The present invention is related to receivers, and more particularly to a receive channel offset correction scheme.
It is important to as nearly as possible cancel any voltage offset because any net offset directly reduces the sensitivity of the receiver by requiring a larger signal to reliably detect either the ‘0’ bits or the ‘1’ bits depending on the polarity of the offset. In SerDes (Serializer-Deserializer) applications, a so-called “Bang-Bang” CDR (Clock and Data Recovery) algorithm is often used for alignment of the receiver's is internal data sampling clock with the incoming serial data stream. This is a digital algorithm that accumulates a running count of the number of instances where an “edge” sample taken midway between two “data” samples mismatches the later of the two samples, minus the number of instances where it mismatches the earlier sample. Only transitions carry timing information, and only when there is an intermediate transition will successive samples be different, hence, indicative of the position of the transition. The idealized eye diagrams in
According to the present invention, a receive channel offset correction scheme utilizes “eye edge” samplers and demultiplexers already present and essential for operation of the CDR algorithm, and adds only simple word-rate logic, with no new analog circuitry. The result is the ability to precisely determine the offset polarity as well as to get an approximate immediate measure of the offset magnitude. The offset detected includes all of the analog circuitry in the channel, including the samplers themselves, which other analog techniques usually miss. If there are odd and even samplers, independent detection for each is easily obtained. Only the edge-sampling path offset is detected; however, offset for the center-eye samplers (also including its entire analog path), can be obtained by swapping the roles of the center and edge channels. This swap can be automated to limit its duration to under the maximum needed for the CDR to track 0.1 unit intervals with nominal performance settings.
The traces have statistical variation in both the voltage (vertical) dimension due to voltage noise from reflections and cross-talk, and in the timing (horizontal) dimension due to jitter on the input signal and on the receiver clocks. For little or no voltage offset and with the CDR adjusting edge timing toward the horizontal mid-point of the crossover region as indicated by the central ellipse 102, the traces pass equally to the left (early) and right (late) of the edge sampling point giving an average difference count of near zero. If the voltage offset is zero the sampling point will be near the middle of the dense crossover region, so small changes in timing will result in large immediate changes in the early vs. late counts, causing an immediate strong response to re-center the sampling time. If there is significant voltage offset, the edge sampling point will be near the top or bottom of the ellipse, or even outside, in which case response will be reduced or eliminated for small variations in timing, thereby reducing CDR effectiveness.
The traces also pass equally above and below the slicing level giving a near equal number of ‘0’ samples and ‘1’ samples at the edge sampling point. If there is a small offset voltage, which will move the input signal up or down relative the slicing level, as mentioned above there will still be a balance in number of traces passing to the left and right, but less density in crossovers near the slicing level. However, more importantly for offset correction there will be more traces passing above than below, or more below than above, hence a rapidly varying count difference between ‘0’s and ‘1’s as offset varies. Just like the bang-bang CDR algorithm, an equivalent bang-bang offset recovery or correction algorithm can be implemented by appropriate accumulation of the ‘0’ vs. ‘1’ count difference and adjustment of offset correction by a voltage step each time the count exceeds a preset threshold. Furthermore, just as a non-centered offset voltage reduces timing detection sensitivity, misalignment of the CDR algorithm reduces offset detection sensitivity. Hence, adjustments done by each algorithm optimize the effectiveness and accuracy of the other algorithm but with no first-order interaction.
A key property of the bang-bang offset auto-zero algorithm is that it uses all of the same circuitry used for the data path whose offset is to be zeroed, not separate information from separate offset circuitry which would not have identical offset. All of the circuitry of the analog signal path is included, with the only discrepancy being that the final sampling latches used for offset detection are the edge samplers, so the center samplers may have slightly different offset not visible to the primary control loop. The mismatch between identical samplers should be relatively minor, in part due to the significant gain in the path prior to the samplers, particularly when small signal amplitudes are expected, including the shared limiting amplifiers immediately before the sampling latches. Furthermore, if necessary, the difference between individual samplers can be measured directly in several ways using the receiver circuitry itself, and if necessary can be corrected by adding further offset insertion points besides the common point near the front-end. By adjusting such individual offsets for minimum BER (Bit Error Rate) under low signal conditions where BER is significant, optimum individual offset corrections can be applied and optimized.
The diagrams immediately below the double-eye diagram at the top show the statistical nature of the number of traces that fall at different locations in both the vertical (voltage) and horizontal (sampling time) directions near the edge sampling point. For example, the portion of the curve to the left 104 shows the density of traces vs. slicing threshold voltage near this point. If the slicing threshold is high, most traces will pass below the threshold so will result in a ‘0’ bit being sampled. If the threshold is low most bits sampled will be ‘1’. If the slicing threshold is exactly at the median level within the distribution curve, exactly an equal number of ‘0’s and ‘1’s will be detected, the condition that the auto-zero algorithm seeks. It seeks this point by moving the slicing threshold voltage up if more ‘1’s than ‘0’s are counted in any particular interval, and moving it down if more ‘0’s than are counted.
