Patent Application
20220373434
The present invention relates to a technique of an attached substance collection device and an attached substance analysis system.
It is required in an engineering field and an environmental field to analyze a physical matter of an attached substance attached to an inspection object. In particular, in the environmental field, in order to grasp the state of environmental pollution, there is a demand for an analysis device that has high sensitivity and can quickly measure an attached substance in real time.
In addition, in an industrial field, for the purpose of production process control and quality control, there is a demand for an analysis device that has high sensitivity and can measure quickly or in real time an attached substance component attached to an industrial product.
For example, Patent Literature 1 discloses an analysis device and an analysis method where “Provided is a technique of analyzing particles in real time while collecting and condensing the particles continuously. Gas and/or particles as a detection target substance that are attached to an authentication target 2 are removed by air flow from a blowing region 5. The removed sample is sucked and is condensed and sampled at a sampling region 10, and ions of the sample are generated at an ion source 21 and are then subjected to mass analysis at a mass analysis region 23. Determination of the obtained mass spectrum is made as to the presence or not of a mass spectrum derived from the detection target substance, and a monitor 27 displays a result thereof. Thereby, the detection target substance attached to the authentication target 2 can be detected continuously in real time, promptly and with a less error rate”.
Patent Literature 2 discloses an analysis apparatus “provided with: a recognition unit for recognizing an object; an air supply unit for jetting air streams onto the object from at least two different directions; a collection port for collecting gas and/or particles stripped from the object; an air intake unit for sucking in the gas and/or particles stripped from the object; a flow rate control unit for controlling the air stream jetting of the air supply unit and the sucking of the air intake unit; a particle capturing unit for concentrating and capturing a substance to be detected included in the sucked in gas and/or particles; an analysis unit for analyzing the substance to be detected, which is introduced from the particle capturing unit; and an analysis determination control unit for determining whether the substance to be detected is present on the basis of the result of the analysis of the analysis unit”.
Patent Literature 3 discloses an accretion collection device and inspection system where “In order to detach substances stably from an object being inspected, this accretion collecting device is characterized in including: ejection openings (n) which eject gas; a housing (B) in which the ejection openings (n) are provided; and supporting portions (H) which are installed on a surface of the housing (B) in which the ejection openings (n) are provided, and which have a prescribed height. Further, the supporting portions (H) are characterized in comprising protrusion-shaped portions formed in the housing (B). In addition, the supporting portions (H) have a cuboid shape, and are installed in such a way that the distance therebetween decreases in the direction of a recovery opening which recovers substances that have been detached from the object being inspected (C) by the gas”.
Patent Literature 1: WO 2012/063796
Patent Literature 2: WO 2016/027320
Patent Literature 3: WO 2017/209065
In these attached substance analysis systems, the inspection object may block a nozzle through which gas jets. In particular, when the inspection object is a hand, unlike an ID card or the like, the shape is variable, and the nozzle tends to be blocked because of the weight. Since the distal end of the nozzle is generally sharp, it is not preferable that the finger and the distal end of the nozzle come into contact with each other. In addition, when the jet opening of the nozzle is blocked with a finger, the efficiency of detachment and collection of the attached substance by gas is deteriorated.
The present invention has been made in view of such background, and an object of the present invention is to stably collect an attached adhered substance attached to an inspection object.
In order to solve the above-described problem, one means of the present invention includes: a nozzle that jets gas upward; a surface including an opening portion through which the gas jetted from the nozzle passes; a collection opening in which the gas jetted toward an object is collected; and a contact detection unit that detects whether or not the object has come into contact with the surface, in which an attached substance attached to the object is collected by using the gas.
Furthermore, another means of the present invention includes: a nozzle that jets gas upward; a surface equipped with an opening portion through which the gas jetted from the nozzle passes; and a collection opening through which the gas jetted toward an object is collected, in which an attached substance attached to the object is collected by using the gas, a height of a distal end of the nozzle is substantially equal to a height of the surface; or equal to or less than a height of the surface, the surface includes an air flow adjustment portion that is a recess portion or a hole portion, and, relative to a jet opening of the nozzle, the air flow adjustment portion is provided closer to the collection opening, and is in contact with a jet opening of the nozzle or includes a jet opening of the nozzle.
