Hard disk drives (HDD) are becoming smaller while at the same time providing greater storage capacity. One reason for these advances is the more prevalent use of brushless direct current motors (BLDC motor) to rotate the HDD. Further yet, a BLDC motor may be a three-phase motor and be driven by pulse-width modulation (PWM). For example, U.S. Pat. No. 6,137,253, which is incorporated by reference, discloses driving each of three BLDC motor coils with a respective PWM signal that causes a sinusoidal (or approximately sinusoidal) current to flow through each of the coils. By causing phase shifted (by approximately 120°) sinusoidal currents to flow through the coils, the BLDC motor is driven with a constant or approximately constant torque. This may be desirable in an application, such as disk drive applications, where it may be desirable to reduce or eliminate torque ripple in the rotation of the motor and that which the motor is rotating (e.g., a disk).
In one application, BLDC motor coils are driven with what is called a MacDonald voltage wave form, which is a PWM waveform that is described in U.S. Pat. No. 6,137,253. The MacDonald voltage wave form, when used to drive the motor coils, causes sinusoidal currents to flow through the coils. This may be accomplished by using a drive circuit having two drivers that comprise a high-side driver and a low-side driver. Thus, the Macdonald waveform may be conditioned to hold, for each 120° portion of the electrical period, one of the high-side or low-side drivers (MOSFET transistors in one example) for one of the coils in an ON state. Holding the high-side or low-side driver in an ON state may significantly reduce the switching losses in each drive transistor, and thus may significantly reduce the power dissipated by the chip.
While it may be desired that the spindle differential phase-to-phase current waveform be as symmetrical as possible (sinusoid) in order to have a constant spindle torque, there is no requirement that the absolute spindle phase voltage be held to a specific voltage to achieve this. Therefore, driver designers use this freedom to improve the driver operation through various drive algorithms that drive each phase pair or drivers, which may lead to reducing the switching losses, for example.
Embodiments of the subject matter disclosed herein will become more readily appreciated as the same become better understood by reference to the following detailed description, when taken in conjunction with the accompanying drawings.
The following discussion is presented to enable a person skilled in the art to make and use the subject matter disclosed herein. The general principles described herein may be applied to embodiments and applications other than those detailed above without departing from the spirit and scope of the present detailed description. The present disclosure is not intended to be limited to the embodiments shown, but is to be accorded the widest scope consistent with the principles and features disclosed or suggested herein.
The speed of the BLDC motor 105 depends on the voltages applied at its phases. By varying the average voltage across the phases, the revolutions per minute (RPM) of the BLDC motor 105 may be altered. This is achieved by altering the duty cycle of each phase's driver circuit 107a-107c. Thus, each phase 160a-c may receive coordinated pulse-width modulated (PWM) signals having a duty cycle at the drive nodes of the respective driver circuits 107a-107c (i.e., gates of their respective MOSFETs as shown below in
In operation, a power supply 170 provides a voltage to a voltage bus Vm. This voltage may be, for example, 12V for HDD systems in desktop computers and may be 5V is HDD systems in laptop computers. This voltage not only provides power to drive the BLDC motor 105, but also provides power to the other portions of the HDD 100. Other portions of the HDD 100 may include read/write channel circuitry 117, read/write head actuation devices 116, the hard disk(s) 115 and the like.
Although described as a HDD system 100 herein, the methods and applications discussed herein may be applicable to any device having a motor for rotating a disk or other device. For example, a DVD drive, a CD drive, and other similar devices may also employ the methods and techniques discussed herein. As illustrated below, power savings may be realized by tailoring the specific sizes of the respective components of each driver circuit 107a-107c.
These MOSFET transistors compose three sets of bi-directional drivers 201/211, 202/212 and 203/213 (these MOSFET transistor pairs may also be called half bridges) that drive the phases 160a-c of the BLDC motor 105. The drive controller 108 may implement control of the MOSFET transistors by monitoring a current through sense resistor 230 or a sense transistor in parallel with an isolation transistor 220 (discussed below), and/or monitoring the supply voltage Vm, and monitoring the BLDC motor 105 position using conventional sensorless techniques to produce desired phase voltages, and, therefore, a corresponding motor speed. More advanced controllers 108 may employ a microprocessor to manage the disk's acceleration/deceleration, control the disk's speed, and fine-tune efficiency of delivery of power to actuating the disk.
