The present invention relates to a field of photonic integrated circuits and in particular to a waveguide configuration, such as a polarization splitter and a polarization splitter and rotator, on the basis of silicon nitride or another semiconductor having a refractive index in the range of silicon nitride.
Silicon photonics is rapidly gaining importance as a generic technology platform for a wide range of applications in telecom, datacom, interconnect and sensing. It allows implementing photonic functions through the use of CMOS compatible wafer-scale technologies on high quality, low cost silicon substrates. However, pure passive silicon waveguide devices still have limited performance in taints of insertion loss, phase noise (which results in channel crosstalk) and temperature dependency. This is due to the high refractive index contrast between the SiO2 (silicon dioxide) cladding and the Si (silicon) core, the non-uniform Si layer thickness and the large thermo-optic effect of silicon.
Silicon nitride-based passive devices offer superior performance, both in terms of insertion loss and phase noise. This is mainly due to the slightly lower refractive index contrast between silicon nitride (n=2) and silicon dioxide (1.5) versus silicon (n=3.5) and silicon dioxide. Both material systems (silicon and silicon nitride waveguides) however have a strong polarization dependency (as compared to e.g. silica waveguides) In order to fabricate polarization independent optical circuits, polarization splitter and rotators (PSRs) are needed as key building blocks. Only a limited number of polarization splitters and rotators in silicon nitride have been published. There are publications based on mode evolution designs.
An example of a polarization splitter and rotator based on mode evolution is reported by Barwicz et al. “Polarization-transparent microphotonic devices in the strong confinement limit”, Nat. Photon., Vol. 1, pp. 57, 2007. The PSR has a good performance over a broad wavelength range and was implemented in a polarization diversity configuration with a ring resonator as optical component. The waveguides consisted of 420 nm thick SiNx. The major drawback of this device, however, and all mode-evolution based PSRs in general is the complex fabrication. It needs multilevel patterning, high aspect ratio features and locally thick SiNx layers.
Chen et al., “Polarization-Diversified DWDM Receiver on Silicon Free of Polarization-dependent Wavelength Shift”, OFC/NFOEC, OW3G.7, 2012 reported a SiNx arrayed waveguide grating in a polarization diversity configuration. However, this is an example in which SiNx is used as a high performance passive waveguide layer on top of an active silicon photonic circuit. The splitting/rotation functionality was implemented in the silicon layer, which is more straightforward.
One objective of the present disclosure is to provide a high performance and easy to fabricate polarization dependent mode converter or polarization splitter and rotator on the basis of a silicon nitride waveguide, or a comparable waveguide material.
A first aspect provides a polarization dependent mode converter on a semiconductor basis, having a waveguide made of a waveguide material comprising SiNx or another solid waveguide material with a refractive index between 1.7 to 2.3, such as SiC or SiON, embedded in a cladding material comprising SiO2 or another solid cladding material having a refractive index less than 1.6 and above 1, wherein the waveguide includes in a portion along its lengthwise extension a first section having a vertical asymmetric configuration, the asymmetric configuration includes a thin layer of silicon above the waveguide material, the thickness of the thin Si-layer in vertical direction is less than the thickness of the waveguide material in the same vertical direction.
In the first section, which may also be called “adiabatic taper”, the vertical asymmetric waveguide cross section will convert a TM-polarized mode (TM0) to a first order TE-polarization mode (TE1) while the TE-polarization mode (TE0) remains unaffected. Thus, the adiabatic taper with the vertical asymmetry provides a polarization conversion.
According to a first implementation, the silicon layer has a thickness between 10 nm and 100 nm in the vertical direction. The waveguide material may have a thickness between more than 100 nm and 600 nm, preferably between 300 nm and 500 nm in the same vertical direction.
The proper design of the vertically asymmetric waveguide configuration has the effect that the launched TE0-mode will keep its polarization state while the TM0-modes convert into the TE1-mode and the input and the output for both TE and TM launched polarization modes are properly confined in the waveguide configuration. Thus, the mode conversion is very efficient and is tolerant to slight dimensional variations of the cross section.