Other solutions will be described as appropriate in the embodiments.
According to the present invention, an attached substance attached to an inspection object is stably collected.
Embodiments of the present invention will be described below with reference to the accompanying drawings. Note that although the accompanying drawings illustrate specific embodiments in accordance with the principle of the present disclosure, these are for the purpose of understanding of the present invention and are by no means used for construing the present disclosure in a limited manner. Modifications by combination or replacement of the embodiments below with known techniques are also included in the scope of the present invention. It is possible to replace a part of the configuration of a certain embodiment with the configuration of another embodiment, and it is also possible to add the configuration of another embodiment to the configuration of a certain embodiment. Note that in all the drawings for describing the embodiments, components having the same functions are denoted by the same reference signs, and the repeated description thereof will be omitted.
First, an outline of an attached substance analysis system 200 according to the present embodiment will be described with reference to
In order to collect an attached substance attached to an inspection object C, the attached substance analysis system 200 of the present embodiment jets gas from a jet opening 112 of a nozzle 111 to detach and collect the attached substance of the inspection object C when the inspection object C is inserted into an attached substance collection device 1. In order to check whether or not a person to be inspected possesses a dangerous material or a trace thereof, the attached substance analysis system 200, as a security gate system at an entrance of an important facility or the like, has a function of analyzing, in real time, whether or not the attached substance attached to the inspection object C is a dangerous material such as an explosive. Note that the following embodiments may also be applied to a security gate installed at an entrance of an important facility and the like, a boarding gate at an airport, a port, and the like, a gate 233 at an automatic ticket gate, a baggage inspection station, and a checked-in baggage inspection station, an entrance/exit ticket gate of an amusement facility, and the like.
The attached substance collection device 1 includes a lower substrate 101, an upper substrate 102 (see
In the attached substance collection device 1, the gas jetted from the nozzle 111 is applied to the inspection object C (a hand C1 is anticipated in FIG.1) inserted into the attached substance collection device 1 (dashed arrow in
As illustrated in
In the first embodiment, a slit nozzle in which the jet openings (distal end) 112 has a linear shape (band shape) is adopted as the nozzle 111 as illustrated in
As illustrated in
The nozzle 111 is embedded and installed in the lower substrate 101 such that the distal end of the nozzle 111 is positioned not to protrude from an upper surface (surface) 105 of the lower substrate 101. That is, the nozzle 111 is installed such that the distal end position of the nozzle 111 substantially coincides with the upper surface 105 of the lower substrate 101. Note that the distal end position of the nozzle 111 may be slightly higher than the upper surface of the lower substrate 101 unless the distal end position of the nozzle 111 greatly protrudes from the upper surface 105 of the lower substrate 101. The distal end position of the nozzle 111 may be positioned below the upper surface of the lower substrate 101. The jet opening 112 of the nozzle 111 is installed in an opening portion 106 provided on the upper surface 105 of the lower substrate 101. That is, the gas jetted from the nozzle 111 is jetted to the inspection object C through the opening portion 106 (
The speed of the gas jetted from the nozzle 111 decreases as the distance from the nozzle 111 increases. That is, when the distance between the jet opening 112 of the nozzle 111 and the inspection object C is increased, the detachment efficiency of the attached substance decreases. Therefore, it is not desirable to unnecessarily increase the distance between the nozzle 111 and the inspection object C. In order to provide a distance where the nozzle 111 does not come in contact with the inspection object and the detachment efficiency, it is desirable that the positions of the jet opening 112 of the nozzle 111 and the lower substrate 101 coincide with each other.
If the distal end of the nozzle 111 protrudes greatly from the bottom surface, the distal end of the nozzle 111 has a possibility to come into great contact with the inspection object C when the inspection object C is inserted into the attached substance collection device 1, and therefore it is not preferable. In particular, it is not preferable in a case where the inspection object C is the hand C1.