In many applications, the PWM pulses that represent the MacDonald wave form are asymmetrical (from an absolute reference). That is, the pulses that compose the MacDonald voltage may activate one of the high-side and low-side drive transistors of a phase for less than half of the time, and activate the other of the high-side and low-side drive transistors for more than half of the time. The time during which the one drive transistor is ON verse the time that the other drive transistor is ON depends, e.g., on the supply voltage Vm that is being switched to the coil, the rotational speed of the BLDC motor, and the coil current needed to maintain that rotational speed.
Thus, in one example embodiment, if the supply voltage Vm is relatively high, then, for each phase, the high-side drive transistor is ON for a shorter duration of time as compared to the amount of time that the low-side transistor is ON. But for the same disk rotational speed, as the supply voltage Vm decreases, then the high-side drive transistor may be ON for a longer duration of time than it is with a higher Vm. For example, the high-side transistor may be ON for approximately 48% or less of the drive-transistor ON time during the phase drive cycle, and the low-side transistor may be ON for approximately 52% or more of the drive-transistor ON time during the phase drive cycle.
The drive circuit 107 may further include an isolator 220, sometimes called an isolation transistor or isolation field-effect transistor (isofet), that is disposed between the Vm supply-voltage node and the high-side driver transistors 201, 202, and 203. The isofet 220 allows the drive controller 108 (
Disk-drive manufacturers may specify a value of diagonal RDSon for the drive circuit 107, where diagonal RDSon is the maximum sum, or a maximum weighted sum of the ON resistances of the isofet 220, a high-side transistor, a low-side transistor. In a bridge configuration where two coils are being driven in series, a current flows from the supply voltage node Vm, through the isofet 220, through a high-side transistor, through the coils of a first respective phase and subsequent second respective phase, and through a low-side transistor of another H-bridge, to the low-power rail 225. Thus, diagonal RDSon is the maximum combined series ON resistance of these two driving transistors and the isofet 220. For example, a specification of 0.3 ohms for the diagonal RDSon indicates that when the isofet 220, a first high-side transistor of one H-bridge (MOSFET 201 for example), and then one diagonally opposite low-side transistor of another different H-bridge (MOSFET 213, for example, to cause a current to flow through coils A and C) are all ON, the total path resistance due to these three transistors can be no greater than 0.3 ohms.
However, there may be no requirement or reason that these transistors need to have equivalent RDSon values. That is, with the specification of a diagonal RDSon of 0.3 ohms, one need not size each transistor (isofet 220, high-side MOSFET and low-side MOSFET) to have an RDSon of 0.1 ohms. As such, these transistors may be sized differently. Furthermore, when a motor-controller manufacture specifies a diagonal RDSon for the driver circuit 107, it typically calculates the diagonal RDSon by adding together the RDSon of the isofet, and the duty-cycle weighted RDSons of any one of the high-side and any one of the low-side transistors for a specified load current range, because all of the high-side transistors may have substantially the same weighted RDSon, as may all of the low-side transistors. But by sizing the high-side MOSFETs and low-side MOSFETs with a specific asymmetric ratio, a power savings may be realized because of the asymmetry of the drive algorithm. The specific ratio chosen may yield different power savings as shown below in
In this embodiment, the low-side transistor has a larger size (e.g., width), and thus a smaller RDSon, than the high-side transistor, because as stated above, the McDonald waveform may dictate that the low-side transistor is ON for a longer portion of a phase cycle than the high-side transistor. For example, the relative size of the high-side transistor is given by 1−x, and the relative size of the low-side transistor is given by 1+x. So, where x=0.2, then the relative size of the high-side transistor is 1−0.2=0.8, the relative size of the low-side transistor is 1+0.2=1.2, such that the low-side transistor is 50% larger than the high-side transistor. It follows, therefore, that the RDSon of the high-side transistor is increased to 1.25 times its value for x=0, and that the RDSon of the low-side transistor is decreased to 0.83 times its value for x=0, such that the RDSon of the high-side transistor is approximately 50% larger than the RDSon of the low-side transistor. In an embodiment, the range of x in
Thus, in the embodiment represented by the plot in
During steady-state operation where the motor is operating at a steady-state speed, one may take into account the duty cycle when calculating the diagonal RDSon.
