Claims
- 1. A broadband microfabricated ultrasonic transducer comprising:
- a substrate;
- a plurality of resonant membranes of different sizes with each size selected for its resonant frequency supported spaced from the substrate by an insulating support;
- and means for applying voltages between said membranes and said substrate.
- 2. A broadband microfabricated transducer as in claim 1 in which the membrane is silicon nitride having a predetermined residual stress.
- 3. A broadband transducer as in claim 1 in which the insulating support is silicon oxide.
- 4. A broadband transducer as in claim 1 in which the insulating support is parylene.
- 5. A transducer array comprising:
- a substrate;
- a plurality of ultrasonic transducers on said substrate, each of said transducers including a plurality of resonant membranes of different sizes with each size selected to resonate at a selected frequency or frequencies, said membranes each supported spaced from said substrate by an insulating support;
- and means for applying voltages between selected membranes and said substrate whereby to focus and/or scan the ultrasonic energy from said plurality of membranes.
- 6. A broadband microfabricated transducer as in claim 5 in which the membrane is silicon nitride having a predetermined residual stress.
- 7. A broadband transducer as in claim 5 in which the insulating support is silicon oxide.
- 8. A broadband transducer as in claim 5 in which the insulating support is parylene.
- 9. A broadband transducer as in claims 6, 7, or 8 in which the transducers are in a linear array.
- 10. A broadband transducer as in claims 6, 7, or 8 in which the transducers are in a two dimensional array.
- 11. A broadband microfabricated ultrasonic transducer comprising:
- a conductive semiconductor substrate;
- a plurality of silicon nitride membranes of different sizes with each size selected for its resonant frequency, said membranes supported spaced from said substrate at their edges by an insulating support;
- and a conductive film formed on the surface of said membranes whereby a voltage can be applied between said membranes and said conductive semiconductor substrate.
- 12. A broadband transducer as in claim 11 in which the insulating support is silicon oxide.
- 13. A broadband transducer as in claim 11 in which the insulating support is parylene.
- 14. A broadband transducer as in claim 11 in which the membranes have areas which range from 300 to 30,000 .mu.m.sup.2 and thicknesses which range from 0.1 to 1 .mu.m, and an insulator support thickness which ranges from 0.1 to 2 .mu.m.
- 15. A broadband transducer as in claims 11, 12, 13, or 14 in which the membranes have different shapes.
- 16. The method of forming a broadband ultrasonic transducer which comprises the steps of:
- selecting a semiconductor conductive substrate forming a thin sacrificial insulating layer on one surface of said substrate;
- forming a thin silicon nitride layer on the surface of said insulating layer;
- forming a number of etchant access holes in said silicon nitride layer, said holes being closely spaced and arranged in patterns each including a plurality of spaced access holes;
- etching the sacrificial insulating layer through said access holes for a period of time which etches away the sacrificial material layer to form a membrane at each pattern of holes.
Parent Case Info
This application is a continuation-in-part of application Ser. No. 08/792,114 filed Jan. 31, 1997, which is a divisional of Ser. No. 08/327,210, filed Oct. 21, 1994, now patent 5,619,476.
GOVERNMENT SUPPORT
The aforementioned was made with the United States government's support under Office of Naval Research Contract No. ONR NOO14-94-1-0730. The government has certain rights to this invention.
US Referenced Citations (24)
Foreign Referenced Citations (1)
Number |
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892773 |
Oct 1953 |
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Divisions (1)
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327210 |
Oct 1994 |
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Continuation in Parts (1)
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792114 |
Jan 1997 |
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