As illustrated in
As illustrated in
The lower substrate 101 is provided with contact detection sensors 130 which each serves as a contact detection unit. As illustrated in
The contact detection sensor 130 is, for example, a photoelectric sensor equipped with a light irradiation unit 131 and a light reception unit 132. That is, by detecting shielding of light such as infrared light emitted from the light irradiation unit 131, the light reception unit 132 detects whether or not the inspection object C is in contact with the lower substrate 101. As described above, when the jet opening 112 is blocked by the inspection object C, gas jet is interrupted. Therefore, the detachment efficiency and the collection efficiency of the attached substance are decreased. It is thus desirable to jet gas in a state where the inspection object C is not in contact with the lower substrate 101. By providing the contact detection sensor 130, it is detected that the inspection object C comes into contact with the lower substrate 101. Due to this, as described later, gas jet may be stopped while the inspection object C is in contact with the lower substrate 101, and the detachment efficiency and the collection efficiency is improved. The relationship between the contact of the inspection object C with the lower substrate 101 by the contact detection sensor 130 and the gas jet will be described later.
The contact detection sensor 130 detects whether or not the inspection object C blocks the jet opening (distal end) 112 of the nozzle 111. In addition, the contact detection sensor 130 also detects whether or not the inspection object C exists at a position where introduction of the separated attached substance to the 0-order filter 151 is interrupted. Therefore, the detection region of the contact detection sensor 130 is desirably a region between the jet opening 112 of the first nozzle 111a and the 0-order filter 151. Reversely, the contact of the inspection object C with the lower substrate 101 closer to the insertion port E1 relative to the jet opening 112 of the first nozzle 111a does not become a large problem. Therefore, the region from the jet opening 112 of the first nozzle 111a to the insertion port E1 may not be the detection region of the contact detection sensor 130.
The 0-order filter 151 is installed between the distal end of the nozzle 111 (111b) closest to the collection opening E2 and the collection opening E2.
After colliding with the lower surface of the inspection object C, the gas jetted from the nozzle 111 flows toward the collection opening E2 by suction force of a concentration device 220 illustrated in
As illustrated in
The presence of the upper cover 103 may restrict the distance in the up-down direction between the inspection object C and the nozzle 111. That is, the inspection object C is prevented from being present at a position where the gas jetted from the nozzle 111 does not reach. In addition, by providing the transparent upper cover 103, the subject may look the position of the inserted inspection object C, and usability is improved. In particular, in a case where the inspection object C is a part of a human body such as a hand C1, it is highly possible that unseen of a body part of the subject causes a subject's oppressive feeling against the inspection when the upper cover 103 is not transparent. Therefore, also for the purpose of reducing the oppressive feeling against the inspection, the transparency of the upper cover 103 is meaningful.
Furthermore, as illustrated in
The lower substrate 101 and the upper cover 103 are equipped with the insertion detection sensors 140 serving as insertion detection units. The insertion detection sensor 140 is, for example, a photoelectric sensor including a light irradiation unit 141 and a light reception unit 142. For example, the upper cover 103 is provided with the light irradiation unit 141, and the lower substrate 101 is provided with the light reception unit 142 so as to face the light irradiation unit 141. Then, by detecting shielding of light such as infrared light emitted from the light irradiation unit 141, the light reception unit 142 detects whether or not the inspection object C is inserted.
In the present embodiment, the inspection is started by inserting the inspection object C between the lower substrate 101 and the upper cover 103 of the attached substance collection device 1. The insertion detection sensor 140 detects the insertion of the inspection object C, and the contact detection sensor 130 detects that the inspection object C is not in contact with the lower substrate 101. When it is detected that the inspection object C is inserted into the attached substance collection device 1 and is not in contact with the lower substrate 101, gas is jetted from the nozzle 111 as described above (dashed arrow in
The gas jetted from the nozzle 111 spreads beyond the width of the nozzle 111 after the jet. Therefore, in order to improve the collection rate of the detached attached substance, the width of the 0-order filter 151 is required to be wider than the width of the nozzle 111. The width of the collection opening E2 is narrower than the width of the nozzle 111 and the width of the 0-order filter 151.
As illustrated in
In
Next, the recess portion 121 will be described with reference to
In the present embodiment, the height of the distal end of the nozzle 111 is substantially the same as the height of the upper surface 105 of the lower substrate 101 or equal to or less than the height of the upper surface 105 of the lower substrate 101 so that the inspection object C (hand C1) does not come into much contact with the distal end of the nozzle 111. However, such a configuration causes the following problems.