As a first example, both high and low H-bridge transistors may have the same RDSon values, e.g., RDSon=0.1 ohms for both the high-side 201 and low-side 212 transistors. This may be because each transistor is sized the same, i.e., x=0. Then, for any duty cycle D, the effective diagonal RDSon of the bridge (excluding the isofet for purposes of example because the isofet experiences a 100% duty cycle) is going to be 0.1 ohms because the high-side 201 and low-side 212 transistors are generally not ON or OFF at the same time (except perhaps during negligible times during zero-crossings of the driving waveform to sense the motor position). For example, where D=40%, meaning that the high-side transistor is ON for approximately D=40% of the cycle and the low-side transistor is ON for approximately 100%-D=60% of the cycle, the effective diagonal RDSon=0.4×0.1 (the effective RDSon of the high-side transistor)+0.6×0.1 (the effective RDSon of the low-side transistor)=0.1 ohms. Therefore, the power-loss through such a drive circuit is substantially independent on duty cycle.
But where the high- and low-side transistors are asymmetrically sized, a duty-cycle-dependent power savings may be realized. Thus, if the high-side 201 and low-side 212 transistors are driven with equal duty cycles, then the effective diagonal RDSon of the bridge is going to be the sum of the effective RDSons of the high-side and low-side transistors divided by two. However, if the duty cycle is shifted to favor one side over the other, the effective RDSon may yield a relative power savings as discussed below.
To illustrate this further, assume a low-side transistor 212 has an RDSon of 0.1 ohms and a high-side transistor 201 has an RDSon of 0.2 ohms. At a 50% duty cycle, the effective diagonal RDSon of these two transistors is 0.15 ohms per above. But now assume a 40% duty cycle, wherein the low-side transistor 212 is ON approximately 60% of the cycle time and the high-side transistor 201 is ON approximately 40% of the cycle time. This results in an effective diagonal RDSon of 0.6×0.1 (the effective RDSon of the low-side transistor 212)+0.4×0.2 (the effective RDSon of the high-side transistor 201)=0.14 ohms, which is smaller than the 0.15 ohms calculated above for the 50% duty cycle. Because power dissipation is proportional to the effective diagonal RDSon, asymmetrical low-side and high-side transistors may reduce power losses. For example, one can see that in at least the above example, the equivalent diagonal RDSon goes down if the duty cycle increases in favor of the transistor with the lower RDSon, in this example, the low-side transistor 212. And this may translate into a power savings as illustrated in
In summary, one may decrease the RDSon and effective RDSon value of a transistor by increasing its width-to-length ratio. That is, by increasing the actual size of the transistor, the RDSon value will decrease. If die space is not a concern, then one may simply optimize the power savings of the drive circuit 107 by increasing the size of the MOSFETs that see the longer average ON times. Similarly, one may also decrease the sizes of the opposite MOSFETs so long as other drive parameters are still met, e.g., driving current to a respective phase.
In yet another embodiment, one may keep the die size the same by decreasing the size of the transistors with the higher RDSon value by as much as the size increase in the transistors with the lower RDSon values. Therefore, one may keep the die size the same yet still realize reduced power consumption. For example, if a symmetrical driver has an equal number of high-side and low-side transistors with normalized widths of 1, then the total width of all the transistors is N, where N is the number of drive transistors. But, an asymmetrical drive circuit having N/2 transistors of width 1.2 and N/2 transistors of 0.8 also has a total width of all the transistors equal to N.
Using this technique, one may realize more of a power or die size savings the bigger the disk drive, and thus the higher currents and voltages that are used to drive the motor. That is, one may be more likely to see a measurable advantage in big server disk drives, and even desktop computer disk drives, than in smaller disk drives like the disk drives that go in cameras or other portable devices.
One may also use this technique to reduce transistor size, and thus die size, without increasing power dissipation. Furthermore, increasing the size, and thus decreasing the RDSon, of the drive transistors that conduct most of the load current may increase the yield and reliability of the motor controller (or other circuitry that includes the drive transistors) because at least some failure analysis studies have shown that the drive transistors conducting most of the load current fail at a higher rate than the drive transistors conducting less of the load current.
