Claims
- 1. A method for forming a customized vehicle instrument cluster, said method comprising the steps of:
obtaining an original OEM instrument cluster assembly, which includes an OEM gauge sub-assembly, OEM electronic circuitry, and an original housing; removing the original housing from the OEM cluster assembly; disconnecting the OEM gauge sub-assembly from the OEM electronic circuitry; removing the OEM gauge sub-assembly from the OEM instrument cluster assembly; connecting a calibrated custom instrument gauge module with the OEM electronic circuitry to form an operational assembly; and attaching the calibrated custom instrument gauge module to a replacement housing to form the customized instrument gauge cluster.
- 2. A method as in claim 1 including the step of mounting the OEM electronic circuitry to the replacement housing with the calibrated custom instrument gauge module.
- 3. A method as in claim 2 wherein the replacement housing is the original housing
- 4. A method as in claim 1 wherein the connecting step is performed with an elongated electrical connector allowing mounting of the calibrated custom instrument gauge module at a location remote from the OEM electronic circuitry.
- 5. A method as in claim 1 wherein the original housing includes an original bezel and lens, the method including the steps of:
customizing the original bezel and lens and; reattaching the customized bezel and lens to the calibrated custom instrument gauge module.
- 6. A method as in claim 1 including attaching an additional sub-component to the custom instrument gauge module.
- 7. A method as in claim 1 wherein the obtaining step includes removing the OEM instrument cluster assembly from an existing vehicle, and the method further includes installing the customized instrument cluster assembly in an existing vehicle.
- 8. 1. A method for modifying a vehicle instrument cluster, said method comprising the steps of:
providing an original instrument cluster assembly including an original gauge sub-assembly removably mounted in a support and separably connected with electronic circuitry operative to control the gauge sub-assembly; disconnecting the original gauge subassembly from the electronic circuitry and removing the original gauge sub-assembly from the support; and mounting a differently designed replacement gauge sub-assembly in the support and connecting the replacement gauge sub-assembly to the electronic circuitry for controlling the replacement gauge sub-assembly.
- 9. A customized vehicle instrument cluster comprising:
OEM electronic circuitry removed from an OEM instrument cluster assembly for a vehicle; a calibrated custom instrument gauge module electrically connected to the OEM electronic circuitry to form an operational assembly; and a housing attached to at least the calibrated custom instrument gauge module for protecting the module.
- 10. The invention of claim 8 wherein the calibrated custom instrument gauge module is electrically connected to the OEM electronic circuitry by an extended connector adequate to allow mounting of the instrument gauge cluster at a location remote from the OEM electronic circuitry.
- 11. The invention of claim 8 including an additional device added to the calibrated custom instrument gauge cluster which performs a function not provided by the OEM instrument cluster assembly.
CROSS REFERENCE TO RELATED APPLICATION
[0001] This application claims the priority of U.S. provisional patent application No. 60/369,903 filed Apr. 4, 2002.
Provisional Applications (1)
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Number |
Date |
Country |
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60369903 |
Apr 2002 |
US |