That is, as illustrated in
On the other hand, as in
As illustrated in
From the above, in order to obtain a high detachment efficiency while reducing the risk of damaging the inspection object C, it is desirable to install the recess portion 121 in the direction of the gas jet from the jet opening112 while making the height of the jet opening 112 in the nozzle 111 equal to the height of the upper surface 105 of the lower substrate 101. Although it is also conceivable to install the recess portion 121 behind the nozzle 111, it is similar to a situation where the nozzle 111 protrudes from the lower substrate 101, and the distal end of the nozzle 111 is highly possible to come into great contact with the inspection object C. Since the recess portion 121 desirably exists over the entire jet opening 112, the width of the recess portion 121 is desirably equal to or larger than the width of the nozzle 111.
As described above, in
The attached substance analysis system 200 illustrated in
The attached substance analysis system 200 includes the attached substance collection device 1, a pulse valve 211, an air tank 212, a pressure controller 213, a compressor 214, and the concentration device 220. The attached substance analysis system 200 includes an analysis device 231, a data processing device 300, a display device 232, the gate 233, and an alarm device 234. The concentration device 220 includes a cyclone collection unit 221, a heater 222, a primary filter 223, a secondary filter 224, and an exhaust device 225. Note that the attached substance analysis system 200 is not necessarily limited to this configuration, and
Although not expressed in
The cyclone collection unit 221 is used for separating and concentrating an attached substance from gas. In the attached substance collection device 1, the adhered substance is detached together with the gas jetted from the nozzle 111 at about 200 L/min. The nozzle 111 is connected to the air tank 212 via a nozzle pipe 215 for supplying gas to the nozzle 111. In this manner, the air tank 212 is provided between the pulse valve 211 and the compressor 214. For example, when the flow rate for the pulse valve 211 is 60 L/min, 100 mL of gas is discharged from the nozzle 111 in 0.1 seconds. When the gas is jetted a plurality of times, the gas is discharged by that amount. Therefore, by providing the air tank 212, a required amount of compressed gas can be stored in the air tank 212. Note that the air tank 212 may not be provided.
In the compressor 214, the gas pressure is increased to about 0.7 MPa. The gas pressure supplied to the nozzle 111 is adjusted by the pressure controller 213.
The pulse valve 211 is normally closed, and is opened for about 0.1 seconds by a gas jet control unit 311 of the data processing device 300 illustrated in
Here, the compressed gas is jetted from the nozzle 111 using the compressor 214, but the gas may be jetted by using an air blower or the like without using the compressor 214.
A mass spectrometer and an ion mobility analysis device, which are representative analysis devices 231, suck only a sample flow rate of equal to or less than 1 L/min in general. If the gas of 200 L/min is jetted from the nozzle 111, of which only 1 L/min is sucked, the sensitivity becomes 1/200.
Therefore, by installing the cyclone collection unit 221 between the attached substance collection device 1 and the analysis device 231, the attached substance analysis system 200 illustrated in
The minimum particle size (separation limit particle size) of the attached substance separated from the gas by the rotational motion varies depending on the configuration of the cyclone collection unit 221 and the suction flow rate of the exhaust device 225. The attached substance collected in the lower part of the cyclone collection unit 221 settles down to the heater 222 as it is. The heater 222 includes the primary filter 223. The attached substance having been settled is collected by the primary filter 223 and heated by the heater 222. The attached substance is vaporized there and the vaporized gas is introduced into the analysis device 231 through the secondary filter 224.
