Claims
- 1. A capacitance probe for use in material level sensing applications or the like comprising an elongated probe element having a central axis, a tubular guard co-axially surrounding and radially spaced from said probe element, said probe element having a greater axial dimension than said guard and projecting from one end of said guard, one-piece unitarily formed insulation means surrounding said probe element and extending from the other side radially outwardly and axially away of said guard, a portion of said guard intermediate said ends and an end portion of said probe element being exposed through said one-piece insulation means, and means capturing said insulation means and adapted for mounting said probe to a material vessel with said exposed portions of said guard and probe element disposed internally of said vessel.
Parent Case Info
This is a continuation of application Ser. No. 763,011, filed Aug. 6, 1985, now abandoned, which is a continuation of Ser. No. 652,853, filed Sept. 21, 1984, now U.S. Pat. No. 4,549,245, issued 10/22/85, which is a division of Ser. No. 419,776, filed Sept. 20, 1982, now U.S. Pat. No. 4,499,641 issued 2/19/1985.
The present invention relates to material level monitors and controls, and more particularly to a capacitance-type antenna or probe for use in an r.f. system for measuring level of fluent material in a storage vessel. Yet more specifically, the invention relates to an improved guarded-type capacitance probe and to a method for manufacture thereof.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
4499641 |
Fleckenstein |
Feb 1985 |
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4549245 |
Fleckenstein |
Oct 1985 |
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Divisions (1)
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Number |
Date |
Country |
Parent |
419776 |
Sep 1982 |
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Continuations (2)
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Number |
Date |
Country |
Parent |
763011 |
Aug 1985 |
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Parent |
652853 |
Sep 1984 |
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