulfonium betaine compound comprises 3-S-isothiuronium propane sulfonate.
- 15. The bath as defined in claim 1 in which said sulfonium betaine compound is selected from the group consisting of N,N'-dimethyl-3-S-isothiuronium propane sulfonate, N,N'-diethyl-3-S-isothiuronium propane sulfonate, N,N'-dihydroxymethyl-3-S-isothiuronium propane sulfonate, N,N'-diisopropyl-3-S-isothiuronium propane sulfonate, N,N,N',N'-tetramethyl-3-S-isothiuronium propane sulfonate, N,N,N'-trimethyl-3-S-isothiuronium propane sulfonate,
- 2-S-isothiuronium ethane sulfonate, 3-S-isothiuronium propane-2-ol sulfonate and mixtures thereof.
- 16. The bath as defined in claim 1 further containing a supplemental stabilizer agent selected from the group consisting of lead ions, cadmium ions, tin ions, bismuth ions, antimony ions, zinc ions, cyanide ions, thiocyanate ions, and mixtures thereof present in combination with said sulfonium betaine compound in an amount below that at which the rate of nickel deposition is reduced to an undesirable magnitude.
- 17. The bath as defined in claim 1 in which said nickel ions are present in an amount of about 1 to about 15 g/l, said hypophosphite ions are present in an amount of about 2 to about 40 g/l, said sulfonium betaine compound is present in an amount of at least about 1 up to about 200 micro mol/l, said bath further including a complexing agent present in an amount up to about 200 g/l, a buffering agent present in an amount up to about 30 g/l and a wetting agent present in an amount up to about 1 g/l.
- 18. A process for chemically depositing nickel on a substrate which comprises the steps of contacting a substrate to be plated with an electroless nickel bath as defined in claim 1 for a period of time sufficient to deposit nickel on the substrate to the desired thickness.
- 19. The process as defined in claim 18 in which said electroless nickel bath further contains a supplemental stabilizer agent selected from the group consisting of lead ions, cadmium ions, tin ions, bismuth ions, antimony ions, zinc ions, cyanide ions, thiocyanate ions, and mixtures thereof present in combination with said sulfonium betaine compound in an amount below that at which the rate of nickel deposition is reduced to an undesireable magnitude.
- 20. A process for rejuvenating an aqueous electroless nickel bath which has been rendered inoperative due to the presence of an excessive concentration of supplemental stabilizing agents therein which comprises the steps of adding to said bath a sulfonium betaine compound corresponding to the structural formula: ##STR4## wherein: R.sub.1, R.sub.2, R.sub.3 and R.sub.4 are the same or different and are H, C.sub.1 -C.sub.6 alkyl radicals, C.sub.1 -C.sub.6 hydroxy alkyl radicals,
- R is the same or different and is H or OH, and
- n is an integer of from 1 to 5,
- as well as mixtures thereof; in an amount sufficient to rejuvenate and restore the plating activity of said bath.
REFERENCE TO RELATED APPLICATIONS
The present application is a continuation-in-part of prior copending application Ser. No. 503,881 filed June 17, 1983 now abandoned.
US Referenced Citations (4)
Number |
Name |
Date |
Kind |
2762723 |
Talmey et al. |
Sep 1956 |
|
2822293 |
Gutzeit et al. |
Feb 1958 |
|
2937978 |
Strauss et al. |
May 1960 |
|
3489576 |
Vincent et al. |
Jan 1970 |
|
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
503881 |
Jun 1983 |
|