For example, since explosive fine particles, which is one of dangerous materials, usually has a particle size of about 5 to 100 μm, it is preferable to collect fine particles having this particle size. The detection target may be not only the explosive fine particles but also a chemical agent, a harmful substance, a dangerous substance, a combustible substance, a biological agent, a virus, a bacterium, a gene, an environmental substance, or the like as long as it adheres to the inspection object. The concentration device 220 is not limited to the cyclone collection unit 221 as long as an attached substance having been separated is concentrated. In order to enhance the effect of the concentration device 220, the suction flow rate of the concentration device 220 is desirably larger than the flow rate of the gas jetted from the nozzle 111. For example, if the flow rate of the gas jetted from the nozzle 111 is 100 L/min, the suction flow rate of the cyclone collection unit 221 is desirably equal to or greater than 100 L/min. If the suction flow rate of the cyclone collection unit 221 is 150 L/min and the flow rate from the cyclone collection unit 221 to the analysis device 231 is 0.5 L/min, the fine particles (attached substance) concentrated in the cyclone collection unit 221 are concentrated 300 times. Thus, by concentrating the attached substance with the concentration device 220, the analysis accuracy in the analysis device 231 is improved.
The inlet E3 of the cyclone collection unit 221 is generally rectangular of which the height is greater than the width. Regarding the cyclone size as expected in the present embodiment, the width of the inlet E3 of the cyclone collection unit 221 is about several 10 mm at the maximum. Therefore, the width of the inlet E3 of the cyclone collection unit 221 becomes smaller than the width of the 0-order filter 151 (not illustrated). The inlet E3 of the cyclone collection unit 221 and the collection opening E2 of the 0-order filter 151 have a structure to be smoothly coupled so that the attached substance having passed through the 0-order filter 151 is efficiently introduced into the inlet E3 of the cyclone collection unit 221.
The heater 222 heats the attached substance at, for example, 200° C. Regarding the temperature of the heater 222, any temperature is good enough as long as the attached substance to be collected is vaporized, and the temperature of the heater 222 may be varied depending on a component of the object. The user may remove the primary filter 223 and the secondary filter 224. Then, the user may clean and reuse the primary filter 223 and the secondary filter 224 as necessary, or replace them with new ones. The primary filter 223 and the secondary filter 224 may be replaced manually, but a predetermined automatic replacement device may replace the primary filter 223 and the secondary filter 224. The primary filter 223 and the secondary filter 224 are good enough when they have a filtration accuracy capable of capturing fine particles having a particle size of equal to or greater than 1 μm.
For example, a stainless steel filter having a filtration accuracy of 1 to 50 μm is used as the primary filter 223 and the secondary filter 224. A pipe 226 connecting the heater 222 and the analysis device 231 is also heated. This is to prevent molecules vaporized by the heater 222 from being adsorbed to the pipe inner wall. The secondary filter 224 is installed for the purpose of preventing an attached substance not captured by the primary filter 223 from entering the analysis device 231. The pipe 226 between the heater 222 and the analysis device 231 is not necessarily required, and the heater 222 and the analysis device 231 may be directly connected.
As the analysis device 231, for example, a wire-type linear ion trap mass spectrometer or the like may be used. As a mass spectrometry method, a linear ion trap mass spectrometer, a quadrupole ion trap mass spectrometer, a quadrupole filter mass spectrometer, a triple quadrupole mass spectrometer, a time-of-flight mass spectrometer, a magnetic field mass spectrometer, and the like may be applied. Alternatively, an ion mobility analysis device and the like may also be used. In addition to them, a device in which an ion mobility analysis device and a mass spectrometer are coupled may also be used. Moreover, the analysis device 231 using various light sources such as fluorescence, infrared rays, and ultraviolet rays may be used.
When the mass spectrometer is used as the analysis device 231, the data processing device 300 analyzes the measured mass spectrum, and identifies the component of the attached substance and specifies the concentration from this mass spectrum. A database is created in advance in the data processing device 300, and a threshold for determining whether or not the specified attached substance is a dangerous material is set in advance. If the concentration of the detected component exceeds a designated threshold, the data processing device 300 makes a positive determination. In this case, the data processing device 300 may display the detected component on the display device 232. The analysis result may be notified to a monitoring center or a monitor at a remote place without displaying the result on the display device 232. In the present embodiment, the gate 233 is closed in cooperation with this analysis result. In addition to this, recording by a monitoring camera, recording of authentication data, and the like may be performed. Not only the mass spectrometer but also other analysis devices 231 such as an ion mobility analysis device analyze an attached substance by collating with a database. The alarm device 234 will be described later.