Another feature of HDD systems is using the disk momentum to generate power (by using the motor as a generator) to park the head and perform other shut down tasks in an emergency or other sudden power-down situation. Such a technique is described in related U.S. patent application Ser. No. 12/505,822 entitled “MANAGEMENT OF DISK DRIVE DURING POWER LOSS” and which is incorporated herein by reference.
In this method, a drive controller 108 (
In one embodiment, there is a decrease in total power dissipation in the drive transistors, and in the motor controller circuit as a whole, during braking of approximately 16.7%. This allows the circuit to run cooler during braking. Such power savings during braking may provide only a small advantage to a disk drive during normal operation within a device (e.g., computer) in which the disk drive is installed, because emergency and other sudden shut downs occur relatively infrequently, and because the energy stored in the disk momentum will be dissipated anyway, whether by the braking or by dissipation in the transistors. But such lower power dissipation during braking may provide a larger advantage during the manufactures' testing of the disk drives, and particularly of the disk drive heads.
A manufacturer may test the robustness of a read write head during a braking procedure to determine how resilient the head is to bumping into the rough surface of the disk during the parking procedure. A manufacturer may do this by cycling the head through a number, e.g., 10,000, emergency/sudden braking cycles. But because the disk drive controller (or other circuit used to test the head) has a maximum temperature rating, the rate at which the head is cycled is slow enough to prevent the controller temperature from exceeding this maximum rating. Therefore, by reducing the power dissipation through the drive transistors as discussed above, the manufacturer may increase the cycle rate without exceeding the controller temperature rating, and thus may decrease the total test time.
While the subject matter discussed herein is susceptible to various modifications and alternative constructions, certain illustrated embodiments thereof are shown in the drawings and have been described above in detail. It should be understood, however, that there is no intention to limit the claims to the specific forms disclosed, but on the contrary, the intention is to cover all modifications, alternative constructions, and equivalents falling within the spirit and scope of the claims.
This application is a continuation of U.S. application Ser. No. 12/620,929, filed Nov. 18, 2009, which claims the benefit of U.S. Provisional Application No. 61/115,870, filed Nov. 18, 2008, each of which is hereby incorporated by reference in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
4804892 | Müller | Feb 1989 | A |
5091680 | Palm | Feb 1992 | A |
RE34609 | Müeller | May 1994 | E |
5504402 | Menegoli | Apr 1996 | A |
5508874 | Williams et al. | Apr 1996 | A |
5828245 | Brambilla et al. | Oct 1998 | A |
6020695 | Kelly et al. | Feb 2000 | A |
6023143 | Salina | Feb 2000 | A |
6137253 | Galbiati et al. | Oct 2000 | A |
6140784 | Mazda | Oct 2000 | A |
RE37589 | Müeller | Mar 2002 | E |
6515443 | Kelly et al. | Feb 2003 | B2 |
6566832 | Ataee | May 2003 | B2 |
6741066 | Densham et al. | May 2004 | B1 |
6768623 | Shen | Jul 2004 | B1 |
6970319 | Bennett et al. | Nov 2005 | B1 |
6972918 | Kokami | Dec 2005 | B2 |
6977482 | Popescu-Stanesti et al. | Dec 2005 | B2 |
6995537 | Plutowski et al. | Feb 2006 | B1 |
7005817 | Thiesfeld et al. | Feb 2006 | B2 |