According to a second implementation, the thin Si-layer is arranged directly on top of the waveguide material (on top means on top in the vertical direction). According to an alternative implementation, the thin Si-layer may be separated from the top of the waveguide material in vertical direction by a layer of the cladding material. The cladding material between the upper surface of the waveguide material and the lower surface of the thin silicon layer may have a thickness between 1 nm and 100 nm in the vertical direction.
Both configurations with or without separating layer between the waveguide material and the thin Si-layer provides a adequate confinement of the relevant TE- and TM-modes in the waveguide.
According to a third implementation, the thin silicon layer may have a length between 100 μm and 800 μm, preferably between 200 μm and 600 μm in the lengthwise direction of the waveguide. As compared to other silicon nitride waveguides using other top cladding materials to obtain vertical asymmetry (e.g. silicon dioxide bottom cladding and a top cladding of a material with refractive index 1.7), the total length of the asymmetric section may be shorter which is a benefit for the construction of integrated waveguide circuitries.
According to a fourth implementation, the thin silicon layer may have one or more tapering transition regions on a first end and/or on a second end, wherein the first and second ends are defined by the respective input and output sides of the vertical asymmetric portion of the waveguide in a lengthwise direction of the waveguide. The tapering transition regions may have the benefit that any reflection of the electromagnetic wave entering or leaving the vertical asymmetric portion of the waveguide construction can be reduced in comparison to a sharp transition between the symmetric waveguide configuration and the asymmetric waveguide configuration. The one or more transition regions may have the form of a triangle with a peak of the triangle facing away from the respective end of the thin silicon layer. According to a further implementation, the transition regions may include two or more triangles next to each other with the two or more peaks facing away from the respective ends of the silicon layer. According to a preferred implementation, the transition region of the first end includes a single triangle and the transition region of the second end includes two triangles next to each other.
According to a fifth implementation, the transition regions may further include a trapezium forming a transition between the basis of the one or more triangles and the silicon layer of its full width. The trapezium also provides a smooth transition from the outer part of the transition regions to the silicon layer in its middle part between the two ends, where the silicon-layer has its full width.
According to a sixth implementation, the thin silicon layer has a width in a horizontal direction which is equal to the width of the waveguide material in the horizontal direction taken in the same cross section. According to this embodiment, only the transition regions at the first end and/or the second end of the vertically asymmetric part of the waveguide, if any, have a thin silicon layer which has a width less than the corresponding width of the waveguide material in the same cross section.
A second aspect refers to a polarization splitter and rotator including the polarization dependent mode converter of the first aspect of the invention and the second section, wherein the second section includes means to convert a TE1 mode from the polarization dependent mode converter to a TE0 mode and couple it into a first output port and means to couple a TE0 mode from the polarization splitter without conversion in a second output port. The second section of the combined polarization splitter and rotator, thus, provides on the first output port a TE0-mode (being the original TE-mode) and TE0-mode on a second output port (converted from the original TM-mode).
For the second section of the second aspect, vertical asymmetry is not needed. According to a seventh implementation, the second portion includes a vertical symmetry. This has the benefit that it can be easily produced.
The means in the second portion may include a directional coupler in accordance with the eighth implementation of the invention. As an alternative, in accordance with a ninth implementation, the means of the second portion may also include an Y-junction, a phase section to introduce a phase shift between the outputs of the Y-junction and a multi-mode interference coupler. Both implementations provide the effect that a TE1-mode is converted into a TE-0-mode and coupled in the first output port and a TE0-mode is coupled in the second output port without conversion.
To illustrate the technical features of embodiments of the present invention more clearly, the accompanying drawings provided for describing the embodiments are introduced briefly in the following. The accompanying drawings in the following description are merely some embodiments of the present invention, but modifications on these embodiments are possible without departing from the scope of the present invention as defined in the claims.
