Claims
- 1. A structure comprising a tank circuit inductively coupled to a flux qubit or a phase qubit.
- 2. The structure of claim 1 further comprising a low temperature preamplifier that is in electrical communication with said tank circuit.
- 3. The structure of claim 1 wherein the tank circuit comprises an effective capacitance and an effective inductance.
- 4. The structure of claim 3 wherein said effective capacitance and said effective inductance are in parallel or in series.
- 5. The structure of claim 3 wherein said effective inductance comprises a multiple winding coil of wire.
- 6. The structure of claim 5 wherein a number of turns in said multiple winding coil of wire is in the range of 1 to 150.
- 7. The structure of claim 5 wherein said multiple winding coil of wire is patterned on a substrate.
- 8. The structure of claim 7 wherein said multiple winding coil of wire is patterned in a quadratic layout.
- 9. The structure of claim 7 wherein said multiple winding coil of wire is made of copper, aluminum or niobium.
- 10. The structure of claim 3 wherein said effective capacitance comprises a capacitor.
- 11. The structure of claim 10 wherein said capacitor a surface mounted capacitor on a substrate.
- 12. The structure of claim 3 wherein said effective capacitance has a value in the range of 1 pF to 1 μF.
- 13. The structure of claim 3 wherein said effective capacitance is patterned on a substrate.
- 14. The structure of claim 1 wherein said tank circuit includes a Josephson junction.
- 15. The structure of claim 1 further comprising an excitation device that is capacitively, inductively or electrically coupled to said flux qubit or said phase qubit.
- 16. The structure of claim 15 wherein said excitation device can be used to bias the qubit.
- 17. The structure of claim 1 wherein said tank circuit is electrically coupled to an amplifier.
- 18. The structure of claim 1 wherein said tank circuit has a qualityfactor with a value in the range of 800 to 10,000 at below 5 Kelvin.
- 19. The structure of claim 1 wherein said tank circuit has a quality factor with a value 500 at 4.2 Kelvin and a value of 1500 at 1 Kelvin.
- 20. The structure of claim 1 wherein said tank circuit has a quality factor with a value in the range 1,200 to 2,400 at temperatures below 5 Kelvin.
- 21. The structure of claim 1 wherein said tank circuit has a quality factor with a value 1,600 at temperatures below 1 Kelvin.
- 22. A method comprising:
providing a tank circuit and a phase qubit that are inductively coupled; reading out a state of said phase qubit; applying a flux to said phase qubit that approaches a net zero flux; increasing a level of flux applied to said phase qubit; and observing a response of said tank circuit in a readout device.
- 23. The method of claim 22 wherein an amplifier is inline between said tank circuit and said readout device.
- 24. The method of claim 22 wherein an excitation device is capacitively, inductively or electrically coupled to said phase qubit.
- 25. The method of claim 22 wherein said observing comprises monitoring the phase of the tank circuit voltage response versus the phase of the excitation device.
- 26. The method of claim 22 wherein said observing comprises monitoring the existence and disappearance of metastable states.
- 27. The method of claim 22 wherein said observing comprises monitoring hysteretic behavior in the tank circuit.
- 28. The method of claim 22 wherein said observing comprises monitoring amplitude of the voltage response of the tank circuit.
- 29. The method of claim 22 wherein said observing comprises monitoring phase of the voltage response of the tank circuit.
- 30. The method of claim 22 wherein said observing comprises determining a magnitude of the tunneling rate of the qubit.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application claims priority, under 35 U.S.C. § 119(e), of U.S. Provisional Patent Application No. 60/341,794, filed on Dec. 18, 2001, which is hereby incorporated by reference in its entirety.
Provisional Applications (1)
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Number |
Date |
Country |
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60341974 |
Dec 2001 |
US |