Number | Name | Date | Kind |
---|---|---|---|
2010256 | Cole | Aug 1935 | |
3123558 | Sullivan | Mar 1964 | |
4504386 | Dyren et al. | Mar 1985 | |
4696738 | Risley | Sep 1987 | |
4960510 | Wolff | Oct 1990 | |
5117983 | Marrs | Jun 1992 | |
5284251 | Marrs et al. | Feb 1994 | |
5305891 | Bielagus | Apr 1994 | |
5367158 | Marrs et al. | Nov 1994 | |
5398819 | Cormack et al. | Mar 1995 |
Number | Date | Country |
---|---|---|
653630 | May 1963 | ITX |
242912 | Jan 1964 | NLX |
Entry |
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Strakes, G., et al., New Chip Thickness Screening System Boosts Efficiency, Extends Wear Life: First coommercial installation, at Mead Corp. 's Chillicothe, Ohio, mill, results in overthick chip removal efficiency of 98%, Pulp & Paper, (Miller Freeman 1992) (6 unmumbered pages). |
Technical Data, S.H. Bushing, undated (1 page). |