Block redundancy in ultra low power memory circuits

Abstract

A circuit comprising a memory array and a logic circuit. The memory array may be configured to read or write data in response to (i) one or more enable signals and (ii) one or more control signals. The logic circuit may be configured to generate the enable signals in response to one or more address signals. De-assertion of one or more of the enable signals generally reduces current consumption in the memory array.

Description

FIELD OF THE INVENTION

The present invention relates to block redundancy generally and, more particularly, to a block redundancy method and/or architecture that may be used with ultra low power memory circuits.

BACKGROUND OF THE INVENTION

Conventional block redundancy circuits may disconnect defective bitlines from a power supply using either fuses or gated loads. Conventional block redundancy circuits (i) only address standby current related to bitline defects, (ii) do not address defects related to intercell problems and (iii) are costly from a die area point of view.

Referring to FIG. 1 , a conventional circuit 10 used for block and/or column redundancy is shown. The circuit 10 comprises a fuse 12 and a fuse 14 . The fuses 12 and 14 disconnect defective bitlines BIT and BITB from the power supply of the circuit 10 .

Referring to FIG. 2 , another conventional circuit 20 used for block redundancy is shown. The circuit 20 comprises a gate 22 , 5 a number of transistors 24 a- 24 n and a number of memory cells 26 a - 26 n . The transistors 24 a - 24 n disconnect defective bitlines BIT and BITB from the power supply of the circuit 20 . The transistors 24 a - 24 n are controlled by the gate 22 .

Referring to FIG. 3 , another conventional circuit 30 for block redundancy is shown. The circuit 30 comprises a transistor 32 , a number of transistors 34 a - 34 n and a number of memory cells 36 a - 36 n . The transistor 32 supplies power to the circuit 30 . The transistors 34 a - 34 n are coupled between the power supply and the bitlines BIT and BITB. The transistors 34 a - 34 n control the power supplied to the bitlines BIT and BITB. Transistor 32 disconnects the power supply of circuit 30 from the defective bitlines BIT and BITB.

SUMMARY OF THE INVENTION

The present invention concerns a circuit comprising a memory array and a logic circuit. The memory array may be configured to read or write data in response to (i) one or more enable signals and (ii) one or more control signals. The logic circuit may be configured to generate the enable signals in response to one or more address signals. De-assertion of one or more of the enable signals generally reduces current consumption in the memory array.

The objects, features and advantages of the present invention may include implementing a method and/or architecture that may (i) allow a power supply to be completely decoupled from a memory array, including Vcc, bitlines and their associated wells, (ii) eliminate contribution to standby current caused by memory array defects, (iii) allow the power supply to be decoupled from sub wordline driver, bitline loads and sense amplifiers, (iv) disable operation of block write functions, (v) eliminate contribution of a defective block to operational current, and/or (vi) increase die area efficiency.

BRIEF DESCRIPTION OF THE DRAWINGS

These and other objects, features and advantages of the present invention will be apparent from the following detailed description and the appended claims and drawings in which:

FIG. 1 is a conventional circuit for block and/or column redundancy;

FIG. 2 is another conventional circuit for block redundancy;

FIG. 3 is another conventional circuit for block redundancy;

FIG. 4 is a block diagram of a preferred embodiment of the present invention;

FIG. 5 is a detailed block diagram of the memory block of FIG. 4 ;

FIG. 6 is a detailed circuit diagram of the memory block of FIG. 5 ;

FIG. 7 is a detailed circuit diagram of the memory array of FIG. 6 ; and

FIG. 8 is a detailed circuit diagram of the block driver circuit of FIG. 6 .

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

In ultra low power designs, parasitic DC current caused by defects should be eliminated. The elimination of parasitic DC current is necessary to maintain low standby current (<10 uA) on repaired devices. The present invention may allow for the total replacement of a defective memory array and cell while maintaining ultra-low standby current.

Referring to FIG. 4 , a block diagram of a circuit 100 is shown in accordance with a preferred embodiment of the present invention. The circuit 100 may completely eliminate power consumption of a memory array (to be described in connection with FIGS. 5 - 7 ). The circuit 100 may work in conjunction with double wordline memory cells, in which the n-well and Vcc supply run parallel to the bitlines. The circuit 100 may be implemented as an architecture with multiple memory blocks. In one example, the circuit 100 may be implemented as an architecture with 16 columns per memory block. However, the circuit 100 may implement any number of columns and/or granularity in order to meet the criteria of a particular implementation.