7054089 | Kokami | May 2006 | B2 |
7068455 | Tanner | Jun 2006 | B2 |
7068460 | Brenden et al. | Jun 2006 | B2 |
7092197 | El-Sherif et al. | Aug 2006 | B2 |
7116512 | Rana et al. | Oct 2006 | B1 |
7256554 | Lys | Aug 2007 | B2 |
7274529 | Ho et al. | Sep 2007 | B2 |
7348760 | Bucur et al. | Mar 2008 | B2 |
7358706 | Lys | Apr 2008 | B2 |
7385364 | Rana et al. | Jun 2008 | B1 |
7420348 | Fukamizu et al. | Sep 2008 | B2 |
7548392 | Desai et al. | Jun 2009 | B1 |
7564220 | Niculae et al. | Jun 2009 | B2 |
7612521 | Miyajima | Nov 2009 | B2 |
7649330 | Yamashita et al. | Jan 2010 | B2 |
7652459 | Abu Qahouq et al. | Jan 2010 | B2 |
7659673 | Lys | Feb 2010 | B2 |
7692394 | Hill et al. | Apr 2010 | B2 |
7773351 | Kanai | Aug 2010 | B2 |
7848045 | Li et al. | Dec 2010 | B1 |
7863841 | Menegoli et al. | Jan 2011 | B2 |
7902778 | Yamashita et al. | Mar 2011 | B2 |
8026706 | Abu Qahouq et al. | Sep 2011 | B2 |
8030861 | Hoogzaad | Oct 2011 | B2 |
8125207 | Houston | Feb 2012 | B2 |
8144420 | Li et al. | Mar 2012 | B1 |
8471509 | Bonvin | Jun 2013 | B2 |
20010030880 | Miyazaki et al. | Oct 2001 | A1 |
20020006007 | Ataee | Jan 2002 | A1 |
20020017887 | Gotou et al. | Feb 2002 | A1 |
20020053890 | Gotou et al. | May 2002 | A1 |
20020060544 | Teutsch et al. | May 2002 | A1 |
20020079856 | Hill et al. | Jun 2002 | A1 |
20030117918 | Thiesfeld et al. | Jun 2003 | A1 |
20040100722 | Kokami | May 2004 | A1 |
20040189221 | Kurosawa et al. | Sep 2004 | A1 |
20050018339 | Tanner | Jan 2005 | A1 |
20050018340 | Tanner | Jan 2005 | A1 |
20050067986 | Kurosawa et al. | Mar 2005 | A1 |
20050213352 | Lys | Sep 2005 | A1 |
20050213353 | Lys | Sep 2005 | A1 |
20050218853 | Kokami | Oct 2005 | A1 |
20050218870 | Lys | Oct 2005 | A1 |
20050219872 | Lys | Oct 2005 | A1 |
20050248308 | Reed et al. | Nov 2005 | A1 |
20050264921 | El-Sherif et al. | Dec 2005 | A1 |
20060007581 | Brenden et al. | Jan 2006 | A1 |
20060072237 | Kokami | Apr 2006 | A1 |
20060103363 | Miftakhutdinov | May 2006 | A1 |
20060158142 | Kurosawa et al. | Jul 2006 | A1 |
20060208680 | Fukamizu et al. | Sep 2006 | A1 |
20060232244 | Vieira Formenti | Oct 2006 | A1 |
20060238160 | Fukamizu et al. | Oct 2006 | A1 |
20070046228 | Ogino et al. | Mar 2007 | A1 |
20070046229 | Ogino et al. | Mar 2007 | A1 |
20070078568 | Donaldson et al. | Apr 2007 | A1 |
20070090766 | LaGrave et al. | Apr 2007 | A1 |
20070188906 | Ho et al. | Aug 2007 | A1 |
20070195451 | Kokami | Aug 2007 | A1 |
20070285827 | Yamashita et al. | Dec 2007 | A1 |
20070285828 | Yamashita et al. | Dec 2007 | A1 |
20080007236 | Elbanhawy | Jan 2008 | A1 |
20080116861 | Kernahan | May 2008 | A1 |
20080203992 | Qahouq et al. | Aug 2008 | A1 |
20080284500 | Chigira | Nov 2008 | A1 |
20080291588 | Kanai | Nov 2008 | A1 |
20080310046 | Menegoli et al. | Dec 2008 | A1 |
20090033293 | Xing et al. | Feb 2009 | A1 |
20090045762 | Hayashi et al. | Feb 2009 | A1 |
20090080115 | Kokami et al. | Mar 2009 | A1 |
20090243706 | Hsueh | Oct 2009 | A1 |
20090284193 | Hoogzaad | Nov 2009 | A1 |
20090315490 | Hoogzaad | Dec 2009 | A1 |
20100002331 | Tan | Jan 2010 | A1 |
20100117616 | Qahouq et al. | May 2010 | A1 |
20100141191 | Chen et al. | Jun 2010 | A1 |
20100289468 | Draghi | Nov 2010 | A1 |
20110074374 | Galbiati | Mar 2011 | A1 |
20130176015 | Sato et al. | Jul 2013 | A1 |
Number | Date | Country | |
---|---|---|---|
20160189742 A1 | Jun 2016 | US |
Number | Date | Country | |
---|---|---|---|
61115870 | Nov 2008 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 12620929 | Nov 2009 | US |
Child | 15065617 | US |