Patent Grant
11913096
The present disclosure relates to a cemented carbide and a tool containing the same.
Conventionally, cemented carbides including a phase containing tungsten carbide (WC) as a main component, a phase composed of a carbide, a nitride, a carbonitride and the like containing a metallic element other than tungsten and a binder phase containing an iron group element as a main component are in use as a material for cutting tools (Patent Literature 1 to Patent Literature 5).
A cemented carbide of the present disclosure is a cemented carbide composed of a first hard phase, a second hard phase and a binder phase,
Recently, a demand for cost reduction has grown more intense, and tools having a long service life have been requested even in, for example, the processing of a heat resistant alloy. Thus, an objective of the present disclosure is to provide a cemented carbide enabling the extension of service lives of tools in the case of being used as tool materials and a tool containing the same.
A tool containing the cemented carbide of the present disclosure is capable of having a long tool service life.
First, embodiments of the present disclosure will be listed and described.
A tool containing the cemented carbide of the present disclosure is capable of having a long tool service life.
In the present disclosure, a numerical expression in the form of “A to B” means the upper limit and lower limit of a range (that is, A or more and B or less), and, when a unit is not put after A but put after B only, the unit of A and the unit of B are the same.
In the present disclosure, when a compound or the like is represented by a chemical formula, the atomic proportion, unless particularly limited, should include all conventionally-known atomic proportions and not be necessarily limited only to atomic proportions within the stoichiometric range. For example, in the case of “TiNbC”, the proportion of the numbers of atoms composing TiNbC include all conventionally-known atomic proportions.
In the present disclosure, when a pressure is specified, the pressure means a pressure based on atmospheric pressure unless particularly limited.
In the development of a tool having a long service life even in the processing of a heat-resistant alloy, the present inventors produced a tool for which a conventional cemented carbide was used and performed processing on a heat-resistant alloy. The processing conditions for heat-resistant alloys causes heat to be likely to remain in the tool during processing, and thus the processing velocity becomes inevitably lower. As a result, it was found that, in the tool for which a conventional cemented carbide was used, thermal wear is likely to develop to thereby make the tool service life shorter. Further, it was found that adhesion of a work material on the tool caused by the processing also makes the tool service life shorter. The adhesion is presumed to also degrade the fracture resistance or the dimensional accuracy. Therefore, the present inventors developed a cemented carbide with attention particularly paid to the wear resistance and adhesion resistance of tools and afforded the cemented carbide of the present disclosure and a tool containing the same.
Hereinafter, specific examples of the cemented carbide of the present disclosure and a tool containing the same will be described with reference to the drawings. In the drawings of the present disclosure, the same reference sign indicates the same portions or equivalent portions. In addition, dimensional relationships of lengths, widths, thicknesses, depths and the like have been modified as appropriate in order for the clarification and simplification of the drawings and do not necessarily indicate actual dimensional relationships.
A cemented carbide of an embodiment of the present disclosure (hereinafter, also referred to as “Embodiment 1”) is a cemented carbide composed of a first hard phase, a second hard phase and a binder phase,
A tool containing the cemented carbide of the present disclosure is capable of having a long tool service life. This is presumed to be because the cemented carbide has excellent adhesion resistance, heat resistance and wear resistance.
<Composition of Cemented Carbide>
The cemented carbide of Embodiment 1 is composed of a first hard phase, a second hard phase and a binder phase. The cemented carbide may also contain an impurity as long as the effect of the present disclosure is not impaired. That is, the cemented carbide may consist of a first hard phase, a second hard phase, a binder phase and an impurity. Examples of the impurity include iron (Fe), molybdenum (Mo), calcium (Ca), silicon (Si) and sulfur (S). The content of the impurity in the cemented carbide (in a case where two or more kinds of impurities are contained, the total content thereof) is preferably 0 mass % or more and less than 0.1 mass %. The content of the impurity in the cemented carbide is measured by inductively coupled plasma emission spectroscopy (measuring instrument: “ICPS-8100” (trademark) by Shimadzu Corporation).
In Embodiment 1, the lower limit of the content of the first hard phase in the cemented carbide can be set to 66 vol % or more, may be 70 vol % or more, may be 75 vol % or more, or may be 80 vol % or more. The upper limit of the content of the first hard phase in the cemented carbide can be set to 99.8 vol % or less, may be 99 vol % or less, may be 98 vol % or less, or may be 97 vol % or less. The content of the first hard phase in the cemented carbide can be set to 66 vol % or more and 99.8 vol % or less, may be 70 vol % or more and 99 vol % or less, may be 75 vol % or more and 98 vol % or less, or may be 80 vol % or more and 97 vol % or less.
In Embodiment 1, the content of the second hard phase in the cemented carbide is 0.1 vol % or more and 15 vol % or less. In such a case, the adhesion resistance, heat resistance and wear resistance of the cemented carbide are improved. The lower limit of the content of the second hard phase in the cemented carbide can be set to 0.10 vol % or more, may be 0.2 vol % or more, may be 0.5 vol % or more, or may be 1 vol % or more. The upper limit of the content of the second hard phase in the cemented carbide can be set to 15 vol % or less, may be 14 vol % or less, may be 12 vol % or less, or may be 10 vol % or less. The content of the second hard phase in the cemented carbide can be set to 0.10 vol % or more and 15 vol % or less, may be 0.2 vol % or more and 14 vol % or less, may be 0.5 vol % or more and 12 vol % or less, or may be 1 vol % or more and 10 vol % or less.
In Embodiment 1, the content of the binder phase in the cemented carbide is 0.1 vol % or more and 19.0 vol % or less. In such a case, the strength of the cemented carbide is improved. The lower limit of the content of the binder phase in the cemented carbide can be set to 0.10 vol % or more, may be 0.3 vol % or more, may be 0.5 vol % or more, or may be 1 vol % or more. The upper limit of the content of the binder phase in the cemented carbide can be set to 19.0 vol % or less, may be 18 vol % or less, may be 16 vol % or less, or may be 14 vol % or less. The content of the binder phase in the cemented carbide can be set to 0.10 vol % or more and 19.0 vol % or less, may be 0.3 vol % or more and 18 vol % or less, may be 0.5 vol % or more and 16 vol % or less, or may be 1 vol % or more and 14 vol % or less.
A method for measuring the content of the first hard phase, the content of the second hard phase and the content of the binder phase in the cemented carbide is as described below.
(A1) The cemented carbide is cut at any position to expose a cross section. The cross section is mirror-like finished with a CROSS SECTION POLISHER (manufactured by JEOL Ltd.).
