This disclosure is related to integrated circuits, and more particularly to circuits that drive varying loads.
Referring to
In at least one embodiment, a method for driving an output node includes driving a control node of an output device coupled to the output node according to an input signal and using a fixed regulated voltage and a variable regulated voltage. The method includes generating the fixed regulated voltage based on a first power supply voltage, a second power supply voltage, and a first reference voltage. The method includes generating the variable regulated voltage based on the first power supply voltage, the second power supply voltage, and a second reference voltage. The method includes generating the second reference voltage based on the first power supply voltage, the second power supply voltage, a reference current, and a predetermined target voltage level of the control node of the output device. In an embodiment, generating the second reference voltage includes periodically calibrating the second reference voltage.
In at least one embodiment, an integrated circuit includes an output node and an output device of a first type coupled between the output node and a first power supply node. The integrated circuit includes a pre-driver circuit coupled to the first power supply node and configured to drive a control node of the output device according to an input signal and using a fixed regulated voltage and a variable regulated voltage. The integrated circuit includes a fixed voltage regulator configured to generate the fixed regulated voltage based on a first power supply voltage, a second power supply voltage, and a first reference voltage level. The integrated circuit includes a variable voltage regulator configured to generate the variable regulated voltage based on the first power supply voltage, the second power supply voltage, and a second reference voltage. The integrated circuit includes a reference voltage generator configured to generate the second reference voltage based on the first power supply voltage, the second power supply voltage, a reference current, and a predetermined target voltage level of the control node of the output device.
The present invention may be better understood, and its numerous objects, features, and advantages made apparent to those skilled in the art by referencing the accompanying drawings.
The use of the same reference symbols in different drawings indicates similar or identical items.
A technique for reducing variation of an output current of a gate driver circuit that improves stability of an application including the gate driver circuit, reduces electromagnetic interference, and improves efficiency of a system including the gate driver circuit is disclosed. Referring to
Fixed regulator 202, variable regulator 204, and reference generator 206 are coupled between power supply VDDHV and ground. Although fixed regulator 202 is shown to be coupled to only one inverting buffer and variable regulator 204 is shown to be coupled to only one inverting buffer, in other embodiments, pre-driver 208 includes additional inverting or non-inverting buffer circuits coupled in series and coupled to fixed regulator 202 or variable regulator 204. Reference generator 206 generates reference voltage VREF using reference current IREF and a replica device that is a replica of output device 106. The replica device is a downscaled version of output device 106. For example, the replica device has fewer fingers and a smaller device width (e.g., a factor of N smaller, where Nis an integer). The replica device is coupled in a feedback loop and its gate voltage is used as a reference voltage for variable regulator 204. The feedback loop maintains the gate voltage of the replica device at the same voltage level as the gate voltage of the output device 106 in an ON state. Therefore, the drain current of the replica device can be used to control the output current of driver circuit 200 to maintain a constant output current in response to temperature variation. In at least one embodiment of driver circuit 200, reference current IREF is temperature independent (e.g., generated by a circuit combining a proportional to absolute temperature (PTAT) voltage reference circuit and a bandgap voltage reference circuit) and is calibrated during production.
Referring to
Since in practice, downscaling is not implemented perfectly, replica current IREP is adjustable and is calibrated during circuit production test. Replica device 304 is coupled in a feedback loop that sets the gate voltage of replica device 304 to match the drain current of replica device 304 to replica current IREP, and to match the drain voltage of the replica device to a target voltage level (e.g., approximately VDDHV/2). Since downscaling affects the temperature behavior of a device, a digitally programmable gain stage coupled to sampling capacitor 306 is included to compensate for effects of temperature variation and to adjust the level of reference voltage VREF to a level suitable for variable regulator 204. The combination of an adjustable replica current IREP and adjustable gain reduces or minimizes effects of temperature variation on the output current of driver circuit 200.
Although replica current IREP is less than the output current of driver circuit 200 due to downscaling, continuous operation of reference generator 206 still generates relatively high current. Therefore, reference generator 206 is configured to operate only periodically and the gate voltage is stored using sampling capacitor 306. In at least one embodiment, control circuit 302 causes reference generator 206 to periodically calibrate reference voltage VREF, e.g., by refreshing charge loss of sampling capacitor 306 due to leakage current and compensating for temperature variation. In an embodiment, the periodic calibration is synchronized to switching of the state of input signal IN to reduce or eliminate effects of ringing of the signal on internal power supply node VDDHV due to high current change in bond wire inductance during switching. An exemplary control sequence for synchronized calibration is illustrated in
The target period for the calibration is a tradeoff between increased average current and effects of leakage current. Periodic calibration increases the average current and if periodic calibration occurs too frequently, the average current may exceed a target current budget for driver circuit 200. If the periodic calibration is too infrequent, leakage current will significantly reduce the voltage of the sampling capacitor. If no transition of the input signal occurs in a target timing window for synchronized calibration, the control circuit 302 triggers a calibration cycle after a predetermined amount of time since the last calibration regardless of the value of the input signal.
