Number | Date | Country | Kind |
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195 36 020.6 | Sep 1995 | DEX |
Number | Name | Date | Kind |
---|---|---|---|
5378943 | Dennard | Jan 1995 | |
5465054 | Erhart | Nov 1995 | |
5532621 | Kobayashi et al. | Jul 1996 | |
5650742 | Hirano | Jul 1997 |
Entry |
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IEEE 1992 Symposium on VLSI Circuits Digest of Technical Papers-"Highly Reliable Process Insensitive 3.3V-5V Interface Circuit"-Wada et al -pp. 90-91. |
IEEE Journal of Solid-State Circuits -vol. 26, No. 7, Jul. 1991, pp. 1003-1009, "Circuit Techniques for 1.5-3.6V Battery-Operated 64 mb DRAM", Nakagome et al. |