(B1) The mirror-like finished surface of the cemented carbide is analyzed using scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM-EDX) (device: Gemini 450 (trademark) manufactured by Carl Zeiss AG), and elements that are contained in the cemented carbide are specified.
(C1) The mirror-like finished surface of the cemented carbide is captured with a scanning electron microscope (SEM) to obtain a backscattered electron image. The captured region of the captured image is set to the central portion of the cross section of the cemented carbide, that is, a position where a portion having properties clearly different from those of the bulk portion, such as a vicinity of the surface of the cemented carbide, is not included (a position where all of the captured region becomes the bulk portion of the cemented carbide). The observation magnification is 5000 times. The measurement conditions are an accelerating voltage of 3 kV, a current value of 2 nA and a working distance (WD) of 5 mm.
(D1) The captured region of the (C1) is analyzed using an energy dispersive X-ray spectrometer with a scanning electron microscope (SEM-EDX), the distribution of the elements specified in the (B1) in the captured region is specified, and an element mapping image is obtained.
(E1) The backscattered electron image obtained in the (C1) is loaded onto a computer, and a binarization treatment is performed using image analysis software (OpenCV, SciPy). The binarization treatment is performed such that, among the first hard phase, the second hard phase and the binder phase in the backscattered electron image, only the second hard phase is extracted. The binarization threshold varies with contrast and is thus set for each image.
An example of the backscattered electron image of the cemented carbide of the present embodiment is shown in
(F1) The element mapping image obtained in the (D1) and the binarized image obtained in the (E1) are superimposed, thereby specifying the presence region of each of the first hard phase, the second hard phase and the binder phase on the binarized image. Specifically, regions which are shown in white on the binarized image and in which tungsten (W) and carbon (C) are present on the element mapping image correspond to the presence regions of the first hard phase. Regions which are shown in black on the binarized image and in which titanium (Ti), niobium (Nb) and one or both of carbon (C) and nitrogen (N) are present on the element mapping image correspond to the presence regions of the second hard phase. Regions which are shown in gray on the binarized image and in which at least one element selected from the group consisting of iron, cobalt and nickel is present on the element mapping image correspond to the presence regions of the binder phase.
(G1) One 12.0 μm×8.2 μm rectangular measurement visual field is set in the binarized image after the binarization treatment. The area percentage of each of the first hard phase, the second hard phase and the binder phase is measured with respect to the area of the entire measurement region as a denominator using the image analysis software.
(H1) The measurement of the (G1) is performed in five measurement visual fields that do not overlap one another. In the present disclosure, the average of the area percentages of the first hard phase in the five measurement visual fields corresponds to the content (vol %) of the first hard phase in the cemented carbide. In the present disclosure, the average of the area percentages of the second hard phase in the five measurement visual fields corresponds to the content (vol %) of the second hard phase in the cemented carbide. In the present disclosure, the average of the area percentages of the binder phase in the five measurement visual fields corresponds to the content (vol %) of the binder phase in the cemented carbide.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any captured region that is described in the (C1) was set on the cross section, any five measurement visual fields that are described in the (H1) were set, and the content of the first hard phase, the content of the second hard phase and the content of the binder phase in the cemented carbide were measured a plurality of times according to the above-described procedure, variations in the measurement results were small, and, even when any cutting spot was set on the cross section of the cemented carbide, any captured region on the backscattered electron image was set, and any measurement visual fields were set, the measurement results were not arbitrary.
<First Hard Phase>
<<Composition>>
In Embodiment 1, the first hard phase is composed of tungsten carbide particles (hereinafter, also referred to as “WC particles”). The tungsten carbide particles (hereinafter, also referred to as “WC particles”) are particles made of tungsten carbide. The first hard phase may contain iron (Fe), molybdenum (Mo), calcium (Ca), silicon (Si), sulfur (S) and the like in the WC particles or together with the WC particles as long as the effect of the present disclosure is not impaired. The content of iron (Fe), molybdenum (Mo), calcium (Ca), silicon (Si) and sulfur (S) in the first hard phase (in a case where two or more thereof are contained, the total content thereof) is preferably 0 mass % or more and less than 0.1 mass %. The content of iron (Fe), molybdenum (Mo), calcium (Ca), silicon (Si) and sulfur (S) in the first hard phase is measured by ICP emission spectroscopy.
<<Average Particle Diameter>>
The lower limit of the average particle diameter of the tungsten carbide particles in Embodiment 1 can be set to 0.2 μm or more and may be 0.4 μm or more. The upper limit of the average particle diameter of the tungsten carbide particles can be set to 3.0 μm or less and may be 2.5 μm or less. The average particle diameter of the tungsten carbide particles can be set to 0.2 μm or more and 3.0 μm or less and may be 0.4 μm or more and 2.5 μm or less. In such a case, the cemented carbide has high hardness, and the wear resistance of a tool containing the cemented carbide is improved. In addition, the tool can have excellent breakage resistance.
In the present disclosure, the average particle diameter of the tungsten carbide particles means D50 (an equivalent circle diameter at which the cumulative number-based frequency reaches 50%, median diameter D50) of equal area equivalent circle diameters (Heywood diameters) of the tungsten carbide particles. A method for measuring the average particle diameter of the tungsten carbide particles is as described below.
(A2) A presence region of the first hard phase (corresponding to the tungsten carbide particles) is specified on the binarized image by the same method as the (A1) to (F1) of the method for measuring the content of the first hard phase, the content of the second hard phase and the content of the binder phase in the cemented carbide.
(B2) One 12.0 μm×8.2 μm rectangular measurement visual field is set in the binarized image after the binarization treatment. The outer edge of each tungsten carbide particle in the measurement visual field is specified using the image analysis software, and the equivalent circle diameter (Heywood diameter: equal area equivalent circle diameter) of each tungsten carbide particle is calculated.
(C2) D50 of the equal area equivalent circle diameters of the tungsten carbide particles is calculated based on all of the tungsten carbide particles in the measurement visual field.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any captured region that is described in the (C1) was set on the cross section, any measurement visual field that is described in the (B2) was set, and the average particle diameter of the tungsten carbide particles was measured a plurality of times according to the above-described procedure, a variation in the measurement results was small, and, even when any cutting spot was set on the cross section of the cemented carbide, any captured region on the captured image was set, and any measurement visual fields were set, the measurement results are not arbitrary.