By connecting the analysis device 231 to the attached substance collection device 1 (via the concentration device 220), the attached substance collected by the attached substance collection device 1 is analyzed. As a result, a dangerous material such as an explosive in the inspection object C is detected.
The data processing device 300 includes a memory 310 and a central processing unit (CPU) 321, a storage device 322 such as a hard disk (HD), an input device 323 such as a keyboard and a mouse, and a communication device 324 such as a network interface card (NIC).
Then, a program stored in the storage device 322 is loaded into the memory 310, and the loaded program is executed by the CPU 321. This embodies the gas jet control unit 311, an analysis determination unit 312, a gate control unit 313, and a display control unit 314.
By controlling the pulse valve 211 and the like, the gas jet control unit 311 controls the pulse valve 211 and the like to jet gas from the nozzle 111 of the attached substance collection device 1.
The analysis determination unit 312 determines whether or not an explosive has been detected based on the analysis result of the analysis device 231.
The gate control unit 313 controls opening and closing of the gate 233 according to the determination result of the analysis determination unit 312.
The display control unit 314 performs display on the display device 232.
First, the subject inserts the inspection object C into the attached substance collection device 1 (S101).
Then, the gas jet control unit 311 of the data processing device 300 determines the insertion detection sensor 140 (“vertical sensor”) in “ON” or “OFF” (S102). That is, the gas jet control unit 311 determines whether or not the inspection object C has been inserted to an appropriate position.
If the insertion detection sensor 140 is in “OFF” (S102: OFF), the gas jet control unit 311 returns the processing to step S102.
If the insertion detection sensor 140 is “ON” (S102: ON), the gas jet control unit 311 determines the contact detection sensor 130 (“horizontal sensor”) in “ON” or “OFF”(S103).
If the contact detection sensor 130 is in “ON” (S103: ON), there is a high possibility that the inspection object C is in contact with the lower substrate 101, and hence the gas jet control unit 311 causes the alarm device 234 to issue an alarm (S111). The alarm emits a voice such as “Please lift the inspection object”. Subsequently, the gas jet control unit 311 returns the processing to step S102.
If the contact detection sensor 130 is in “OFF” for a predetermined time (S103: OFF), the gas jet control unit 311 controls the pulse valve 211 to jet gas from the nozzle 111 (S112). Here, the predetermined time is a jet waiting time T illustrated in
Then, the gas jet control unit 311 determines whether or not the jet of the gas has ended (S113).
If the jet of the gas has not ended (S113→No), the gas jet control unit 311 returns the processing to step S102.
If the jet of the gas has ended (S113→Yes), the gas jet control unit 311 ends the processing.
After step S111, if the inspection target is lifted as per the voice, the condition in which the insertion detection sensor 140 is in “ON” and the contact detection sensor 130 is in “OFF”, is satisfied, and hence the gas jet control unit 311 causes gas to be jetted.
The inspection object C is inserted into the attached substance collection device 1. With this, as illustrated in
By performing the control as illustrated in
In the case illustrated in
However, since an explosive or the like can be detected by the attached substance detached at the stage of the first gas jet (reference sign 301) in
The same applies to a case where the contact detection sensor 130 is turned “ON” while the valve for second nozzle is open. That is, when the contact detection sensor 130 is turned “ON” while the valve for second nozzle is open, the valve for first nozzle is opened and closed first and the valve for second nozzle is opened and closed next after the contact detection sensor 130 is turned “OFF”.
In
In
Sample insertion is detected at timing of time t30, and gas is jetted at time t31. The explosive detached by the gas is collected, heated, and vaporized, and a signal detected by the mass spectrometer (analysis device 231) is confirmed with reference sign 411. As illustrated in
In
First, the subject approaches the attached substance analysis system 200 and inserts the inspection object C into the attached substance collection device 1 (S201).
When the insertion detection sensor 140 detects insertion of the inspection object C and the contact detection sensor 130 detects that the inspection object C is not in contact with the lower substrate 101, the gas jet control unit 311 of the data processing device 300 causes gas to be jetted from the nozzle 111 to detach and collect the attached substance attached to the inspection object C (S211). The processing in step S211 is the processing illustrated in
The collected attached substance is heated and vaporized by the heater 222 (S212), and the analysis device 231 analyzes the vaporized gas (S213).