In at least one embodiment of driver circuit 200, control circuit 302 begins a synchronized calibration cycle of the periodic calibration in response to a transition of input signal IN. The transition of input signal IN causes reference generator 206 to enter a first phase of the calibration cycle that allows for sufficient damping of ringing of the signal on power supply node VDDHV. For example, control circuit 302 asserts control signal WAIT4RING and triggers a timer that allows for sufficient damping of ringing on power supply node VDDHV. After the timer reaches a predetermined value corresponding to a predetermined time elapsed, control circuit 302 causes reference generator 206 to enter a second phase of the calibration cycle. For example, control circuit 302 de-asserts control signal WAIT4RING and asserts control signal CALIBRATE. Control signal CALIBRATE closes switch 308, which couples current source 303 to a drain terminal of replica device 304, thereby enabling the feedback loop to match the drain current of replica device 304 to replica current IREP. Control circuit 302 asserts control signal CALIBRATE for a second predetermined amount of time that is sufficient to achieve stabilization of the calibration loop. After the second predetermined amount of time elapses, the calibration loop is stabilized and control circuit 302 causes reference generator 206 to enter a sampling phase of the calibration cycle. For example, control circuit 302 de-asserts control signal CALIBRATE and pulses control signal SAMPLING, which causes reference generator 206 to close switch 310 just long enough to sample the gate voltage of replica device 304 using sampling capacitor 306. If input signal IN changes during a calibration cycle, control circuit 302 interrupts the calibration cycle and restarts the calibration cycle synchronously to that new transition of input signal IN.
In at least one embodiment, the damping time is approximately 100 ns (e.g., WAIT4RING is asserted for 100 ns), and the calibration phase takes approximately 300 ns. In at least one embodiment, the charging time of the calibration capacitor is approximately 30 ns (e.g., SAMPLING=30 ns), the minimum time between two calibrations is 100 μs, and the maximum time between two calibrations is approximately 200 μs. In general, the sampling time (e.g., the time control signal SAMPLING is asserted) is much smaller than the calibration phase. In an exemplary embodiment, the average current consumption is approximately 60 μA although the calibration current is approximately 10 mA, including high side and low side calibration (e.g., 60 μA=(300 ns/100 μs)×10 mA×2).
Referring to
Thus, embodiments of a gate driver product that provides a substantially constant output current are described. The substantially constant output current increases stability of performance in an environment including temperature variation, thereby reducing electromagnetic interference and increasing efficiency of the application (e.g., a motor control application) using the gate driver product. The description of the invention set forth herein is illustrative and is not intended to limit the scope of the invention as set forth in the following claims. For example, while the invention has been described in an embodiment in which the calibration technique is implemented in a gate driver application, one of skill in the art will appreciate that the teachings herein can be utilized with other applications. The terms “first,” “second,” “third,” and so forth, as used in the claims, unless otherwise clear by context, is to distinguish between different items in the claims and does not otherwise indicate or imply any order in time, location, or quality. Variations and modifications of the embodiments disclosed herein may be made based on the description set forth herein, without departing from the scope of the invention as set forth in the following claims.
