Number | Date | Country | Kind |
---|---|---|---|
6-116705 | May 1994 | JPX | |
7-060487 | Mar 1995 | JPX |
Entry |
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"Behavioral Design and Test Assistance for Pipelined Processors" Jan. 1992, Iwashita, IEEE, pp. 8-13. |
"Functional Test Generation for Pipelined Computer Implementations". David C. Lee and Daniel P. Siewiorek, 1991 IEEE, pp. 60-67. |