IEEE Transitions on Computer-Aided Design, "Test Generation for Sequential Circuits", vol. 7, No. 10, by Hi-Keung Tony Ma et al, pp. 1081-1093 (Oct. 1988). |
IEEE 1990 Custom Integrated Circuits Conference, "Estimation of Power Dissipation in CMOS Combinational Circuits" by Srinvas Devadas et al., pp. 19.7.1-19.7.6 (1990). |
IEEE, "Estimating Dynamic Power Consumption of CMOS Circuits" by Mehmet A. Cirit, pp. 534-537 (1987). |
IEEE, "Hercules" A Power Analyzer for MOS VLSI Circuits by Akhilesh Tyagi, University of Washington, Seattle, pp. 530-533 (1987). |
25th ACM/IEEE Design Automation Conference, Paper 21.3, "Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits" by Richard Burch et al. (1988). |