This application is a continuation of U.S. application Ser. No. 17/230,060, filed Apr. 14, 2021, entitled “CALIBRATION OF DRIVER OUTPUT CURRENT,” issued as U.S. Pat. No. 11,502,683. Each of the foregoing applications are incorporated herein by reference in their entirety. This application is related to U.S. patent application Ser. No. 17/123,358, entitled “High-Speed Low-Impedance Boosting Low-Dropout Regulator,” naming Péter Onódy, Tamás Marozsák, Viktor Zsolczai, and András V. Horváth as inventors, filed on Dec. 16, 2020, which application is incorporated by reference herein, in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
7091709 | Suzuki | Aug 2006 | B2 |
7199565 | Demolli | Apr 2007 | B1 |
7893676 | Hanna | Feb 2011 | B2 |
7999523 | Caffee et al. | Aug 2011 | B1 |
8947112 | Yamanobe | Feb 2015 | B2 |
9261892 | Wang et al. | Feb 2016 | B2 |
9337824 | Piselli | May 2016 | B2 |
9537581 | Mills et al. | Jan 2017 | B2 |
9625925 | Yan et al. | Apr 2017 | B2 |
9817426 | Chellappa | Nov 2017 | B2 |
10281943 | Ho | May 2019 | B1 |
10296026 | Caffee et al. | May 2019 | B2 |
10784860 | Sakai | Sep 2020 | B1 |
11057029 | Westwick et al. | Jul 2021 | B2 |
11127327 | Kim et al. | Sep 2021 | B2 |
11258432 | Onódy et al. | Feb 2022 | B1 |
11362646 | Tesu et al. | Jun 2022 | B1 |
11502683 | Onódy et al. | Nov 2022 | B2 |
11556144 | Onódy et al. | Jan 2023 | B2 |
11561563 | Zsolczai et al. | Jan 2023 | B2 |
20050248331 | Whittaker | Nov 2005 | A1 |
20070075776 | Garlapati et al. | Apr 2007 | A1 |
20070241731 | Van Ettinger | Oct 2007 | A1 |
20080054867 | Soude et al. | Mar 2008 | A1 |
20080238385 | Nagata et al. | Oct 2008 | A1 |
20080303496 | Schlueter et al. | Dec 2008 | A1 |
20090295360 | Hellums | Dec 2009 | A1 |
20100117699 | Wu et al. | May 2010 | A1 |
20100156362 | Xie | Jun 2010 | A1 |
20100156364 | Cho et al. | Jun 2010 | A1 |
20110121802 | Zhu | May 2011 | A1 |
20130082671 | Ivanov et al. | Apr 2013 | A1 |
20150185747 | Liu | Jul 2015 | A1 |
20150198960 | Zhang et al. | Jul 2015 | A1 |
20150286232 | Parikh | Oct 2015 | A1 |
20160224040 | Peluso et al. | Aug 2016 | A1 |
20160357206 | Liu | Dec 2016 | A1 |
20170093399 | Atkinson et al. | Mar 2017 | A1 |
20170115677 | Caffee et al. | Apr 2017 | A1 |
20170126329 | Gorecki et al. | May 2017 | A1 |
20170160757 | Yang | Jun 2017 | A1 |
20170244395 | Ojha et al. | Aug 2017 | A1 |
20180017984 | Mayer et al. | Jan 2018 | A1 |
20180053463 | Kong et al. | Feb 2018 | A1 |
20180129234 | Melgar et al. | May 2018 | A1 |
20180173258 | Singh | Jun 2018 | A1 |
20180219516 | Soliman | Aug 2018 | A1 |
20190109528 | Nobe et al. | Apr 2019 | A1 |
20200106403 | Soliman | Apr 2020 | A1 |
20210159898 | Westwick et al. | May 2021 | A1 |
20210193002 | Kim et al. | Jun 2021 | A1 |
20220115941 | May et al. | Apr 2022 | A1 |
20220182004 | Heckroth et al. | Jun 2022 | A1 |
20220182041 | Tesu et al. | Jun 2022 | A1 |
20220187862 | Onódy et al. | Jun 2022 | A1 |
20220200580 | Onódy et al. | Jun 2022 | A1 |
20220294427 | Tesu et al. | Sep 2022 | A1 |
20220337238 | Onódy et al. | Oct 2022 | A1 |
20220352884 | Onódy et al. | Nov 2022 | A1 |
Number | Date | Country |
---|---|---|
WO2020086150 | Apr 2020 | WO |
Entry |
---|
Onsemi, “Single 6 High-Speed, Low-Side SiC MOSFET Driver,” Semiconductor Components Industries, LLC, 2017, Rev. Apr. 3, 2019, Publication Order No. NCP51705/D, 21 pages. |
Rohm Semiconductors, “Isolation voltage 2500Vrms 1ch Gate Driver Providing Galvanic Isolation,” Gate Driver Providing Galvanic Isolation Series, BM60054AFV-C Datasheet, Rev 003, Apr. 23, 2018, 42 pages. |
Klomark, S., “Design of an Integrated Voltage Regulator,” Institution for Systemteknik, Oct. 17, 2003, 54 pages. |
Number | Date | Country | |
---|---|---|---|
20230179201 A1 | Jun 2023 | US |
Number | Date | Country | |
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Parent | 17230060 | Apr 2021 | US |
Child | 17986723 | US |