<Second Hard Phase>
<<Composition>>
In Embodiment 1, the second hard phase is composed of at least one first compound selected from the group consisting of TiNbC, TiNbN and TiNbCN. In such a case, the adhesion resistance, heat resistance and wear resistance of the cemented carbide are improved. In the present disclosure, in respect of TiNbC, the proportion between the sum of the numbers of atoms of Ti and Nb and the number of atoms of C is not limited to 1:1 and can include conventionally-known proportions as long as the effect of the present disclosure is not impaired. In the present disclosure, in respect of TiNbN, the proportion between the sum of the numbers of atoms of Ti and Nb and the number of atoms of N is not limited to 1:1 and can include conventionally-known proportions as long as the effect of the present disclosure is not impaired. In the present disclosure, in respect of TiNbCN, the proportion between the sum of the numbers of atoms of Ti and Nb and the sum of the numbers of atoms of C and N is not limited to 1:1 and can include conventionally-known proportions as long as the effect of the present disclosure is not impaired.
The second hard phase is not limited to pure TiNbC, TiNbN and TiNbCN and may contain, in addition to the above-described compounds, a metallic element such as tungsten (W), chromium (Cr) or cobalt (Co) to an extent that the effect of the present disclosure is not impaired. The total content of W, Cr and Co in the second hard phase is preferably 0 mass % or more and less than 0.1 mass %. The contents of W, Cr and Co in the second hard phase are measured by ICP emission spectroscopy.
The second hard phase is preferably composed of a plurality of crystal grains. Examples of the crystal grains that are included in the second hard phase include TiNbC particles, TiNbN particles, TiNbCN particles and particles made of two or more first compounds selected from the group consisting of TiNbC, TiNbN and TiNbCN.
The second hard phase may be composed of crystal grains all having the same composition. For example, the second hard phase may be composed of TiNbC particles. The second hard phase may be composed of TiNbN particles. The second hard phase may be composed of TiNbCN particles. The second hard phase may be composed of particles made of two or more first compounds selected from the group consisting of TiNbC, TiNbN and TiNbCN.
The second hard phase may be composed of crystal grains having two or more different compositions. For example, the second hard phase may be composed of two or more kinds of crystal grains selected from the group consisting of TiNbC particles, TiNbN particles, TiNbCN particles and particles made of two or more first compounds selected from the group consisting of TiNbC, TiNbN and TiNbCN. The second hard phase may be composed of TiNbC particles, TiNbN particles and TiNbCN particles.
A method for measuring the composition of the second hard phase is as described below.
(A3) The cemented carbide is sliced at any position using an ion slicer (device: IB09060CIS (trademark) manufactured by JEOL Ltd.) to produce a sample having a thickness of 30 to 100 nm. The accelerating voltage of the ion slicer is 6 kV in the slicing process and 2 kV in the finishing process.
(B3) The sample is observed with a scanning electron microscope (STEM) (device: JFM-ARM300F (trademark) manufactured by JEOL Ltd.) at 50000 times to obtain a high-angle annular dark field scanning transmission electron microscope (STEM-HAADF) image. The captured region of the STEM-HAADF image is set to the central portion of the sample, that is, a position where a portion having properties clearly different from those of the bulk portion, such as a vicinity of the surface of the cemented carbide, is not included (a position where all of the captured region becomes the bulk portion of the cemented carbide). Regarding the measurement condition, the accelerating voltage is 200 kV.
(C3) Next, element mapping analysis is performed on the STEM-HAADF image with EDX in STEM to obtain an element mapping image. A region in which titanium (Ti), niobium (Nb) and one or both of carbon (C) and nitrogen (N) are present on the element mapping image is specified as the second hard phase, and the composition of the second hard phase is specified. When the second hard phase is composed of a plurality of crystal grains, the composition is specified for each crystal grain.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any captured region of the STEM-HAADF image was set on the sample, and the composition of the second hard phase was measured a plurality of times according to the above-described procedure, a variation in the measurement result was small, and, even when any cutting spot was set on the cross section of the cemented carbide, and any captured region of the STEM-HAADF image was set, the measurement result was not arbitrary.
In the second hard phase, the lower limit of the ratio of niobium to the sum of titanium and niobium in terms of the number of atoms (hereinafter, also referred to as “Nb ratio”) can be set to 0.03 or more, may be 0.04 or more, or may be 0.05 or more The upper limit of the Nb ratio can be set to 0.48 or less, may be 0.46 or less, may be 0.44 or less, or may be 0.42 or less. The Nb ratio can be set to 0.03 or more and 0.48 or less, may be 0.04 or more and 0.46 or less, may be 0.05 or more and 0.44 or less, or may be 0.05 or more and 0.42 or less. In such a case, the second hard phase can be finely dispersed in the cemented carbide, and the adhesion resistance of the cemented carbide is improved.
In the present disclosure, the ratio of niobium to the sum of titanium and niobium in terms of the number of atoms in the second hard phase means the average of the ratios (Nb ratios) of niobium to the sum of titanium and niobium in terms of the number of atoms in all of the second hard phases that are included in the cemented carbide. The Nb ratio is obtained by the following procedure. A 12.0 μm×8.2 μm rectangular measurement visual field is set in the element mapping image of the (C3). Based on all of the second hard phases that are observed in the measurement visual field, the compositions of the second hard phases are measured, and the ratios (Nb ratios) of niobium to the sum of titanium and niobium in terms of the number of atoms are calculated. The Nb ratios are obtained in five measurement visual fields that do not overlap one another. In the present disclosure, the average of the compositions of all of the second hard phases in the five measurement visual fields corresponds to the composition of all of the second hard phases in the cemented carbide. In the present disclosure, the average of the Nb ratios in the five measurement visual fields corresponds to the Nb ratio in the cemented carbide.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any captured region of the STEM-HAADF image was set on the sample, and the average of the Nb ratios in all of the second hard phases was measured a plurality of times according to the above-described procedure, a variation in the measurement result was small, and, even when any cutting spot was set on the cross section of the cemented carbide, and any captured region of the STEM-HAADF image was set, the measurement result was not arbitrary.
<<Average Particle Diameter>>
In Embodiment 1, the second hard phase has an average particle diameter of 0.25 μm or less. In such a case, the adhesion resistance of the cemented carbide is improved. In addition, the second hard phase is less likely to act as a starting point of fracture, and the breakage resistance of a tool containing the cemented carbide is improved. The lower limit of the average particle diameter of the second hard phase can be set to 0.002 μm or more, may be 0.01 μm or more, may be 0.02 μm or more, or may be 0.03 μm or more. The upper limit of the average particle diameter of the second hard phase is 0.25 μm or less, may be 0.23 μm or less, may be 0.2 μm or less, may be 0.19 μm or less, or may be 0.18 μm or less. The average particle diameter of the second hard phase can be set to 0.01 μm or more and 0.25 μm or less, may be 0.01 μm or more and 0.23 μm or less, may be 0.01 μm or more and 0.20 μm or less, may be 0.02 μm or more and 0.19 μm or less, or may be 0.02 μm or more and 0.18 μm or less. In such a case, the tool service life is further improved.
