BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a plan view of a measurement chip of one embodiment according to the present invention.
FIG. 2 is an enlarged view of FIG. 1.
FIG. 3 is a block diagram of an analyzer of a first embodiment according to the present invention.
FIG. 4 is a graph showing an analysis example according to the first embodiment.
FIG. 5 is a plan view of a measurement chip according to a second embodiment.
FIG. 6 is a block diagram of the analyzer according to the second embodiment.
FIG. 7 is a schematic view showing an analyzer to which a sensor according to the prior art is applied.
FIG. 8 is a side view showing a structure of a noble metal fine particle sensor according to the prior art.