Claims
- 1. A system for determining a location of an impedance discontinuity on a conductor by utilizing a standing wave reflectometer, said system comprising:
a processor for controlling operation of the standing wave reflectometer; a frequency synthesizer that is controlled by the processor, and generates a transmitted signal over a range of frequencies; an impedance matching network that is disposed to receive the transmitted signal from the frequency synthesizer; a conductor being tested that is coupled at a first end to the impedance matching network; at least one voltage or power measurement circuit for receiving a standing wave; and an analog output circuit for generating an output signal representative of the location of the impedance discontinuity on the conductor.
- 2. The system as defined in claim 1 wherein the system further comprises a terminator coupled to a second end of the conductor so that a single reflection occurs.
- 3. The system as defined in claim 2 wherein at least one voltage or power measurement circuit further comprises:
a receiver signal strength indicator circuit for receiving the standing wave; and a differential amplifier coupled to the receiver strength indicator circuit at a first end, and coupled to the processor at a second end.
- 4. The system as defined in claim 3 wherein the processor further comprises:
an analog-to-digital converter for receiving a signal from the differential amplifier; and a pulse-width modulated output to the analog output circuit.
- 5. The system as defined in claim 4 wherein the pulse-width modulated output is replaced by a digital-to-analog converter.
- 6. The system as defined in claim 5 wherein the digital-to-analog converter is external to the processor.
- 7. The system as defined in claim 6 wherein the analog-to-digital converter is external to the processor.
- 8. The system as defined in claim 1 wherein the processor further comprises:
memory for storing at least one program and data; and a floating point processor for performing analysis of the standing wave.
- 9. The system as defined in claim 1 wherein the frequency synthesizer is selected from the group of frequency synthesizers comprised of a Direct Digital Synthesizer (DDS) and a Phase Lock Loop (PLL) synthesizer.
- 10. The system as defined in claim 9 wherein the PLL further comprises a local oscillator, a phase comparator, a low-pass filter, a voltage controlled oscillator, and two digitally controlled dividers.
- 11. The system as defined in claim 9 wherein the DDS further comprises
an external reference clock oscillator; and a low-pass filter for removing image frequencies that result from previous signal processing.
- 12. The system as defined in claim 11 wherein the low-pass filter is selected from the group of low-pass filters that utilize filter coefficients including binomial, Chebyshev, and elliptical coefficients.
- 13. The system as defined in claim 12 wherein the low-pass filter is a 9th order Chebyshev filter that enables some ripple in a pass band, and therefore has a relatively fast cutoff.
- 14. The system as defined in claim 1 wherein the at least one voltage or power measurement circuit for receiving a standing wave is selected from the group of circuits comprised of a detector diode coupled to an integrating capacitor, a root mean square (RMS) to direct current (DC) converter circuit, a super diode circuit, and a Receiver Signal Strength Indicator (RSSI) circuit.
- 15. The system as defined in claim 1 wherein the impedance matching network that is disposed to receive the transmitted signal from the frequency synthesizer is selected from the group of impedance matching networks comprised of a Chebyshev filter, a hand wound transfer, and a commercial transformer.
- 16. A method for determining a location of an impedance discontinuity on a conductor by utilizing a standing wave reflectometer, said method comprising the steps of:
(1) providing a processor, a frequency synthesizer, an impedance matching network, a conductor being tested, at least one voltage or power measurement circuit, and an analog output circuit for generating an output signal representative of the location of the impedance discontinuity on the conductor; (2) terminating the conductor so that a single reflection will occur; (3) transmitting a plurality of frequencies onto the conductor, wherein a sum of the transmitted frequencies and reflected signals generates a standing wave as a function of frequency; (4) determining a plurality of minima of the standing wave; and (5) correlating the plurality of minima to a location of the impedance discontinuity on the conductor.
- 17. The method as defined in claim 16 wherein the method further comprises the step of utilizing the plurality of minima to determine a level of a liquid.
- 18. The method as defined in claim 17 wherein the method further comprises the step of calibrating the system so that the plurality of minima correspond to the level of the liquid.
- 19. The method as defined in claim 18 wherein the method further comprises the step of generating control words for the frequency synthesizer by utilizing the processor.
- 20. The method as defined in claim 19 wherein the method further comprises the step of determining a plurality of minima on the standing wave by sampling the at least one voltage or power measurement circuit.
- 21. The method as defined in claim 20 wherein the method further comprises the step of selecting the frequency synthesizer by choosing a frequency synthesier that can generate a plurality of different frequencies at a consistent power level.
- 22. The method as defined in claim 21 wherein the method further comprises the step of selecting the frequency synthesizer through a consideration of factors including a desired frequency range of operation, a smallest required step between frequencies to be generated, the necessary output power, and the method that will be used to tune between frequencies.
- 23. The method as defined in claim 22 wherein the method further comprises the step of selecting a low-pass filter that is coupled to the frequency synthesizer that enables the frequency synthesizer to use a maximum output range of frequencies.