In the present disclosure, the average particle diameter of the second hard phase means D50 (an equivalent circle diameter at which the cumulative number-based frequency reaches 50%, median diameter D50) of equal area equivalent circle diameters (Heywood diameters) of a plurality of crystal grains that are included in the second hard phase. A method for measuring the average particle diameter of the second hard phase is as described below.
(A4) A presence region of the second hard phase is specified on the binarized image by the same method as the (A1) to (F1) of the method for measuring the content of the first hard phase, the content of the second hard phase and the content of the binder phase in the cemented carbide.
(B4) One 12.0 μm×8.2 μm rectangular measurement visual field is set in the binarized image after the binarization treatment. The outer edge of each second hard phase in the measurement visual field is specified using the image analysis software, and the equivalent circle diameter (Heywood diameter equal area equivalent circle diameter) of each second hard phase is calculated.
(C4) Based on all of the second hard phases in the measurement visual field, D50 of the equal area equivalent circle diameters of the second hard phases is calculated.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any captured region that is described in the (C1) was set on the cross section, any measurement visual field that is described in the (B4) was set, and the average particle diameter of the second hard phase was measured a plurality of times according to the above-described procedure, a variation in the measurement results was small, and, even when any cutting spot was set on the cross section of the cemented carbide, any captured region on the captured image was set, and any measurement visual fields were set, the measurement results are not arbitrary.
<<Number of Second Hard Phases>>
In a 12.0 μm×8.2 μm rectangular measurement visual field set in an image after a binarization treatment of a backscattered electron image that is obtained by capturing a cross section of the cemented carbide of Embodiment 1 with a scanning electron microscope, the number of the second hard phases may be 30 or more. In such a case, the adhesion resistance of the cemented carbide is improved. The lower limit of the number of the second hard phases may be 30 or more, may be 32 or more, or may be 35 or more. The upper limit of the number of the second hard phases can be set to 300 or less, may be 250 or less, or may be 200 or less. The number of the second hard phases can be set to 30 or more and 300 or less, may be 32 or more and 250 or less, or may be 35 or more and 200 or less.
The number of the second hard phases can be obtained by specifying the outer edge of each second hard phase in the measurement visual field by the same method as the (A4) to (B4) of the method for measuring the average particle diameter of the second hard phase and counting the number of the second hard phases in the measurement visual field.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any captured region that is described in the (C1) was set on the cross section, any measurement visual field that is described in the (B4) was set, and the average particle diameter of the second hard phase was measured a plurality of times according to the above-described procedure, a variation in the measurement results was small, and, even when any cutting spot was set on the cross section of the cemented carbide, any captured region on the captured image was set, and any measurement visual fields were set, the measurement results are not arbitrary.
<<Dispersity>>
In Embodiment 1, the second hard phase has a dispersity of more than 0.70 and 17.0 or less. When the dispersity of the second hard phase is more than 0.70, contact points between the second hard phases increase in the cemented carbide, the heat dissipation properties of the cemented carbide are improved, thermal wear is suppressed, and thereby the cemented carbide can have excellent wear resistance. When the dispersity of the second hard phase is 17.0 or less, the structure of the cemented carbide becomes homogeneous, and the cemented carbide is capable of having excellent adhesion resistance. The lower limit of the dispersity of the second hard phase is more than 0.70, may be 0.71 or more, may be 0.72 or more, or may be 0.73 or more. The upper limit of the dispersity of the second hard phase is 17.0 or less, may be 16.0 or less, or may be 15.0 or less. The dispersity of the second hard phase is more than 0.70 and 17.0 or less, may be 0.71 or more and 17.0 or less, may be more than 0.70 and 16.0 or less, may be 0.71 or more and 16.0 or less, may be more than 0.70 and 15.0 or less, may be 0.71 or more and 15.0 or less, may be 0.72 or more and 16.0 or less, or may be 0.73 or more and 15.0 or less.
In the present disclosure, the dispersity of the second hard phase is measured using a Voronoi diagram. A specific measurement method is as described below.
(A5) A binarization treatment is performed on a backscattered electron image of a mirror-like finished surface of the cemented carbide by the same method as the (A1) to (F1) in the methods for measuring the content of the first hard phase, the content of the second hard phase and the content of the binder phase of the cemented carbide to obtain a binarized image on which only the second hard phase has been extracted.
(B5) One 12.0 μm×8.2 μm rectangular measurement region is set in the binarized image. In the measurement region, the position of the center of gravity of each second hard phase is derived using the image processing software. The obtained coordinate of the center of gravity is regarded as a generator, a Voronoi partition is performed and Voronoi cells of all generators are derived to produce a Voronoi diagram. The Voronoi cell is a region surrounded by Voronoi boundaries that are each generated by partitioning a space between two adjacent generators with a perpendicular bisector when a plurality of generators is disposed on the same plane.
A Voronoi diagram produced based on the backscattered electron image shown in
(C5) For all of the Voronoi cells in the measurement region, the Voronoi area (μm2) of each cell is derived using the image processing software. Here, the Voronoi cell in the measurement region means a Voronoi cell that is fully present in the measurement region. Therefore, when a part of a Voronoi cell is present outside the measurement region, the Voronoi cell is not regarded as a Voronoi cell in the measurement region.
A standard deviation a of all of the Voronoi areas in the measurement region is derived.
(D5) The standard deviation a is derived in five measurement regions that do not overlap one another. In the present disclosure, the average of the standard deviations a in the five measurement regions corresponds to the dispersity of the second hard phase in the cemented carbide.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any measurement region described in the (B5) was set on the sample, and the dispersity of the second hard phase was measured a plurality of times according to the above-described procedure, a variation in the measurement result was small, and, even when any cutting spot was set on the cross section of the cemented carbide, and any captured region of the captured image was set, the measurement result was not arbitrary.
<Binder Phase>
<<Composition>>
In Embodiment 1, the binder phase contains at least one first element selected from the group consisting of iron, cobalt and nickel. The content of the first element in the binder phase (in a case where the first element is composed of two or more elements, the total content thereof) can be set to 90 mass % or more and 100 mass % or less, may be 95 mass % or more and 100 mass % or less, may be 98 mass % or more and 100 mass % or less, or may be 100 mass %. The content of the first element in the binder phase is measured by ICP emission spectroscopy.
