Claims
- 1. A method of determining ink-jet printhead alignment offset, comprising the steps of:printing a test pattern on a sheet of media, said test pattern providing a design of predetermined nominal shape and spacing parameters in accordance with a first data set; acquiring a second data set representative of actual shape and spacing parameters of said test pattern from the test pattern on the sheet of media; fitting a first waveform representative of said first data set to said second data set such that an initial fit offset value is determined by a characteristic of fit between said first waveform and said second data set; partitioning said second data set into a plurality of individual third data sets selectively chosen from said pattern for measuring differential offset values evidenced in said second data set; fitting a measuring construct to each of said individual third data sets for determining an actual printhead alignment offset value for each of said third data sets; and calculating an actual printhead alignment offset value for each of said third data sets using said initial offset in combination with comparison data representative of comparing said measuring construct and said second data set.
- 2. The method as set forth in claim 1, the step of calculating further comprising the steps of:determining relative position of centers of each measuring construct of each of said individual third data sets, and comparing said relative position to expected position based upon said first data set.
- 3. The method as set forth in claim 1, the step of calculating further comprising the step of:averaging actual printhead alignment offset values calculated for each of said third data sets and selecting said average as said actual printhead alignment offset value.
- 4. The method as set forth in claim 1, the step of calculating further comprising the step of:selecting a representative one of said individual third data sets printhead alignment offset value as said actual printhead alignment offset value.
- 5. The method as set forth in claim 1, the step of acquiring a second data set comprising the steps of:optically scanning individual regions of said test pattern for variations in reflectance across said regions, converting analog reflectance values into a digital data set, and storing said digital data set in a computer memory as said second data set.
- 6. The method as set forth in claim 4, the step of converting further comprising the steps of:extracting a sample of data acquired from an individual region of said test pattern under analysis; determining an average DC-bias of said sample of data; eliminating any DC- bias in said second data set.
- 7. The method as set forth in claim 6, said step of converting further comprising the step of:reducing said second data set by deleting data acquired outside of said test pattern.
- 8. The method as set forth in claim 6, the step of fitting a first waveform further comprising the steps of:fitting a sinusoidal waveform conforming to said first data set to said second data set, and determining phase shift between said first data set and said second data set, wherein said phase shift is representative of an initial offset value between said first data set and said second data set.
- 9. The method as set forth in claim 8, the step of fitting a measuring construct further comprising the step of:reducing each said individual third data sets to provide data representative of linear regions of reflectance data for each of said individual third data sets.
- 10. The method as set forth in claim 9, the step of fitting a measuring construct to said data representative of linear regions further comprising the step of:fitting a trapezoidal waveform construct to said data representative of linear regions.
- 11. The method as set forth in claim 9, the step of fitting a measuring construct to said data representative of linear regions further comprising the step of:determining relative position of intersection of linearly fit extension lines to said linear regions, said relative position of intersection being determinative of true third data set center relative to said first data set.
- 12. The method as set forth in claim 9, the step of fitting a measuring construct to said data representative of linear regions further comprising the steps of:fitting an individual test pattern object having a known width and center point based upon said first data set between linear regions, and determining relative position of said center point, said relative position of said center point being determinative of true third data set center relative to a nominal center expected of said first data set.
- 13. The method as set forth in claim 1, further comprising the step of:said step of printing including printing a repeating pattern of test objects.
- 14. The method as set forth in claim 13, the step of calculating further comprising the step of:determining a midpoint between successive alternate test objects.
- 15. The method as set forth in claim 14, said step of determining a midpoint comprising the further steps of:determining a centerpoint for an intervening test object between said successive alternate test objects of an object triad, determining a centerpoint for each of said successive alternate test objects of said object triad, determining an offset error value by a calculation in accordance with the formula error value triad1=(centerpoint A1+centerpoint A2)−centerpoint B), where A1 and A2 are the successive alternate test objects and B is the intervening test object of an object triad.
- 16. The method as set forth in claim 13, said step of calculating comprising the further step of:said individual third data sets being pairs of said objects, said actual printhead alignment offset value is determined by calculation in accordance with the formulae 1st pair offset=(centerpoint B1−centerpoint A1)−PSd, 2nd pair offset=(centerpoint B2−centerpoint A2)−PSd, throughNth pair offset=(centerpoint BN−centerpoint AN)−Psd, where A is a first object in a pair, B is a second object in a pair, PSd is the test pattern spacing, and N is the number of pairs in a second data set under analysis.
- 17. The method as set forth in claim 16, further comprising the step of:errors for all pairs of bars are averaged to arrive at the final average offset value by calculation in accordance with the formula final average offset value=Σ(pair offsets)÷N.