The analysis determination unit 312 of the data processing device 300 determines whether or not an explosive is detected by the processing of step S213 (S221). As described above, the analysis determination unit 312 makes the determination in step S221 based on the threshold for determining whether or not the specified attached substance stored in the storage device 322 of the data processing device 300 is a dangerous material.
If no explosive is detected (S221: No), the gate control unit 313 of the data processing device 300 brings the gate 233 into an open state (S222) and permits the subject to pass.
If an explosive is detected (S221: Yes), the display control unit 314 of the data processing device 300 displays, on the display device 232, a meaning that the explosive is detected (S223). Subsequently, the gate control unit 313 brings the gate 233 into a close state (S224) and does not permit the subject to pass.
According to the first embodiment, the contact detection sensor 130 is provided on the upper surface 105 of the lower substrate 101. This avoids the distal end of the nozzle 111 from being blocked by the inspection object C, and thus the reliability of collection of the attached substance is improved.
According to the first embodiment, the jet opening 112 of the nozzle 111 is included, and the recess portion 121 is provided in the direction of the gas jet by the nozzle 111. Doing this enables the gas to be appropriately applied to the inspection object C as described in
With these configurations, the attached substance attached to the inspection object C is stably collected.
The attached substance collection device 1 illustrated in the first embodiment is provided with the insertion detection sensor 140. By providing the insertion detection sensor 140, the gas is jetted after the inspection object C is certainly inserted into the attached substance collection device 1.
The attached substance collection device 1a illustrated in
The authentication device 161 is not limited to the ID card authentication device, and may be a fingerprint authentication device or a finger vein authentication device. In particular, when the inspection object C is a hand C1 or a finger, it is desirable to provide a fingerprint authentication device or a finger vein authentication device as the authentication device 161. In such a case, when the hand C1 is inserted into the attached substance collection device 1a, authentication of the fingerprint or the finger vein is performed simultaneously with collection and analysis of the attached substance of the hand C1 by the jetted gas.
In the example illustrated in
In
The data processing device 300a illustrated in
The authentication determination unit 315 determines whether or not the authentication information acquired from the authentication device 161 is correct.
Here, steps S201 to S213 illustrated in
Then, in parallel with the processing of steps S211 to S213, the authentication device 161 acquires authentication information from the inspection object C (S301).
Then, the authentication determination unit 315 of the data processing device 300a determines whether or not the authentication information acquired in step S301 is correct authentication information (S311).
If it is not correct authentication information (S311: No), the display control unit 314 of the data processing device 300a displays a meaning that the authentication cannot be performed (S312), on the display device 232. Subsequently, the gate control unit 313 brings the gate 233 into a close state (S313) and does not permit the subject to pass.
If it is correct authentication information (S311: Yes), the analysis determination unit 312 of the data processing device 300a determines whether or not an explosive is detected by the processing in step S222 (S221). Since the processing of steps S221 to S224 is similar to the processing illustrated in
According to the second embodiment, the security level is improved by simultaneously performing explosive inspection and authentication.
As illustrated in
The side wall 104 is not illustrated in
The spacer 171 is useful when the inspection object C is not something that has an easily deformed shape such as the hand C1 but something that has a fixed shape such as the ID card C2 and a passport as illustrated in
In the example illustrated in
When the inspection object C comes into contact with the spacer 171 at the time of inspection, the distance between the distal end of the nozzle 111 and the inspection object C is restricted by the height of the spacer 171 as described above. The lower the spacer 171 is, the smaller the height direction distance between the distal end of the nozzle 111 and the inspection object C becomes. The flow velocity of the gas jetted from the nozzle 111 decreases with increasing distance from the nozzle 111. The dynamic pressure acting on the attached substance by gas is proportional to the square of the flow velocity. Therefore, the faster the flow rate is, the higher the dynamic pressure acting on the attached substance becomes. That is, the smaller the distance between the nozzle 111 and the attached substance is, the higher the dynamic pressure becomes. However, if the height of the spacer 171 is made too low, when the inspection object C has a concave-convex portion, the concave-convex portion has a possibility to come into contact with the lower substrate 101. It is known that the region in which the gas is jetted from the nozzle 111 has a region called a potential core region in which the flow velocity does not decrease from the velocity at the outlet of the nozzle 111. In order to efficiently detach the attached substance while separating the distance between the nozzle 111 and the inspection object C to some extent, the height of the spacer 171 is preferably designed so that the distance between the inspection object C and the nozzle 111 falls within the potential core region. As a result, the height of the spacer 171 is desirably set to be between 2 to 4 mm.