Referring now to
The demux blocks 214, 216, 218 are simple serial-to-parallel converters that accumulate bits and output them as parallel words at a much lower rate for practical performance reasons. The center data parallel output and edge parallel output are compared and processed in the bang-bang CDR digital algorithm block 220 to maintain alignment of the master clock to the data, while the edge output is used by the bang-bang offset algorithm block 222 to maintain both the common voltage offset and the even/odd offset difference as close to zero as possible. The even or odd can be separately zeroed by the OAZ algorithm using only the even or odd bits, respectively. The eye monitor path has its own algorithms in block 224 that can determine offsets when needed.
The technique according to the present invention counts the balance of ‘0’ edge bits vs ‘1’ edge bits, and integrates the difference, then applies an incremental offset correction when the integral reaches some specific limit. Edge bits are those bits from the edge sampling channel lying between adjacent data bits of mutually opposite polarity. When the ‘1’ vs. ‘0’ count difference reaches a large pre-defined value, a minimum sized step of offset correction is applied to that channel or to the specific sampler involved. Only polarity information is needed, but proportional response near the ‘0’ offset condition always occurs due to noise and limited comparator gain. The CDR will automatically place the edge sampling point near signal crossover points where the edge samples miscorrelate equally with the data bits immediately before and after. Unless there is an amplitude dead-zone exactly where the CDR positions the edge sampler timing, any offset will immediately show up as a count difference which will be integrated and corrected.
If there is a dead-zone at the eye edge, i.e., at the median signal crossover position, the channel needs to be corrected because the CDR will then come to a satisfactory resting point anywhere within that dead-zone. This means it will be free to drift to any timing within that dead-zone rather than tracking the signal. Such a dead-zone would normally only occur with a very poorly equalized channel plus a large receive signal which will not occur simultaneously for acceptable channels. Poor equalization is needed to allow the eye to split into multiple sections, while a strong signal is required to prevent jitter, crosstalk, noise, etc., from causing those sections to merge into a continuous diffused crossover zone between full or partial eye openings. Such a dead-zone can be detected by the same offset compensation scheme by enabling the compensation and applying a small step of voltage offset (writing a slightly modified value to the offset register), first in one direction then in the other. If significantly different settled offset correction values are obtained, it indicates that a dead-band is present.
The receiver architecture 200 shown in
The RX “bumps” 226 and 228 are the equivalent of bonding pads in the “flip-chip” packaging technology. They are the terminals of the die—connecting it with the package =where the transmission lines of media and package get loaded by on-die termination impedance and where the analog signal processing path begins.
The termination resistors 230 and 232 have calibration functionality to cancel process and temperature factors on the reflection coefficient in the wide band of the signal spectrum.
The input to receiver 200 is an analog signal with up to 1 Vppd max swing; with spectral components in the band from data-rate/2 down to approaching 0 Hz, excluding the 0 Hz point.
The linear equalizer 234 and the DFE filter are part of the RX signal-processing, which equalizes the insertion loss of the media and the loss from reflections. The split signal path in the particular receiver architecture is an element which the proposed OAZ is able to cover.
The FE Offset DAC 202 is a feed-forward path that is the common signal path before the split, which contributes common offset and could be compensated right there in the feed-forward path or later after the split.
The mismatch offset DACs are used in case of cancelling only the offset difference after the split. This is like a single DAC, which steers DC components between the two signal paths. This means applying compensations with the same magnitude and opposite sign (half of the offset difference) in both split paths. This requires only one control bus driving two DACs—one of them inverting.
The CML DFE weighting buffers 212 are the scalers in the feed-back path of the DFE filter.
The Primary Data Demux 214 is the center sampling serial-parallel converter.
The Primary Edge Demux 216 is the edge sampling serial-parallel converter.
The Eye Monitor Demux 218 is an additional serial-parallel converter with an independently controlled sampling phase. It is used for adapting the RX equalization filtering.
The OAZ Algorithm block 222 is used for Offset-Auto-Zeroing (OAZ).
The CDR Algorithm block 220 is used for Clock-and-Data-Recovery (CDR).
The Eye Monitor Algorithms block 224 contains built-in algorithms for automatic control of the phase and offset in the independently sampling serial-parallel converter channel. These algorithms execute a set of macro-commands related to the eye-monitoring features. None of them is related to the proposed OAZ.
The OAZ circuit with the digital and analog elements has been implemented on test-silicon which supports back-plane media up to 1 m long at rates from 1.25 Gbps to 14.025 Gbps. The loss of the test-media goes up to −30 dB at 14 Gbps rate and requires good linearity in the large 1V input referred range for the RX analog processing which equalizes the loss. Before equalized, the lowest magnitudes are 30 mV on top of 1000 mV low frequency components. The offset cancellation is critical, the high-speed analog path has poor matching and it could generate static offset in the range of +/−100 mV (3-sigma input referred). The specification for the analog part of the OAZ functionality specifies the range needed to be covered by the DAC's full-scale and the resolution choice on the LSB.
Referring now to
Referring now to
It will be apparent to those skilled in the art, therefore that various modifications and variations can be made to the invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention covers the modifications and variations of this invention provided they come within the scope of the appended claims.
The present invention claims priority from U.S. Provisional Patent Application Ser. No. 61/477,984 filed Apr. 21, 2011, and is incorporated herein by reference in its entirety for all purposes as if fully set forth herein.
Number | Date | Country | |
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61477984 | Apr 2011 | US |