The circuit 100 may comprise a decode logic block (or circuit) 106 and a memory array (or circuit) 108 . A global write signal (e.g., BLK_WRT) may be presented to an input 111 of the memory 108 . The global write signal BLK_WRT may enable the memory 108 to write data. The decode logic circuit 106 may present a number of enable signals (e.g., EN_a-EN_n) at a number of outputs 112 a - 112 n , respectively. The memory array 108 may have a number of inputs 114 a - 114 n that may receive the signals EN_a-EN_n, a data input/output 118 and an input 120 that may receive a number of global wordline signals (e.g., GWLa-GWLn). The signals EN_a-EN_n may enable a particular memory block within the memory array 108 to read or write data (to be described in more detail in connection with FIGS. 7 and 8 ). The decode logic circuit 106 may generate the signals EN_a-EN_n in response to an address signal (e.g., BLOCK ADDRESS) received at an input 116 . The signal BLK_WRT may control writing of data to the memory array 108 .

Referring to FIG. 5 , a detailed diagram of the memory array 108 is shown. The memory array 108 may comprise a number of memory blocks 140 a - 140 n . The memory blocks 140 a - 140 n may each receive the signal BLK_WRT at a number of inputs 143 a - 143 n . The memory blocks 140 a - 140 n may each receive one of the signals EN_a-EN_n at a number of inputs 145 a - 145 n, respectively. The signals EN_a-EN_n may be implemented as enable signals and may enable the memory blocks 140 a - 140 n . The memory blocks 140 a - 140 n may be connected through a number of connections (e.g., DATAIOa-DATAIOn) . The connections DATAIOa-DATAIOn may be connected to each memory section 140 a - 140 n through a number of input/outputs 150 a - 150 n . The memory blocks 140 a - 140 n may each receive a number of global wordline signals (e.g., GWLa-GWLn) at a number of inputs 220 a - 220 n.

Referring to FIG. 6 a detailed diagram of a memory block 140 a is show n. The memory block 140 a may comprise a number of memory columns 161 a - 161 n, a fuse latch 102 , a fuse latch 104 , a number of sub-wordline drivers 228 a - 228 n, and a fused block driver block (or circuit) 109 . The fuse latch 102 may have an output 122 that may present a signal (e.g., CTR 1 ) to a number of inputs 126 a - 126 n of the memory columns 161 a - 161 n. The fuse latch 102 may present the signal CTR 1 in response to the state of a fuse 300 . With the fuse 300 in place, the signal CTR 1 is generally disabled (e.g., de-asserted). With the fuse 300 removed, the signal CTR 1 will generally be enabled (e.g., asserted) in response to a signal (e.g., RESET) received at an input 124 . The fuse latch 104 may be similar to the fuse latch 102 . The fuse latch 104 may have an output that may present a signal (e.g., CTR 2 ) to one or more inputs 129 a - 129 n of the memory columns 161 a - 161 n. The fuse latch 104 may present the signal CTR 2 in response to a state of a fuse 301 .

With the fuse 301 in place, the signal CTR 2 may be considered disabled (e.g., de-asserted). With the fuse 301 removed, the signal CTR 2 may be considered enabled (e.g., asserted) in response to the signal RESET at an input 130 . The signal CTR 1 and the signal CTR 2 may control the current supplied to the memory block 108 . The signals EN_a-EN_n, the signal CTR 1 and the signal CTR 2 may have a first, asserted state that is generally “on” (e.g., a digital HIGH, or 1) and a second, de-asserted state that is generally “off” (e.g., a digital LOW, or 0). However, the particular polarities of the on (e.g., asserted) and off (e.g., de-asserted) states may be adjusted (e.g., reversed) accordingly to meet the design criteria of a particular implementation.