- 18. The method as set forth in claim 9, said step of fitting a measuring construct further comprising the steps of:clipping a waveform representative of said second data set to at least a maximum deviation of peak/trough values evidenced in said second data set.
- 19. The method as set forth in claim 9, said step of fitting a measuring construct further comprising the step of:clipping a waveform representative of said second data set to at least a maximum deviation of peak/trough values evidenced in said second data set.
- 20. A computer memory for implementing an automatic alignment of an ink-jet printhead device, comprising:means for storing a test pattern first data set, said test pattern having objects with given nominal object spacing and object width; means for storing a test pattern second data set from reading back a printed first test pattern data set; means for fitting a first waveform representative of said first data set to said second data set such that an initial fit offset value is determined by a characteristic of fit between said first waveform and said second data set; means for partitioning said second data set into a plurality of individual third data sets selectively chosen from said pattern for measuring differential offset values evidenced in said second data set; means for fitting a measuring construct to each of said individual third data sets for determining an actual printhead alignment offset value for each of said third data sets; and means for calculating an actual printhead alignment offset value for each of said third data sets using said initial offset in combination with comparison data representative of comparing said measuring construct and said second data set.
- 21. The computer memory as set forth in claim 20, said means for calculating an actual printhead alignment offset value further comprising:means for determining relative position of centers of each measuring construct of each of said individual third data sets, and means for comparing said relative position to expected position based upon said first data set.
- 22. The computer memory as set forth in claim 20, the means for calculating an actual printhead alignment offset value further comprising:means for averaging actual printhead alignment offset values calculated for each of said third data sets and selecting said average as said actual printhead alignment offset value.
- 23. A method for aligning ink-jet printhead devices in a hard copy apparatus having a printhead nozzle-firing means for directing ink-jet nozzle firing pulses, the method comprising the steps of:upon changing at least one of said printhead devices or upon an end-user apparatus test mode implementation command, automatically printing on a print media a given test pattern from a first data set having test pattern objects of a given shape and spacing dimensions, said given test pattern including objects relevant to determining printhead device alignment offset values relative to said at least one of said devices; automatically reading back printed test pattern information as a second data set; partitioning said second data set into a plurality of subpatterns representative of printing in a predetermined orientation such that a plurality of subpattern offset values is represented for said printing in a predetermined orientation; fitting a measuring construct to each of said subpatterns; determining from said measuring construct a printhead device alignment offset value between a printed test pattern object actual position and a printed test pattern object expected position based upon said first data set; and transmitting a final printhead device alignment offset value based upon said initial offset and said printhead device alignment offset value to said printhead nozzle-firing means.
- 24. The method as set forth in claim 23, said step of automatically printing further comprising the step of:printing only given test pattern objects relevant to determining final printhead device alignment offset values only relative to a changed printhead device.
- 25. The method as set forth in claim 23, said step of automatically reading back printed test pattern information further comprising the step of:optically scanning said pattern such that said second data set is representative of a substantially sinusoidal waveform related to reflectance values of alternating test pattern objects and intervening black spaces between said objects.
- 26. The method as set forth in claim 25, said step of fitting a measuring construct comprising the further step of:fitting a measuring construct to said sinusoidal waveform such that a centerpoint of said construct measured over a single period of said waveform is indicative of actual relative center position of a printed object on said print media of said second data set relative to an expected relative center of said printed object based upon said first data set.
- 27. The method as set forth in claim 26, said step of determining from said measuring construct a printhead device alignment offset value further comprises the steps of:for a predetermined printhead device printing orientation, determining a plurality of actual relative center positions of a plurality of printed objects on said print media of said second data set relative to expected relative centers of said printed objects based upon said first data set, taking an average of said plurality of actual relative center positions of a plurality of printed objects on said print media, using said average as said final printhead device alignment offset value.
- 28. The method as set forth in claim 23, further comprising the step of:for determining bidirectional scanning axis offset values, using a determined left-to-right printhead device alignment offset of same absolute value with opposite delay imposed by the nozzle-firing means for right-to-left scanning of said printhead device.
- 29. The method as set forth in claim 23, further comprising the step of:prior to said step of partitioning, determining from a comparison of said first data set to said second data set an initial offset between an expected start of said pattern of said first data set and an actual start of said pattern from said second data set.
RELATED APPLICATIONS
The present application is related to U.S. patent application Ser. No. 09/263,962, filed on the same date herewith, by the same inventors for a Test Pattern Implementation for Ink-Jet Printhead Alignment,.
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