Even if the spacer 171 as illustrated in
If the spacer 171 exists between the nozzle 111 and the 0-order filter 151, the spacer 171 possibly interrupts the flow of the gas jetted from the nozzle 111. Therefore, the spacer 171 preferably has a thin structure within a range where the strength becomes sufficient so as not to interrupt the flow of the gas. Here, the thin structure is a structure in which the axial direction toward the insertion opening E1 and the collection opening E2 is the longitudinal direction.
On the other hand, in comparison with the nozzle 111, a spacer 171-1 installed closer to the insertion opening E1 hardly affects the jet gas. For this reason, the spacer 171-1 does not necessarily have a thin structure. For example, the spacer 171-1 may have a structure that has a concave structure in the entire region from the first nozzle 111a to the insertion port E1.
The height of each spacer 171 may be the same, or the height of at least one spacer 171 may be different.
The attached substance collection device 1c illustrated in
In the attached substance collection devices 1d and 1e illustrated in
Note that the nozzle 111 may not only have a shape as illustrated in
The characteristic of the present embodiment lies in that the recess portion 121 is provided closer to the collection opening E2 side with respect to the jet opening112 of the nozzle 111 for jetting gas so that the gas efficiently flows toward the inspection object C. Therefore, the shape of the nozzle 111 is not limited to the shape illustrated in the previous embodiments and
According to the attached substance collection devices 1d and 1e illustrated in
Comparing the attached substance collection device 1f illustrated in
In the previous embodiments, the space between the upper substrate 102 and the lower substrate 101 are identical in height with the 0-order filter 151. On the other hand, in the attached substance collection device 1g illustrated in
As illustrated in
Unlike that in the previous embodiments, the attached substance collection device 1h illustrated in
In such a configuration, the lower substrate 101 is desirably made of a transparent member. If the detection of the contact of the inspection object C with the lower substrate 101 by the distance sensor 162 is regarded as “ON” of the contact detection sensor 130 in the previous embodiments, it can be considered as processing similar to that in the previous embodiments. Note that the distance sensor 162 may not necessarily used for contact detection. For example, contact of the inspection object C with the lower substrate 101 may be detected by installing a capacitance sensor on the lower substrate 101 instead of the contact detection sensor 130 or the distance sensor 162.
In the attached substance collection device 1i illustrated in
However, by changing the operation, unless the inspection object C is in contact with any of the upper substrate 102i and the lower substrate 101, the gas may be jetted to at least a surface of the inspection object C that is not in contact with any of the upper substrate 102i and the lower substrate 101. Therefore, an operation may be carried out in which gas is jetted when any of the contact detection sensors 130 provided in the upper substrate 102i and the lower substrate 101 is “OFF”.
With such a configuration, the attached substance on both the upper surface and the lower surface of the inspection object C is detached.
Unlike that of the previous embodiments, the attached substance collection device 1j illustrated in
On the other hand, by providing the hole portion 121j penetrating the lower substrate 101 as illustrated in
The above-described configurations, functions, units, storage device 322, and the like may be implemented by hardware by designing some or all of them with an integrated circuit, for example. As illustrated in
In each embodiment, a control line and an information line that are considered to be necessary for explanation are illustrated, and not necessarily all control lines and information lines on the product are illustrated. In practice, almost all configurations may be considered to be interconnected.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2019-129334 | Jul 2019 | JP | national |
This application is National Stage Entry of International application No. PCT/JP2020/023832, filed Jun. 17, 2020, which claims the benefit of priority from Japanese Patent Application No. 2019-129334, filed on Jul. 11, 2019; the entire contents of which are incorporated herein by reference.
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/JP2020/023832 | 6/17/2020 | WO |