The memory block 140 a may also receive the signal BLK_WRT at the input 143 a . The signal BLK_WRT may be presented to the memory columns 161 a - 161 n at inputs 144 a - 144 n , respectively. The memory block 140 a may receive the signal EN_a at an input 145 a . The signal EN_a may also be presented to an input 146 a of the block driver circuit 109 . The block driver circuit 109 may essentially control the operation and current consumption of the memory block 140 a . In one example, the memory block 140 a may be implemented as a twin well memory block. The twin well memory block 140 a may allow the block driver circuit 109 to control the ground voltage (e.g., a virtual ground VSS) of the circuit 140 a in addition to or in place of controlling the supply voltage (e.g., VCC). The block driver circuit 109 may essentially control the operation of memory block 140 a . The block driver circuit 109 may be disabled with a self-contained fuse (described in more detail in connection with FIG. 8 ). An intact fuse may allow the enable signal EN_a to propagate through to the memory columns 161 a - 161 n . A removed (e.g., blown) fuse may disable a signal (e.g., EN_int) which may disable the memory block 140 a . The memory columns 161 a - 161 n may receive the signal EN_int from the block driver circuit 109 . The memory 140 a may have a number of input/outputs 150 a - 150 n that may receive the signals DATAIOa-DATAIOn.

The sub-wordline drivers 228 a - 228 n may receive the global wordline signals GWLa-GWLn at a number of inputs 221 a - 221 n , respectively. The sub-wordline drivers 228 a - 228 n may receive the enable signal EN_int at a number of inputs 229 a - 229 n. The memory columns 161 a - 161 n may receive signals (e.g., SWL_a-SWL_n) from a number of outputs 222 a - 222 n of the sub-wordline drivers 228 a - 228 n . Each sub-wordline driver 228 a - 228 n may be powered down with minimal effect to die area. An example of a sub-wordline driver may be found in co-pending application Ser. No. 09/398,735, filed Sep. 17, 1999 (now U.S. Pat. No. 6,163,495), which is hereby incorporated by reference in its entirety. The input/outputs 150 a - 150 n may be connected to the memory columns 161 a - 161 n at the input/outputs 160 a - 160 n , respectively.

Referring to FIG. 7 a detailed block diagram of the memory column 161 a of FIG. 6 is shown. The memory column 161 a may comprise a number of memory cells 242 a - 242 n , a number of bitline load blocks (or circuits) 243 (only one bitline load is shown for clarity of the illustration), a sense amplifier 241 , a write block (or circuit) 240 , a transistor 230 , a transistor 231 and a transistor 232 . The memory cells 242 a - 242 n , the bitline load circuit 243 , the sense amplifier 241 and the write circuit 240 may be connected through a bitline (e.g., BIT) and a complementary bitline bar (e.g., BITB).

The transistors 230 , 231 and 232 may be implemented as P-type transistors or any other type transistor necessary to meet the criteria of a particular implementation. The transistor 230 may essentially control the supply voltage to the sense amplifier 241 . The transistors 231 and 232 may remove the supply voltage VCC from the memory cells 242 a - 242 n and the bitline load 243 . The transistors 230 , 231 and 232 may eliminate current contribution of a defective block to the overall operational current.

The signal CTR 1 may be presented to the gate of the transistor 230 and the gate of the transistor 231 . The source of the transistor 231 may be connected to the supply voltage VCC. The drain of the transistor 231 may be connected to (i) a number of inputs 233 a - 233 n of the memory cells 241 a - 242 n , (ii) an input 234 of the bitline load, and (iii) a drain of the transistor 232 . The source of the transistor 232 may be connected to the supply voltage VCC. The drain of the transistor 232 may be connected to the inputs 233 a - 233 n of the memory cells 242 a - 242 n and the drain of the transistor 231 . The drain of the transistor 230 may be connected to the input 236 of sense amplifier 241 . The source of the transistor 230 may be connected to the supply voltage VCC. The signal CTR 2 may be presented to the gate of the transistor 232 .

The gate of transistors 230 and 231 may receive the signal CTR 1 .

The input/output 160 a may (i) present the signal DATAIOa to the input 250 of write circuit 240 or (ii) receive the signal DATAIOa from the output 251 from sense amplifier 241 . The sub-wordline signal inputs 223 a - 223 n may be presented to a number of inputs 400 a - 400 n of the memory cells 242 a - 242 n.

Referring to FIG. 8 a detailed block diagram of the block driver logic circuit 109 of FIG. 6 is shown. The block driver circuit 109 generally comprises a fuse 702 , an inverter 700 , and a transistor 701 . The block driver circuit 109 may receive the signal EN_a at the input 146 a . The signal EN_a may be presented to the fuse 702 . The block driver 109 may present the enable signal EN_int at the output 147 a. The input/output 710 of fuse 702 may be connected to the input of the inverter 700 and the drain of the transistor 701 . The output of the inverter 700 may be connected to the gate of transistor 701 .

