| Number | Name | Date | Kind |
|---|---|---|---|
| 4585315 | Sincerbox et al. | Apr 1986 | A |
| 4691231 | Fitzmorris et al. | Sep 1987 | A |
| 4978225 | Reimer | Dec 1990 | A |
| 5216481 | Minato | Jun 1993 | A |
| 5426509 | Peplinski | Jun 1995 | A |
| 5493123 | Knollenberg et al. | Feb 1996 | A |
| 5845002 | Heck et al. | Dec 1998 | A |
| 5898488 | Kuhl | Apr 1999 | A |
| 6049379 | Lucas | Apr 2000 | A |
| 6067155 | Ringlien | May 2000 | A |
| 6304323 | Ishikura et al. | Oct 2001 | B1 |
| WO 9614169 | Sep 1995 | ||
| WO 9820327 | Nov 1997 |
| Entry |
|---|
| Patent Abstracts of Japan—NEC Corporation, Nov. 24, 1989 “Defect Inspecting Device”. |
| Patent Abstracts of Japan—Dainippon Printing Co. Ltd. Jan. 23, 1995 “Methods for Inspecting Defects of Lenticular Lens Sheet”. |
| Patent Abstracts of Japan—Mar. 10, 1997 Dakku Engineering—Quality Inspection Device. |