| Number | Date | Country | Kind |
|---|---|---|---|
| 6-116705 | May 1994 | JPX | |
| 7-060487 | Mar 1995 | JPX |
| Entry |
|---|
| "Behavioral Design and Test Assistance for Pipelined Processors" Jan. 1992, Iwashita, IEEE, pp. 8-13. |
| "Functional Test Generation for Pipelined Computer Implementations". David C. Lee and Daniel P. Siewiorek, 1991 IEEE, pp. 60-67. |