The present invention may provide a redundancy scheme for use in ultra-low power memory circuits. In ultra-low power designs, parasitic DC current caused by defects must generally be eliminated to maintain low standby current (e.g., <10 uA) on repaired devices. The present invention may allow for the total replacement of defective blocks of memory while maintaining ultra-low standby current.

While the invention has been particularly shown and described with reference to the preferred embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made without departing from the spirit and scope of the invention.

Claims

1. A circuit comprising:a memory array comprising a plurality of memory cells and one or more redundant memory cells, wherein said memory array is configured to read or write data in response to (i) one or more enable signal s and (ii) one or more control signals; and a logic circuit configured to (i) generate said one or more enable signals in response to one or more address signals and (ii) de-assert said one or more enable signals to reduce current consumption in said memory array.

2. The circuit according to claim 1, wherein said logic circuit comprises a block decode logic circuit.

3. The circuit according to claim 1, wherein each of said one or more enable signals comprise local enable signals.

4. The circuit according to claim 1, wherein said memory array is further configured to read and write data in response to a global signal.

5. The circuit according to claim 4, wherein said global signal comprises a global write control signal.

6. The circuit according to claim 1, wherein said memory array is configured to read or write data in further response to one or more global wordline signals.

7. The circuit according to claim 1, wherein said logic circuit is configured to control the reading of data from or writing of data to one or more of said redundant memory cells and one or more replaced memory cells in response to said one or more enable signals.

8. The circuit according to claim 7, further comprising:a first latch circuit configured to generate a first control signal of said one or more control signals; and a second latch circuit configured to generate a second control signal of said one or more control signals.

9. The circuit according to claim 8, wherein said first and second latch circuits each comprise a plurality of transistors configured to reduce current consumption contributed by said one or more replaced memory cells.

10. The circuit according to claim 9, wherein said plurality of transistors comprises P-channel transistors.

11. The circuit according to claim 1, wherein said memory array further comprises a plurality of storage elements each comprising one or more bitlines, one or more complementary bitlines and one or more bitline load circuits.

12. The circuit according to claim 11, wherein said memory array further comprises one or more write circuits and one or more sense amplifier circuits configured to control the reading of data from and writing of data to said memory array.

13. The circuit according to claim 12, wherein each of said storage elements further comprises a block driver, wherein said block driver is configured to disable said one or more write circuits and said one or more sense amplifier circuits in order to reduce current consumption in said memory array.

14. The circuit according to claim 13, wherein said block driver is further configured to disable one or more wordline drivers in order to reduce current consumption in said memory array.

15. A circuit comprising:means for reading data from or writing data to a memory array comprising a plurality of memory cells and one or more redundant memory cells, in response to (i) one or more enable signals and (ii) one or more control signals; and means for generating said one or more enable signals in response to one or more address signals, wherein said generating means is configured to de-assert said one or more enable signals to reduce current consumption in said memory array.

16. A method for reading data from or writing data to a memory array comprising a plurality of memory cells and one or more redundant memory cells, comprising the steps of:(A) reading or writing said data in response to (i) one or more enable signals and (ii) one or more control signals; (B) generating said one or more enable signals in response to one or more address signals; and (C) de-asserting said one or more enable signals to reduce current consumption in said memory array.

17. The method according to claim 16, wherein step (A) comprises reading or writing data to one or more of said redundant memory cells in response to said one or more enable signals.

18. The method according to claim 16, wherein step (A) is performed in further response to one or more global wordline signals.

19. The method according to claim 16, wherein step (A) is further responsive to a global signal.

20. The method according to claim 16, further comprising:controlling one or more wordline drivers in response to said one or more enable signals.

21. The method according to claim 16, further comprising:controlling one or more sense amplifiers and one or more write circuits in response to said one or more enable signals.

22. A circuit comprising:a memory array comprising one or more memory blocks and one or more redundant memory blocks, wherein said memory array is configured to disable at least one of said one or more memory blocks and enable at least one of said one or more redundant memory blocks in response to (i) one or more enable signals and (ii) one or more control signals; and a logic circuit configured (i) to generate said one or more enable signals according to a block redundancy scheme and (ii) to de-assert said one or more enable signals to reduce current consumption in said memory array.

23. The circuit according to claim 22, wherein each of said one or more memory blocks and each of said one or more redundant memory blocks comprises one or more elements from the group consisting of memory cells, sense amplifiers, wordline drivers, write circuits and bitline loads.