Number | Name | Date | Kind |
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4777822 | Uemura et al. | Oct 1988 | |
5095730 | Lauder | Mar 1992 |
Entry |
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Vinod Sharma, Kenneth S. Vecchio, and S. Nemat-Nasser, "Damage Evolution in Silicon Nitride Under Repeated Dynamic Loading", 1991, paper presented at the Proceedings of the 49th Annual Meeting of the Electron Microscopy Society of America, 2 pages. |