Claims
- 1. A method of determining ink-jet printhead alignment offset, the method comprising:printing a test pattern having predetermined parameters in accordance with a first data set; acquiring a second data set representative of actual parameters of said test pattern; fitting a waveform to said second data set; and partitioning said second data set into a plurality of individual third data sets for measuring differential offset values evidenced in said second data set as compared to said first data set.
- 2. The method as set forth in claim 1, the fitting a waveform further comprising:fitting the waveform as representative of said first data set to said second data set such that an initial fit offset value is determined by a characteristic of fit between said waveform and said second data set.
- 3. The method as set forth in claim 2 further comprising:fitting a measuring construct to each of said individual third data sets for determining an actual printhead alignment offset value for each of said third data sets; and calculating an actual printhead alignment offset value for each of said third data sets using said initial offset in combination with comparison data representative of comparing said measuring construct and said second data set.
- 4. The method as set forth in claim 1 further comprising:providing said test pattern having a design of predetermined nominal shape and spacing parameters.
- 5. The method as set forth in claim 4 further comprising:acquiring the second data set as data representative of actual shape and spacing parameters of said test pattern.
- 6. A computerized process for determining ink-jet printhead alignment offset, the process comprising:printing a test pattern having predetermined parameters in accordance with a first data set; acquiring a second data set representative of actual parameters of said test pattern; fitting a waveform to said second data set; and partitioning said second data set into a plurality of individual third data sets for measuring differential offset values evidenced in said second data set as compared to said first data set.
- 7. A computer memory comprising:computer code printing a test pattern having predetermined parameters in accordance with a first data set; computer code acquiring a second data set representative of actual parameters of said test pattern; computer code fitting a waveform to said second data set; and computer code partitioning said second data set into a plurality of individual third data sets for measuring differential offset values evidenced in said second data set as compared to said first data set.
- 8. A method for aligning ink-jet printhead devices, the method comprising:using said ink-jet printhead devices, printing a test pattern from a first data set; automatically reading back printed test pattern information as a second data set; partitioning said second data set into a plurality of subpatterns representative of printing in a predetermined orientation such that a plurality of subpattern offset values is represented for said printing in a predetermined orientation; fitting a measuring construct to each of said subpatterns; determining from said measuring construct a printhead device alignment offset value between a printed test pattern object actual position and a printed test pattern object expected position based upon said first data set; and transmitting a final printhead device alignment offset value based upon said initial offset and said printhead device alignment offset value to said printhead.
- 9. The method as set forth in claim 8 wherein test pattern objects are of a given shape and spacing dimensions, including objects relevant to determining printhead device alignment offset values relative to said at least one of said devices.
- 10. The method as set forth in claim 8, said printing further comprising:printing only given test pattern objects relevant to determining final printhead device alignment offset values only relative to a replaced printhead device.
- 11. The method as set forth in claim 8, said automatically reading back printed test pattern information further comprising:optically scanning said test pattern such that said second data set is representative of a substantially sinusoidal waveform related to reflectance values of alternating test pattern objects and intervening black spaces between said objects.
- 12. The method as set forth in claim 11, said fitting a measuring construct comprising:fitting a measuring construct to said sinusoidal waveform such that a centerpoint of said construct measured over a single period of said waveform is indicative of actual relative center position of a printed object on said print media of said second data set relative to an expected relative center of said printed object based upon said first data set.
- 13. The method as set forth in claim 12, said determining from said measuring construct a printhead device alignment offset value further comprises:for a predetermined printhead device printing orientation, determining a plurality of actual relative center positions of a plurality of printed objects on said print media of said second data set relative to expected relative centers of said printed objects based upon said first data set, taking an average of said plurality of actual relative center positions of a plurality of printed objects on said print media, using said average as said final printhead device alignment offset value.
- 14. The method as set forth in claim 8, further comprising:for determining bidirectional scanning axis offset values, using a determined left-to-right printhead device alignment offset of same absolute value with opposite delay imposed by the nozzle-firing means for right-to-left scanning of said printhead device.
- 15. The method as set forth in claim 8, further comprising:prior to said step of partitioning, determining from a comparison of said first data set to said second data set an initial offset between an expected start of said pattern of said first data set and an actual start of said pattern from said second data set.
RELATED APPLICATIONS
The present application is a continuation of U.S. patent application Ser. No. 09/263,594, filed on the same date Mar. 5, 1999 herewith, by the same inventors for a Test Pattern Implementation for Ink-Jet Printhead Alignment.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
4675696 |
Suzuki |
Jun 1987 |
A |
6234602 |
Soto et al. |
May 2001 |
B1 |
Continuations (1)
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Number |
Date |
Country |
Parent |
09/263594 |
Mar 1999 |
US |
Child |
09/811962 |
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US |