Claims
- 1. A capacitance probe for use in material level sensing applications or the like comprising an elongated probe element having a central axis, a tubular guard co-axially surrounding and radially spaced from said probe element, said probe element having a greater axial dimension than said guard and projecting from one end of said guard, one-piece unitarily formed insulation means entirely surrounding said probe element between said guard and said probe element, and surrounding and radially overlapping axially spaced ends of said guard, a portion of said guard intermediate said ends and an end portion of said probe element projecting from said one end of said guard being exposed through said one-piece insulation means, and means capturing said insulation means and adapted for mounting said probe to a material vessel with said exposed portions of said guard and probe element being remote from said capturing means for disposition internally of said vessel.
Parent Case Info
This is a division of application Ser. No. 419,776, filed Sept. 20, 1982 and entitled "Capacitance-Type Material Level Probe and Method of Manufacture", now U.S. Pat. No. 4,499,641.
US Referenced Citations (12)
Foreign Referenced Citations (2)
Number |
Date |
Country |
1275777 |
Aug 1968 |
DEX |
52-29770 |
Mar 1977 |
JPX |
Divisions (1)
|
Number |
Date |
Country |
Parent |
419776 |
Sep 1982 |
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