Claims
- 1. A built-in resistor for cathode-ray tube which comprises;an insulating substrate; a resistance layer formed on one main surface of the insulating substrate; a plurality of terminal electrodes mounted on the resistance layer; and a plurality of terminals connected respectively with said terminal electrodes; wherein said plurality of terminals are individually constituted by a base body comprising a non-magnetic alloy, and by a surface layer which is formed on the surface of the base body and comprising an oxide of said non-magnetic alloy; said plurality of terminals have a relative permeability of not more than 1.005; and said surface layer of each of the terminals is partially provided with an insulating covering layer.
- 2. The built-in resistor for cathode-ray tube according to claim 1, wherein said surface layer is formed through an oxidation treatment of the surfaces of said terminals.
- 3. The built-in resistor for cathode-ray tube according to claim 1, wherein said terminals are respectively provided with a caulking portion which is engaged with and fixed to a through-hole formed in the insulating substrate, and said insulating covering layer is formed on the other main surface of said insulating substrate to cover said caulking portion.
- 4. The built-in resistor for cathode-ray tube according to claim 1, wherein said non-magnetic alloy is a Ni—Cr-based alloy.
- 5. The built-in resistor for cathode-ray tube according to claim 4, wherein said surface layer is formed through an oxidation treatment under a condition where the formation of NiO can be suppressed.
- 6. The built-in resistor for cathode-ray tube according to claim 4, wherein said surface layer comprises, as a main component, Cr2O3 and NiCr2O4.
- 7. The built-in resistor for cathode-ray tube according to claim 5, wherein said surface layer is formed of a material containing Cr2O3 and NiCr2O4 at a ratio of 60% by weight or more.
- 8. The built-in resistor for cathode-ray tube according to claim 1, wherein said surface layer is formed on a surface where said terminals are contacted with said terminal electrodes.
- 9. The built-in resistor for cathode-ray tube according to claim 1, wherein said surface layer has a thickness ranging from 0.5 to 2 μm.
- 10. A cathode-ray tube comprising;an envelope constituted by a panel portion having a fluorescent screen formed on an inner surface thereof and by a funnel portion having a neck portion; and an electron gun disposed inside the neck portion and comprising a cathode body, a plurality of grid electrodes, and a resistor for loading a divided partial voltage to some of said plurality of grid electrodes; which is featured in that; said resistor comprises an insulating substrate, a resistance layer formed on one main surface of the insulating substrate, a plurality of terminal electrodes mounted on the resistance layer, and a plurality of terminals connected respectively with said terminal electrodes; wherein said plurality of terminals are individually constituted by a base body comprising a non-magnetic alloy, and by a surface layer which is formed on the surface of the base body and comprising an oxide of said non-magnetic alloy; said plurality of terminals have a relative permeability of not more than 1.005; and said surface layer of each of the terminals is partially provided with an insulating covering layer.
- 11. The cathode-ray tube according to claim 10, wherein said surface layer is formed through an oxidation treatment of the surfaces of said terminals.
- 12. The cathode-ray tube according to claim 10, wherein said terminals are respectively provided with a caulking portion which is engaged with and fixed to a through-hole formed in the insulating substrate, and said insulating covering layer is formed on the other main surface of said insulating substrate to cover said caulking portion.
- 13. The cathode-ray tube according to claim 10, wherein said non-magnetic alloy is a Ni—Cr-based alloy.
- 14. The cathode-ray tube according to claim 13, wherein said surface layer is formed through an oxidation treatment under a condition where the formation of NiO can be suppressed.
- 15. The cathode-ray tube according to claim 13, wherein said surface layer comprises, as a main component, Cr2O3 and NiCr2O4.
- 16. The cathode-ray tube according to claim 15, wherein said surface layer is formed of a material containing Cr2O3 and NiCr2O4 at a ratio of 60% by weight or more.
- 17. The cathode-ray tube according to claim 10, wherein said surface layer is formed on a surface where said terminals are contacted with said terminal electrodes.
- 18. The cathode-ray tube according to claim 10, wherein said surface layer has a thickness ranging from 0.5 to 2 μm.
Priority Claims (1)
Number |
Date |
Country |
Kind |
11-171894 |
Jun 1999 |
JP |
|
CROSS-REFERENCE TO RELATED APPLICATIONS
This is a Continuation Application of PCT Application No. PCT/JP00/03827, filed Jun. 13, 2000, which was not published under PCT Article 21(2) in English.
This application is based upon and claims the benefit of priority from the prior Japanese Patent Application No. 11-171894, filed Jun. 18, 1999, the entire contents of which are incorporated herein by reference.
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JP |
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Entry |
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Continuations (1)
|
Number |
Date |
Country |
Parent |
PCT/JP00/03827 |
Jun 2000 |
US |
Child |
09/783972 |
|
US |