Automatic semiconductor wafer tester

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Information

Patent Grant
D292979

References
Source

Patent Number
D292,979
Date Filed
Friday, April 26, 1985
39 years ago
Date Issued
Tuesday, December 1, 1987
37 years ago

Inventors
- Marland Chow
Original Assignees
- Prometrix Corporation
Examiners
- Holtje; Nelson C.
Agents
- Flehr, Hohbach, Test, Albritton & Herbert

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 46
- D10 75
- D10 77
- D10 78
- D10 81
- D10 102
- 324 73 R
- 324 73 AT
- 324 73 PC
- 324 158 F
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for an automatic semiconductor wafer tester, as shown.

US Referenced Citations (7)

Number	Name	Date	Kind
D173618	Hose	Dec 1954
D215120	Estes	Sep 1969
D276315	Collister	Nov 1984
D282724	Collister	Feb 1986
D283107	Collister	Mar 1986
4348636	Doundoulakis	Sep 1982
4520931	Evain	Jun 1985