- 24. The method as defined in claim 23 wherein the method of selecting a low-pass filter further comprises the steps of:
(1) determining desirable characteristics of the low-pass filter; (2) selecting a low-pass filter from available filter coefficients; (3) converting from a low-pass to a high-pass, a band pass, or a notch filter if necessary; and (4) scaling the coefficients so that a desired cutoff frequency or pass band is achieved.
- 25. The method as defined in claim 17 wherein the step of selecting the at least one voltage or power measurement circuit further comprises the steps of:
(1) selecting a receiver signal strength indicator circuit for receiving the standing wave, wherein the receiver signal strength indicator circuit is selected having a high impedance input value so as not to adversely affect the power being transmitted on the conductor; and (2) coupling a differential amplifier to the receiver strength indicator circuit at a first end, and coupling the differential amplifier to the processor at a second end.
- 26. The method as defined in claim 25 wherein the method further comprises the step of providing at least one additional buffer circuit at an input of the receiver signal strength indicator circuit, while compensating for additional harmonics that arise from use of the at least one additional buffer circuit.
- 27. The method as defined in claim 26 wherein the method further comprises the steps of:
(1) providing the processor with an analog-to-digital converter for receiving a signal from the differential amplifier; and (2) providing the processor with a pulse-width modulated output to the analog output circuit.
- 28. The method as defined in claim 26 wherein the method further comprises selecting the frequency synthesizer from the group of frequency synthesizers comprised of a Direct Digital Synthesizer (DDS) and a Phase Lock Loop (PLL) synthesizer.
- 29. The method as defined in claim 28 wherein the method further comprises the step of running a computer program that is stored by the processor, wherein the computer program enables determination of the plurality of minima of the standing wave.
- 30. The method as defined in claim 29 wherein the method further comprises the steps of:
(1) sampling a digital representation of the standing wave at each of the plurality of minima; (2) locating tentative and curve fitting minima at each of the plurality of minima; (3) calculating the location of the discontinuity utilizing predetermined coefficients; and (4) outputting analog values representative of the detected location of the discontinuity.
- 31. The method as defined in claim 30 wherein the method of locating a tentative minima further comprises the step of finding a global minimum in a local range.
- 32. The method as defined in claim 30 wherein the method of locating a tentative minima further comprises the step of sweeping through the frequency range while the standing wave values are decreasing until the standing wave curve starts to increase.
- 33. The method as defined in claim 30 wherein the method further comprises the step of compensating for the presence of noise by curve fitting to remove the discreteness from measurements.
- 34. The method as defined in claim 33 wherein the method further comprises the step of utilizing the tentative minima to perform a parabolic curve fit function by the steps of:
(1) defining a center point for data to be taken; and (2) making a plurality of standing wave measurements at discrete frequencies around the center point.
- 35. The method as defined in claim 34 wherein the method further comprises the steps of:
(1) storing values of the plurality of minima that are returned from the parabolic fit function; and (2) calculating the location of the discontinuity utilizing calibration coefficients.
- 36. A system for determining a level of a liquid utilizing a standing wave reflectometer, said system comprising:
a processor for controlling operation of the standing wave reflectometer and for determining the level of the liquid; a frequency synthesizer that is controlled by the processor, and generates a transmitted signal over a range of frequencies; a test line that is at least partially disposed in a liquid at a second end, and having a first end that is disposed to receive the transmitted signal from the frequency synthesizer; a standing wave measurement circuit for measuring at least one characteristic of a reflected standing wave from the test line; and a converter for receiving the at least one characteristic of the reflected standing wave and generating a digital signal that is representative of a point along the second end of the test line where the test line enters the liquid.
- 37. The system as defined in claim 36 wherein the system further comprises:
analog output circuitry for filtering a pulse width modulated signal; and the processor, wherein the processor receives the digital signal from the converter, and generates the pulse width modulated signal that is filtered by the analog output circuitry.
- 38. A method for determining a level of a liquid utilizing a standing wave reflectometer, said method comprising the steps of:
(1) providing a processor, a frequency synthesizer, a test line that is at least partially disposed in a liquid at a second end, and having a first end that is disposed to receive a transmitted signal from the frequency synthesizer, a standing wave measurement circuit for receiving a reflected standing wave from the test line, and a converter for generating a signal that is representative of a point along the second end of the test line where the test line enters the liquid; (2) generating at least one frequency on the test line to produce a standing wave; (3) generating a digital representation of the standing wave; (4) determining a plurality of curve fitted minima of the digital representation of the standing wave; and (5) determining a location of the point along the test line where the test line enters the liquid to thereby determine the level of the liquid.
- 39. A method for determining integrity of a cable under test utilizing standing wave reflectometry, said method comprising the steps of:
(1) generating at least one frequency on the cable under test to thereby produce a standing wave; (2) receiving a reflected standing wave from the cable under test; (3) generating a digital representation of the reflected standing wave; (4) determining a plurality of curve fitted minima of the digital representation of the reflected standing wave; and (5) determining a location along the cable under test where there is an interruption in uniformity.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This document is a continuation of, claims priority to, and incorporates by reference all of the subject matter included in the provisional patent application filed on Nov. 30, 2001, and having serial No. 60/335,280.
Provisional Applications (1)
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Number |
Date |
Country |
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60335280 |
Nov 2001 |
US |