Number | Date | Country | Kind |
---|---|---|---|
11-300205 | Oct 1999 | JP |
Number | Name | Date | Kind |
---|---|---|---|
3997830 | Newell et al. | Dec 1976 | A |
4833459 | Geur et al. | May 1989 | A |
5049834 | Kasai | Sep 1991 | A |
5625272 | Takahashi | Apr 1997 | A |
5652501 | McClure et al. | Jul 1997 | A |
5818201 | Stockstad et al. | Oct 1998 | A |
6157165 | Kinoshita et al. | Feb 2000 | A |
6147499 | Torii et al. | Apr 2000 | A |
6064178 | Miller | May 2000 | A |
6163265 | Klippel | Dec 2000 | A |
Number | Date | Country |
---|---|---|
37 02 591 | Jan 1987 | DE |
41 28 284 | Aug 1991 | DE |
41 32 229 | Sep 1991 | DE |
196 005 481 | Feb 1996 | DE |
0 990 913 | Apr 2000 | EP |
61-125700 | Jun 1986 | JP |
06-061813 | Mar 1994 | JP |
08-140204 | May 1996 | JP |
09-001617 | Jan 1997 | JP |
11-113182 | Apr 1999 | JP |
11-248755 | Sep 1999 | JP |
11-248757 | Sep 1999 | JP |
Entry |
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Office Action of corresponding Japanese Patent Application No. Hei 11-300205, dated Jan. 8, 2002. |
Office Action of corresponding German Patent Appln. No. 100519849.9-35, dated Feb. 8, 2002, with English translation. |
Ebert, J., Jurres, E., Digitale Messtechnik, VEB Verlag Technik Berlin, 2ndedition 1973, 1976, pp. 94-101. |