The binder phase may contain, in addition to the first element, tungsten (W), chromium (Cr), vanadium (V), titanium (Ti), niobium (Nb), tantalum (Ta) or the like to an extent that the effect of the present disclosure is not impaired.
<Manufacturing Method>
The cemented carbide of Embodiment 1 can be produced by, for example, the following method. Raw material powders are prepared. As raw materials of the first hard phase and the second hard phase, a tungsten carbide (WC) powder, a tungsten trioxide (WO3) powder, a titanium oxide (TiO2) powder and a niobium oxide (Nb2O5) powder are prepared. The use of the tungsten trioxide (WO3) powder makes it possible to make WC particles in the cemented carbide fine. Examples of a raw material of the binder phase include an iron (Fe) powder, a cobalt (Co) powder and a nickel (Ni) powder. Examples of a grain growth inhibitor include a chromium carbide (Cr3C2) powder and a vanadium carbide (VC) powder.
The average particle diameter of the tungsten carbide (WC) powder can be set to 0.1 μm or more and 3.5 μm or less. The average particle diameter of the WC powder is measured by the Fischer method or the BET method.
The average particle diameter of the tungsten trioxide (WO3) powder can be set to 0.1 μm or more and 3 μm or less. The average particle diameter of the titanium oxide (TiO2) powder can be set to 0.001 μm or more and 1 μm or less. The average particle diameter of the niobium oxide (Nb2O5) powder can be set to 0.001 μm or more and 1 μm or less. The average particle diameter of the iron (Fe) powder can be set to 0.1 μm or more and 5 μm or less. The average particle diameter of the cobalt (Co) powder can be set to 0.1 μm or more and 5 μm or less. The average particle diameter of the nickel (Ni) powder can be set to 0.1 μm or more and 5 μm or less. The average particle diameter of the raw material powder means the number-based median diameter d50 of the sphere equivalent diameters of the raw material powders. The average particle diameter of the raw material powder is measured using a particle size distribution measuring instrument (trade name: MT3300EX) manufactured by MicrotracBEL Corp.
Next, the raw material powders are mixed together to obtain a powder mixture. An attritor can be used for the mixing The mixing time in the attritor can be set to longer than 20 hours and no longer than 30 hours.
Next, the powder mixture is molded into a desired shape to afford a compact. A molding method and molding conditions do not particularly matter as long as ordinary method and conditions are adopted.
Next, the compact is put into a sintering furnace, and the temperature is raised up to 1200° C. in a vacuum. Subsequently, the temperature is raised from 1200° C. up to 1350° C. in a N2 gas atmosphere at a pressure of 8 to 40 kPa. Subsequently, the compact is sintered by being held in the N2 gas atmosphere at a pressure of 12 to 40 kPa and 1350° C. for 30 to 60 minutes to afford a sintered material.
Next, a post-sinter hot isostatic pressing (HIP) treatment is performed on the sintered material. For example, a temperature of 1300° C. and a pressure of 10 MPa are applied to the sintered material for 60 minutes using an Ar gas as a pressure medium.
Next, the sintered material after the post-sinter HIP treatment is quenched to room temperature in an Ar gas at a pressure of 400 kPaG to afford a cemented carbide.
A cemented carbide of an embodiment of the present disclosure (hereinafter, also referred to as “Embodiment 2”) is a cemented carbide composed of a first hard phase, a third hard phase and a binder phase,
The cemented carbide of Embodiment 2 can be configured in the same manner as the cemented carbide of Embodiment 1 except that the second hard phase of the cemented carbide of Embodiment 1 is changed to the third hard phase. Hereinafter, the third hard phase and a manufacturing method will be described.
<Third Hard Phase>
<<Composition>>
In Embodiment 2, the third hard phase is composed of at least one second compound selected from the group consisting of TiTaC, TiTaN and TiTaCN. In such a case, the adhesion resistance and wear resistance of the cemented carbide are improved. In the present disclosure, in respect of TiTaC, the proportion between the sum of the numbers of atoms of Ti and Ta and the number of atoms of C is not limited to 1:1 and can include conventionally-known proportions as long as the effect of the present disclosure is not impaired. In the present disclosure, in respect of TiTaN, the proportion between the sum of the numbers of atoms of Ti and Ta and the number of atoms of N is not limited to 1:1 and can include conventionally-known proportions as long as the effect of the present disclosure is not impaired. In the present disclosure, in respect of TiTaCN, the proportion between the sum of the numbers of atoms of Ti and Ta and the sum of the numbers of atoms of C and N is not limited to 1:1 and can include conventionally-known proportions as long as the effect of the present disclosure is not impaired.
The third hard phase is not limited to pure TiTaC, TiTaN and TiTaCN and may contain a metallic element such as tungsten (W), chromium (Cr) or cobalt (Co) to an extent that the effect of the present disclosure is not impaired. The total content of W, Cr and Co in the third hard phase is preferably 0 mass % or more and less than 0.1 mass %. The contents of W, Cr and Co in the third hard phase are measured by ICP emission spectroscopy.
The third hard phase is preferably composed of a plurality of crystal grains. Examples of the crystal grains that are included in the third hard phase include TiTaC particles, TiTaN particles, TiTaCN particles and particles composed of two or more second compounds selected from the group consisting of TiTaC, TiTaN and TiTaCN.
The third hard phase may be composed of crystal grains all having the same composition. For example, the third hard phase may be composed of TiTaC particles. The third hard phase may be composed of TiTaN particles. The third hard phase may be composed of TiTaCN particles. The third hard phase may be composed of particles made of two or more second compounds selected from the group consisting of TiTaC, TiTaN and TiTaCN.
The third hard phase may be composed of crystal grains having two or more different compositions. For example, the third hard phase may be composed of two or more kinds of crystal grains selected from the group consisting of TiTaC particles, TiTaN particles, TiTaCN particles and particles made of two or more second compounds selected from the group consisting of TiTaC, TiTaN and TiTaCN. The third hard phase may be composed of TiTaC particles, TiTaN particles and TiTaCN particles.
A method for measuring the composition of the third hard phase can be performed according to the method for measuring the composition of the second hard phase described in Embodiment 1 and thus will not be described repeatedly.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any captured region of the STEM-HAADF image was set on the sample, and the composition of the third hard phase was measured a plurality of times according to the method for measuring the composition of the second hard phase described in Embodiment 1, a variation in the measurement result was small, and, even when any cutting spot was set on the cross section of the cemented carbide, and any captured region of the STEM-HAADF image was set, the measurement result was not arbitrary.