With reference to
A thin silicon layer 4 which has a thickness between about 10 nm to 100 nm is arranged on top of the waveguide material to create vertical asymmetry. The thin silicon layer 4 has the thickness in the vertical direction which is less than the thickness h of the waveguide material 2. The thickness of the waveguide material 2 is dependent on the wavelength for the application. For a wavelength around 1.55 μm, the typical thickness of the waveguide material is about 400 nm.
The waveguide material 2 and the thin silicon layer 4 are embedded in a cladding material 6 which comprise SiO2.
A skilled person in this field will understand that the waveguide materials SiNx which has a refractive index (for a wavelength around 1.5 μm) of about 2 may also be replaced by another waveguide material having a refractive index between 1.7 to 2.3. Examples of such waveguide material which can also form embodiments of the invention are SiC (silicon carbide) or SiOxNy (silicon oxynitride) with values of x and y leading to the desired refractive index. Moreover, the cladding material which comprises SiO2 having a refractive index of about 1.45 may also be replaced by another solid cladding material having a refractive index in the range of above 1 and less than 1.7, for example SiOxNy (silicon oxynitride) with values of x and y leading to the desired refractive index according to different embodiments of the invention.
According to a first embodiment, the standard silicon nitride waveguide 2 with a symmetric cladding can be butt-coupled to the vertically asymmetric section as shown in
Further embodiments having different kinds of transition regions are shown in
According to the embodiment of
The waveguide configurations as presented above results in a strong vertical asymmetry. This allows for an efficient polarization-dependent mode conversion as described below.
By proper design of the asymmetric waveguide section, the launched TE-mode will keep its polarization state (TE0>TE0) as shown in the first row of
With reference to
A strong vertical asymmetry could be obtained when the top cladding material is air, i.e. with a refractive index of 1 or another material with a refractive index of 1.7. As can be seen from the graph of
Thus, most cases of a CMOS compatible material having a refractive index 1.7 would make it necessary to use very long asymmetric parts (L>1,000 μm) to obtain high conversion efficiency.
Having an air (n=1) cladding on top of the SiNx waveguide on the other hand results in a strong asymmetry and possible short waveguide configuration. However, a hermetic package is needed in this case in order to keep the refractive index of the upper cladding material constant.
By using an asymmetric waveguide configuration of the present invention including the thin Si-layer 4 very efficient conversation can be obtained. For Si-layer thicknesses as thin as 30 nm, 800 μm long asymmetric waveguide sections result in more than 95% conversion efficiency.
By slightly increasing the thickness to 50 nm, the taper length can even decreased to 400 μm. When increasing the thickness further, the required asymmetric waveguide section length saturates. In the simulation example provided in
The simulations presented in
With reference to
The asymmetric waveguide section of the embodiments of the invention as previously described may form part of a polarization splitter and rotator according to a further aspect of the invention. The polarization splitter and rotator includes a second section, wherein the TE1-mode (being the original TM-mode) needs to be converted to a TE0-mode and coupled to a first output port and the TE0-mode (being the original TE-mode) needs to be coupled to a second output port. For the second section, no vertical asymmetry is needed and a conventional SiNx waveguide with a SiO2 cladding material on top and bottom of the waveguide materials can be used. Possible configurations for the second section in accordance with different embodiments of the invention are presented in
In
According to the embodiment of
According to the embodiment of
The foregoing descriptions are only implementation manners of the present invention, but the protection of the scope of the present invention is not limited to this. Any variations or replacements can be easily made through person skilled in the art. Therefore, the protection scope of the present invention should be subject to the protection scope of the attached claims.
Number | Date | Country | Kind |
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14161764.7 | Mar 2014 | EP | regional |
This application is a continuation of International Application No. PCT/CN2015/072814, filed on Feb. 11, 2015, which claims priority to European Patent Application No. EP14161764.7, filed on Mar. 26, 2014. The disclosures of the aforementioned applications are hereby incorporated by reference in their entireties.
Number | Date | Country | |
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Parent | PCT/CN2015/072814 | Feb 2015 | US |
Child | 15274341 | US |