In the third hard phase, the lower limit of the ratio of tantalum to the sum of titanium and tantalum in terms of the number of atoms (hereinafter, also referred to as “Ta ratio”) can be set to 0.03 or more, may be 0.04 or more, or may be 0.05 or more. The upper limit of the Ta ratio can be set to 0.48 or less, may be 0.46 or less, may be 0.44 or less, or may be 0.42 or less. The Ta ratio can be set to 0.03 or more and 0.48 or less, may be 0.04 or more and 0.46 or less, may be 0.05 or more and 0.44 or less, or may be 0.05 or more and 0.42 or less. In such a case, the third hard phase can be finely dispersed in the cemented carbide, and the adhesion resistance of the cemented carbide is improved.
In the present disclosure, the ratio of tantalum to the sum of titanium and tantalum in terms of the number of atoms in the third hard phase means the average of the ratios (Ta ratios) of tantalum to the sum of titanium and tantalum in terms of the number of atoms in the third hard phases that are included in the cemented carbide. The Ta ratio is obtained by the following procedure. A 12.0 μm×8.2 μm rectangular measurement visual field is set in the element mapping image of the (C3). Based on all of the third hard phases that are observed in the measurement visual field, the compositions of the third hard phases are measured, and the ratios (Ta ratios) of tantalum to the sum of titanium and tantalum in terms of the number of atoms are calculated. The Ta ratios are obtained in five measurement visual fields that do not overlap one another In the present disclosure, the average of the compositions of all of the third hard phases in the five measurement visual fields corresponds to the composition of all of the third hard phases in the cemented carbide. In the present disclosure, the average of the Ta ratios in the five measurement visual fields corresponds to the Ta ratio in the cemented carbide.
It was confirmed from the measurement on the same specimen by the applicant that, even when any cutting spot was set on the cross section of the cemented carbide, any captured region of the STEM-HAADF image was set on the sample, and the average of the Ta ratios in all of the third hard phases was measured a plurality of times according to the above-described procedure, a variation in the measurement result was small, and, even when any cutting spot was set on the cross section of the cemented carbide, and any captured region of the STEM-HAADF image was set, the measurement result was not arbitrary.
<<Average Particle Diameter>>
In Embodiment 2, the third hard phase has an average particle diameter of 0.25 μm or less. In such a case, the adhesion resistance of the cemented carbide is improved. In addition, the third hard phase is less likely to act as a starting point of fracture, and the breakage resistance of a tool containing the cemented carbide is improved. The lower limit of the average particle diameter of the third hard phase can be set to 0.002 μm or more, may be 0.01 μm or more, may be 0.02 μm or more, or may be 0.03 μm or more. The upper limit of the average particle diameter of the third hard phase is 0.25 μm or less, may be 0.23 μm or less, may be 0.2 μm or less, may be 0.19 μm or less, or may be 0.18 μm or less. The average particle diameter of the third hard phase can be set to 0.01 μm or more and 0.25 μm or less, may be 0.01 μm or more and 0.23 μm or less, may be 0.01 μm or more and 0.20 μm or less, may be 0.02 μm or more and 0.19 μm or less, or may be 0.02 μm or more and 0.18 μm or less. In such a case, the tool service life is further improved. The average particle diameter of the third hard phase can be measured in accordance with the method for measuring the average particle diameter of the second hard phase.
<<Number of Third Hard Phases>>
In a 12.0 μm×8.2 μm rectangular measurement visual field set in an image after a binarization treatment of a backscattered electron image that is obtained by capturing a cross section of the cemented carbide of Embodiment 2 with a scanning electron microscope, the number of the third hard phases may be 30 or more. In such a case, the adhesion resistance of the cemented carbide is improved. The lower limit of the number of the third hard phases may be 30 or more, may be 32 or more, or may be 35 or more. The upper limit of the number of the third hard phases can be set to 300 or less, may be 250 or less, or may be 200 or less. The number of the third hard phases can be set to 30 or more and 300 or less, may be 32 or more and 250 or less, or may be 35 or more and 200 or less. The number of the third hard phases can be measured in accordance with the method for measuring the number of the second hard phases.
<<Dispersity>>
In Embodiment 2, the third hard phase has a dispersity of more than 0.70 and 17.0 or less. When the dispersity of the third hard phase is more than 0.70, contact points between the third hard phases increase in the cemented carbide, the heat dissipation properties of the cemented carbide are improved, thermal wear is suppressed, and thereby the cemented carbide can have excellent wear resistance. When the dispersity of the third hard phase is 17.0 or less, the structure of the cemented carbide becomes homogeneous, and the cemented carbide is capable of having excellent adhesion resistance. The lower limit of the dispersity of the third hard phase is more than 0.70, may be 0.71 or more, may be 0.72 or more, or may be 0.73 or more. The upper limit of the dispersity of the third hard phase is 17.0 or less, may be 16.0 or less, or may be 15.0 or less. The dispersity of the third hard phase is more than 0.70 and 17.0 or less, may be 0.71 or more and 17.0 or less, may be more than 0.70 and 16.0 or less, may be 0.71 or more and 16.0 or less, may be more than 0.70 and 15.0 or less, may be 0.71 or more and 15.0 or less, may be 0.72 or more and 16.0 or less, or may be 0.73 or more and 15.0 or less. The dispersity of the third hard phase can be measured in accordance with the method for measuring the dispersity of the second hard phase.
<Manufacturing Method>
A method for manufacturing the cemented carbide of Embodiment 2 can be the same as the method for manufacturing the cemented carbide of Embodiment 1 except that, in the method for manufacturing the cemented carbide of Embodiment 1, as the raw material powder, the niobium oxide (Nb2O5) powder is changed to a tantalum oxide (Ta2O5) powder.
[Embodiment 3: Tool]
A tool of one embodiment of the present disclosure (hereinafter, also referred to as “Embodiment 3”) is a cutting tool containing the cemented carbide described in Embodiment 1 or Embodiment 2. The tool is also capable of having excellent adhesion resistance and wear resistance in addition to the mechanical strength that the cemented carbide intrinsically has. The tool preferably contains the cemented carbide of Embodiment 1 or Embodiment 2 at least in a part that is involved in cutting. The part that is involved in cutting means a region that is 1.0 μm or less distant from the cutting edge.
As the tool, a drill, a micro drill, an end mill, an indexable cutting insert for a drill, an indexable cutting insert for an end mill, a throwaway insert for milling, a throwaway insert for turning, a metal saw, a gear cutting tool, a reamer, a tap, a cutting tool, a wear-resistant tool, a tool for friction stir welding and the like can be exemplified.
[Addendum 1] In a 12.0 μm×8.2 μm rectangular measurement visual field set in an image after a binarization treatment of a backscattered electron image that is obtained by capturing a cross section of the cemented carbide in the cemented carbide of Embodiment 2 with a scanning electron microscope, the number of the third hard phases may be 30 or more. In such a case, the adhesion resistance of the cemented carbide is improved.
[Addendum 2]
In the cemented carbide of Embodiment 2, the third hard phase may have an average particle diameter of 0.01 μm or more and 0.2 μm or less. In such a case, the adhesion resistance of the cemented carbide is improved.
[Addendum 3]
In the cemented carbide of Embodiment 2, the third hard phase may have a dispersity of more than 0.70 and 15.0 or less. In such a case, the adhesion resistance, heat resistance and wear resistance of the cemented carbide are improved.
[Addendum 4]
In the cemented carbide of Embodiment 2, the dispersity is a standard deviation of an area of each Voronoi cell in a Voronoi diagram that is obtained by performing a Voronoi partition with a center of gravity of the third hard phase as a generator, and
the Voronoi diagram is obtained by extracting the third hard phases in a backscattered electron image obtained by capturing a cross section of the cemented carbide with a scanning electron microscope, setting a 12.0 μm×8.2 μm rectangular measurement visual field in an image after a binarization treatment of the backscattered electron image, performing Voronoi partitions with centers of gravity of the extracted third hard phases as generators and calculating Voronoi cells of all of the generators.
The present embodiments will be more specifically described using Examples. However, the present embodiments are not limited to these Examples.
[Production of Cemented Carbide]
<Specimen 1 to Specimen 66 and Specimen 1-1 to Specimen 1-30:>
As raw materials, tungsten carbide (WC) powders, a tungsten trioxide (WO3) powder, a chromium carbide (Cr3C2) powder, a titanium oxide (TiO2) powder, a niobium oxide (Nb2O5) powder, a tantalum oxide (Ta2O5) powder, a cobalt (Co) powder, a nickel (Ni) powder and an iron (Fe) powder were prepared.
As the WC powders, tungsten carbide powders “WC04NR” (average particle diameter: 0.45 to 0.49 μm, average particle diameter by the Fischer method), “WC02NR” (average particle diameter: 0.10 to 0.14 μm, equivalent particle diameter by the BET method) and “WC25S” (average particle diameter: 2.4 to 3.2 μm, measured using a particle size distribution measuring instrument (trade name: MT3300EX) manufactured by MicrotracBEL Corp.), all of which were manufactured by A.L.M.T. Corp., were used.
The average particle diameter of the WO3 powder is 1.5 μm, the average particle diameter of the Cr3C2 powder is 1.5 μm, the average particle diameter of the TiO2 powder is 0.01 μm, the average particle diameter of the Nb2O5 powder is 0.05 μm, the average particle diameter of the Ta2O5 powder is 0.05 μm, the average particle diameter of the Co powder is 1 μm, the average particle diameter of the Ni powder is 1 μm, and the average particle diameter of the Fe powder is 1 μm. The average particle diameters of the raw material powders are values measured using the particle size distribution measuring instrument (trade name: MT3300EX) manufactured by MicrotracBEL Corp.
The raw material powders were mixed at proportions shown in the “raw material powders” column of Table 1 to Table 5 to afford powder mixtures. For the mixing, an attritor was used. The mixing time in the attritor is as indicated in the “time” column of “mixing” of Table 1 to Table 5.
The obtained powder mixtures were molded by pressing to afford compacts having a round bar shape with a diameter of 46.5 mm.
For specimens other than Specimen 1-1, sintered materials were afforded by the following method. The compacts were put into a sintering furnace, and the temperature was raised up to 1200° C. in a vacuum. The temperature rise rate was set to 10° C./minute. Subsequently, the temperature was raised from 1200° C. up to 1350° C. in a N2 gas atmosphere at pressures shown in the “pressure” columns for “step 1” in Table 1 to Table 5. Subsequently, the compacts were sintered by being held in the N2 gas atmosphere at pressures shown in the “pressure” columns for “step 2” in Table 1 to Table 5 at a temperature of 1350° C. for times shown in the “time” columns for “step 2” to afford sintered materials.
For Specimen 1-1, a sintered material was afforded by the following method. The compact was put into a sintering furnace, and the temperature was raised up to 1200° C. in a vacuum. The temperature rise rate was set to 10° C./minute. Subsequently, the temperature was raised from 1200° C. up to 1350° C. in a vacuum (expressed as “vac sintering” in Table 4). Subsequently, the compact was sintered by being held in the vacuum at a temperature of 1350° C. for the time shown in the “time” column for “step 2” (expressed as “vac sintering” in Table 4) to afford a sintered material.
On the obtained sintered materials, post-sinter HIP treatments were performed. Specifically, a temperature of 1300° C. and a pressure of 10 MPa were applied to the sintered material for 60 minutes using an Ar gas as a pressure medium. Subsequently, the sintered material after the post-sinter HIP treatment was quenched to room temperature in the Ar gas at a pressure of 400 kPa to afford a cemented carbide.
[Evaluation]
<Cemented Carbide>
<<Composition of Cemented Carbide>>
For the cemented carbide of each specimen, the contents (vol %) of the first hard phase, the second hard phase, or the third hard phase and the binder phase were measured. A specific measurement method is as described in Embodiment 1. The results are shown in the “vol %” columns for “first hard phase”, the “vol %” columns for “second hard phase/third hard phase” and the “vol %” columns for “binder phase” for “cemented carbide” in Table 6 to Table 10.
<<Average Particle Diameter of Tungsten Carbide Particles>>
For the cemented carbide of each specimen, the average particle diameter of tungsten carbide particles in the first hard phase was measured. A specific measurement method is as described in Embodiment 1. The results are shown in the “average particle diameter (μm)” columns for “first hard phase” in Table 6 to Table 10.
<<Composition of Second Hard Phase or Third Hard Phase>>
For the cemented carbide of each specimen, the composition of the second hard phase or the third hard phase was measured. A specific measurement method is as described in Embodiment 1 and Embodiment 2. The results are shown in the “composition” columns for “second hard phase/third hard phase” in Table 6 to Table 10.
When “TiNbC, TiNbN, TiNbCN” is shown in the “composition” column, it is indicated that the cemented carbide includes the second hard phase and the second hard phase includes TiNbC particles, TiNbN particles, TiNbCN particles and two or more kinds of first compounds selected from the group consisting of TiNbC, TiNbN and TiNbCN. When “TiNbC” is shown in the “composition” column, it is indicated that the second hard phase is composed of TiNbC particles. When “TiNbN” is shown in the “composition” column, it is indicated that the second hard phase is composed of TiNbN particles. When “TiNbCN is shown in the “composition” column, it is indicated that the second hard phase is composed of TiNbCN particles.
When “TiTaC, TiTaN, TiTaCN” is shown in the “composition” column, it is indicated that the cemented carbide includes the third hard phase and the third hard phase includes TiTaC particles, TiTaN particles, TiTaCN particles and two or more kinds of second compounds selected from the group consisting of TiTaC, TiTaN and TiTaCN. When “TiTaC” is shown in the “composition” column, it is indicated that the third hard phase is composed of TiTaC particles. When “TiTaN” is shown in the “composition” column, it is indicated that the third hard phase is composed of TiTaN particles. When “TiTaCN” is shown in the “composition” column, it is indicated that the third hard phase is composed of TiTaCN particles.
“−” in the “composition” column indicates that neither the second hard phase nor the third hard phase is present.
<<Nb Ratio and Ta Ratio>>
For the cemented carbide of each specimen, the ratio of niobium to the sum of titanium and niobium in terms of the number of atoms in the second hard phase (Nb ratio) or the ratio of tantalum to the sum of titanium and tantalum in terms of the number of atoms in the third hard phase (Ta ratio) were derived based on the composition measured above. The results are shown in the “Nb ratio/Ta ratio” columns for “second hard phase/third hard phase” in Table 6 to Table 10.
<<Average Particle Diameter of Second Hard Phase or Third Hard Phase>>
For the cemented carbide of each specimen, the average particle diameter of the second hard phase or the third hard phase was measured. A specific measurement method is as described in Embodiment 1. The results are shown in the “average particle diameter (μm)” columns for “second hard phase/third hard phase” in Table 6 to Table 10
<<Dispersity of Second Hard Phase or Third Hard Phase>>
For the cemented carbide of each specimen, the dispersity of the second hard phase or the third hard phase was measured. A specific measurement method is as described in Embodiment 1. The results are shown in the “dispersity” columns for “second hard phase/third hard phase” in Table 6 to Table 10.
<<Number of Second Hard Phases or Third Hard Phases>>
For the cemented carbide of each specimen, the number of the second hard phases or the third hard phases in a 12.0 μm×8.2 μm rectangular measurement visual field was measured. A specific measurement method is as described in Embodiment 1. The results are shown in the “number” columns for “second hard phase/third hard phase” in Table 6 to Table 10.
<Tool>
<<Adhesion Resistance Test>>
Round bars made of the cemented carbide of each specimen were processed to produce end mills having a diameter of ϕ6.0 mm. The side surface of Inconel 718 was processed using the end mill of each specimen. Inconel 718 is a heat-resistant alloy. Regarding the processing conditions, the cutting velocity Vc was set to 50 m/min, the table feed F was set to 100 mm/min, the depth of cut (axial direction) ap was set to 8 mm, and the width of cut (radial direction) ae was set to 0.3 mm. Three end mills were processed.
When the length of cut reached 180 m, the cutting edge of the end mill was observed with a scanning electron microscope, and the area of the cutting edge to which a deposit was attached was measured by image analysis. Specifically, the area was measured by the following procedure.
The cutting edge of the end mill is captured with a scanning electron microscope (SEM) in a rake face direction to obtain a backscattered electron image. The observation magnification is 5000 times. The measurement conditions are an accelerating voltage of 3 kV, a current value of 2 nA and a working distance (WD) of 5 mm. An example of a backscattered electron image of the cutting edge in a case where a work material was processed using an end mill made of the cemented carbide is shown in
The captured region with the SEM is analyzed using SEM-EDX, titanium mapping is performed on the captured region, and the component of the deposit is identified. The area (mm2) of the cutting edge to which the deposit has been attached is measured using image analysis software (OpenCV. SciPy).
The average values of the areas (mm2) of the cutting edges to which the deposit has been attached in the three end mills are shown in the “adhesion resistance” column of “cutting test” for “tool” in Tables 6 to Table 10. It is indicated that, as the area becomes smaller, the adhesion resistance becomes superior. The expression “breakage” in the “adhesion resistance” column indicates that a breakage was caused in the tool before a length of cut of 180 m.
<<Wear Resistance Test>>
A cutting test was performed using the end mill of each specimen under the same conditions as for the above-described adhesion resistance test. The length of cut was measured when the wear loss of the flank face reached 0.2 mm. The average values of the lengths of cut (m) in the three end mills are shown in the “wear resistance” column of “tool service life” of “cutting test” for tool” in Table 6 to Table 10. It is indicated that, as the length of cut becomes longer, the tool service life becomes longer.
The cemented carbides and the tools of Specimen 1 to Specimen 66 correspond to the examples. The cemented carbides and the tools of Specimen 1-1 to Specimen 1-30 correspond to comparative examples. It was confirmed that, in the tools of Specimen 1 to Specimen 66 (examples), compared with the tools of Specimen 1-1 to Specimen 1-30 (comparative examples), the adhesion resistance and wear resistance were excellent and the tool service lives were long in the processing of a heat-resistant alloy.
The embodiments and Examples of the present disclosure have been described as described above, and originally, appropriate combinations or various modifications of the configurations of individual embodiments and Examples described above are also planned.
The embodiments and Examples disclosed this time shall be considered to be exemplary in all aspects and to limit nothing The scope of the present invention is shown not by the above-described embodiments and Examples but by the claims and is intended to include equivalent meaning to the claims and all modifications within the scope.
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/JP2022/042888 | 11/18/2022 | WO |
| Number | Name | Date | Kind |
|---|---|---|---|
| 20180222804 | Kido et al. | Aug 2018 | A1 |
| 20200048747 | Michiuchi et al. | Feb 2020 | A1 |
| 20200291504 | Fukae et al. | Sep 2020 | A1 |
| 20210040587 | Yamanishi et al. | Feb 2021 | A1 |
| 20220090237 | Fukae et al. | Mar 2022 | A1 |
| Number | Date | Country |
|---|---|---|
| 2002-137168 | May 2002 | JP |
| 2012-251242 | Dec 2012 | JP |
| 2016-098393 | May 2016 | JP |
| 2021-110010 | Aug 2021 | JP |
| 2017191744 | Nov 2017 | WO |
| 2018194018 | Oct 2018 | WO |
| 2020070978 | Apr 2020 | WO |
| 2020090280 | May 2020 | WO |
| 2021210357 | Oct 2021 | WO |
| Entry |
|---|
| International Search Report and Written Opinion dated Jan. 24, 2023, received for PCT Application PCT/JP2022/042888, filed on Nov. 18, 2022, 12 pages including English Translation. |
